64 bytes factory preprogrammed, 64 bytes user programmable
Flexible programming
Byte/Page Program (1 to 256 bytes)
Fast program and erase times
1.0ms typical Page Program (256 bytes) time
50ms typical 4KB Block Erase time
250ms typical 32KB Block Erase time
550ms typical 64KB Block Erase time
Program and Erase Suspend/Resume
Automatic checking and reporting of erase/program failures
Software controlled reset
JEDEC Standard Manufacturer and Device ID Read Methodology
Low power dissipation
10mA Active Read current (typical at 20MHz)
8μA Deep Power-Down current (typical)
Endurance: 100,000 program/erase cycles
Data retention: 20 years
Complies with full industrial temperature range
Industry standard green (Pb/halide-free/RoHS-compliant) package options
8-lead SOIC (0.150" wide)
8-pad Ultra-thin DFN (5 x 6 x 0.6mm)
8-ball dBGA (WLCSP)
™
operation
) of 5ns maximum
V
8795E–DFLASH–12/2012
1.Description
The AT25DL161 is a serial interface Flash memory device designed for use in a wide variety of high-volume, consumerbased applications in which program code is shadowed from Flash memory into embedded or external RAM for
execution. The flexible erase architecture of the AT25DL161, with its erase granularity as small as 4KB, makes it ideal for
data storage as well, eliminating the need for additional data storage EEPROM devices.
The physical sectoring and the erase block sizes of the AT25DL161 have been optimized to meet the needs of today's
code and data storage applications. By optimizing the size of the physical sectors and erase blocks, the memory space
can be used much more efficiently. Because certain code modules and data storage segments must reside by
themselves in their own protected sectors, the wasted and unused memory space that occurs with large sectored and
large Block Erase Flash memory devices can be greatly reduced. This increased memory space efficiency allows
additional code routines and data storage segments to be added, while still maintaining the same overall device density.
The AT25DL161 also offers a sophisticated method for protecting individual sectors against erroneous or malicious
program and erase operations. By providing the ability to individually protect and unprotect sectors, a system can
unprotect a specific sector to modify its contents while keeping the remaining sectors of the memory array securely
protected. This is useful in applications where program code is patched, updated on a subroutine or module basis, or in
applications where data storage segments need to be modified without running the risk of errant modifications to the
program code segments. In addition to individual sector protection capabilities, the AT25DL161 incorporates Global
Protect and Global Unprotect features that allow the entire memory array to be either protected or unprotected all at
once. This reduces overhead during the manufacturing process because sectors do not have to be unprotected one by
one prior to initial programming.
To take code and data protection to the next level, the AT25DL161 incorporates a sector lockdown mechanism that
allows any combination of individual 64KB sectors to be locked down and become permanently read-only. This
addresses the need of certain secure applications that require portions of the Flash memory array to be permanently
protected against malicious attempts at altering program code, data modules, security information or
encryption/decryption algorithms, keys, and routines. The device also contains a specialized, OTP (One-Time
Programmable) security register, which can be used for unique device serialization, system-level Electronic Serial
Number (ESN) storage, locked key storage, or other purposes.
Specifically designed for use in 1.8V systems, the AT25DL161 supports read, program, and erase operations with a
supply voltage range of 1.65V to 1.95V. No separate voltage is required for programming and erasing.
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2.Pin Descriptions and Pinouts
Table 2-1.Pin Descriptions
SymbolName and Function
Chip Select: Asserting the CS pin selects the device. When the CS pin is
deasserted, the device will be deselected and normally be placed in standby
mode (not deep Power-Down mode) and the SO pin will be in a high-impedance
CS
SCK
SI (SIO)
state. When the device is deselected, data will not be accepted on the SI pin.
A high-to-low transition on the
low-to-high transition is required to end an operation. When ending an internally
self-timed operation, such as a program or erase cycle, the device will not enter
the standby mode until the completion of the operation.
