9) High reliability EEPROM with Double-Cell structure.
10) High reliability fine patte rn CMOS te chnology.
11) Endurance : 1,000,000 erase / write cycles
12) Data retention : 40 years
13) Filtered inputs in SCL
14) Initial data FFh in all address.
zAbsolute maximum ratings (T a=25°C)
Supply voltage−0.3 to +6.5V
Power dissipationmW
Storage temperature
Operating temperature
Terminal voltage
∗1 Reduced by 8.0mW for each increase in Ta of 1°C over 25°C.
∗2 Reduced by 4.5mW for each increase in Ta of 1°C over 25°C.
∗3 Reduced by 3.0mW for each increase in Ta of 1°C over 25°C.
∗4 Reduced by 3.1mW for each increase in Ta of 1°C over 25°C.
(5V) : 1.5mA (T yp.)
CC.
•SDA for noise suppression.
ParameterSymbolLimitsUnit
V
CC
∗1
∗2
∗2
∗3
∗4
°C
°C
V
Pd
Tstg
Topr
−
800(DIP8)
450(SOP8)
450(SOP-J8)
300(SSOP-B8)
310(MSOP8)
−65 to +125
−40 to +85
−0.3 to VCC+0.3
1/25
BR24L08-W / BR24L08F-W / BR24L08FJ-W
Memory ICsBR24L08FV-W / BR24L08FVM-W
zRecommended operating conditions (Ta=25°C)
ParameterSymbolLimitsUnit
CC
Supply voltage
Input voltageV
zDC operating charac teristics (Unless otherwise specified Ta=−40 to 85°C, VCC=1.8 to 5.5V)
∗1 An open drain output requires a pull-up resistor.
I / O
−
−
−
IN
IN
IN / OUT
IN
Power supply
Ground (0V)
Out of useA0, A1
Slave address set
Serial clock input
Slave and word address,
serial data input, serial data output
Write protect input
1234
A0
Function
A1
Fig.3 PIN LAYOUT
A2
∗1
GND
4/25
BR24L08-W / BR24L08F-W / BR24L08FJ-W
Memory ICsBR24L08FV-W / BR24L08FVM-W
zAC operating characteristics (Unless otherwise specified Ta=−40 to 85°C, V
Fast-mode
ParameterSymbol
Clock frequency
Data clock "HIGH" period
Data clock "LOW" periodtLOW
SDA and SCL rise time
SDA and SCL fall timetF
Start condition hold time
Start condition setup time
Input data hold time
Input data setup time
Output data delay time
Output data hold time
Stop condition setup time
Bus free time
Write cycle time
Noise spike width (SDA and SCL)
WP hold time
WP setup time
WP high period
∗1 Not 100% tested.
∗1
∗1
fSCLkHz
tHIGH
tR
tHD:STA
tSU:STA
tHD:DATns
tSU:DATns
tPD
tDH
tSU:STOµs
tBUF
tWR
tl
tHD:WP
tSU:WP
tHIGH:WP
2.5V ≤ Vcc ≤ 5.5V
Min.
Typ.
−
−
0.6
−
1.2
−
−
−
−
−
0.6
−
0.6
−
0
−
100
0.1
0.1
0.6
1.2
−
−
0
0.1
1.0
−
−
−
−
−
−
−
−
−−
−−
CC=1.8 to 5.5V)
1.8V ≤ Vcc ≤ 5.5V
Max.
Min.
400
4.0
−
4.7
−
0.3
0.3
4.0
−
4.7
−
−
250
−
0.9
0.2
0.2
−
−
4.7
−
4.7
5
0.1
−
0.1
1.0
Standard-mode
Typ.
−
−
−
−
−
−
−
−
−
−
0
−
−
−
−
−
−
−
−
−
−
0
−
−−
−−
Max.
