Rainbow Electronics DS1646P User Manual

Page 1
www.dalsemi.com
A
A13A
A11A
A9A
A7A6A
A4A
A
A
A
A
A13A8A9A
A
DS1646/DS1646P
Nonvolatile Timekeeping RAM
FEATURES
Integrates NV SRAM, real time clock,
crystal, power-fail control circuit and lithium energy source
Clock registers are accessed identically to the
static RAM. These registers are resident in the eight top RAM locations
operation in the absence of power
BCD coded year, month, date, day, hours,
minutes, and seconds with leap year compensation valid up to 2100
Power-fail write protection allows for ±10%
VCC power supply tolerance
DS1646 only (DIP Module)
Standard JEDEC bytewide 128k x 8 RAM
pinout
DS1646P only (PowerCap® Module Board)
Surface mountable package for direct
connection to PowerCap containing battery and crystal
Replaceable battery (PowerCap)
Power-fail output
Pin-for-pin compatible with other densities
of DS164XP Timekeeping RAM
ORDERING INFORMATION
DS1646 32-pin DIP module
*DS1646P 34-pin PowerCap Module
Board
PIN ASSIGNMENT
NC A15 A16
PFO
V
CC
WE
OE
CE
DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0
GND
NC
A16 A14 A12
DQ0 DQ1 DQ2
GND
34-Pin PowerCap Module Board
(Uses DS9034PCX PowerCap)
1 2
3 4
A7
5
A6
6
A5
7
A4
8
A3
9
A2
10
A1
11 12
A0
13 14 15 16
32-Pin Encapsulated Package
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
X1 GND V 16 17
BAT
32 31
30 29
28 27
26 25
24 23
22 21
20 19 18 17
X2
V
CC
15 NC WE
11 OE
10 CE
DQ7 DQ6 DQ5 DQ4 DQ3
34 33 32 31 30 29 28
27 26 25 24 23 22 21 20 19 18
NC NC
14 12 10 8
5 3
2 1 0
*DS9034PCX Power Cap
(Required; must be ordered
separately)
1 of 11 022101
Page 2
DS1646/DS1646P
PIN DESCRIPTION
A0-A16 - Address Input
CE - Chip Enable OE - Output Enable
WE - Write Enable
- +5V
V
CC
GND - Ground
DQ0-DQ7 - Data Input/Output NC - No Connection
PFO - Power-fail Output
(DS1646P only) X1, X2 - Crystal Connection V
- Battery Connection
BAT
DESCRIPTION
The DS1646 is a 128k x 8 nonvolatile static RAM with a full-function real time clock, which are both accessible in a byte-wide format. The nonvolatile timekeeping RAM is functionally equivalent to any JEDEC standard 128k x 8 SRAM. The device can also be easily substituted for ROM, EPROM and EEPROM, providing read/write nonvolatility and the addition of the real time clock function. The real time clock information resides in the eight uppermost RAM locations. The RTC registers contain year, month, date, day, hours, minutes, and seconds data in 24-hour BCD format. Corrections for the day o f the month and leap year are made automatically. The RTC clock registers are double-buffered to avoid access of incorrect data that can occur during clock update cycles. The double-buffered system also prevents time loss as the timekeeping countdown continues unabated by access to time register data. The DS1646 also contains its own power-fail circuitry, which deselects the device when the VCC supply is in an out-of­tolerance condition. This feature prevents loss of data from unpredictable system operation brought on b y low VCC as errant access and update cycles are avoided.
PACKAGES
The DS1646 is available in two packages: 32-pin DIP and 34-pin PowerCap module. The 32-pin DIP style module integrates the crystal, lithium energy source, and silicon all in one package. The 34-pin PowerCap Module Board is designed with contacts for connection to a separate PowerC ap (DS9034PCX) that contains the crystal and battery. This design allows the PowerCap to be mounted on top of the DS1646P after the completion of the surface mount process. Mounting the PowerCap aft er the surface mount process prevents damage to the crystal and battery due to the hi gh tempe ratur es required for solde r reflow. The PowerCap is keyed to prevent reverse insertion. The PowerCap Module Board and PowerCap are ordered separately and shipped in separate containers. The part number for the PowerCap is DS9034PCX.