Serial Clock: This pin is used to provide a clock to the device and is used to
control the flow of data to and from the device. Command, address, and input
data present on the SI pin is always latched in on the rising edge of SCK, while
output data on the SO pin is always clocked out on the falling edge of SCK.
Serial Input (Serial Input/Output): The SI pin is used to shift data into the
device. The SI pin is used for all data input including command and address
sequences. Data on the SI pin is always latched in on the rising edge of SCK.
With the Dual-Output Read Array command, the SI pin becomes an output pin
(SIO) to allow two bits (on the SO and SIO pins) of data to be clocked out on
every falling edge of SCK. To maintain consistency with SPI nomenclature, the
SIO pin will be referenced as SI throughout this document except for those
sections dealing with the Dual-Output Read Array command, in which it will be
referenced as SIO.
Data present on the SI pin will be ignored whenever the device is deselected
(
CS is deasserted).
CS pin is required to start an operation and a
Asserted
State
LowInput
—Input
—Input/Output
Type
SO (SOI)
WP
Serial Output (Serial Output/Input): The SO pin is used to shift data out from
the device. Data on the SO pin is always clocked out on the falling edge of
SCK.
With the Dual-Input Byte/Page Program command, the SO pin becomes an
input pin (SOI) to allow two bits (on the SOI and SI pins) of data to be clocked in
on every rising edge of SCK. To maintain consistency with nomenclature, the
SOI pin will be referenced as SO throughout this document except for those
sections dealing with the Dual-Input Byte/Page Program command in which it
will be referenced as SOI.
The SO pin will be in a high-impedance state whenever the device is deselected
(
CS is deasserted).
Write Protect: The WP pin controls the hardware locking feature of the device.
See “Protection Commands and Features” on page 21 for more details on
protection features and the
WP pin is internally pulled-high and may be left floating if hardware
The
controlled protection will not be used. However, it is recommended that the
pin also be externally connected to V
WP pin.
whenever possible.
CC
WP
—Input/Output
LowInput
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Table 2-1.Pin Descriptions (Continued)
SymbolName and Function
Hold: The HOLD pin is used to temporarily pause serial communication without
deselecting or resetting the device. While the
on the SCK pin and data on the SI pin will be ignored and the SO pin will be in a
high-impedance state.
The
CS pin must be asserted and the SCK pin must be in the low state in order
HOLD
for a Hold condition to start. A Hold condition pauses serial communication only
and does not have an affect on internally self-timed operations, such as a
program or erase cycle. See “Hold” on page 46 for additional details on the Hold
operation.
The
HOLD pin is internally pulled-high and may be left floating if the Hold
function will not be used. However, it is recommended that the
be externally connected to the V
Device Power Supply: The VCC pin is used to supply the source voltage to the
V
CC
device.
Operations at invalid V
voltages may produce spurious results and should not
CC
be attempted.
HOLD pin is asserted, transitions
whenever possible.
CC
HOLD pin also
Asserted
State
LowInput
—Power
Type
GND
Ground: The ground reference for the power supply. GND should be
connected to the system ground.
Note: SIO and SOI pin naming convention is used for Dual-I/O commands.
Interface
Control
and
Logic
Protection Logic
Y-Decoder
X-Decoder
Address Latch
I/O Buffers
and Latches
SRAM
Data Buffer
Y-Gating
Flash
Memory
Array
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4.Memory Array
To provide the greatest flexibility, the AT25DL161 memory array can be erased in four levels of granularity, including a
full Chip Erase. In addition, the array has been divided into physical sectors of uniform size, which can be individually
protected from program and erase operations. The size of the physical sectors is optimized for both code and data
storage applications, allowing both code and data segments to reside in their own isolated regions. The memory
architecture diagram illustrates the breakdown of each erase level, as well as the breakdown of each physical sector.
