3.3V Self-Calibrating 12-Bit Plus Sign Serial I/O
A/D Converters with MUX and Sample/Hold
March 1995
ADC12L030/ADC12L032/ADC12L034/ADC12L038
3.3V Self-Calibrating 12-Bit Plus Sign Serial I/O A/D Converters with MUX and Sample/Hold
General Description
The ADC12L030 family is 12-bit plus sign successive approximation A/D converters with serial I/O and configurable
input multiplexers. These devices are fully tested with a single 3.3V power supply. The ADC12L032, ADC12L034 and
ADC12L038 have 2, 4 and 8 channel multiplexers, respectively. Differential multiplexer outputs and A/D inputs are
available on the MUXOUT1, MUXOUT2, A/DIN1 and
A/DIN2 pins. The ADC12L030 has a two channel multiplexer with the multiplexer outputs and A/D inputs internally
connected. On request, these A/Ds go through a self calibration process that adjusts linearity, zero and full-scale errors to less than
g
(/2 LSB each.
The analog inputs can be configured to operate in various
combinations of single-ended, differential, or pseudo-differential modes. A fully differential unipolar analog input range
a
(0V to
3.3V) can be accommodated with a singlea3.3V
supply. In the differential modes, valid outputs are obtained
even when the negative inputs are greater than the positive
because of the 12-bit plus sign two’s compliment output
data format.
The serial I/O is configured to comply with NSC’s MICRO-
TM
WIRE
and Motorola’s SPI standards. For complementary
voltage references see the LM4040, LM4041 or LM9140
data sheets.
Applications
Y
Portable Medical instruments
Y
Portable computing
Y
Portable Test equipment
ADC12L038 Simplified Block Diagram
Features
Y
0V to 3.3V analog input range with single 3.3V power
supply
Y
Serial I/O (MICROWIRE and SPI Compatible)
Y
2, 4, or 8 channel differential or single-ended
multiplexer
Y
Analog input sample/hold function
Y
Power down mode
Y
Variable resolution and conversion rate
Y
Programmable acquisition time
Y
Variable digital output word length and format
Y
No zero or full scale adjustment required
Y
Fully tested and guaranteed with a 2.5V reference
Y
No Missing Codes over temperature
Key Specifications
Y
Resolution12-bit plus sign
Y
12-bit plus sign conversion time8.8 ms (min)
Y
12-bit plus sign sampling rate73 kHz (max)
Y
Integral linearity error
Y
Single supply3.3Vg10%
Y
Power dissipation15 mW (max)
Ð Power down40 mW (typ)
g
1 LSB (max)
TRI-STATEÉis a registered trademark of National Semiconductor Corporation.
TM
COPS
microcontrollers, HPCTMand MICROWIRETMare trademarks of National Semiconductor Corporation.
TM
Microsoft
is a trademark of Microsoft Corporation.
