The AT27C040 chip is a lo w-power, high-p erformance, 4,194,304-b it one-time pro grammable read only memory (OTP EPRO M) organized as 512K by 8 bits . The
AT27C040 requires onl y one 5V power suppl y in normal read mode op eration. Any
byte can be accessed in less than 70 ns, eliminating the need for speed reducing
WAIT states on high-performance microprocessor systems.
Atmel’s scaled CMOS tec hnology provides low acti ve
power cons umption, and fast pr ogrammi ng. Power consumption is typically 8 mA in active mode and less than
10 µA in standby mode.
The AT27C040 is available in a choice of industry standard
JEDEC-approved one-tim e programmable (OTP) plastic
PDIP, PLCC, SOIC (SOP), and TSO P packages. The
device features two-line control (CE
contention in high-speed systems.
Atmel’s AT27C040 has addition al features to ensure hig h
quality and efficient production use. The Rapid
ming Algori thm reduc es the time require d to prog ram the
part and guarantees reliable programming. Programming
time is typically only 100 µs/byte. The Integrated Product
Identification Code electronica lly identifi es the devic e and
manufacturer. This feature is used by industry standard
programming equi pmen t to se lect the prop er progr ammi ng
algorithms and voltages.
, OE) to eliminate bus
™
Program-
Block Diagram
Switching Considerations
Switching between active and standby conditions via the
Chip Enable pin may produ ce tra ns ien t vo ltag e ex cu rs i ons .
Unless accommodated by the system design, these transients may exceed data sheet limits, resulting in device
non-conforman ce. At a mini mum, a 0.1 µF high frequency,
low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor should be connected
between the V
close to the device as possible. Additionally, to stabilize the
supply voltage level on printed circuit boards with large
EPROM arrays, a 4.7 µF bulk electrolytic capacitor should
be utilized, again connected between the V
terminals. This capacitor should be positioned as close as
possible to the point where the power supply is connected
to the array.
and Ground terminals of the device, as
CC
and Ground
CC
2
AT27C040
Page 3
Operating Modes
AT27C040
Mode/PinCEOEAiV
ReadV
IL
Output DisableXV
StandbyV
Rapid Program
(2)
IH
V
IL
PGM VerifyXV
PGM InhibitV
Product Identification
(4)
IH
V
IL
V
IL
IH
AiX
XXHigh Z
XXXHigh Z
V
IH
IL
V
IH
V
IL
AiV
AiV
XVPPHigh Z
A9 = V
(3)
H
A0 = VIH or VIL
A1 - A18 = V
IL
Notes: 1. X can be VIL or VIH.
2. Refer to Programming Characteristics
3. VH = 12.0 ± 0.5V.
4. Two identifier bytes ma y be se lected. All Ai inputs are held lo w (V
) to select the Manufacturer’s Identificaton byte and high (VIH) to select the Device Code byte.
(V
IL
), except A9 which is set to VH and A0 which is toggled low
IL
Absolute Maximum Ratings*
Temperature Under Bias................................-55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
Voltage on Any Pin with
Respect to Ground ............................................-2.0V to +7.0V
Voltage on A9 with
Respect to Ground .........................................-2.0V to +14.0V
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the de vic e. T his is a stres s r ating o nly an d
functional opera tion of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device re li abi li ty.
PP
(1)
PP
PP
Outputs
D
OUT
D
IN
D
OUT
XIdentification Code
V
Supply Voltage with
PP
Respect to Ground ..........................................-2.0V to +14.0V
A 100 µs CE pulse width is used to program. The address
is set to the first location. V
raised to 13.0V. Each address is first programmed with one
100 µs CE
tion/reprogramming loo p is exec uted for each addres s. In
the event a byte fails to pass verification, up to 10 successive 100 µs pulses are app lie d with a ver if icat ion afte r eac h
pulse without verification. Then a verifica-
is raised to 6.5V and VPP is
CC
pulse. If the by te fails to v erify afte r 10 pulses ha ve been
applied, the part is consi dered fai led. Afte r the byte ve rifies
properly, the next address is selected until all have been
checked. V
bytes are read again and compared with the original data to
determine if the device passes or fails.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s website. The Company assumes no responsibility for
any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without
notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are
not authorized for use as critical components in life support devices or systems.
®
Marks bearing
Terms and product names in this document may be trademarks of others.
and/or ™ are registered trademarks and trademarks of Atmel Corporation.
Printed on recycled paper.
0189E–07/97/xM
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