The AT25DL161 is controlled by a set of instructions that are sent from a host controller, commonly referred to as the SPI
master. The SPI master communicates with the AT25DL161 via the SPI bus, which is comprised of four signal lines:
Chip Select (
The SPI protocol defines a total of four modes of operation (Mode 0, 1, 2, or 3), with each mode differing in respect to the
SCK polarity and phase and how the polarity and phase control the flow of data on the SPI bus. The AT25DL161
supports the two most common modes, SPI Modes 0 and 3. The only difference between SPI Modes 0 and 3 is the
polarity of the SCK signal when in the inactive state (when the SPI master is in standby mode and not transferring any
data). With SPI Modes 0 and 3, data is always latched in on the rising edge of SCK and always output on the falling edge
of SCK.
Figure 5-1. SPI Mode 0 and 3
CS
SCK
CS), Serial Clock (SCK), Serial Input (SI), and Serial Output (SO).
SI
SO
MSBLSB
5.1Dual-I/O Operation
The AT25DL161 features a Dual-Input Program mode and a Dual-Output Read mode that allow two bits of data to be
clocked into or out of the device every clock cycle to improve throughput. To accomplish this, both the SI and SO pins
are utilized as inputs/outputs for the transfer of data bytes. With the Dual-Input Byte/page Program command, the SO
pin becomes an input along with the SI pin. Alternatively, with the Dual-Output Read Array command, the SI pin
becomes an output along with the SO pin. For both Dual-I/O commands, the SO pin will be referred to as the
SOI (Serial Output/Input) pin and the SI pin will be referred to as the SIO (Serial Input/Output) pin.
6.Commands and Addressing
A valid instruction or operation must always be started by first asserting the CS pin. After the CS pin has been asserted,
the host controller must then clock out a valid 8-bit opcode on the SPI bus. Following the opcode, instruction-dependent
information, such as address and data bytes, would then be clocked out by the host controller. All opcode, address, and
data bytes are transferred with the Most-Significant Bit (MSB) first. An operation is ended by deasserting the
Opcodes not supported by the AT25DL161 will be ignored by the device and no operation will be started. The device will
continue to ignore any data presented on the SI pin until the start of the next operation (
then reasserted). In addition, if the
device, then no operation will be performed, and the device will simply return to the idle state and wait for the next
operation.
Addressing of the device requires a total of three bytes of information to be sent, representing address bits A23-A0.
Since the upper address limit of the AT25DL161 memory array is 1FFFFFh, address bits A23-A21 are always ignored by
the device.
CS pin is deasserted before complete opcode and address information is sent to the
MSBLSB
CS pin.
CS pin being deasserted and
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Table 6-1.Command Listing
Command
Clock
Frequency
Address
Bytes
Dummy
Bytes
Data
Bytes
Read Commands
1Bh0001 1011Up to 100MHz321+
Read Array
0Bh0000 1011Up to 85MHz311+
03h0000 0011Up to 40MHz301+
Dual-Output Read Array3Bh0011 1011Up to 66MHz311+
Program and Erase Commands
Block Erase (4KB)20h0010 0000Up to 100MHz300
Block Erase (32KB)52h0101 0010Up to 100MHz300
Block Erase (64KB)D8h1101 1000Up to 100MHz300
60h0110 0000Up to 100MHz000
Chip Erase
C7h1100 0111Up to 100MHz000
Byte/Page Program (1 to 256 bytes)02h0000 0010Up to 100MHz301+
Dual-Input Byte/Page Program (1 to 256 bytes)A2h1010 0010Up to 100MHz301+
Program/Erase SuspendB0h1011 0000Up to 100MHz000
Program/Erase ResumeD0h1101 0000Up to 100MHz000
Protection Commands
Write Enable06h0000 0110Up to 100MHz000
Write Disable04h0000 0100Up to 100MHz000
Protect Sector36h0011 0110Up to 100MHz300
Unprotect Sector39h0011 1001Up to 100MHz300
Global Protect/UnprotectUse Write Status Register Byte 1 Command
Read Sector Protection Registers3Ch0011 1100Up to 100MHz301+
Security Commands
Sector Lockdown33h0011 0011Up to 100MHz301
Freeze Sector Lockdown State34h0011 0100Up to 100MHz301
Read Sector Lockdown Registers35h0011 0101Up to 100MHz301+
Program OTP Security Register9Bh1001 1011Up to 100MHz301+
Read OTP Security Register77h0111 0111Up to 100MHz321+
Status Register Commands
Read Status Register05h0000 0101Up to 100MHz001+
Write Status Register Byte 101h0000 0001Up to 100MHz001
Write Status Register Byte 231h0011 0001Up to 100MHz001
Miscellaneous Commands
ResetF0h1111 0000Up to 100MHz001
Read Manufacturer and Device ID9Fh1001 1111Up to 85MHz001 to 5
Deep Power-DownB9h1011 1001Up to 100MHz000
Resume from Deep Power-DownABh1010 1011Up to 100MHz000
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7.Read Commands
7.1Read Array
The Read Array command can be used to sequentially read a continuous stream of data from the device by simply
providing the clock signal once the initial starting address has been specified. The device incorporates an internal
address counter that automatically increments on every clock cycle.