100
−
−
1.0
0.3
−
−
−
−
3.5
−
−
−µs
5
0.1
−
Unit
µs
µs
µs
µs
µs
µs
µs
µs
ms
µs
ns
µs
µs
5/25
BR24L08-W / BR24L08F-W / BR24L08FJ-W
Memory ICsBR24L08FV-W / BR24L08FVM-W
zSynchronous dat a timing
t
HIGH
t
DH
SCL
SDA
(IN)
SDA
(OUT)
t
R
t
HD :
STAt
t
BUF
tSU : DATtHD : DAT
t
F
LOW
t
PD
SCL
SDA
START BITSTOP BIT
Fig.4 SYNCHRONOUS DATA TIMING
•SDA data is latched into the chip at the rising edge of SCL clock.
•Output data toggles at the falling edge of SCL clock.
zWrite cy cle timing
SCL
SDA
WRITE DATA (n)
ACKD0
tSU : STOtHD : STAtSU : STA
t
WR
START CONDITIONSTOP CONDITION
Fig.5 WRITE CYCLE TIMING
6/25
BR24L08-W / BR24L08F-W / BR24L08FJ-W
Memory ICsBR24L08FV-W / BR24L08FVM-W
zWP timing
SCL
DATA (n)DATA (1)
SDA
WP
SCL
SDA
WP
D1
D1
t
SU : WP
D0
Fig.6(a) WP TIMING OF THE WRITE OPERATION
DATA (n)DATA (1)
D0
t
HIGH : WP
ACKACK
t
WR
STOP BIT
t
HD : WP
ACKACK
Fig.6(b) WP TIMING OF THE WRITE CANCEL OPERATION
•For the WRITE operation, WP must be “LOW” during the period of time from the rising edge of the clock which takes in
D0 of first byte until the end of t
WR. ( See Fig.6 (a) )
During this period, WRITE operation is canceled by setting WP “HIGH”. ( See Fig.6 (b) )
•In the case of setting WP “HIGH” during tWR, WRITE operation is stopped in the middle and the data of accessing
address is not guaranteed. Please write correct data again in the case.
7/25
BR24L08-W / BR24L08F-W / BR24L08FJ-W
Memory ICsBR24L08FV-W / BR24L08FVM-W
zDevice operation
1) Start condi tion (Recognition of st art bit)
• All commands are proceeded by the start condition, which is a HIGH to LOW transition of SDA when SCL is HIGH.
• The device continuously monitors the SDA and SCL lines for the start condition and will not respond to any command
until this condition has been met. (See Fig.4 SYNCHRONOUS DAT A TIMING)
2) Stop conditio n (Recognition of sto p bit)
• All communications must be terminated by a stop condi tion, which is a LOW to HIGH transition of SDA when SCL is
HIGH. (See Fig.4 SYNCHRONOUS DAT A TIMING)
3) Notice about write command
• In the case that stop condition is not executed in WRITE mode, transferred dat a will not be w ritten in a memory.
4) Device addressing
• Following a START condition, the master output the slave address to be accessed.
• The most significant four bits of the slave address are the “device type identifier”, for this device it is fixed as “1010”.
• The next bit (device address) identify the specified device on the bus.
The device address is defined by the state of A2 input pin. This IC works only when the device address
inputted from SDA pin correspond to the state of A2 input pin. Using this address scheme, up to two devices may be
connected to the bus.
• The nex t two bits (P1 , P0) are used by the master to select t four 256 word p age of memory.
P1, P0 set to “0” “0” - - - - - - 1page (000 to 0FF)
P1, P0 set to “0” “1” - - - - - - 2page (100 to 1FF)
P1, P0 set to “1” “0” - - - - - - 3page (200 to 2FF)
P1, P0 set to “1” “1” - - - - - - 4page (300 to 3FF)
• The last bit of the stream (R/W - - - READ / WRITE) determines the operation to be performed. When set to “1”, a read
operation is selected ; when set to “0”, a write operation is selected.
R / W set to “0” - - - - - - WRITE (including word address input of Random Re ad)
R / W set to “1” - - - - - - READ
5) Write protect (WP)
When WP pin set to V
When WP pin set to GND (L level), enable to write 1024 words (all address).
Either control this pin or connect to GND (or VCC). It is inhibited from being left unconnected.
A2P1P01010R / W
CC (H level), write protect is set for 1024 words (all address).
8/25
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