Rainbow Electronics AT25DL161 User Manual

AT25DL161
16-Mbit, 1.65V Minimum SPI Serial Flash Memory
with Dual-I/O Support
DATASHEET

Features

Single 1.65V – 1.95V supply
Serial Peripheral Interface (SPI) compatible
Supports SPI Modes 0 and 3Supports RapidSSupports Dual-Input Program and Dual-Output Read
Very high operating frequencies
100MHz for RapidS85MHz for SPIClock-to-output time (t
Flexible, optimized erase architecture for code + data storage applications
Uniform 4KB, 32KB, and 64KB Block EraseFull Chip Erase
Individual sector protection with Global Protect/Unprotect feature
32 sectors of 64KB each
Hardware controlled locking of protected sectors via WP pin
Sector Lockdown with permanent freeze option
Make any combination of 64KB sectors permanently read-only
128-byte, One-Time Programmable (OTP) Security Register
64 bytes factory preprogrammed, 64 bytes user programmable
Flexible programming
Byte/Page Program (1 to 256 bytes)
Fast program and erase times
1.0ms typical Page Program (256 bytes) time50ms typical 4KB Block Erase time250ms typical 32KB Block Erase time550ms typical 64KB Block Erase time
Program and Erase Suspend/Resume
Automatic checking and reporting of erase/program failures
Software controlled reset
JEDEC Standard Manufacturer and Device ID Read Methodology
Low power dissipation
10mA Active Read current (typical at 20MHz)8μA Deep Power-Down current (typical)
Endurance: 100,000 program/erase cycles
Data retention: 20 years
Complies with full industrial temperature range
Industry standard green (Pb/halide-free/RoHS-compliant) package options
8-lead SOIC (0.150" wide)8-pad Ultra-thin DFN (5 x 6 x 0.6mm)8-ball dBGA (WLCSP)
operation
) of 5ns maximum
V
8795E–DFLASH–12/2012

1. Description

The AT25DL161 is a serial interface Flash memory device designed for use in a wide variety of high-volume, consumer­based applications in which program code is shadowed from Flash memory into embedded or external RAM for execution. The flexible erase architecture of the AT25DL161, with its erase granularity as small as 4KB, makes it ideal for data storage as well, eliminating the need for additional data storage EEPROM devices.
The physical sectoring and the erase block sizes of the AT25DL161 have been optimized to meet the needs of today's code and data storage applications. By optimizing the size of the physical sectors and erase blocks, the memory space can be used much more efficiently. Because certain code modules and data storage segments must reside by themselves in their own protected sectors, the wasted and unused memory space that occurs with large sectored and large Block Erase Flash memory devices can be greatly reduced. This increased memory space efficiency allows additional code routines and data storage segments to be added, while still maintaining the same overall device density.
The AT25DL161 also offers a sophisticated method for protecting individual sectors against erroneous or malicious program and erase operations. By providing the ability to individually protect and unprotect sectors, a system can unprotect a specific sector to modify its contents while keeping the remaining sectors of the memory array securely protected. This is useful in applications where program code is patched, updated on a subroutine or module basis, or in applications where data storage segments need to be modified without running the risk of errant modifications to the program code segments. In addition to individual sector protection capabilities, the AT25DL161 incorporates Global Protect and Global Unprotect features that allow the entire memory array to be either protected or unprotected all at once. This reduces overhead during the manufacturing process because sectors do not have to be unprotected one by one prior to initial programming.
To take code and data protection to the next level, the AT25DL161 incorporates a sector lockdown mechanism that allows any combination of individual 64KB sectors to be locked down and become permanently read-only. This addresses the need of certain secure applications that require portions of the Flash memory array to be permanently protected against malicious attempts at altering program code, data modules, security information or encryption/decryption algorithms, keys, and routines. The device also contains a specialized, OTP (One-Time Programmable) security register, which can be used for unique device serialization, system-level Electronic Serial Number (ESN) storage, locked key storage, or other purposes.
Specifically designed for use in 1.8V systems, the AT25DL161 supports read, program, and erase operations with a supply voltage range of 1.65V to 1.95V. No separate voltage is required for programming and erasing.
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
2