CLOCK OPERATIONS - READING THE CLOCK
While the double-buffered register structure reduces the chanc e of r eadin g incor rect d ata, internal updates to the DS1646 clock registers should be halted before clock data is read to prevent reading of data in transition. However, halting the internal clock register updating process does not affect clock accuracy. Updating is halted when a 1 is written into the read bit, the 7th most significant bit in the control register. As long as 1 remains in that position, updating is halted. After a halt is issued, the registers reflect the count, that is day, date, and time that was present at the moment the halt command was issued. However, the internal clock registers of the double-buffered system continue to update so that clock accuracy is not affected by the access of data. All of the DS1646 registers are updated simultaneously after the clock status is reset. Updating is within a second after the read bit is written to 0.
2 of 11
Page 3
BLOCK DIAGRAM DS1646 Figure 1
TRUTH TABLE DS1646 Table 1
V
CC
5V ± 10%
<4.5V >V
<V
BAT
BAT
CE OE WE
V
IH
X X DESELECT HIGH-Z STANDBY
X X X DESELECT HIGH-Z STANDBY V V V
IL IL IL
XVILWRITE DATA IN ACTIVE V V
IL IH
V V
IH IH
X X X DESELECT HIGH-Z CMOS STANDBY X X X DESELECT HIGH-Z DATA RETENTION
DS1646/DS1646P
MODE DQ POWER
READ DATA OUT ACTIVE READ HIGH-Z ACTIVE
MODE
SETTING THE CLOCK
The MSB Bit, B7, of the control register is the write bit. Setting the write bit to a 1, like the read bit halts updates to the DS1646 registers. The user can then load them with the correct day, date and time data in 24-hour BCD format. Resetting the write bit to a 0 then transfers those values to the actual clock counters and allows normal operation to resume.
STOPPING AND STARTING THE CLOCK OSCILLATOR
The clock oscillator may be stopped at any time. To increase the shelf life, the oscillator can be turned off to minimize current drain from the battery. The
OSC bit is the MSB for the second’s registers. Setting it
to a 1 stops the oscillator.
FREQUENCY TEST BIT
Bit 6 of the day byte is the frequency test bit. When the frequency test bit is set to logic 1 and the oscillator is running, the LSB of the second’s register will toggle at 512 Hz. When the seconds register is being read, the DQ0 line will toggle at the 512 Hz frequency as long as conditions for access
remain valid (i.e.,
CE low, OE low, and address for seconds register remain valid and stable).
3 of 11
Page 4
DS1646/DS1646P
CLOCK ACCURACY (DIP MODULE)
The DS1646 is guaranteed to keep time accuracy to within ±1 minute per month at 25°C. The RTC is calibrated at the factory by Dallas Semiconductor using nonvolatile tuning elements, and does not require additional calibration. For this reason, methods of field clock calibration are not available and not necessary. Clock accuracy is also effected by the electrical environment and caution should be taken to place the RTC in the lowest level EMI section of the PCB layout. For additional information please see application note 58.
CLOCK ACCURACY (POWERCAP MODULE)
The DS1646 and DS9034PCX are each individually tested for accuracy. Once mounted together, the module will typically keep time accuracy to within ±1.53 minutes per month (35 ppm) at 25°C. Clock accuracy is also effected by the electrical environment and caution should be taken to place the RTC in the lowest level EMI section of the PCB layout. For additional information please see application note
58.
1646 REGISTER MAP - BANK1 Table 2
ADDRESS
B
7
B
6
B
5
1FFFF - - - - - - - - YEAR 00-99
1FFFE X X X - - - - - MONTH 01-12 1FFFD X X - - - - - - DATE 01-31 1FFFC X FT X X X - - - DAY 01-07 1FFFB X X - - - - - - HOUR 00-23 1FFFA X - - - - - - - MINUTES 00-59
1FFF9
OSC
-------
1FFF8WRXXXXXXCONTROLA
OSC = STOP BIT
W = WRITE BIT X = UNUSED
DATA
B
4
B
3
B
2
B
1
B
0
FUNCTION
SECONDS 00-59
R = READ BIT FT = FREQUENCY TEST
NOTE:
All indicated “X” bits are not dedicated to any particular function and can be used as normal RAM bits.
RETRIEVING DATA FROM RAM OR CLOCK
The DS1646 is in the read mode whenever WE (write enable) is high; CE (chip enable) is low. The device architecture allows ripple-through access to an y of the address locations in the NVSRAM. Valid
data will be available at the DQ pins within tAA after the last address input is stable, providing that the CE and OE access times and states are satisfied. If CE or OE access times are not met, valid data will be
available at the latter of chip -enable access (t data input/output pins (DQ) is controlled by
) or at output enable access time (t
CEA
CE and OE . If the outputs are activated befor e t
lines are driven to an intermediate state until tAA. If the address inputs are changed while CE and OE remain valid, output data will remain valid for output data hold time (tOH) but will then go indeterminate until the next address access.
