Rainbow Electronics DAB-IMU-C01 User Manual

A

Programmable Low Power Gyroscope

FEATURES

Yaw rate gyroscope with digital range scaling

±80°/sec, ±160°/sec, and ±320°/sec settings
14-bit digital gyroscope sensor outputs
12-bit digital temperature sensor output
Calibrated sensitivity and bias

ADIS16250: +25°C

ADIS16255: −40°C to +85°C
In-system, auto-zero for bias drift calibration
Digitally controlled sample rate
Digitally controlled frequency response
Dual alarm settings with configurable operation
Embedded integration for short-term angle estimates
Digitally activated self-test
Digitally activated low power mode

Interrupt-driven wake-up
SPI®-compatible serial interface
50 Hz sensor bandwidth
Auxiliary 12-bit ADC input and 12-bit DAC output
Auxiliary digital input/output
Single-supply operation: 4.75 V to 5.25 V
2000 g powered shock survivability

ADIS16250/ADIS16255

APPLICATIONS

Instrumentation control
Platform control and stabilization
Motion control and analysis
Avionics instrumentation
Navigation
Image stabilization
Robotics

FUNCTIONAL BLOCK DIAGRAM

UX

AUX

RATE

FILT

VCC

COM

TEMPERAT URE

SENSOR

GYROSCOPE

SENSOR

SELF-TEST

ADC

POWER

MANAGEMENT

VREF

DAC

SIGNAL

CONDITI ONING

AND

CONVERSION

CONTROL

ALARM

RST DIO0 DIO1

Figure 1.

CALIBRATI ON

PROCESSING

DIGITAL

AND

DIGITAL

AUXILIARY

I/O

ADIS16250/

ADIS16255

SPI

PORT

CS

SCLK

DIN

DOUT

06070-001

GENERAL DESCRIPTION

The ADIS16250/ADIS16255 are complete angular rate meas­urement systems available in a single compact package enabled
by Analog Devices, Inc. iSensor™ integration. By enhancing
Analog Devices iMEMS® sensor technology with an embedded
signal processing solution, the ADIS16250/ADIS16255 provide
factory-calibrated and tunable digital sensor data in a convenient
format that can be accessed using a simple SPI serial interface.
The ADIS16255 additionally provides an extended temperature
calibration. The SPI interface provides access to measurements
for the gyroscope, temperature, power supply, and one auxiliary
analog input. Easy access to calibrated digital sensor data
provides developers with a system-ready device, reducing
development time, cost, and program risk.

The device range can be digitally selected from three different
settings: ±80°/sec, ±160°/sec, and ±320°/sec. Unique charac­teristics of the end system are accommodated easily through

Rev. B

Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.

several built-in features, including a single-command auto-zero
recalibration function, as well as configurable sample rate and
frequency response. Additional features can be used to further
reduce system complexity, including:

• Configurable alarm function

• Auxiliary 12-bit ADC and DAC

• Two configurable digital I/O ports

• Digital self-test function

System power dissipation can be optimized via the ADIS16250/
ADIS16255 power management features, including an interrupt­driven wake-up. The ADIS16250/ADIS16255 are available in an
11 mm × 11 mm × 5.5 mm, laminate-based land grid array
(LGA) package with a temperature range of −40°C to +85°C.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2006–2007 Analog Devices, Inc. All rights reserved.

ADIS16250/ADIS16255

TABLE OF CONTENTS

Features.............................................................................................. 1

Applications....................................................................................... 1

Functional Block Diagram .............................................................. 1

General Description ......................................................................... 1

Revision History ............................................................................... 2

Specifications..................................................................................... 3

Timing Specifications .................................................................. 5

Absolute Maximum Ratings............................................................ 6

ESD Caution.................................................................................. 6

Pin Configuration and Function Descriptions............................. 7

Recommended Layout................................................................. 7

Typical Performance Characteristics ............................................. 8

Theory of Operation ...................................................................... 10

Overview...................................................................................... 10

Relative Angle Estimate............................................................. 10

Factory Calibration .................................................................... 10

Auxiliary ADC Function........................................................... 10

Basic Operation .............................................................................. 11

Serial Peripheral Interface (SPI)............................................... 11

Data Output Register Access .................................................... 12

Programming and Control............................................................ 13

Control Register Overview ....................................................... 13

Control Register Structure........................................................ 13

Calibration................................................................................... 14

Global Commands ..................................................................... 14

Operational Control................................................................... 14

Status and Diagnostics............................................................... 16

Outline Dimensions....................................................................... 20

Ordering Guide .......................................................................... 20

REVISION HISTORY

3/07—Rev. A to Rev. B

Changes to Table 2 and Figure 2..................................................... 5