2. Pin Descriptions and Pinouts

Table 2-1. Pin Descriptions
Symbol Name and Function
Chip Select: Asserting the CS pin selects the device. When the CS pin is
deasserted, the device will be deselected and normally be placed in standby mode (not deep Power-Down mode) and the SO pin will be in a high-impedance
CS
SCK
SI (SIO)
state. When the device is deselected, data will not be accepted on the SI pin.
A high-to-low transition on the low-to-high transition is required to end an operation. When ending an internally self-timed operation, such as a program or erase cycle, the device will not enter the standby mode until the completion of the operation.
Serial Clock: This pin is used to provide a clock to the device and is used to control the flow of data to and from the device. Command, address, and input data present on the SI pin is always latched in on the rising edge of SCK, while output data on the SO pin is always clocked out on the falling edge of SCK.
Serial Input (Serial Input/Output): The SI pin is used to shift data into the device. The SI pin is used for all data input including command and address sequences. Data on the SI pin is always latched in on the rising edge of SCK.
With the Dual-Output Read Array command, the SI pin becomes an output pin (SIO) to allow two bits (on the SO and SIO pins) of data to be clocked out on every falling edge of SCK. To maintain consistency with SPI nomenclature, the SIO pin will be referenced as SI throughout this document except for those sections dealing with the Dual-Output Read Array command, in which it will be referenced as SIO.
Data present on the SI pin will be ignored whenever the device is deselected (
CS is deasserted).
CS pin is required to start an operation and a
Asserted
State
Low Input
Input
Input/Output
Type
SO (SOI)
WP
Serial Output (Serial Output/Input): The SO pin is used to shift data out from the device. Data on the SO pin is always clocked out on the falling edge of SCK.
With the Dual-Input Byte/Page Program command, the SO pin becomes an input pin (SOI) to allow two bits (on the SOI and SI pins) of data to be clocked in on every rising edge of SCK. To maintain consistency with nomenclature, the SOI pin will be referenced as SO throughout this document except for those sections dealing with the Dual-Input Byte/Page Program command in which it will be referenced as SOI.
The SO pin will be in a high-impedance state whenever the device is deselected (
CS is deasserted).
Write Protect: The WP pin controls the hardware locking feature of the device.
See “Protection Commands and Features” on page 21 for more details on
protection features and the
WP pin is internally pulled-high and may be left floating if hardware
The controlled protection will not be used. However, it is recommended that the pin also be externally connected to V
WP pin.
whenever possible.
CC
WP
Input/Output
Low Input
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
3
Table 2-1. Pin Descriptions (Continued)
Symbol Name and Function
Hold: The HOLD pin is used to temporarily pause serial communication without
deselecting or resetting the device. While the on the SCK pin and data on the SI pin will be ignored and the SO pin will be in a high-impedance state.
The
CS pin must be asserted and the SCK pin must be in the low state in order
HOLD
for a Hold condition to start. A Hold condition pauses serial communication only and does not have an affect on internally self-timed operations, such as a program or erase cycle. See “Hold” on page 46 for additional details on the Hold operation.
The
HOLD pin is internally pulled-high and may be left floating if the Hold function will not be used. However, it is recommended that the be externally connected to the V
Device Power Supply: The VCC pin is used to supply the source voltage to the
V
CC
device.
Operations at invalid V
voltages may produce spurious results and should not
CC
be attempted.
HOLD pin is asserted, transitions
whenever possible.
CC
HOLD pin also
Asserted
State
Low Input
Power
Type
GND
Ground: The ground reference for the power supply. GND should be connected to the system ground.
Power
Figure 2-1. 8-lead SOIC Figure 2-2. 8-pad UDFN Figure 2-3. 8-ball dBGA (WLSCP)
1 2
CS
SO (SOI)
WP
GND
1 2 3 4
Top View
1
V
8
CC
HOLD
7
SCK
6
SI (SIO)
5
CS
SO (SOI)
WP
GND
2
3
4
Top View
8
7
6
5
V
CC
HOLD
SCK
SI (SIO)
A
B
VCC
HOLD
SCK
SI (SIO)
CS
SO (SOI)
WP
GND
C
D
E
F
Top View
through back of Die
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
4

3. Block Diagram

Figure 3-1. Block Diagram
Control and
CS
SCK
SI (SIO)
SO (SOI)
WP
HOLD
Note: SIO and SOI pin naming convention is used for Dual-I/O commands.
Interface
Control
and
Logic
Protection Logic
Y-Decoder
X-Decoder
Address Latch
I/O Buffers
and Latches
SRAM
Data Buffer
Y-Gating
Flash
Memory
Array
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
5