4 of 11
). The state of the
OEA
, the data
AA
Page 5
DS1646/DS1646P
WRITING DATA TO RAM OR CLOCK
The DS1646 is in the write mode whenever WE and CE are in their act ive state. The start of a write i s referenced to the latter occurring high to low transition of WE and CE . The addresses must be held valid throughout the cycle. CE or WE must return inactive for a minimum of tWR prior to the initiation of
another read or write cycle. Data in must be valid tDS prior to the end of write and remain valid for t afterward. In a typical application, the OE signal will be high during a write cycle. However, OE can be
DH
active provided that care is taken with the data bus to avoid bus contention. If
OE is low prior to WE
transitioning low the data bus can become active with read data defined by the address inputs. A low transition on WE will then disable the outputs t
after WE goes active.
WEZ
DATA RETENTION MODE
When VCC is within nominal limits (VCC > 4.5 volts) the DS1646 can be accessed as described above with read or write cycles. However, when VCC is below the power-fail point VPF (point at which write protection occurs) the internal clock registers and RAM are blocked from access. This is accomplished
internally by inhibiting access via the CE signal. At this time the power-fail output signal (PFO ) will be driven active low and will remain active until VCC returns to nominal levels. When VCC falls below the level of the internal battery supply, power input is switched from the VCC pin to the internal battery and clock activity, RAM, and clock data are maintained from the battery until VCC is returned to nominal level.
5 of 11
Page 6
DS1646/DS1646P
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground -0.3V to +7.0V Storage Temperature -40°C to +85°C Soldering Temperature 260°C for 10 seconds (DIP Package) (See Note 7)
See IPC/JEDEC Standard J-STD-020A for Surface Mount Devices
* This is a stress rating only and functional operation of the device at these or an y other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability.
OPERATING RANGE
Range Temperature V
Commercial 0°C to +70°C
CC
5V ± 10%
RECOMMENDED DC OPERATING CONDITIONS (Over the Operating Range)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Supply Voltage V Logic 1 Voltage All Inputs V Logic 0 Voltage All Inputs V
CC
IH IL
4.5 5.0 5.5 V 1
2.2 VCC+0.3 V
-0.3 0.8 V
DC ELECTRICAL CHARACTERISTICS (Over the Operating Range)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Average VCC Power Supply Current I TTL Standby Current (CE =VIH)
CMOS Standby Current
I I
(CE =VCC-0.2V) Input Leakage Current (any input) I Output Leakage Current I Output Logic 1 Voltage (I
= -1.0 mA)
OUT
Output Logic 0 Voltage (I
= +2.1 mA)
OUT
V
V
Write Protection Voltage V
CC1 CC2
CC3
IL
OL
OH
OL
PF
3 6 mA 2, 3 2 4.0 mA 2, 3
-1 +1
-1 +1
2.4 V
4.0 4.25 4.5 V
85 mA 2, 3
µA µA
0.4 V
6 of 11
Page 7
DS1646/DS1646P
AC ELEC TRIC AL CHARACTERI STICS (Over the Operating Range)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Read Cycle Time t Address Access Time t
CE Access Time CE Data Off Time
Output Enable Access Time t Output Enable Data Off Time t Output Enable to DQ Low-Z t
CE to DQ Low-Z
Output Hold from Address t Write Cycle Time t Address Setup Time t
CE Pulse Width
Address Hold from End of Write t
Write Pulse Width t
WE Data Off Time WE or CE Inactive Time
Data Setup Time t Data Hold Time High t
RC AA
t
CEA
t
CEZ OEA
OEZ OEL
t
CEL
OH
WC
AS
t
CEW
AH1
t
AH2
WEW
t
WEZ
t
WR
DS
DH1
t
DH2
120 ns
120 ns 120 ns
40 ns
100 ns
40 ns 5ns 5ns
5ns
120 ns
0ns
100 ns
5
30
ns ns
5 6
75 ns
40 ns
10 ns 85 ns
0
25
ns ns
5 6
AC TEST CONDITIONS
Input Levels: 0V to 3V Transition Times: 5 ns
CAPACITANCE (t
= 25°C)
A
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
Capacitance on all pins (except DQ) C Capacitance on DQ pins C
I
DQ
7pF
10 pF
AC ELEC TRIC AL CHARACTERI STICS (POWER-UP/DOWN TIMING) (Over the Operating Range)
PARAMETER SYMBOL MIN TYP MAX UNITS NOTES
CE or WE at V
before Power-Down
IH
VPF (Max) to VPF (Min) VCC Fall Time t VPF (Min) to VSO VCC Fall Time t VSO to VPF (Min) VCC Rise Time t VPF (Min) to VPF (Max) VCC Rise Time t Power-Up t Expected Data Retention Time
(Oscillator On)
t
PD
FB RB
REC
t
DR
F
R
0
300
10
1 0
µs µs
µs µs µs
15 35 ms 10 years 4
7 of 11
Page 8
DS1646 READ CYCLE TIMING
DS1646 WRITE CYCLE TIMING
DS1646/DS1646P
8 of 11
Page 9
POWER-DOWN/POWER-UP TIMING
DS1646/DS1646P
NOTES:
1. All voltages are referenced to ground.
OUTPUT LOAD
2. Typical values are at 25°C and nominal
supplies.
3. Outputs are open.
4. Data retention time is at 25°C and is
calculated from the date code on the device package. The date code XXYY is the year followed by the week of the year in which the device was manufactured. For example,
th
9225 would mean the 25
5. t
6. t
7. Real-Time Clock Modules (DIP) can be successfully processed through conventional wave-soldering
AH1
AH2
, t
are measured from WE going high.
DH1
, t
are measured from CE going high.
DH2
week of 1992.
techniques as long as temperatures as long as temperature exposure to the lithium energy source contained within does not exceed +85°C. Post-solder cleaning with water washing techniques is acceptable, provided that ultrasonic vibration is not used.
In addition, for the PowerCap version: a. Dallas Semiconductor recommends that PowerCap Module bases experience one pass through
solder reflow oriented with the label side up (“live-bug”).
b. Hand soldering and touch-up: Do not touch or apply the soldering iron to leads for more than
3 (three) seconds. To solder, apply flux to the pad, heat the lead frame pad and apply solder. To remove the part, apply flux, heat the lead frame pad until the solder reflows and use a solder wick to remove solder.
9 of 11
Page 10
DS1646 32-PIN PACKAGE
PKG 28-PIN
DIM MIN MAX
A IN.
MM
B IN.
MM
C IN.
MM
D IN.
MM
E IN.
MM
F IN.
MM
G IN.
MM
H IN.
MM
J IN.
MM
K IN.
MM
1.670
38.42
0.715
18.16
0.335
8.51
0.075
1.91
0.015
0.38
0.140
3.56
0.090
2.29
0.590
14.99
0.010
0.25
0.015
0.38
1.690
38.93
0.740
18.80
0.365
9.27
0.105
2.67
0.030
0.76
0.180
4.57
0.110
2.79
0.630
16.00
0.018
0.45
0.025
0.64
DS1646/DS1646P
DS1646P
PKG INCHES
DIM MIN NOM MAX
A B C D E F G
0.920 0.925 0.930
0.980 0.985 0.990
- - 0.080
0.052 0.055 0.058
0.048 0.050 0.052
0.015 0.020 0.025
0.025 0.027 0.030
NOTE:
For the PowerCap version:
a. Dallas Semiconductor recommends that PowerCap Module bases experience one pass through solder
reflow oriented with the label side up (“live - bug”).
b. Hand Soldering and touch-up: Do not touch or apply the soldering iron to leads for more than
3 (three) seconds. To solder, apply flux to the pad, heat the lead frame pad and apply solder. To remove the part, apply flux, heat the lead frame pad until the solder reflows and use a solder wick to remove solder.
10 of 11
Page 11
DS1646P WITH DS9034PCX ATTACHED
DS1646/DS1646P
PKG INCHES
DIM MIN NOM MAX
A B C D E F G
0.920 0.925 0.930
0.955 0.960 0.965
0.240 0.245 0.250
0.052 0.055 0.058
0.048 0.050 0.052
0.015 0.020 0.025
0.020 0.025 0.030
RECOMMENDED POWERCAP MODULE LAND PATTERN
PKG INCHES
DIM MIN NOM MAX
A B C D E
- 1.050 -
- 0.826 -
- 0.050 -
- 0.030 -
- 0.112 -
11 of 11
Loading...