C
1995 National Semiconductor CorporationRRD-B30M75/Printed in U. S. A.
TL/H/11830
TL/H/11830– 1
Connection Diagrams
16-Pin Dual-In-Line and
Wide Body SO Packages
Top View
24-Pin Dual-In-Line and
Wide Body SO Packages
TL/H/11830– 2
20-Pin Dual-In-Line and
Wide Body SO Packages
Top View
28-Pin Dual-In-Line and
Wide Body SO Packages
TL/H/11830– 3
Top View
Ordering Information
TL/H/11830– 4
Industrial Temperature RangeNS Package
b
40§CsT
s
a
85§CNumber
A
ADC12L030CINN16E
ADC12L030CIWMM16B
ADC12L032CINN20A
ADC12L032CIWMM20B
ADC12L034CINN24C
ADC12L034CIWMM24B
ADC12L038CINN28B
ADC12L038CIWMM28B
2
Top View
TL/H/11830– 5
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Self-Calibration or Auto-Zero2(tCK)2(tCK)(min)
Synchronization Time from DOR
DOR High Time when CS is Low9(tSK)9(tSK)(max)
Continuously for Read Data and Software
Power Up/Down
t
CONV
CONV Valid Data Time8(tSK)8(tSK)(max)
REF
a
ea
2.500 VDC,V
REF
a
REF
and V
b
e
REF
TypicalLimitsUnits
(Note 10)(Note 11)(Limits)
1MHz (min)
0Hz (min)
60% (max)
60% (max)
8.8ms (max)
4.2ms (max)
)(max)
CK
1.2ms (min)
1.4ms (max)
11(t
CK
2.0ms (min)
2.2ms (max)
19(t
CK
3.6ms (min)
3.8ms (max)
35(t
CK
6.8ms (min)
7.0ms (max)
988.8ms (max)
15.2ms (max)
3(t
)(max)
CK
0.40ms (min)
0.60ms (max)
1.8ms (max)
1.6ms (max)
0VDC, 12-bit
b
s
25X, fully-
)(max)
)(max)
)(max)
a
7
AC Electrical Characteristics (Continued)
a
a
e
The following specifications apply for V
sign conversion mode, t
differential input with fixed 1.250V common-mode voltage, and 10(t
limits apply for T
e
e
t
3 ns, f
r
f
e
e
T
A
T
J
MIN
CK
to T
e
MAX
V
A
f
SK
SymbolParameterConditions
t
t
HPU
SPU
Hardware Power-Up Time, Time from
PD Falling Edge to EOC Rising Edge
Software Power-Up Time, Time from
Serial Data Clock Falling Edge to500700ms (max)
EOC Rising Edge
t
ACC
t
SET-UP
t
DELAY
t1H,t
t
HDI
t
SDI
t
HDO
t
DDO
t
RDO
t
FDO
t
CD
t
SD
C
IN
C
OUT
Access Time Delay from
CS
Falling Edge to DO Data Valid
Set-Up Time of CS Falling Edge to
Serial Data Clock Rising Edge
Delay from SCLK Falling
Edge to CS
Delay from CS Rising Edge toR
0H
DO TRI-STATE
Falling Edge
É
DI Hold Time from Serial Data
Clock Rising Edge
DI Set-Up Time from Serial Data
Clock Rising Edge
DO Hold Time from Serial DataR
Clock Falling Edge5ns (min)
Delay from Serial Data Clock
Falling Edge to DO Data Valid
DO Rise Time, TRI-STATE to HighR
DO Rise Time, Low to High1040ns (max)
DO Fall Time, TRI-STATE to LowR
DO Fall Time, High to Low1540ns (max)
Delay from CS Falling Edge
to DOR
Falling Edge
Delay from Serial Data Clock Falling
Edge to DOR
Rising Edge
Capacitance of Logic Inputs10pF
Capacitance of Logic Outputs20pF
a
e
ea
V
D
e
5 MHz, R
S
; all other limits T
e
L
e
L
e
L
e
L
3.3 VDC,V
e
25X, source impedance for V
) acquisition time unless otherwise specified. Boldface
CK
e
T
A
e
3k, C
L
e
3k, C
L
e
3k, C
L
e
3k, C
L
a
REF
e
25§C. (Note 17)
J
ea
2.500 VDC,V
REF
a
REF
and V
b
e
REF
0VDC, 12-bit
b
s
25X, fully-
TypicalLimitsUnits
(Note 10)(Note 11)(Limits)
250700ms (max)
2560ns (max)
50ns (min)
05ns (min)
100 pF
70100ns (max)
515ns (min)
510ns (min)
100 pF
35
65ns (max)
5090ns (max)
100 pF1040ns (max)
100 pF1540ns (max)
5080ns (max)
4580ns (max)
a
8
Electrical Characteristics (Continued)
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: When the input voltage (V
The 120 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 20 mA to four.
Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
allowable power dissipation at any temperature is P
maxe150§C. The typical thermal resistance (HJA) of these parts when board mounted follow:
device, T
J
) at any pin exceeds the power supplies (V
IN
e
(TJmaxbTA)/iJAor the number given in the Absolute Maximum Ratings, whichever is lower. For this
D
IN
k
GND or V
Part NumberResistance
ADC12L030CIN53§C/W
ADC12L030CIWM70§C/W
ADC12L032CIN46§C/W
ADC12L032CIWM64§C/W
ADC12L034CIN42§C/W
ADC12L034CIWM57§C/W
ADC12L038CIN40§C/W
ADC12L038CIWM50§C/W
Note 5: The human body model is a 100 pF capacitor discharged through a 1.5 kX resistor into each pin.
Note 6: See AN450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in any post 1986 National
Semiconductor Linear Data Book for other methods of soldering surface mount devices.
Note 7: Two on-chip diodes are tied to each analog input through a series resistor as shown below. Input voltage magnitude up to 5V above V
will not damage this device. However, errors in the A/D conversion can occur (if these diodes are forward biased by more than 50 mV) if the input voltage
magnitude of selected or unselected analog input go above V
s
3.05 VDCto ensure accurate conversions.
must be
a
or below GND by more than 50 mV. As an example, if V
A
a
l
IN
a
V
or V
), the current at that pin should be limited to 20 mA.
A
D
max, iJAand the ambient temperature, TA. The maximum
J
Thermal
i
JA
a
is 3.0 VDC, full-scale input voltage
A
a
or 5V below GND
A
a
Note 8: To guarantee accuracy, it is required that the V
pin.
Note 9: With the test condition for V
e
Note 10: Typicals are at T
Note 11: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive full-
scale and zero. For negative integral linearity error, the straight line passes through negative full-scale and zero (see
Note 13: Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the worst-case value of the code transitions
between 1 to 0 and 0 to
J
a
1 (see
T
A
e
Figure 2
a
b
REF(VREF
25§C and represent most likely parametric norm.
V
).
a
and V
A
REF
be connected together to the same power supply with separate bypass capacitors at each V
D
b
) given asa2.500V the 12-bit LSB is 610 mV and the 8-bit LSB is 9.8 mV.
TL/H/11830– 6
Figures 1b
and1c).
Note 14: Total unadjusted error includes offset, full-scale, linearity and multiplexer errors.
Note 15: The DC common-mode error is measured in the differential multiplexer mode with the assigned positive and negative input channels shorted together.
Note 16: Channel leakage current is measured after the channel selection.
Note 17: Timing specifications are tested at the TTL logic levels, V
to 1.4V.
Note 18: The ADC12L030 family’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will
result in a maximum repeatability uncertainty of 0.2 LSB.
Note 19: If SCLK and CCLK are driven from the same clock source, then t
Note 20: The ‘‘12-Bit Conversion of Offset’’ and ‘‘12-Bit Conversion of Full-Scale’’ modes are intended to test the functionality of the device. Therefore, the output
data from these modes are not an indication of the accuracy of a conversion result.
e
0.4V for a falling edge and V
IL
is 6, 10, 18 or 34 clock periods minimum and maximum.
A
e
2.4V for a rising edge. TRI-STATE output voltage is forced
IH
9
a
Electrical Characteristics (Continued)
FIGURE 1a. Transfer Characteristic
FIGURE 1b. Simplified Error Curve vs Output Code without Auto-Calibration or Auto-Zero Cycles
TL/H/11830– 7
TL/H/11830– 8
10
Electrical Characteristics (Continued)
FIGURE 1c. Simplified Error Curve vs Output Code after Auto-Calibration Cycle
TL/H/11830– 10
FIGURE 2. Offset or Zero Error Voltage
TL/H/11830– 9
11
Typical Performance Characteristics
The following curves apply for 12-bitasign mode after auto-calibration unless otherwise specified. The performance for 8-bit
sign mode is equal to or better than shown. (Note 9)
a
Linearity Error Change
vs Temperature
Zero Error Change
vs Temperature
Full-Scale Error Change
vs Temperature
Zero Error Change
vs Supply Voltage
Digital Supply Current
vs Temperature
Full-Scale Error Change
vs Supply Voltage
Analog Supply Current
vs Temperature
TL/H/11830– 11
12
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