4. Memory Array

To provide the greatest flexibility, the AT25DL161 memory array can be erased in four levels of granularity, including a full Chip Erase. In addition, the array has been divided into physical sectors of uniform size, which can be individually protected from program and erase operations. The size of the physical sectors is optimized for both code and data storage applications, allowing both code and data segments to reside in their own isolated regions. The memory architecture diagram illustrates the breakdown of each erase level, as well as the breakdown of each physical sector.
Figure 4-1. Memory Architecture Diagram
1-256 byte
Page Program
(02h Command)
256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes
256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes 256 bytes
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
6

5. Device Operation

The AT25DL161 is controlled by a set of instructions that are sent from a host controller, commonly referred to as the SPI master. The SPI master communicates with the AT25DL161 via the SPI bus, which is comprised of four signal lines: Chip Select (
The SPI protocol defines a total of four modes of operation (Mode 0, 1, 2, or 3), with each mode differing in respect to the SCK polarity and phase and how the polarity and phase control the flow of data on the SPI bus. The AT25DL161 supports the two most common modes, SPI Modes 0 and 3. The only difference between SPI Modes 0 and 3 is the polarity of the SCK signal when in the inactive state (when the SPI master is in standby mode and not transferring any data). With SPI Modes 0 and 3, data is always latched in on the rising edge of SCK and always output on the falling edge of SCK.
Figure 5-1. SPI Mode 0 and 3
CS
SCK
CS), Serial Clock (SCK), Serial Input (SI), and Serial Output (SO).
SI
SO
MSB LSB

5.1 Dual-I/O Operation

The AT25DL161 features a Dual-Input Program mode and a Dual-Output Read mode that allow two bits of data to be clocked into or out of the device every clock cycle to improve throughput. To accomplish this, both the SI and SO pins are utilized as inputs/outputs for the transfer of data bytes. With the Dual-Input Byte/page Program command, the SO pin becomes an input along with the SI pin. Alternatively, with the Dual-Output Read Array command, the SI pin becomes an output along with the SO pin. For both Dual-I/O commands, the SO pin will be referred to as the SOI (Serial Output/Input) pin and the SI pin will be referred to as the SIO (Serial Input/Output) pin.

6. Commands and Addressing

A valid instruction or operation must always be started by first asserting the CS pin. After the CS pin has been asserted, the host controller must then clock out a valid 8-bit opcode on the SPI bus. Following the opcode, instruction-dependent information, such as address and data bytes, would then be clocked out by the host controller. All opcode, address, and data bytes are transferred with the Most-Significant Bit (MSB) first. An operation is ended by deasserting the
Opcodes not supported by the AT25DL161 will be ignored by the device and no operation will be started. The device will continue to ignore any data presented on the SI pin until the start of the next operation ( then reasserted). In addition, if the device, then no operation will be performed, and the device will simply return to the idle state and wait for the next operation.
Addressing of the device requires a total of three bytes of information to be sent, representing address bits A23-A0. Since the upper address limit of the AT25DL161 memory array is 1FFFFFh, address bits A23-A21 are always ignored by the device.
CS pin is deasserted before complete opcode and address information is sent to the
MSB LSB
CS pin.
CS pin being deasserted and
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
7
Table 6-1. Command Listing
Command
Clock
Frequency
Address
Bytes
Dummy
Bytes
Data
Bytes
Read Commands
1Bh 0001 1011 Up to 100MHz 3 2 1+
Read Array
0Bh 0000 1011 Up to 85MHz 3 1 1+
03h 0000 0011 Up to 40MHz 3 0 1+
Dual-Output Read Array 3Bh 0011 1011 Up to 66MHz 3 1 1+
Program and Erase Commands
Block Erase (4KB) 20h 0010 0000 Up to 100MHz 3 0 0
Block Erase (32KB) 52h 0101 0010 Up to 100MHz 3 0 0
Block Erase (64KB) D8h 1101 1000 Up to 100MHz 3 0 0
60h 0110 0000 Up to 100MHz 0 0 0
Chip Erase
C7h 1100 0111 Up to 100MHz 0 0 0
Byte/Page Program (1 to 256 bytes) 02h 0000 0010 Up to 100MHz 3 0 1+
Dual-Input Byte/Page Program (1 to 256 bytes) A2h 1010 0010 Up to 100MHz 3 0 1+
Program/Erase Suspend B0h 1011 0000 Up to 100MHz 0 0 0
Program/Erase Resume D0h 1101 0000 Up to 100MHz 0 0 0
Protection Commands
Write Enable 06h 0000 0110 Up to 100MHz 0 0 0
Write Disable 04h 0000 0100 Up to 100MHz 0 0 0
Protect Sector 36h 0011 0110 Up to 100MHz 3 0 0
Unprotect Sector 39h 0011 1001 Up to 100MHz 3 0 0
Global Protect/Unprotect Use Write Status Register Byte 1 Command
Read Sector Protection Registers 3Ch 0011 1100 Up to 100MHz 3 0 1+
Security Commands
Sector Lockdown 33h 0011 0011 Up to 100MHz 3 0 1
Freeze Sector Lockdown State 34h 0011 0100 Up to 100MHz 3 0 1
Read Sector Lockdown Registers 35h 0011 0101 Up to 100MHz 3 0 1+
Program OTP Security Register 9Bh 1001 1011 Up to 100MHz 3 0 1+
Read OTP Security Register 77h 0111 0111 Up to 100MHz 3 2 1+
Status Register Commands
Read Status Register 05h 0000 0101 Up to 100MHz 0 0 1+
Write Status Register Byte 1 01h 0000 0001 Up to 100MHz 0 0 1
Write Status Register Byte 2 31h 0011 0001 Up to 100MHz 0 0 1
Miscellaneous Commands
Reset F0h 1111 0000 Up to 100MHz 0 0 1
Read Manufacturer and Device ID 9Fh 1001 1111 Up to 85MHz 0 0 1 to 5
Deep Power-Down B9h 1011 1001 Up to 100MHz 0 0 0
Resume from Deep Power-Down ABh 1010 1011 Up to 100MHz 0 0 0
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
8