Changes to Table 8.......................................................................... 13

Changes to Table 9 and Table 11................................................... 14

Changes to Table 24........................................................................ 16

Changes to Data-Ready I/O Indicator Section........................... 17

Changes to Self-Test Section ......................................................... 17

2/07—Rev. 0 to Rev. A

Added ADIS16255..............................................................Universal

Changes to Table 1............................................................................ 3

Changes to Table 2............................................................................ 5

Changes to Figure 2.......................................................................... 5

Changes to Typical Performance Characteristics......................... 8

Deleted Temperature Sensor Section ........................................... 11

Added Factory Calibration Section.............................................. 11

Changes to Table 7.......................................................................... 12

Changes to Table 8.......................................................................... 13

Changes to Table 11........................................................................ 14

Changes to Table 19........................................................................ 16

Changes to Flash Memory Endurance Section........................... 18

Changes to Ordering Guide.......................................................... 20

10/06—Revision 0: Initial Version

Rev. B | Page 2 of 20

ADIS16250/ADIS16255

SPECIFICATIONS

TA = −40°C to +85°C, VCC = 5.0 V, angular rate = 0°/sec, ±1 g, ±320°/sec range setting, unless otherwise noted.

Table 1.

Parameter Conditions Min Typ Max Unit

SENSITIVITY

25°C, dynamic range = ±320°/sec
25°C, dynamic range = ±160°/sec 0.03663 °/sec/LSB
25°C, dynamic range = ±80°/sec 0.01832 °/sec/LSB
Initial Tolerance 25°C, dynamic range = ±320°/sec ±0.2 ±1 %
Temperature Coefficient ADIS16250 (see Figure 8) 225 ppm/°C
ADIS16255 (see Figure 11) 25 ppm/°C
Nonlinearity Best fit straight line 0.1 % of FS

BIAS

In Run Bias Stability 25°C, 1σ 0.016 °/sec
Turn-On-to-Turn-On Bias Stability 25°C, 1σ 0.05 °/sec
Angular Random Walk 25°C, 1σ 3.6 °/√hour
Temperature Coefficient ADIS16250 (see Figure 7) 0.03 °/sec/°C
ADIS16255 (see Figure 10) 0.005 °/sec/°C
Linear Acceleration Effect Any axis 0.2 °/sec/g
Voltage Sensitivity VCC = 4.75 V to 5.25 V 1.0 °/sec/V

NOISE PERFORMANCE

Output Noise At 25°C, ±320°/sec range, no filtering 0.48 °/sec rms
At 25°C, ±160°/sec range, 4-tap filter setting 0.28 °/sec rms
At 25°C, ±80°/sec range, 16-tap filter setting 0.14 °/sec rms
Rate Noise Density

FREQUENCY RESPONSE

3 dB Bandwidth

Sensor Resonant Frequency 14 kHz

SELF-TEST STATE

Change for Positive Stimulus 320°/sec dynamic range setting 439 721 1092 LSB
Change for Negative Stimulus 320°/sec dynamic range setting −439 −721 −1092 LSB
Internal Self-Test Cycle Time 20 ms

TEMPERATURE SENSOR

Output at 25°C 0 LSB
Scale Factor 6.88 LSB/°C

ADC INPUT

Resolution 12 Bits
Integral Nonlinearity ±2 LSB
Differential Nonlinearity ±1 LSB
Offset Error ±4 LSB
Gain Error ±2 LSB
Input Range 0 2.5 V
Input Capacitance During acquisition 20 pF

ON-CHIP VOLTAGE REFERENCE 2.5 V

Accuracy At 25°C −10 +10 mV
Temperature Coefficient ±40 ppm/°C
Output Impedance 70 Ω

