– Internal Address and Data Latches for 64 Bytes
– Internal Control Timer
• Fast Write Cycle Times
– Page Write Cycle Time: 10 ms Maximum
– 1- to 64-byte Page Write Operation
• Low Power Dissipation
– 15 mA Active Current
– 20 µA CMOS Standby Current
• Hardware and Software Data Protection
• DATA Polling for End of Write Detection
• High Reliability CMOS Technology
– Endurance: 10,000 Cycles
– Data Retention: 10 Years
• JEDEC Approved Byte-wide Pinout
• Commercial and Industrial Temperature Ranges
256K (32K x 8)
Battery-Voltage
Parallel
EEPROMs
™
Description
The AT28BV256 is a high-performance Electrically Erasable and Programmable Read
Only Memory. Its 256K of memory is organized as 32,768 words by 8 bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers access
times to 200 ns with power dissipation of just 54 mW. When the device is deselected,
OE
A11
A13
WE
VCC
A14
A12
µA.
A9
A8
A7
A6
A5
A4
A3
(continued)
PDIP, SOIC
Top V ie w
1
A14
2
A12
3
A7
4
A6
5
A5
6
A4
7
A3
8
A2
9
A1
10
A0
11
I/O0
12
I/O1
13
I/O2
14
GND
TSOP
Top V ie w
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
VCC
27
WE
26
A13
25
A8
24
A9
23
A11
22
OE
21
A10
20
CE
19
I/O7
18
I/O6
17
I/O5
16
I/O4
15
I/O3
28
A10
27
CE
26
I/O7
25
I/O6
24
I/O5
23
I/O4
22
I/O3
21
GND
20
I/O2
19
I/O1
18
I/O0
17
A0
16
A1
15
A2
the CMOS standby current is less than 200
Pin Configurations
Pin NameFunction
A0 - A14Addresses
CE
OEOutput Enable
WE
I/O0 - I/O7Data Inputs/Outputs
NCNo Connect
DCDon’t Connect
Note: PLCC package pins 1 and 17
are DON’T CONNECT.
Chip Enable
Write Enable
PLCC
Top View
AT28BV256
Rev. 0273G–11/99
1
The AT28BV256 is accessed like a Static RAM for the read
or write cycle without the need for external components.
The device contains a 64-byte page register to allow writing
of up to 64 bytes simultaneously. During a write cycle, the
addresses and 1 to 64 bytes of data are internally latched,
freeing the address and data bus for other operations. Following the initiation of a write cycle, the device will automatically write the latched data using an internal control timer.
The end of a write cycle can be detected by DATA
polling
Block Diagram
of I/O7. Once the end of a write cycle has been detected a
new access for a read or write can begin.
Atmel’s 28BV256 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correction for extended endurance and improved data
retention characteristics. An optional software data protection mechanism is available to guard against inadvertent
writes. The device also includes an extra 64 bytes of
EEPROM for device identification or tracking.
Absolute Maximum Ratings*
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to V
Voltage on OE
with Respect to Ground...................................-0.6V to +13.5V
and A9
+ 0.6V
CC
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
2
AT28BV256
Device Operation
READ: The AT28BV256 is accessed like a Static RAM.
When CE
at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high
impedance state when either CE
line control gives designers flexibility in preventing bus contention in their system.
BYTE WRITE: A low pulse on the WE
CE
cycle. The address is latched on the falling edge of CE
WE
rising edge of CE
started it will automatically time itself to completion. Once a
programming operation has been initiated and for the duration of t
operation.
PAGE WRITE: The page write operation of the
AT28BV256 allows 1 to 64 bytes of data to be written into
the device during a single internal programming period. A
page write operation is initiated in the same manner as a
byte write; the first byte written can then be followed by 1 to
63 additional bytes. Each successive byte must be written
within 150
exceeded the AT28BV256 will cease accepting data and
commence the internal programming operation. All bytes
during a page write operation must reside on the same
page as defined by the state of the A6 - A14 inputs. For
each WE
tion, A6 - A14 must be the same.
The A0 to A5 inputs are used to specify which bytes within
the page are to be written. The bytes may be loaded in any
order and may be altered within the same load period. Only
bytes which are specified for writing will be written; unnecessary cycling of other bytes within the page does not
occur.
DATA
to indicate the end of a write cycle. During a byte or page
write cycle an attempted read of the last byte written will
result in the complement of the written data to be presented
on I/O7. Once the write cycle has been completed, true
data is valid on all outputs, and the next write cycle may
begin. DATA
cycle.
TOGGLE BIT: In addition to DATA
provides another method for determining the end of a write
cycle. During the write operation, successive attempts to
and OE are low and WE is high, the data stored
or OE is high. This dual-
or CE input with
or WE low (respectively) and OE high initiates a write
or
, whichever occurs last. The data is latched by the first
or WE. Once a byte write has been
, a read operation will effectively be a polling
WC
µs (t
) of the previous byte. If the t
BLC
BLC
limit is
high to low transition during the page write opera-
POLLING: The AT28BV256 features DATA Polling
Polling may begin at anytime during the write
Polling the AT28BV256
AT28BV256
read data from the device will result in I/O6 toggling
between one and zero. Once the write has completed, I/O6
will stop toggling and valid data will be read. Reading the
toggle bit may begin at any time during the write cycle.