7. Read Commands

7.1 Read Array

The Read Array command can be used to sequentially read a continuous stream of data from the device by simply providing the clock signal once the initial starting address has been specified. The device incorporates an internal address counter that automatically increments on every clock cycle.
Three opcodes (1Bh, 0Bh, and 03h) can be used for the Read Array command. The use of each opcode depends on the maximum clock frequency that will be used to read data from the device. The 0Bh opcode can be used at any clock frequency up to the maximum specified by f to the maximum specified by f any clock frequency up to the maximum specified by f
should be reserved for systems employing the RapidS protocol.
f
CLK
To perform the Read Array operation, the 03h) must be clocked into the device. After the opcode has been clocked in, the three address bytes must be clocked in to specify the location of the first byte to read within the memory array. Following the three address bytes, additional dummy bytes may need to be clocked into the device, depending on which opcode is used for the Read Array operation. If the 1Bh opcode is used, then two dummy bytes must be clocked into the device after the three address bytes. If the 0Bh opcode is used, then a single dummy byte must be clocked in after the address bytes.
After the three address bytes (and any dummy bytes) have been clocked in, additional clock cycles will result in data being output on the SO pin. The data is always output with the MSB of a byte first. When the last byte (1FFFFFh) of the memory array has been read, the device will continue reading from the beginning of the array (000000h). No delays will be incurred when wrapping around from the end of the array to the beginning of the array.
Deasserting the CS pin will terminate the read operation and put the SO pin into a high-impedance state. The CS pin can be deasserted at any time and does not require that a full byte of data be read.
, and the 03h opcode can be used for lower frequency read operations, up
CLK
. The 1Bh opcode allows the highest read performance possible and can be used at
RDLF
; however, use of the 1Bh opcode at clock frequencies above
MAX
CS pin must first be asserted and then the appropriate opcode (1Bh, 0Bh, or
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
9
Figure 7-1. Read Array – 1Bh Opcode
CS
2310
675410119812 394243414037 3833 36353431 3229 30 44 47 484645 50 5149 52 55 565453
SCK
Opcode
SI
SO
00011011
MSB MSB
High-impedance
AAAA AAAAA
Figure 7-2. Read Array – 0Bh Opcode
CS
2310
675410119812 394243414037 3833 36353431 3229 30 44 47 484645
SCK
Opcode
SI
SO
00001011
MSB MSB
High-impedance
Address Bits A23-A0 Don't Care
Don't Care
XXXXXXXX
MSB
XXXXXXXX
MSB
Address Bits A23-A0 Don't Care
AAAA AAAAA
XXXXXXXX
MSB
Data Byte 1
DDDDDDDDDD
MSB MSB
Data Byte 1
DDDDDDDDDD
MSB MSB
Figure 7-3. Read Array – 03h Opcode
CS
2310
675410119812 373833 36353431 3229 30 39 40
SCK
Opcode
SI
SO
00000011
MSB MSB
High-impedance
Address Bits A23-A0
AAAA AAAAA
Data Byte 1
DDDDDDDDDD
MSB MSB
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
10