Three opcodes (1Bh, 0Bh, and 03h) can be used for the Read Array command. The use of each opcode depends on the
maximum clock frequency that will be used to read data from the device. The 0Bh opcode can be used at any clock
frequency up to the maximum specified by f
to the maximum specified by f
any clock frequency up to the maximum specified by f
should be reserved for systems employing the RapidS protocol.
f
CLK
To perform the Read Array operation, the
03h) must be clocked into the device. After the opcode has been clocked in, the three address bytes must be clocked in
to specify the location of the first byte to read within the memory array. Following the three address bytes, additional
dummy bytes may need to be clocked into the device, depending on which opcode is used for the Read Array operation.
If the 1Bh opcode is used, then two dummy bytes must be clocked into the device after the three address bytes. If the
0Bh opcode is used, then a single dummy byte must be clocked in after the address bytes.
After the three address bytes (and any dummy bytes) have been clocked in, additional clock cycles will result in data
being output on the SO pin. The data is always output with the MSB of a byte first. When the last byte (1FFFFFh) of the
memory array has been read, the device will continue reading from the beginning of the array (000000h). No delays will
be incurred when wrapping around from the end of the array to the beginning of the array.
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-impedance state. The CS pin can
be deasserted at any time and does not require that a full byte of data be read.
, and the 03h opcode can be used for lower frequency read operations, up
CLK
. The 1Bh opcode allows the highest read performance possible and can be used at
RDLF
; however, use of the 1Bh opcode at clock frequencies above
MAX
CS pin must first be asserted and then the appropriate opcode (1Bh, 0Bh, or
The Dual-Output Read Array command is similar to the standard Read Array command and can be used to sequentially
read a continuous stream of data from the device by simply providing the clock signal once the initial starting address has
been specified. Unlike the standard Read Array command, however, the Dual-Output Read Array command allows two
bits of data to be clocked out of the device on every clock cycle, rather than just one.
The Dual-Output Read Array command can be used at any clock frequency, up to the maximum specified by f
perform the Dual-Output Read Array operation, the
clocked into the device. After the opcode has been clocked in, the three address bytes must be clocked in to specify the
location of the first byte to read within the memory array. Following the three address bytes, a single dummy byte must
also be clocked into the device.
After the three address bytes and the dummy byte have been clocked in, additional clock cycles will result in data being
output on both the SO and SIO pins. The data is always output with the MSB of a byte first and the MSB is always output
on the SO pin. During the first clock cycle, bit 7 of the first data byte is output on the SO pin, while bit 6 of the same data
byte is output on the SIO pin. During the next clock cycle, bits 5 and 4 of the first data byte are output on the SO and SIO
pins, respectively. The sequence continues with each byte of data being output after every four clock cycles. When the
last byte (1FFFFFh) of the memory array has been read, the device will continue reading from the beginning of the array
(000000h). No delays will be incurred when wrapping around from the end of the array to the beginning of the array.
