9) High reliability EEPROM with Double-Cell structure.
10) High reliability fine pattern CMOS technology.
11) Endurance : 1,000,000 erase / write cycles
12) Data retent ion : 40 y ears
13) Filtered inputs in SC L
14) Initial data FFh in all address.
(5V) : 1.2 mA (Typ.)
CC
•
SDA for noise suppression.
.
Absolute maximum ratings
z
ParameterSymbolLimitsUnit
Supply voltage−0.3 to +6.5V
Power dissipationmW
Storage temperature
Operating temperature
Terminal voltage
∗1 Degradation is done at 8.0mW/°C for operation above 25°C.
∗2, 3 Degradation is done at 4.5mW/°C for operation above 25°C.
∗4 Degradation is done at 3.0mW/°C for operation above 25°C.
∗5 Degradation is done at 3.1mW/°C for operation above 25°C.
(T a=25°C)
CC
V
Pd
Tstg
Topr
−
800 (DIP8)
450 (SOP8)
450 (SOP-J8)
300 (SSOP-B8)
310 (MSOP8)
−65 to +125
−40 to +85
−0.3 to VCC+0.3
∗1
∗2
∗3
∗4
∗5
°C
°C
V
1/25
BR24L16-W / BR24L16F-W / BR24L16FJ-W /
Memory ICs
Recommende d operat ing condi tions
z
ParameterSymbolLimitsUnit
Supply voltage
Input voltageV
∗1 An open drain output requires a pull-up resistor.
I / O
−
−
IN
IN
IN / OUT
IN
Power supply
Ground (0V)
Out of use
Serial clock input
Slave and word address,
serial data input, serial data output
Write protect input
1234
A0
Function
A1
Fig.3 PIN LAYOUT
A2
∗1
GND
4/25
BR24L16-W / BR24L16F-W / BR24L16FJ-W /
Memory ICs
BR24L16FV-W / BR24L16FVM-W
AC operatin g ch aract eris tics
z
ParameterSymbol
Clock frequency
Data clock "HIGH" period
Data clock "LOW" periodtLOW
SDA and SCL rise time
SDA and SCL fall timetF
Start condition hold time
Start condition setup time
Input data hold time
Input data setup time
Output data delay time
Output data hold time
Stop condition setup time
Bus free time
Write cycle time
Noise spike width (SDA and SCL)
WP hold time
WP setup time
WP high period
∗1 Not 100% tested.
(Unless otherwise specifies T a=−40 to 85°C, V
∗1
∗1
tHIGH:WP
CC
=1.8 to 5.5V)
Fast-mode
2.5V ≤ Vcc ≤ 5.5V
Min.
Typ.
Max.
−
−
fSCLkHz
tHIGH
tR
tHD:STA
tSU:STA
tHD:DAT
tSU:DAT
tPD
tDH
tSU:STO
tBUF
tWR
tl
tHD:WP
tSU:WP
0.6
1.2
−
−
0.6
0.6
0
100
0.1
0.1
0.6
1.2
−
−
0
0.1
1.0
400
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−−
−−
1.8V ≤ Vcc ≤ 5.5V
Min.
4.0
−
4.7
−
0.3
0.3
4.0
−
4.7
−
−
250
−
0.9
0.2
0.2
−
−
4.7
−
4.7
5
0.1
−
0.1
1.0
Standard-mode
Typ.
−
−
−
−
−
−
−
−
−
−
0
−
−
−
−
−
−
−
−
−
−
0
−
−−
−−
Max.