7.2 Dual-Output Read Array

The Dual-Output Read Array command is similar to the standard Read Array command and can be used to sequentially read a continuous stream of data from the device by simply providing the clock signal once the initial starting address has been specified. Unlike the standard Read Array command, however, the Dual-Output Read Array command allows two bits of data to be clocked out of the device on every clock cycle, rather than just one.
The Dual-Output Read Array command can be used at any clock frequency, up to the maximum specified by f perform the Dual-Output Read Array operation, the clocked into the device. After the opcode has been clocked in, the three address bytes must be clocked in to specify the location of the first byte to read within the memory array. Following the three address bytes, a single dummy byte must also be clocked into the device.
After the three address bytes and the dummy byte have been clocked in, additional clock cycles will result in data being output on both the SO and SIO pins. The data is always output with the MSB of a byte first and the MSB is always output on the SO pin. During the first clock cycle, bit 7 of the first data byte is output on the SO pin, while bit 6 of the same data byte is output on the SIO pin. During the next clock cycle, bits 5 and 4 of the first data byte are output on the SO and SIO pins, respectively. The sequence continues with each byte of data being output after every four clock cycles. When the last byte (1FFFFFh) of the memory array has been read, the device will continue reading from the beginning of the array (000000h). No delays will be incurred when wrapping around from the end of the array to the beginning of the array.
Deasserting the CS pin can be deasserted at any time and does not require that a full byte of data be read.
Figure 7-4. Dual-Output Read Array
CS
CS pin will terminate the read operation and put the SO and SIO pins into a high-impedance state. The
RDDO
CS pin must first be asserted and then the opcode 3Bh must be
. To
SCK
SI (SIO)
SO (SOI)
2310
675410119812 394243414037 3833 36353431 3229 30 44 47 484645
Opcode
00111011
MSB MSB
High-impedance
Address Bits A23-A0 Don't Care
AAAA AAAAA
XXXXXXXX
MSB
Output
Data Byte 1
D
D
D
6
4
2
D
D
D
7
5
3
MSB MSB MSB
D
0
D
1
Output
Data Byte 2
D
D
6
4
D
D
7
5
D
D
D
2
0
D
D
D
3
1
D
6
4
D
7
5
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
11

8. Program and Erase Commands

8.1 Byte/Page Program

The Byte/Page program command allows anywhere from a single byte of data to 256 bytes of data to be programmed into previously erased memory locations. An erased memory location is one that has all eight bits set to the Logical 1 state (a byte value of FFh). Before a byte/page program command can be started, the Write Enable command must have been previously issued to the device (see “Write Enable” on page 21) to set the Write Enable Latch (WEL) bit of the Status Register to a Logical 1 state.
To perform a Byte/Page Program command, a 02h opcode must be clocked into the device followed by the three address bytes denoting the first location of the memory array to begin programming at. After the address bytes have been clocked in, data can then be clocked into the device and be stored in an internal buffer.
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page boundary (A7-A0 are not all 0), then special circumstances regarding which memory locations are to be programmed will apply. In this situation, any data that are sent to the device that go beyond the end of the page will wrap around to the beginning of the same page. In addition, if more than 256 bytes of data are sent to the device, then only the last 256 bytes sent will be latched into the internal buffer.
Example: If the starting address denoted by A23-A0 is 0000FEh and three bytes of data are sent to the device, then
the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh, while the last byte of data will be programmed at address 000000h. The remaining bytes in the page (addresses 000001h through 0000FDh) will not be programmed and will remain in the erased state (FFh).
When the
CS pin is deasserted, the device will program the data stored in the internal buffer into the appropriate memory array locations based on the starting address specified by A23-A0 and the number of data bytes sent to the device. If fewer than 256 bytes of data are sent to the device, then the remaining bytes within the page will not be programmed and will remain in the erased state (FFh). The programming of the data bytes is internally self-timed and should take place in a time of t
The three address bytes and at least one complete byte of data must be clocked into the device before the deasserted, and the
or tBP if only programming a single byte.
PP
CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise, the device
CS pin is
will abort the operation and no data will be programmed into the memory array. In addition, if the address specified by A23-A0 points to a memory location within a sector that is in the protected state (see “Protect Sector” on page 23) or locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will not be executed and the device will return to the idle state once the
CS pin has been deasserted. The WEL bit in the Status Register will be reset back to the Logical 0 state if the program cycle aborts due to an incomplete address being sent, an incomplete byte of data being sent, the
CS pin being deasserted on uneven byte boundaries, or because the memory location to be
programmed is protected or locked down.
While the device is programming, the Status Register can be read and will indicate that the device is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t
or tPP time to determine if the
BP
data bytes have finished programming. At some point before the program cycle completes, the WEL bit in the Status Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent programming algorithm that can detect when a byte location fails to program properly. If a programming error arises, it will be indicated by the EPE bit in the Status Register.
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
12
Figure 8-1. Byte Program
CS
2310
SCK
Opcode
SI
SO
00000010
MSB MSB
High-impedance
Figure 8-2. Page Program
CS
2310
SCK
Opcode
SI
00000010
MSB MSB
675410119812 3937 3833 36353431 3229 30
Address Bits A23-A0 Data In
AAAA AAAAA
6754983937 3833 36353431 3229 30
Address Bits A23-A0 Data In Byte 1
AA AAAA
DDDDDDDD
MSB
DDDDDDDD
MSB
Data In Byte n
DDDDDDDD
MSB
SO
High-impedance
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
13