Deasserting the
CS pin can be deasserted at any time and does not require that a full byte of data be read.
Figure 7-4. Dual-Output Read Array
CS
CS pin will terminate the read operation and put the SO and SIO pins into a high-impedance state. The
RDDO
CS pin must first be asserted and then the opcode 3Bh must be
The Byte/Page program command allows anywhere from a single byte of data to 256 bytes of data to be programmed
into previously erased memory locations. An erased memory location is one that has all eight bits set to the Logical 1
state (a byte value of FFh). Before a byte/page program command can be started, the Write Enable command must have
been previously issued to the device (see “Write Enable” on page 21) to set the Write Enable Latch (WEL) bit of the
Status Register to a Logical 1 state.
To perform a Byte/Page Program command, a 02h opcode must be clocked into the device followed by the three address
bytes denoting the first location of the memory array to begin programming at. After the address bytes have been clocked
in, data can then be clocked into the device and be stored in an internal buffer.
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page boundary (A7-A0 are not
all 0), then special circumstances regarding which memory locations are to be programmed will apply. In this situation,
any data that are sent to the device that go beyond the end of the page will wrap around to the beginning of the same
page. In addition, if more than 256 bytes of data are sent to the device, then only the last 256 bytes sent will be latched
into the internal buffer.
Example:If the starting address denoted by A23-A0 is 0000FEh and three bytes of data are sent to the device, then
the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh, while the last byte of
data will be programmed at address 000000h. The remaining bytes in the page (addresses 000001h
through 0000FDh) will not be programmed and will remain in the erased state (FFh).
When the
CS pin is deasserted, the device will program the data stored in the internal buffer into the appropriate memory
array locations based on the starting address specified by A23-A0 and the number of data bytes sent to the device. If
fewer than 256 bytes of data are sent to the device, then the remaining bytes within the page will not be programmed and
will remain in the erased state (FFh). The programming of the data bytes is internally self-timed and should take place in
a time of t
The three address bytes and at least one complete byte of data must be clocked into the device before the
deasserted, and the
or tBP if only programming a single byte.
PP
CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise, the device
CS pin is
will abort the operation and no data will be programmed into the memory array. In addition, if the address specified by
A23-A0 points to a memory location within a sector that is in the protected state (see “Protect Sector” on page 23) or
locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will not be executed and the
device will return to the idle state once the
CS pin has been deasserted. The WEL bit in the Status Register will be reset
back to the Logical 0 state if the program cycle aborts due to an incomplete address being sent, an incomplete byte of
data being sent, the
CS pin being deasserted on uneven byte boundaries, or because the memory location to be
programmed is protected or locked down.
While the device is programming, the Status Register can be read and will indicate that the device is busy. For faster
throughput, it is recommended that the Status Register be polled rather than waiting the t
or tPP time to determine if the
BP
data bytes have finished programming. At some point before the program cycle completes, the WEL bit in the Status
Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent programming algorithm that can detect when a byte location fails to program
properly. If a programming error arises, it will be indicated by the EPE bit in the Status Register.
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Figure 8-1. Byte Program
CS
2310
SCK
Opcode
SI
SO
00000010
MSBMSB
High-impedance
Figure 8-2. Page Program
CS
2310
SCK
Opcode
SI
00000010
MSBMSB
6754101198123937 383336353431 3229 30
Address Bits A23-A0Data In
AAAAAAAAA
6754983937 383336353431 3229 30
Address Bits A23-A0Data In Byte 1
AAAAAA
DDDDDDDD
MSB
DDDDDDDD
MSB
Data In Byte n
DDDDDDDD
MSB
SO
High-impedance
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8.2Dual-Input Byte/Page Program
The Dual-Input Byte/Page Program command is similar to the standard Byte/Page Program command and can be used
to program anywhere from a single byte of data up to 256 bytes of data into previously erased memory locations. Unlike
the standard byte/page program command, however, the Dual-Input Byte/Page Program command allows two bits of
data to be clocked into the device on every clock cycle rather than just one.
