Commercial, Industrial and Automotive Temperature Ranges
µµµµ
s/byte (typical)
Description
The AT27C256R is a low- pow er , high- pe rf orman ce 262,144-bit one-time pro gramm able read only memory (OTP EPROM) organized 32K by 8 bits. It requires only one 5V
power supply in norm al read mo de operat ion. Any byt e can be acc essed in less than
45 ns, eliminating the n eed for speed reducing WAIT s tates on high-pe rformance
microprocessor systems.
Atmel’s scaled CMOS technolo gy provide s low-acti ve power c onsumptio n, and fast
programming. Power consumption is typically only 8 mA in Active Mode and less than
10 µA in Standby.
(continued)
Pin Configurations
Pin NameFunction
A0 to A14Addresses
O0 - O7Outputs
CE
OE
NCNo Connect
PLCC Top View
5
A6
6
A5
7
A4
8
A3
9
A2
10
A1
11
A0
12
NC
13
O0
Note:PLCC Package Pins 1 and
17 are DON’T CONNECT.
Chip Enable
Output En able
A7
A12
VPPNCVCC
A14
432
1
323130
14151617181920
O1
O2
O3O4O5
NC
GND
A13
29
28
27
26
25
24
23
22
21
A8
A9
A11
NC
OE
A10
CE
O7
O6
A11
A13
A14
VCC
VPP
A12
PDIP, SOIC Top View
VPP
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
GND
TSOP Top View
OE
22
23
A9
24
A8
25
26
27
28
1
2
3
A7
4
A6
5
A5
6
A4
7
A3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Type 1
28
VCC
27
A14
26
A13
25
A8
24
A9
23
A11
22
OE
21
A10
20
CE
19
O7
18
O6
17
O5
16
O4
15
O3
21
A10
20
CE
19
O7
18
O6
17
O5
16
O4
15
O3
14
GND
13
O2
12
O1
11
O0
10
A0
9
A1
8
A2
256K (32K x 8)
OTP EPROM
AT27C256R
256K EPROM
Rev. 0014H–07/98
1
The AT27C256 R is ava ilable in a c hoice of indu stry st andard JEDEC-approved one time programmable (OTP)
plastic DIP, PLCC, SOIC, and TSOP packages. All devices
feature two-line control (CE
ibility to prevent bus contention.
With 32K byte storage capability, the AT27C256R allows
firmware to be stored reliably and to be accessed by the
system without the delays of mass storage media.
Atmel’s 27C256R has addit ional features to ensure high
quality and efficient producti on use. The Rapi d™ Progra mming Algori thm reduc es the time require d to prog ram the
part and guarantees reliable programming. Programming
time is typically only 100 µs/byte. The Integrated Product
Identification Code electronica lly identifi es the devic e and
manufacturer. This feature is used by industry standard
programming equi pmen t to se lect the prop er progr ammi ng
algorithms and voltages.
, OE) to give designers the flex-
System Considerations
Switching between active and standby conditions via the
Chip Enable pin may produ ce tra ns ien t vo ltag e ex cu rs i ons .
Unless accommodated by the system design, these transients may exceed data sheet limits, resulting in device
non-conformance. At a minimum, a 0.1 µF high frequency,
low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor should be connected
between the V
close to the device as possible. Additionally, to stabilize the
supply voltage level on printed circuit boards with large
EPROM arrays, a 4.7 µF bulk electrolytic capacitor should
be utilized, again connected between the V
terminals. This capacitor should be positioned as close as
possible to the point where the power supply is connected
to the array.
and Ground terminals of the device, as
CC
and Ground
CC
2
AT27C256R
Block Diagram
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature.....................................-65°C to +150°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on A9 with
Respect to Ground ......................................-2.0V to +14.0V
VPP Supply Voltage with
Respect to Ground .......................................-2.0V to +14.0V
AT27C256R
*NOTICE:Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other
(1)
(1)
Note:1 . Minimum voltage is -0.6V dc which ma y unde rshoot
(1)
conditions beyond those indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
to -2.0V for pulses of les s than 20 ns .Maximum output pin voltage is V
+ 0.75V dc which may over-
CC
shoot to +7.0 volts for pulses of less than 20 ns.
A 100 µs CE pulse width is used to program. The address
is set to the first location. V
raised to 13.0V. Each address is first programmed with one
100 µs CE
tion/reprogramming loop is execu ted for ea ch address . In
the event a byte fails to pass verification, up to 10 successive 100 µs pulses are applied with a verification after each
pulse with out verificati on. Then a ve rifica-
is raised to 6.5V and VPP is
CC
pulse. If the byte fails to verify after 10 pulses have been
applied, the part is c on sider e d f ail ed . A fter the b yte ver if ies
properly, the next address is selected until all have been
checked. V
bytes are read again and compared with the original data to
determine if the device passes or fails.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s website. The Company assumes no responsibility for
any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without
notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are
not authorized for use as critical components in life support devices or systems.
®
Marks bearing
Terms and product names in this document may be trademarks of others.
and/or ™ are registered trademarks and trademarks of Atmel Corporation.
Printed on recycled paper.
0014H–07/98/xM
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