100
−
−
1.0
0.3
−
−
−
−
3.5
−
−
−µs
5
0.1
−
Unit
µs
µs
µs
µs
µs
µs
ns
ns
µs
µs
µs
ms
µs
ns
µs
µs
5/25
BR24L16-W / BR24L16F-W / BR24L16FJ-W /
Memory ICs
Synchronous d ata timin g
z
SCL
t
HD :
STAt
SDA
(IN)
t
BUF
SDA
(OUT)
BR24L16FV-W / BR24L16FVM-W
t
t
t
F
LOW
PD
t
R
tSU : DATtHD : DAT
HIGH
t
DH
SCL
SDA
START BITSTOP BIT
Fig.4 SYNCHRONOUS DATA TIMING
SDA data is latched into the chip at the rising edge of SCL clock.
•
Output data toggles at the falling edge of SCL clock.
•
Write cy cle timing
z
SCL
SDA
WRITE DATA (n)
ACKD0
tSU : STOtHD : STAtSU : STA
t
WR
START CONDITIONSTOP CONDITION
Fig.5 WRITE CYCLE TIMING
6/25
BR24L16-W / BR24L16F-W / BR24L16FJ-W /
Memory ICs
WP timing
z
SCL
DATA (n)DATA (1)
BR24L16FV-W / BR24L16FVM-W
SDA
WP
SCL
SDA
WP
D1
D1
t
SU : WP
D0
Fig.6(a) WP TIMING OF THE WRITE OPERATION
DATA (n)DATA (1)
D0
t
HIGH : WP
ACKACK
t
WR
STOP BIT
t
HD : WP
ACKACK
Fig.6(b) WP TIMING OF THE WRITE CANCEL OPERATION
•For the WRITE operation, WP must be “LOW” during the period of time from the rising edge of the clock which takes in
D0 of first byte until the end of t
WR
. ( See Fig. 6 (a) )
During this period, WRITE operation is canceled by setting WP “HIGH”. ( See Fig.6 (b) )
•In the case of setting WP “HIGH” during t
WR
, WRITE operation is stopped in the middle and the data of accessing
address is not guaranteed. Please write correct data again in the case.
7/25
BR24L16-W / BR24L16F-W / BR24L16FJ-W /
Memory ICs
Device oper ation
z
1) Start condition (Recognition of start bit)
• All commands are proceeded by the start condition, which is a HIGH to LOW transition of SDA when SCL is HIGH.
• The device continuously monitors the SDA and SCL lines for the start condition and will not respond to any command
until this condition has been met. (See Fig.4 SYNCHRONOUS DATA TIMING)
2) Stop condition (Recognition of stop bit)
• All communications must be terminated by a stop condition, which is a LOW to HIGH transition of SDA when SCL is
HIGH. (Se e Fig.4 SY NCHRONOUS D AT A TIM ING)
3) Notice about write command
• In the case that stop condition is not excuted in WRITE mode, transfered data will not be written in a memory.
4) Device addressing
• Following a START condition, the master output the slave address to be accessed.
• The most significant four bits of the slave address are the “device type indentifier”, for this device it is fixed as “1010”.
• The next three bit (P2, P1, P0) are used by the master to select eight 256 word page of memory.
P2, P1, P0 set to ‘0’ ‘0 ’ ‘0’ - - - - - 1 pag e (000 to 0F F)
P2, P1, P0 set to ‘0’ ‘0 ’ ‘1’ - - - - - 2 pag e (100 to 1F F)
P2, P1, P0 set to ‘1’ ‘1 ’ ‘1’ - - - - - 8 pag e (700 to 7F F)
•
•
•
•
•
•
BR24L16FV-W / BR24L16FVM-W
• The last bit of the stream (R/W - - - READ / WRITE) determines the operation to be performed. When set to “1”, a read
operation is selected ; when set to “0”, a write operation is selected.
R / W set to “0” - - - - - - WRITE (including word address input of Random Read)
R / W set to “1” - - - - - - READ
P2P1P01010R / W
5) Write protect (WP)
When WP pin set to V
CC
(H level), write protect is set for 2,048 words (all address).
When WP pin set to GND (L level), enable to write 2,048 words (all address).
Either control this pin or connect to GND (or V
CC
). It is inhibited from being left unconnected.
8/25
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