Before the Dual-Input Byte/Page Program command can be started, the Write Enable command must have been
previously issued to the device (see “Write Enable” on page 21) to set the Write Enable Latch (WEL) bit of the Status
Register to a Logical 1 state. To perform a Dual-Input Byte/Page Program command, an A2h opcode must be clocked
into the device followed by the three address bytes denoting the first location of the memory array to begin programming
at. After the address bytes have been clocked in, data can then be clocked into the device two bits at a time on both the
SOI and SI pins.
The data is always input with the MSB of a byte first, and the MSB is always input on the SOI pin. During the first clock
cycle, bit 7 of the first data byte is input on the SOI pin while bit 6 of the same data byte is input on the SI pin. During the
next clock cycle, bits 5 and 4 of the first data byte are input on the SOI and SI pins, respectively. The sequence continues
with each byte of data being input after every four clock cycles. Like the standard Byte/Page Program command, all data
clocked into the device are stored in an internal buffer.
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page boundary (A7-A0 are
not all 0), then special circumstances regarding which memory locations are to be programmed will apply. In this
situation, any data that are sent to the device that go beyond the end of the page will wrap around to the beginning of the
same page. In addition, if more than 256 bytes of data are sent to the device, then only the last 256 bytes sent will be
latched into the internal buffer.
Example:If the starting address denoted by A23-A0 is 0000FEh and three bytes of data are sent to the device, then
the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh, while the last byte of
data will be programmed at address 000000h. The remaining bytes in the page (addresses 000001h
through 0000FDh) will not be programmed and will remain in the erased state (FFh).
When the
CS pin is deasserted, the device will program the data stored in the internal buffer into the appropriate memory
array locations based on the starting address specified by A23-A0 and the number of data bytes sent to the device. If
fewer than 256 bytes of data are sent to the device, then the remaining bytes within the page will not be programmed and
will remain in the erased state (FFh). The programming of the data bytes is internally self-timed and should take place in
a time of t
The three address bytes and at least one complete byte of data must be clocked into the device before the
deasserted, and the
or tBP if only programming a single byte.
PP
CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise, the device
CS pin is
will abort the operation and no data will be programmed into the memory array. In addition, if the address specified by
A23-A0 points to a memory location within a sector that is in the protected state (see “Protect Sector” on page 23) or
locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will not be executed, and the
device will return to the idle state once the
CS pin has been deasserted. The WEL bit in the Status Register will be reset
back to the Logical 0 state if the program cycle aborts due to an incomplete address being sent, an incomplete byte of
data being sent, the
CS pin being deasserted on uneven byte boundaries, or because the memory location to be
programmed is protected or locked down.
While the device is programming, the Status Register can be read and will indicate that the device is busy. For faster
throughput, it is recommended that the Status Register be polled rather than waiting the t
or tPP time to determine if the
BP
data bytes have finished programming. At some point before the program cycle completes, the WEL bit in the Status
Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent programming algorithm that can detect when a byte location fails to program
properly. If a programming error arises, it will be indicated by the EPE bit in the Status Register.
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Figure 8-3. Dual-Input Byte Program
CS
2310
SCK
Opcode
SI (SIO)
SO (SOI)
10100010
MSBMSB
High-impedance
Figure 8-4. Dual-Input Page Program
CS
2310
SCK
Opcode
SI (SIO)
10100010
MSBMSB
67541011981233353431 3229 30
Address Bits A23-A0
AAAAAAAAA
6754101198123937 383336353431 3229 30
Address Bits A23-A0
AAAAAAAAA
Data Byte
D
D
6
D
D
7
MSB
Data Byte 1
D
D
6
Input
4
5
Input
4
D
D
2
0
D
D
3
1
Input
Data Byte 2
D
D
D
D
D
2
0
6
D
4
2
0
Input
Data Byte n
D
D
6
4
D
D
2
0
SO (SOI)
High-impedance
D
D
D
D
7
5
MSBMSB
D
3
1
D
D
7
D
5
3
1
D
MSB
D
D
7
D
5
3
1
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8.3Block Erase
A block of 4, 32, or 64KB can be erased (all bits set to the Logical 1 state) in a single operation by using one of three
different opcodes for the Block Erase command. An opcode of 20h is used for a 4KB erase, an opcode of 52h is used for
a 32KB erase, and an opcode of D8h is used for a 64KB erase. Before a Block Erase command can be started, the Write
Enable command must have been previously issued to the device to set the WEL bit of the Status Register to a Logical 1
state.