8.2 Dual-Input Byte/Page Program

The Dual-Input Byte/Page Program command is similar to the standard Byte/Page Program command and can be used to program anywhere from a single byte of data up to 256 bytes of data into previously erased memory locations. Unlike the standard byte/page program command, however, the Dual-Input Byte/Page Program command allows two bits of data to be clocked into the device on every clock cycle rather than just one.
Before the Dual-Input Byte/Page Program command can be started, the Write Enable command must have been previously issued to the device (see “Write Enable” on page 21) to set the Write Enable Latch (WEL) bit of the Status Register to a Logical 1 state. To perform a Dual-Input Byte/Page Program command, an A2h opcode must be clocked into the device followed by the three address bytes denoting the first location of the memory array to begin programming at. After the address bytes have been clocked in, data can then be clocked into the device two bits at a time on both the SOI and SI pins.
The data is always input with the MSB of a byte first, and the MSB is always input on the SOI pin. During the first clock cycle, bit 7 of the first data byte is input on the SOI pin while bit 6 of the same data byte is input on the SI pin. During the next clock cycle, bits 5 and 4 of the first data byte are input on the SOI and SI pins, respectively. The sequence continues with each byte of data being input after every four clock cycles. Like the standard Byte/Page Program command, all data clocked into the device are stored in an internal buffer.
If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page boundary (A7-A0 are not all 0), then special circumstances regarding which memory locations are to be programmed will apply. In this situation, any data that are sent to the device that go beyond the end of the page will wrap around to the beginning of the same page. In addition, if more than 256 bytes of data are sent to the device, then only the last 256 bytes sent will be latched into the internal buffer.
Example: If the starting address denoted by A23-A0 is 0000FEh and three bytes of data are sent to the device, then
the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh, while the last byte of data will be programmed at address 000000h. The remaining bytes in the page (addresses 000001h through 0000FDh) will not be programmed and will remain in the erased state (FFh).
When the
CS pin is deasserted, the device will program the data stored in the internal buffer into the appropriate memory array locations based on the starting address specified by A23-A0 and the number of data bytes sent to the device. If fewer than 256 bytes of data are sent to the device, then the remaining bytes within the page will not be programmed and will remain in the erased state (FFh). The programming of the data bytes is internally self-timed and should take place in a time of t
The three address bytes and at least one complete byte of data must be clocked into the device before the deasserted, and the
or tBP if only programming a single byte.
PP
CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise, the device
CS pin is
will abort the operation and no data will be programmed into the memory array. In addition, if the address specified by A23-A0 points to a memory location within a sector that is in the protected state (see “Protect Sector” on page 23) or locked down (see “Sector Lockdown” on page 29), then the Byte/Page Program command will not be executed, and the device will return to the idle state once the
CS pin has been deasserted. The WEL bit in the Status Register will be reset back to the Logical 0 state if the program cycle aborts due to an incomplete address being sent, an incomplete byte of data being sent, the
CS pin being deasserted on uneven byte boundaries, or because the memory location to be
programmed is protected or locked down.
While the device is programming, the Status Register can be read and will indicate that the device is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t
or tPP time to determine if the
BP
data bytes have finished programming. At some point before the program cycle completes, the WEL bit in the Status Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent programming algorithm that can detect when a byte location fails to program properly. If a programming error arises, it will be indicated by the EPE bit in the Status Register.
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
14
Figure 8-3. Dual-Input Byte Program
CS
2310
SCK
Opcode
SI (SIO)
SO (SOI)
10100010
MSB MSB
High-impedance
Figure 8-4. Dual-Input Page Program
CS
2310
SCK
Opcode
SI (SIO)
10100010
MSB MSB
675410119812 33353431 3229 30
Address Bits A23-A0
AAAA AAAAA
675410119812 3937 3833 36353431 3229 30
Address Bits A23-A0
AAAA AAAAA
Data Byte
D
D
6
D
D
7
MSB
Data Byte 1
D
D
6
Input
4
5
Input
4
D
D
2
0
D
D
3
1
Input
Data Byte 2
D
D
D
D
D
2
0
6
D
4
2
0
Input
Data Byte n
D
D
6
4
D
D
2
0
SO (SOI)
High-impedance
D
D
D
D
7
5
MSB MSB
D
3
1
D
D
7
D
5
3
1
D
MSB
D
D
7
D
5
3
1
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
15

