9) High reliability EEPROM with Double-Cell structure
10) High reliability fine pattern CMOS technology.
11) Endurance : 1,000,000 erase / write cycles
12) Data retent ion : 40 y ears
13) Filtered inputs in SC L
14) Initial data FFh in all address.
(5V) : 1.2 mA (Typ.)
CC
•
SDA for noise suppression.
.
Absolute maximum ratings
z
ParameterSymbolLimitsUnit
Supply voltage−0.3 to +6.5V
Power dissipationmW
Storage temperature
Operating temperature
Terminal voltage
∗1 Degradation is done at 8.0mW/°C for operation above 25°C.
∗2, 3 Degradation is done at 4.5mW/°C for operation above 25°C.
∗4 Degradation is done at 3.0mW/°C for operation above 25°C.
∗5 Degradation is done at 3.1mW/°C for operation above 25°C.
(T a=25°C)
V
CC
Pd
Tstg
Topr
−
800 (DIP8)
450 (SOP8)
450 (SOP-J8)
300 (SSOP-B8)
310 (MSOP8)
−65 to +125
−40 to +85
−0.3 to VCC+0.3
∗1
∗2
∗3
∗4
∗5
°C
°C
V
1/25
BR24L02-W / BR24L02F-W / BR24L02FJ-W /
Memory ICs
Recommende d operat ing condi tions
z
ParameterSymbolLimitsUnit
Supply voltage
Input voltageV
∗1 An open drain output requires a pull-up resistor.
I / O
−
−
IN
IN
IN / OUT
IN
Power supply
Ground (0V)
Slave address set
Serial clock input
Slave and word address,
serial data input, serial data output
Write protect input
1234
A0
Function
A1
Fig.3 PIN LAYOUT
A2
∗1
GND
4/25
BR24L02-W / BR24L02F-W / BR24L02FJ-W /
Memory ICs
BR24L02FV-W / BR24L02FVM-W
AC operatin g ch aract eris tics
z
ParameterSymbol
Clock frequency
Data clock "HIGH" period
Data clock "LOW" periodtLOW
SDA and SCL rise time
SDA and SCL fall timetF
Start condition hold time
Start condition setup time
Input data hold time
Input data setup time
Output data delay time
Output data hold time
Stop condition setup time
Bus free time
Write cycle time
Noise spike width (SDA and SCL)
WP hold time
WP setup time
WP high period
∗1 Not 100% tested.
(Unless otherwise specified T a=−40 to 85°C, V
∗1
∗1
tHD:DAT
tSU:DAT
tSU:STO
tHIGH:WP
CC
=1.8 to 5.5V)
Fast-mode
2.5V ≤ Vcc ≤ 5.5V
Min.
Typ.
Max.
−
−
fSCLkHz
tHIGH
tR
tHD:STA
tSU:STA
tPD
tDH
tBUF
tWR
tl
tHD:WP
tSU:WP
0.6
1.2
−
−
0.6
0.6
0
100
0.1
0.1
0.6
1.2
−
−
0
0.1
1.0
400
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−−
−−
1.8V ≤ Vcc ≤ 5.5V
Min.
4.0
−
4.7
−
0.3
0.3
4.0
−
4.7
−
−
250
−
0.9
0.2
0.2
−
−
4.7
−
4.7
5
0.1
−
0.1
1.0
Standard-mode
Typ.
−
−
−
−
−
−
−
−
−
−
0
−
−
−
−
−
−
−
−
−
−
0
−
−−
−−
Max.
100
−
−
1.0
0.3
−
−
−
−
3.5
−
−
−µs
5
0.1
−
Unit
µs
µs
µs
µs
µs
µs
ns
ns
µs
µs
µs
ms
µs
ns
µs
µs
5/25
BR24L02-W / BR24L02F-W / BR24L02FJ-W /
Memory ICs
Synchronous d ata timin g
z
SCL
t
HD :
STAt
SDA
(IN)
t
BUF
SDA
(OUT)
BR24L02FV-W / BR24L02FVM-W
t
t
t
F
LOW
PD
t
R
tSU : DATtHD : DAT
HIGH
t
DH
SCL
SDA
START BITSTOP BIT
Fig.4 SYNCHRONOUS DATA TIMING
SDA data is latched into the chip at the rising edge of SCL clock.
•
Output data toggles at the falling edge of SCL clock.
•
Write cy cle timing
z
SCL
SDA
WRITE DATA (n)
ACKD0
tSU : STOtHD : STAtSU : STA
t
WR
START CONDITIONSTOP CONDITION
Fig.5 WRITE CYCLE TIMING
6/25
BR24L02-W / BR24L02F-W / BR24L02FJ-W /
Memory ICs
WP timing
z
SCL
DATA (n)DATA (1)
BR24L02FV-W / BR24L02FVM-W
SDA
WP
SCL
SDA
WP
D1
D1
t
SU : WP
D0
Fig.6(a) WP TIMING OF THE WRITE OPERATION
DATA (n)DATA (1)
D0
t
HIGH : WP
ACKACK
t
WR
STOP BIT
t
HD : WP
ACKACK
Fig.6(b) WP TIMING OF THE WRITE CANCEL OPERATION
•For the WRITE operation, WP must be “LOW” during the period of time from the rising edge of the clock which takes in
D0 of first byte until the end of t
WR
. ( See Fig. 6 (a) )
During this period, WRITE operation is canceled by setting WP “HIGH”. ( See Fig.6 (b) )
•In the case of setting WP “HIGH” during t
WR
, WRITE operation is stopped in the middle and the data of accessing
address is not guaranteed. Please write correct data again in the case.
7/25
BR24L02-W / BR24L02F-W / BR24L02FJ-W /
Memory ICs
Device oper ation
z
1) Start condition (Recognition of start bit)
• All commands are proceeded by the start condition, which is a HIGH to LOW transition of SDA when SCL is HIGH.
• The device continuously monitors the SDA and SCL lines for the start condition and will not respond to any command
until this condition has been met. (See Fig.4 SYNCHRONOUS DATA TIMING)
2) Stop condition (Recognition of stop bit)
• All communications must be terminated by a stop condition, which is a LOW to HIGH transition of SDA when SCL is
HIGH. (Se e Fig.4 SY NCHRONOUS D AT A TIM ING)
3) Notice about write command
• In the case that stop condition is not executed in WRITE mode, transferred data will not be written in a memory.
4) Device addressing
• Following a START condition, the master output the slave address to be accessed.
• The most sig nifica nt four bi ts of th e slave ad dress ar e the “de vice ty pe ident ifier”, f or thi s devic e it is fixe d as “1010” .
• The next three bit (device address) identify the specified device on the bus.
The device address is defined by the state of A0, A1 and A2 input pins. This IC works only when the device address
inputted from SDA pin correspond to the state of A0, A1 and A2 input pins. Using this address scheme, up to eight
device may be connected to the bus. The last bit of the stream (R/W - - - READ / WRITE) determines the operation to
the performed.
• The last bit of the stream (R/W - - - READ / WRITE) determines the operation to be performed. When set to “1”, a read
operation is selected ; when set to “0”, a write operation is selected.
BR24L02FV-W / BR24L02FVM-W
R / W set to “0” - - - - - - WRITE (including word address input of Random Read)
R / W set to “1” - - - - - - READ
5) Write protect (WP)
When WP pin set to V
When WP pin set to GND (L level), enable to write 256 words (all address).
Either control this pin or connect to GND (or V
A2A1A01010R / W
CC
(H level), wri te pr ote ct is set for 256 w ords (all addr ess) .
CC
). It is inhibited from being left unconnected.
8/25
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