To perform a Block Erase, the CS pin must first be asserted and then the appropriate opcode (20h, 52h, or D8h) must be
clocked into the device. After the opcode has been clocked in, three address bytes specifying the address within the
4, 32, or 64KB block to be erased must be clocked in. Any additional data clocked into the device will be ignored. When
CS pin is deasserted, the device will erase the appropriate block. The erasing of the block is internally self-timed and
the
should take place in a time of t
Since the Block Erase command erases a region of bytes, the lower order address bits do not need to be decoded by the
device. Therefore, for a 4KB erase, address bits A11-A0 will be ignored by the device and their values can be either a
Logical 1 or 0. For a 32KB erase, address bits A14-A0 will be ignored and for a 64KB erase, address bits A15-A0 will be
ignored. Despite the lower order address bits not being decoded by the device, the three complete address bytes must
still be clocked into the device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte
boundary (multiples of eight bits); otherwise, the device will abort the operation and no Erase operation will be performed.
If the address specified by A23-A0 points to a memory location within a sector that is in the protected or locked down
state, then the Block Erase command will not be executed and the device will return to the idle state once the
been deasserted.
The WEL bit in the Status Register will be reset back to the Logical 0 state if the erase cycle aborts due to an incomplete
address being sent, the
region to be erased is protected or locked down.
While the device is executing a successful erase cycle, the Status Register can be read and will indicate that the device
is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t
determine if the device has finished erasing. At some point before the erase cycle completes, the WEL bit in the Status
Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent erase algorithm that can detect when a byte location fails to erase properly. If
an erase error occurs, it will be indicated by the EPE bit in the Status Register.
.
BLKE
CS pin has
CS pin being deasserted on uneven byte boundaries, or because a memory location within the
time to
BLKE
Figure 8-5. Block Erase
CS
SCK
SI
SO
CCCCCCCC
MSBMSB
High-impedance
2310
Opcode
6754101198123129 3027 2826
Address Bits A23-A0
AAAAAAAAAA A A
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8.4Chip Erase
The entire memory array can be erased in a single operation by using the Chip Erase command. Before a Chip Erase
command can be started, the Write Enable command must have been previously issued to the device to set the WEL bit
of the Status Register to a Logical 1 state.
Two opcodes, 60h and C7h, can be used for the Chip Erase command. There is no difference in device functionality
when utilizing the two opcodes, so they can be used interchangeably. To perform a Chip Erase, one of the two opcodes
(60h or C7h) must be clocked into the device. Since the entire memory array is to be erased, no address bytes need to
be clocked into the device and any data clocked in after the opcode will be ignored. When the
device will erase the entire memory array. The erasing of the device is internally self-timed and should take place in a
time of t
The complete opcode must be clocked into the device before the
deasserted on an even byte boundary (multiples of eight bits); otherwise, no erase will be performed. In addition, if any
sector of the memory array is in the protected or locked down state, then the Chip Erase command will not be executed
and the device will return to the idle state once the
be reset back to the Logical 0 state if the
or locked down state.
While the device is executing a successful erase cycle, the Status Register can be read and will indicate that the device
is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t
determine if the device has finished erasing. At some point before the erase cycle completes, the WEL bit in the Status
Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent erase algorithm that can detect when a byte location fails to erase properly. If
an erase error occurs, it will be indicated by the EPE bit in the Status Register.