8.3 Block Erase

A block of 4, 32, or 64KB can be erased (all bits set to the Logical 1 state) in a single operation by using one of three different opcodes for the Block Erase command. An opcode of 20h is used for a 4KB erase, an opcode of 52h is used for a 32KB erase, and an opcode of D8h is used for a 64KB erase. Before a Block Erase command can be started, the Write Enable command must have been previously issued to the device to set the WEL bit of the Status Register to a Logical 1 state.
To perform a Block Erase, the CS pin must first be asserted and then the appropriate opcode (20h, 52h, or D8h) must be clocked into the device. After the opcode has been clocked in, three address bytes specifying the address within the 4, 32, or 64KB block to be erased must be clocked in. Any additional data clocked into the device will be ignored. When
CS pin is deasserted, the device will erase the appropriate block. The erasing of the block is internally self-timed and
the should take place in a time of t
Since the Block Erase command erases a region of bytes, the lower order address bits do not need to be decoded by the device. Therefore, for a 4KB erase, address bits A11-A0 will be ignored by the device and their values can be either a Logical 1 or 0. For a 32KB erase, address bits A14-A0 will be ignored and for a 64KB erase, address bits A15-A0 will be ignored. Despite the lower order address bits not being decoded by the device, the three complete address bytes must still be clocked into the device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits); otherwise, the device will abort the operation and no Erase operation will be performed.
If the address specified by A23-A0 points to a memory location within a sector that is in the protected or locked down state, then the Block Erase command will not be executed and the device will return to the idle state once the been deasserted.
The WEL bit in the Status Register will be reset back to the Logical 0 state if the erase cycle aborts due to an incomplete address being sent, the region to be erased is protected or locked down.
While the device is executing a successful erase cycle, the Status Register can be read and will indicate that the device is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t determine if the device has finished erasing. At some point before the erase cycle completes, the WEL bit in the Status Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent erase algorithm that can detect when a byte location fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status Register.
.
BLKE
CS pin has
CS pin being deasserted on uneven byte boundaries, or because a memory location within the
time to
BLKE
Figure 8-5. Block Erase
CS
SCK
SI
SO
CCCCCCCC
MSB MSB
High-impedance
2310
Opcode
675410119812 3129 3027 2826
Address Bits A23-A0
AAAA AAAAA A A A
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
16