DATA PROTECTION: If precautions are not taken, inadvertent writes may occur during transitions of the host system power supply. Atmel has incorporated both hardware
and software features that will protect the memory against
inadvertent writes.
HARDWARE PROTECTION: Hardware features protect
against inadvertent writes to the AT28BV256 in the following ways: (a) V
1.8V (typical) the device will automatically time out 10 ms
(typical) before allowing a write; (b) write inhibit—holding
any one of OE
cycles; and (c) noise filter—pulses of less than 15 ns (typical) on the WE
SOFTWARE DATA PROTECTION: A software-controlled
data protection feature has been implemented on the
AT28BV256. Software data protection (SDP) helps prevent
inadvertent writes from corrupting the data in the device.
SDP can prevent inadvertent writes during power-up and
power-down as well as any other potential periods of system instability.
The AT28BV256 can only be written using the software
data protection feature. A series of three write commands
to specific addresses with specific data must be presented
to the device before writing in the byte or page mode. The
same three write commands must begin each write operation. All software write commands must obey the page
mode write timing specifications. The data in the 3-byte
command sequence is not written to the device; the
address in the command sequence can be utilized just like
any other location in the device.
Any attempt to write to the device without the 3-byte
sequence will start the internal write timers. No data will be
written to the device; however, for the duration of t
operations will effectively be polling operations.
DEVICE IDENTIFICATION: An extra 64 bytes of EEPROM
memory are available to the user for device identification.
By raising A9 to 12V
7FC0H to 7FFFH the additional bytes may be written to or
read from in the same manner as the regular memory
array.
power-on delay—once VCC has reached
CC
low, CE high or WE high inhibits write
or CE inputs will not initiate a write cycle.
, read
WC
± 0.5V and using address locations
3
DC and AC Operating Range
AT28BV256-20AT28BV256-25
Operating
Temperature (Case)
V
Power Supply2.7V - 3.6V2.7V - 3.6V
CC
Com.0°C - 70°C0°C - 70°C
Ind.-40°C - 85°C-40°C - 85°C
Operating Modes
ModeCEOEWEI/O
ReadV
(2)
Write
Standby/Write InhibitV
IL
V
IL
IH
Write InhibitXXV
Write InhibitXV
Output DisableXV
Chip EraseV
IL
V
IL
V
IH
(1)
X
IL
IH
(3)
V
H
V
IH
V
IL
D
OUT
D
IN
XHigh Z
IH
X
XHigh Z
V
IL
High Z
Notes: 1. X can be VIL or VIH.
2. Refer to AC programming waveforms.
= 12.0V ± 0.5V.
3. V
H
DC Characteristics
SymbolParameterConditionMinMaxUnits
I
LI
I
LO
I
SB
I
CC
V
IL
V
IH
V
OL
V
OH
Input Load CurrentVIN = 0V to VCC + 1V10µA
Output Leakage CurrentV
= 0V to V
I/O
CC
10µA
Com.20µA
VCC Standby Current CMOSCE = V
V
Active Currentf = 5 MHz; I
CC
- 0.3V to VCC + 1V
CC
= 0 mA15mA
OUT
Ind.50µA
Input Low Voltage0.6V
Input High Voltage2.0V
Output Low VoltageIOL = 1.6 mA0.3V
Output High VoltageIOH = -100 µA2.0V
4
AT28BV256
AC Read Characteristics
tR, tF < 20 ns
SymbolParameter
AT28BV256
AT28BV256-20AT28BV256-25
UnitsMinMaxMinMax
t
t
t
t
t
ACC
CE
OE
DF
OH
(1)
(2)
(3)(4)
Address to Output Delay200250ns
CE to Output Delay200250ns
OE to Output Delay0800100ns
CE or OE to Output Float055060ns
Output Hold from OE, CE or Address, whichever
occurred first
AC Read Waveforms
(1)(2)(3)(4)
t
ACC
t
CE
t
00ns
OE
t
DF
t
OH
Notes: 1. CE may be delayed up to t
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by t
without impact on t
is specified from OE or CE whichever occurs first (CL = 5 pF).
3. t
DF
ACC
.
- tCE after the address transition without impact on t
ACC
ACC
.
- tOE after an address change
ACC
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and
Output Test Load
Measurement Level
Pin Capacitance
f = 1 MHz, T = 25°C
SymbolTypMaxUnitsConditions
C
IN
C
OUT
Note:1. This parameter is characterized and is not 100% tested.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for
any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without
notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are
not authorized for use as critical components in life support devices or systems.
®
Marks bearing
Terms and product names in this document may be trademarks of others.
and/or ™ are registered trademarks and trademarks of Atmel Corporation.
Printed on recycled paper.
0273G–11/99/xM
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