Rapid™ Programming Algorithm - 100 µs/b y te (typic al)
•
CMOS and TTL Compatible Inputs and Outputs
– JEDEC Standard for LVTTL and LVBO
•
Integrated Product Identification Code
•
Commercial and Industrial Temperature Ranges
512K (64K x 8)
Unregulated
Battery-Voltage
™
High Speed OTP
EPROM
Description
The AT27BV512 is a high performance, low power, low voltage 524,288-bit one-time
programmable re ad only memory (OTP EP ROM) organized as 64 K by 8 bits. It
requires only one suppl y in t he ran ge of 2. 7V to 3. 6V in norma l rea d mode o perat ion,
making it ideal for fast, portable systems using either regulated or unregulated battery
power.
Pin Configurations
Pin NameFunction
A0 - A15Addresses
O0 - O7Outputs
CE
/VPP
OE
NCNo Connect
5
A6
6
A5
7
A4
8
A3
9
A2
10
A1
11
A0
12
NC
13
O0
Note: PLCC package pins 1 and 17 are
DON’T CONNECT.
Atmel’s innovative desi gn techniques provide fast sp eeds
that rival 5V parts while keepi ng the lo w power con sumption of a 3V supply. At V
= 2.7V, any byte can be
CC
accessed in less than 70 ns. With a typi cal power consumption of only 18 mW at 5 MHz and V
= 3V, the
CC
AT27BV512 consumes less than one fifth the power of a
standard 5V EPROM.
Standby mode supply current is typically less than 1 µA at
3V. The AT27BV512 simplifies system design an d
stretches battery lif etime even further by el iminating the
need for power supply regulation.
The AT27BV512 is available in industry standard JEDECapproved one-time programmable (OTP) plastic PLCC,
SOIC, and TSOP pac kages. All devices featu re two-line
control (CE
, OE) to give designers the flexibility to prevent
bus contention.
The AT27BV512 op eratin g with V
at 3.0V produces TTL
CC
level outputs that are compatible with standard TTL logic
devices operati ng at V
= 5.0V. At VCC = 2.7V, the part is
CC
compatible with JEDEC approved low voltage battery operation (LVBO) interface specifications. T he device is als o
capable of standard 5-volt operation making it ideally suited
for dual sup ply rang e system s or car d produc ts that are
pluggable in both 3-volt and 5-volt hosts.
Atmel’s AT27BV 512 h as a dditio nal f eatures to en sur e hig h
quality and efficient producti on use. The Rapi d™ Progra m-
ming Algorithm reduces the time required to program the
part and guarantees reliable programming. Programming
time is typically only 100 µs/byte. The Integrated Product
Identification Code electronically identifi es the device and
manufacturer. This feature is used by industry standard
programming eq uipme nt to sele ct the prop er program ming
algorithms and voltages. The AT27BV512 programs
exactly the same way as a standard 5V AT27C512R and
uses the same programming equipment.
System Considerations
Switching between active and standby conditions via the
Chip Enable pin may produ ce tra ns ien t vo ltag e ex cu rs i ons .
Unless accommodated by the system design, these transients may exceed data sheet limits, resulting in device
non-conforman ce. At a mini mum, a 0.1 µF high frequency,
low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor should be connected
between the V
close to the device as possible. Additionally, to stabilize the
supply voltage level on printed circuit boards with large
EPROM arrays, a 4.7 µF bulk electrolytic capacitor should
be utilized, again connected between the V
terminals. This capacitor should be positioned as close as
possible to the point where the power supply is connected
to the array.
and Ground terminals of the device, as
CC
and Ground
CC
Block Diagram
2
AT27BV512
Page 3
Absolute Maximum Ratings*
Temperature Under Bias.................................. -40°C to +85°C
Storage Temperature..................................... -65°C to +125°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on A9 with
Respect to Ground ......................................-2.0V to +14.0V
AT27BV512
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the de vic e. T his is a stres s r ating o nly an d
functional opera tion of the device at these or an y
(1)
(1)
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reli abi li ty
VPP Supply Voltage with
Respect to Ground .......................................-2.0V to +14.0V
(1)
Note:1.Minimum voltage is -0.6V dc which may undershoot to -2.0V for pulses of less than 20 ns. Maximum output pin voltage is
+ 0.75V dc which may be exceeded if certain precautions are observed (consult application notes) and which may
V
CC
overshoot to +7.0V for pulses of less than 20 ns.
Operating Modes
Mode \ PinCEOE/V
(2)
Read
Output Disable
Standby
Rapid Program
PGM Verify
PGM Inhibit
(2)
(2)
(3)
(3)
(3)
Product Identification
Notes:1 . X can be V
(3)(5)
IL
or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
V
IH
V
IL
2. Read, output disable, and standby modes require, 2.7 V ≤ V
3. Refer to Programming C haracteristics. Programming modes require VCC = 6.5V.
4. VH = 12.0 ± 0.5V.
5. Two identifier bytes may be selected. All Ai inputs are held low (V
) to select the Manufacturer’s Identification byte and high (VIH) to select the Device Code byte.
(V
IL
PP
V
IL
V
IH
XXV
V
PP
V
IL
V
PP
V
IL
≤ 3.6V, or 4.5V ≤ VCC ≤ 5.5V.
CC
AiV
AiV
(1)
X
AiV
AiV
XV
A9 = V
(4)
H
A0 = VIH or VIL
A1 - A15 = V
), except A9 which is set to VH and A0 which is toggle d low
Note:1. The AT27BV512 has the same Product Identification Code as the AT27C512R. Both are programming compatible.
8
AT27BV512
Page 9
Rapid Programming Algorithm
A 100 µs CE pulse width is used to program. The address
is set to the first lo ca tio n. V
is raised to 13.0V. Each address is first pr ogrammed with
one 100 µs CE
tion / reprogrammi ng lo op is ex ecuted fo r ea ch a ddress . In
the event a byte fails to pass verification, up to 10 successive 100 µs pulses are applied with a verification after each
pulse without verification. Then a verifica-
is raised to 6.5V and OE/V
CC
PP
AT27BV512
pulse. If the byte fails to verify after 10 pulses have been
applied, the part is c on sider e d f ail ed . A fter the b yte ver if ies
properly, the next address is selected until all have been
checked. OE
bytes are read again and compared with the original data to
determine if the device passes or fails.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s website. The Company assumes no responsibility for
any errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without
notice, and does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are
not authorized for use as critical components in life support devices or systems.
®
Marks bearing
Ter ms and product names in this document may be trademarks of others.
and/or ™ are registered trademarks and trademarks of Atmel Corporation.
Printed on recycled paper.
0602B–10/98/xM
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