8.4 Chip Erase

The entire memory array can be erased in a single operation by using the Chip Erase command. Before a Chip Erase command can be started, the Write Enable command must have been previously issued to the device to set the WEL bit of the Status Register to a Logical 1 state.
Two opcodes, 60h and C7h, can be used for the Chip Erase command. There is no difference in device functionality when utilizing the two opcodes, so they can be used interchangeably. To perform a Chip Erase, one of the two opcodes (60h or C7h) must be clocked into the device. Since the entire memory array is to be erased, no address bytes need to be clocked into the device and any data clocked in after the opcode will be ignored. When the device will erase the entire memory array. The erasing of the device is internally self-timed and should take place in a time of t
The complete opcode must be clocked into the device before the deasserted on an even byte boundary (multiples of eight bits); otherwise, no erase will be performed. In addition, if any sector of the memory array is in the protected or locked down state, then the Chip Erase command will not be executed and the device will return to the idle state once the be reset back to the Logical 0 state if the or locked down state.
While the device is executing a successful erase cycle, the Status Register can be read and will indicate that the device is busy. For faster throughput, it is recommended that the Status Register be polled rather than waiting the t determine if the device has finished erasing. At some point before the erase cycle completes, the WEL bit in the Status Register will be reset back to the Logical 0 state.
The device also incorporates an intelligent erase algorithm that can detect when a byte location fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status Register.
CHPE
CS pin is deasserted, the
.
CS pin is deasserted, and the CS pin must be
CS pin has been deasserted. The WEL bit in the Status Register will
CS pin is deasserted on uneven byte boundaries or if a sector is in the protected
time to
CHPE
Figure 8-6. Chip Erase
CS
SCK
SI
SO
CCCCCCCC
MSB
High-impedance
2310
Opcode
6754
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
17

8.5 Program/Erase Suspend

In some code-plus-data storage applications, it is often necessary to process certain high-level system interrupts that require relatively immediate reading of code or data from the Flash memory. In such an instance, it may not be possible for the system to wait the microseconds or milliseconds required for the Flash memory to complete a program or erase cycle. The Program/Erase Suspend command allows a program or erase operation in progress on a particular 64KB sector of the Flash memory array to be suspended so that other device operations can be performed.
By suspending an erase operation on a particular sector, the system can perform a program or read operation within another 64KB sector of the device. Other device operations, such as a Read Status Register, can also be performed while a program or erase operation is suspended. Table 8-1 outlines the operations that are allowed and not allowed while a program or erase operation is suspended.
Since the need to suspend a program or erase operation is immediate, the Write Enable command does not need to be issued prior to the Program/Erase Suspend command being issued. Therefore, the Program/Erase Suspend command operates independently of the state of the WEL bit in the Status Register.
To perform a Program/Erase Suspend, the the device. No address bytes need to be clocked into the device, and any data clocked in after the opcode will be ignored. When the time of t
SUSP
Logical 1 state to indicate that the program or erase operation has been suspended. In addition, the RDY/BSY bit in the Status Register will indicate that the device is ready for another operation. The complete opcode must be clocked into the device before the eight bits); otherwise, no suspend operation will be performed.
Read operations are not allowed to a 64KB sector that has had its program or erase operation suspended. If a read is attempted to a suspended sector, then the device will output undefined data. Therefore, if performing a Read Array operation on an unsuspended sector, and if the device’s internal address counter increments and crosses the sector boundary to a suspended sector, the device will then start outputting undefined data continuously until the address counter increments and crosses a sector boundary to an unsuspended sector.
A program operation is not allowed on a sector that has been erase suspended. If a program operation is attempted on an erase suspended sector, then the program operation will abort and the WEL bit in the Status Register will be reset back to the Logical 0 state. Likewise, an erase operation is not allowed on a sector that has been program suspended. If attempted, the erase operation will abort and the WEL bit in the Status Register will be reset to a Logical 0 state.
During an Erase Suspend, a program operation to a different 64KB sector can be started and subsequently suspended. This results in a simultaneous Erase Suspend/Program Suspend condition, which will be indicated by the ES and PS bits in the Status Register being set to the Logical 1 state.
If a Reset operation (see “Reset” on page 41) is performed while a sector is erase suspended, the suspend operation will abort and the contents of the block in the suspended sector will be left in an undefined state. However, if a Reset is performed while a sector is program suspended, the suspend operation will abort, but only the contents of the page that was being programmed and subsequently suspended will be undefined. The remaining pages in the 64KB sector will retain their previous contents.
If an attempt is made to perform an operation that is not allowed while a program or erase operation is suspended, such as a Protect Sector command, then the device will simply ignore the opcode and no operation will be performed. The state of the WEL bit in the Status Register, as well as the SPRL (Sector Protection Registers Locked) and SLE (Sector Lockdown Enabled) bits, will not be affected.
CS pin is deasserted, the program or erase operation currently in progress will be suspended within a
. The Program Suspend (PS) bit or the Erase Suspend (ES) bit in the Status Register will then be set to the
CS pin is deasserted, and the CS pin must be deasserted on an even byte boundary (multiples of
CS pin must first be asserted and then the opcode B0h must be clocked into
AT25DL161 [DATASHEET]
8795E–DFLASH–12/2012
18
Loading...
+ 40 hidden pages