1

Clockwise rotation is positive output

At 25°C, f = 25 Hz, ±320°/sec range,
no filtering

Analog Bandwidth section for

See the
adjustment

2

0.07326 °/sec/LSB

0.056 °/sec/√Hz rms

50 Hz

Rev. B | Page 3 of 20

ADIS16250/ADIS16255

Parameter Conditions Min Typ Max Unit

DAC OUTPUT 5 kΩ/100 pF to GND

Resolution 12 Bits

Relative Accuracy For Code 101 to Code 4095 4 LSB

Differential Nonlinearity 1 LSB

Offset Error ±5 mV

Gain Error ±0.5 %

Output Range 0 to 2.5 V

Output Impedance 2 Ω

Output Settling Time 10 µs
LOGIC INPUTS

Input High Voltage, V

Input Low Voltage, V

Logic 1 Input Current, I

Logic 0 Input Current, I

All except RST

3

RST

Input Capacitance, CIN 10 pF
DIGITAL OUTPUTS

Output High Voltage, VOH I

Output Low Voltage, VOL I
SLEEP TIMER

Timeout Period
START-UP TIME

Initial 160 ms

Sleep Mode Recovery 2.5 ms
FLASH MEMORY

Endurance

Data Retention

5

6

CONVERSION RATE

Minimum Conversion Time 3.906 ms

Maximum Conversion Time 7.75 sec

Maximum Throughput Rate 256 SPS

Minimum Throughput Rate 0.129 SPS
POWER SUPPLY

Operating Voltage Range, VCC 4.75 5.0 5.25 V

Power Supply Current Normal mode at 25°C 18 mA

Fast mode at 25°C 44 mA
Sleep mode at 25°C 425 A

1

ADIS16255 characterization data represents ±4σ to fall within the ±1% limit.

2

The sensor is capable of ±600°/sec, but the specifications herein are for ±320°/sec only.

3

RST

The

pin has an internal pull-up.

4

Guaranteed by design.

5

Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.

6

Retention lifetime equivalent at junction temperature (TJ) 55°C, as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.

2.0 V

INH

0.8 V

INL

CS signal when used to wake up from

For

0.55 V

sleep mode

V

INH

V

INL

= 3.3 V ±0.2 ±10 µA

IH

= 0 V

IL

−40 −60 A

−1 mA

= 1.6 mA 2.4 V

SOURCE

= 1.6 mA 0.4 V

SINK

4

0.5 128 sec

20,000 Cycles
TJ = 55°C 20 Years

Rev. B | Page 4 of 20

ADIS16250/ADIS16255

TIMING SPECIFICATIONS

TA = −40°C to +85°C, VCC = 5.0 V, unless otherwise noted.

Table 2.

Parameter Description Min

f

Fast mode, SMPL_PRD ≤ 0x07 (fS ≥ 64 Hz) 0.01 2.5 MHz

SCLK

1

Typ Max

1

Unit

Normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 56.9 Hz) 0.01 1.0 MHz
t

Data rate period, fast mode, SMPL_PRD ≤ 0x07 (fS ≥ 64 Hz) 32 s

DATARATE

Data rate period, normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 56.9 Hz) 42 s
t

Stall period, fast mode, SMPL_PRD ≤ 0x07 (fS ≥ 64 Hz) 9 s

STALL

Stall period, normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 56.9 Hz) 12 s
tCS Chip select to clock edge 48.8 ns
t

Data output valid after SCLK falling edge2 100 ns

DAV

t

Data input setup time before SCLK rising edge 24.4 ns

DSU

t

Data input hold time after SCLK rising edge 48.8 ns

DHD

tDF Data output fall time 5 12.5 ns
tDR Data output rise time 5 12.5 ns
t

SFS

CS high after SCLK edge

3

5 ns

Flash update time (power supply must be within range) 50 ms

1

Guaranteed by design; not production tested.

2

The MSB presents an exception to this parameter. The MSB clocks out on the falling edge of CS. The rest of the DOUT bits are clocked after the falling edge of SCLK and

are governed by this specification.

3

This parameter may need to be expanded to allow for proper capture of the LSB. After CS goes high, the DOUT line goes into a high impedance state.

t

DATARATE

CS

SCLK

t

DATASTALL

06070-026

Figure 2. SPI Chip Select Timing

CS

SCLK

DOUT

DIN

t

CS

*

*NOT DEFINE D

1 2 3 4 5 6 15 16

t

DAV

MSB DB14

W/R A5 A4 A3 A2

DB13 DB12 DB10DB11 DB2 LSBDB1

t

DSU

t

DHD

D2

D1 LSB

t

SFS

06070-003

Figure 3. SPI Timing

(Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)

Rev. B | Page 5 of 20

ADIS16250/ADIS16255

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration (Any Axis, Unpowered, 0.5 ms) 2000 g
Acceleration (Any Axis, Powered, 0.5 ms) 2000 g
VCC to COM −0.3 V to +6.0 V
Digital Input/Output Voltage to COM −0.3 V to +5.5 V
Analog Inputs to COM −0.3 V to +3.5 V
Operating Temperature Range1 −40°C to +125°C
Storage Temperature Range1 −65°C to +150°C

1

Extended exposure to temperatures outside of the specified temperature

range of −40°C to +85°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +85°C.

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

RATE

AXIS

LONGIT UDINAL

AXIS

10

6

LATERAL

AXIS

5

1

Figure 4. RATEOUT Level Increase with Clockwise Rotation Increase

RATEOUT

RATEIN

+8191 LSB

CLOCKWISE
ROTATIO N

–8192 LSB

ESD CAUTION

06070-011

Rev. B | Page 6 of 20