– 20 Year Data Retention
– 100 Erase/Write Cycles
– 2,000V ESD Protection
– 200 mA Latchup Immunity
• Commercial, and Industrial Temperature Ranges
• Dual-in-line and Surface Mount Packages in Standard Pinouts
• PCI-compliant
®
Highperformance
EE PLD
ATF16V8B
ATF16V8BQ
ATF16V8BQL
Block Diagram
Pin Configurations
All Pinouts Top View
Pin NameFunction
CLKClock
ILogic Inputs
I/OBi-directional Buffers
OE
VCC+5V Supply
Output Enable
I/CLK
GND
DIP/SOIC
1
2
I1
3
I2
4
I3
5
I4
6
I5
7
I6
8
I7
9
I8
10
I/CLK
GND
20
19
18
17
16
15
14
13
12
11
TSSOP
1
2
I1
3
I2
4
I3
5
I4
6
I5
7
I6
8
I7
9
I8
10
VCC
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
13
I/O
12
I9/OE
11
PLCC
VCC
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I9/OE
I3
I4
I5
I6
I7
I2I1I/CLK
321
4
5
6
7
8
910111213
I8
GND
I9/OE
VCC
20
I/O
I/O
19
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
I/O
Rev. 0364I–04/01
1
Description
The ATF16V8B is a high-performance CMOS (electricallyerasable) programmable logic device (PLD) that utilizes
Atmel’s proven electrically-erasable Flash memory technology. Speeds down to 7.5 ns are offered. All speed ranges
are specified over the full 5V
temperature ranges, and 5V
± 10% range for industrial
± 5% for commercial tempera-
ture ranges.
Several low-power options allow selection of the best solution for various types of power-limited applications. Each of
Absolute Maximum Ratings*
Temperature Under Bias.................................-55oC to +125oC
Respect to Ground .......................................-2.0 V to +7.0 V
Voltage on Input Pins
with Respect to Ground
During Programming...................................-2.0 V to +14.0 V
Programming Voltage with
Respect to Ground .....................................-2.0 V to +14.0 V
o
C to +150oC
(1)
(1)
(1)
these options significantly reduces total system power and
enhances system reliability.
The ATF16V8Bs incorporate a superset of the generic
architectures, which allows direct replacement of the 16R8
family and most 20-pin combinatorial PLDs. Eight outputs
are each allocated eight product terms. Three different
modes of operation, configured automatically with software, allow highly complex logic functions to be realized.
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Note:1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns.
Maximum output pin voltage is V
which may overshoot to 7.0V for pulses of less
than 20 ns.
+ 0.75V DC,
CC
DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Ambient)0
VCC Power Supply5V=± 5%5V=± 10%
o
C - 70oC-40
o
C - 85oC
2
ATF16V8B(QL)
ATF16V8B(QL)
DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
I
IH
Input or I/O Low
Leakage Current
Input or I/O High
Leakage Current
0 ≤=VIN ≤=VIL(Max)-35-100µA
3.5 ≤=V
IN
≤=V
CC
10µA
Com.5585mA
B-7, -10
Ind.5595mA
B-15Com.5075mA
B-15Ind.5080mA
V
= Max,
I
CC
Power Supp ly
Current, Standby
CC
= Max,
V
IN
Outputs Open
B-25Com.5075mA
B-25Ind.5080mA
BQ-10Com.3555mA
BQL-15Com.510mA
BQL-15Ind.515mA
BQL-25Com.510mA
BQL-25Ind.515mA
Com.6090mA
B-7, -10
Ind.60100mA
B-15Com.5585mA
B-15Ind.5595mA
B-25Com.5585mA
B-25Ind.5595mA
BQ-10Com.4055mA
I
CC2
Clocked Power
Supply Current
= Max,
V
CC
Outputs Open,
f=15 MHz
BQL-15Com.2035mA
BQL-15Ind.2040mA
BQL-25Com.2035mA
BQL-25Ind.2040mA
(1)
I
OS
V
IL
V
IH
V
OL
V
OH
Output Short
Circuit Current
= 0.5 V-130mA
V
OUT
Input Low Voltage-0.50.8V
Input High Voltage2.0VCC+0.75V
Output High Voltage
Output High Voltage
V
IN=VIH
V
CC
V
IN=VIH
V
CC
or VIL,
=Min
or VIL,
=Min
= -24 mA
I
OL
Com., Ind.
= -4.0 mA2.4V
I
OH
0.5V
Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
2. Shaded parts are obsolete with a last time buy date of 19 August 1999.
3
AC Waveforms
(1)
Note:1. Timing measurement reference is 1.5V. Input AC driving levels are 0.0V 3.0V, unless otherwise specified.