CHPE
CS pin is deasserted, the
.
CS pin is deasserted, and the CS pin must be
CS pin has been deasserted. The WEL bit in the Status Register will
CS pin is deasserted on uneven byte boundaries or if a sector is in the protected
time to
CHPE
Figure 8-6. Chip Erase
CS
SCK
SI
SO
CCCCCCCC
MSB
High-impedance
2310
Opcode
6754
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8.5Program/Erase Suspend
In some code-plus-data storage applications, it is often necessary to process certain high-level system interrupts that
require relatively immediate reading of code or data from the Flash memory. In such an instance, it may not be possible
for the system to wait the microseconds or milliseconds required for the Flash memory to complete a program or erase
cycle. The Program/Erase Suspend command allows a program or erase operation in progress on a particular 64KB
sector of the Flash memory array to be suspended so that other device operations can be performed.
By suspending an erase operation on a particular sector, the system can perform a program or read operation within
another 64KB sector of the device. Other device operations, such as a Read Status Register, can also be performed
while a program or erase operation is suspended. Table 8-1 outlines the operations that are allowed and not allowed
while a program or erase operation is suspended.
Since the need to suspend a program or erase operation is immediate, the Write Enable command does not need to be
issued prior to the Program/Erase Suspend command being issued. Therefore, the Program/Erase Suspend command
operates independently of the state of the WEL bit in the Status Register.
To perform a Program/Erase Suspend, the
the device. No address bytes need to be clocked into the device, and any data clocked in after the opcode will be
ignored. When the
time of t
SUSP
Logical 1 state to indicate that the program or erase operation has been suspended. In addition, the RDY/BSY bit in the
Status Register will indicate that the device is ready for another operation. The complete opcode must be clocked into
the device before the
eight bits); otherwise, no suspend operation will be performed.
Read operations are not allowed to a 64KB sector that has had its program or erase operation suspended. If a read is
attempted to a suspended sector, then the device will output undefined data. Therefore, if performing a Read Array
operation on an unsuspended sector, and if the device’s internal address counter increments and crosses the sector
boundary to a suspended sector, the device will then start outputting undefined data continuously until the address
counter increments and crosses a sector boundary to an unsuspended sector.
A program operation is not allowed on a sector that has been erase suspended. If a program operation is attempted on
an erase suspended sector, then the program operation will abort and the WEL bit in the Status Register will be reset
back to the Logical 0 state. Likewise, an erase operation is not allowed on a sector that has been program suspended. If
attempted, the erase operation will abort and the WEL bit in the Status Register will be reset to a Logical 0 state.
During an Erase Suspend, a program operation to a different 64KB sector can be started and subsequently suspended.
This results in a simultaneous Erase Suspend/Program Suspend condition, which will be indicated by the ES and PS bits
in the Status Register being set to the Logical 1 state.
If a Reset operation (see “Reset” on page 41) is performed while a sector is erase suspended, the suspend operation will
abort and the contents of the block in the suspended sector will be left in an undefined state. However, if a Reset is
performed while a sector is program suspended, the suspend operation will abort, but only the contents of the page that
was being programmed and subsequently suspended will be undefined. The remaining pages in the 64KB sector will
retain their previous contents.
If an attempt is made to perform an operation that is not allowed while a program or erase operation is suspended, such
as a Protect Sector command, then the device will simply ignore the opcode and no operation will be performed. The
state of the WEL bit in the Status Register, as well as the SPRL (Sector Protection Registers Locked) and SLE (Sector
Lockdown Enabled) bits, will not be affected.
CS pin is deasserted, the program or erase operation currently in progress will be suspended within a
. The Program Suspend (PS) bit or the Erase Suspend (ES) bit in the Status Register will then be set to the
CS pin is deasserted, and the CS pin must be deasserted on an even byte boundary (multiples of
CS pin must first be asserted and then the opcode B0h must be clocked into
AT25DL161 [DATASHEET]
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