AC Characteristics
(1)
-10-15
SymbolParameter
t
PD
t
CF
t
CO
t
S
t
H
t
P
t
W
Input or Feedback to
Non-Registered Output
Clock to Feedback6810ns
Clock to Output27210212ns
Input or Feedback
Setup Time
Hold Time000ns
Clock Period121624ns
Clock Width6812ns
8 outputs switching310315
1 output switchingns
7.512
External Feedback 1/(tS+tCO)684537MHz
f
MAX
t
EA
t
ER
t
PZX
t
PXZ
Internal Feedback 1/(tS + tCF)745040MHz
No Feedback 1/(t
Input to Output Enable —
Product Term
Input to Output Disable —
Product Term
)836241MHz
P
310315
210215
OE pin to Output Enable210215220ns
OE pin to Output Disable1.5101.5151.520ns
Note:1. See ordering information for valid part numbers and speed grades.
2. Shaded parts are obsolete with a last time buy date of 19 August 1999.
-25
MinMax
UnitsMinMaxMinMax
325 ns
15ns
320ns
220ns
4
ATF16V8B(QL)
ATF16V8B(QL)
Input Test Waveforms and
Measurement Levels:
Output Test Loads:
Commercial
tR, tF < 5 ns (10% to 90%)
Pin Capacitance
f = 1 MHz, T = 25°C
C
IN
C
OUT
Note:1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
(1)
TypMaxUnitsConditions
58 pFV
68 pFV
Power-up Reset
The registers in the ATF16V8Bs are designed to reset dur-
.
crossing
CC
ParameterDescriptionTypMaxUnits
t
PR
V
RST
Power-up
Reset Time
Power-up
Reset Voltage
Security Fuse Usage
A single fuse is provided to prevent unauthorized copying
of the ATF16V8B fuse patterns. Once programmed, fuse
verify and preload are inhibited. However, the 64-bit User
Signature remains accessible.
The security fuse should be programmed last, as its effect
is immediate.
ing power-up. At a point delayed slightly from V
, all registers will be reset to the low state. As a result,
V
RST
the registered output state will always be high on power-up.
This feature is critical for state machine initialization. However, due to the asynchronous nature of reset and the
uncertainty of how V
actually rises in the system, the fol-
CC
lowing conditions are required:
1. The V
rise must be monotonic,
CC
2. After reset occurs, all input and feedback setup
times must be met before driving the clock pin high,
and
3. The clock must remain stable during t
PR
Preload of Registered Outputs
The ATF16V8B’s registers are provided with circuitry to
allow loading of each register with either a high or a low.
This feature will simplify testing since any state can be
forced into the registers to control test sequencing. A
JEDEC file with preload is generated when a source file
with vectors is compiled. Once downloaded, the JEDEC file
preload sequence will be done automatically by most of the
approved programmers after the programming.
= 0 V
IN
= 0 V
OUT
6001,000ns
3.84.5V
5
Electronic Signature Word
There are 64 bits of programmable memory that are always
available to the user, even if the device is secured. These
bits can be used for user-specific data.
Programming/Erasing
Programming/erasing is performed using standard PLD
programmers. See CMOS PLD Programming Hardwareand Software Support for information on
software/programming.
Input and I/O Pull-ups
All ATF16V8B family members have internal input and I/O
pull-up resistors. Therefore, whenever inputs or I/Os are
not being driven externally, they will float to V
ensures that all logic array inputs are at known states.
These are relatively weak active pull-ups that can easily be
overdriven by TTL-compatible drivers (see input and I/O
diagrams below).
CC
. This
Input Diagram
Compiler Mode Selection
I/O Diagram
Functional Logic Diagram Description
The Logic Option and Functional Diagrams describe the
ATF16V8B architecture. Eight configurable macrocells can
be configured as a registered output, combinatorial I/O,
combinatorial output, or dedicated input.
The ATF16V8B can be configured in one of three different
modes. Each mode makes the ATF16V8B look like a different device. Most PLD compilers can choose the right
mode automatically. The user can also force the selection
by supplying the compiler with a mode selection. The determining factors would be the usage of register versus
combinatorial outputs and dedicated outputs versus
outputs with output enable control.
The ATF16V8B universal architecture can be programmed
to emulate many 20-pin PAL devices. These architectural
subsets can be found in each of the configuration modes
described in the following pages. The user can download
the listed subset device JEDEC programming file to the
PLD programmer, and the ATF16V8B can be configured to
act like the chosen device. Check with your programmer
manufacturer for this capability.
Unused product terms are automatically disabled by the
compiler to decrease power consumption. A security fuse,
when programmed, protects the content of the ATF16V8B.
Eight bytes (64 fuses) of User Signature are accessible to
the user for purposes such as storing project name, part
number, revision, or date. The User Signature is accessible
regardless of the state of the security fuse.
RegisteredComplexSimpleAuto Select
ABEL, Atmel-ABELP16V8RP16V8CP16V8ASP16V8
CUPLG16V8MSG16V8MAG16V8ASG16V8
LOG/iCGAL16V8_R
OrCAD-PLD“Registered”“Complex”“Simple”GAL16V8A
PLDesignerP16V8RP16V8CP16V8CP16V8A
Tango-PLDG16V8RG16V8CG16V8ASG16V8
Note:1. Only applicable for version 3.4 or lower.
6
ATF16V8B(QL)
(1)
GAL16V8_C7
(1)
GAL16V8_C8
(1)
GAL16V8
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