The ADC1001 is a CMOS, 10-bit successive approximation
A/D converter. The 20-pin ADC1001 is pin compatible with
the ADC0801 8-bit A/D family. The 10-bit data word is read
in two 8-bit bytes, formatted left justified and high byte first.
The six least significant bits of the second byte are set to
zero, as is proper for a 16-bit word.
Differential inputs provide low frequency input common
mode rejection and allow offsetting the analog range of the
converter. In addition, the reference input can be adjusted
enabling the conversion of reduced analog ranges with 10bit resolution.
Features
Y
ADC1001 is pin compatible with ADC0801 series 8-bit
A/D converters
Y
Compatible with NSC800 and 8080 mP derivativesÐno
interfacing logic needed
Connection Diagram
ADC1001 (for an 8-bit data bus)
Dual-In-Line Package
Y
Easily interfaced to 6800 mP derivatives with minimal
external logic
Y
Differential analog voltage inputs
Y
Logic inputs and outputs meet both MOS and TTL voltage level specifications
Y
Works with 2.5V (LM336) voltage reference
Y
On-chip clock generator
Y
0V to 5V analog input voltage range with single 5V supply
Y
Operates ratiometrically or with 5 VDC, 2.5 VDC, or analog span adjusted voltage reference
Y
0.3×standard width 20-pin DIP package
Key Specifications
Y
Resolution10 bits
Y
Linearity error
Y
Conversion time200mS
g
1 LSB
Top View
TL/H/5675– 11
Ordering Information
Temperature Range 0§Ctoa70§Cb40§Ctoa85§C
Order NumberADC1001CCJ-1ADC1001CCJ
Package OutlineJ20AJ20A
TRI-STATEÉis a registered trademark of National Semiconductor Corp.
C
1995 National Semiconductor CorporationRRD-B30M115/Printed in U. S. A.
TL/H/5675
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage (V
Logic Control Inputs
Voltage at Other Inputs and Outputs
Storage Temperature Range
Package Dissipation at T
Lead Temp. (Soldering, 10 seconds)300§C
ESD Susceptibility (Note 10)800V
) (Note 3)6.5V
CC
e
25§C875 mW
A
b
b
0.3V to (V
b
65§Ctoa150§C
0.3V toa18V
CC
a
0.3V)
Operating Conditions (Notes1&2)
Temperature RangeT
ADC1001CCJ
ADC1001CCJ-10§CsT
Range of V
CC
s
MIN
b
40§CsT
4.5 VDCto 6.3 V
s
T
T
A
MAX
s
a
85§C
A
s
a
70§C
A
DC
Converter Characteristics
s
Converter Specifications: V
CC
e
5VDC,V
/2e2.500 VDC,T
REF
MIN
s
T
T
A
MAX
and f
e
410 kHz unless otherwise specified.
CLK
ParameterConditionsMInTypMaxUnits
Linearity Error
Zero Error
Full-Scale Error
g
1LSB
g
2LSB
g
2LSB
Total Ladder Resistance (Note 9)Input Resistance at Pin 92.24.8KX
Analog Input Voltage Range(Note 4) V(a)orV(b)GNDb0.05V
DC Common-Mode ErrorOver Analog Input Voltage Range
e
Power Supply SensitivityV
CC
Allowed V
Voltage Range (Note 4)
g
5V
DC
(a) and VIN(b)
IN
5% Over
g
(/8LSB
g
(/8LSB
CC
a
0.05V
DC
AC Electrical Characteristics
Timing Specifications: V
e
5VDCand T
CC
SymbolParameterConditionsMInTypMaxUnits
T
f
c
CLK
Conversion Time(Note 5)80901/f
Clock Frequency(Note 8)1001260kHz
Clock Duty Cycle4060%
CRConversion Rate In Free-RunningINTR tied to WR with4600conv/s
ModeCSe0VDC,f
t
W(WR)L
t
ACC
Width of WR Input (Start PulseCSe0VDC(Note 6)150ns
Width)
Access Time (Delay fromC
Falling Edge of RD
to Output
Data Valid)
t1H,t
TRI-STATEÉControl (DelayC
0H
from Rising Edge of RD
Hi-Z State)Circuits)
tWI,t
t
1rs
C
IN
C
OUT
Delay from Falling Edge300450ns
RI
of WR
or RD to Reset of INTR
INTR to 1st Read Set-Up Time550400ns
Input Capacitance of Logic57.5pF
Control Inputs
TRI-STATE Output57.5pF
Capacitance (Data Buffers)
e
25§C unless otherwise specified.
A
e
f
410 kHz195220ms
CLK
e
410 kHz
CLK
e
100 pF170300ns
L
e
10 pF, R
to(See TRI-STATE Test
L
e
10k125200ns
L
CLK
2
DC Electrical Characteristics
s
The following specifications apply for V
e
5VDCand T
CC
SymbolParameterConditionsMInTypMaxUnits
CONTROL INPUTS[Note: CLK IN is the input of a Schmitt trigger circuit and is therefore specified separately
VIN(1)Logical ‘‘1’’ Input VoltageV
(Except CLK IN)
VIN(0)Logical ‘‘0’’ Input VoltageV
(Except CLK IN)
IIN(1)Logical ‘‘1’’ Input CurrentV
(All Inputs)
IIN(0)Logical ‘‘0’’ input CurrentV
(All Inputs)
CC
CC
IN
IN
e
e
e
e
5.25 V
4.75 V
5V
0V
CLOCK IN
a
V
T
b
V
T
V
H
CLK IN Positive Going2.73.13.5V
Threshold Voltage
CLK IN Negative Going1.51.82.1V
Threshold Voltage
CLK IN Hysteresis0.61.32.0V
a)b
(V
T
b
(V
)
T
OUTPUTS AND INTR
V
(0)Logical ‘‘0’’ Output VoltageI
OUT
V
(1)Logical ‘‘1’’ Output VoltageI
OUT
I
OUT
I
SOURCE
I
SINK
TRI-STATE Disabled OutputV
Leakage (All Data Buffers)V
e
1.6 mA, V
OUT
eb
360 mA, V
O
eb
I
10 mA, V
O
e
OUT
e
OUT
V
Short to GND, T
OUT
V
Short to VCC,T
OUT
POWER SUPPLY
I
CC
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified. The separate A GND point should always be wired to the D GND.
Note 3: A zener diode exists, internally, from V
Note 4: For V
conduct for analog input voltages one diode drop below ground or one diode drop greater than the V
as high level analog inputs (5V) can cause this input diode to conductÐespecially at elevated temperatures, and cause errors for analog inputs near fullscale. The
spec allows 50 mV forward bias of either diode. This means that as long as the analog V
code will be correct. To achieve an absolute 0 V
variations, initial tolerance and loading.
Note 5: With an asynchronous start pulse, up to 8 clock periods may be required before the internal clock phases are proper to start the conversion process. The
start request is internally latched, see
Note 6: The CS
the converter in a reset mode and the start of conversion is initiated by the low to high transition of the WR
Note 7: All typical values are for T
Note 8: Accuracy is guaranteed at f
Note 9: The V
of these two equal resistors.
Note 10: Human body model, 100 pF discharged through a 1.5 kX resistor.
Supply Current (Includesf
Ladder Current)V
to GND and has a typical breakdown voltage of 7 VDC.
(b)tVIN(a) the digital output code will be all zeros. Two on-chip diodes are tied to each analog input (see Block Diagram) which will forward
IN
input is assumed to bracket the WR strobe input and therefore timing is dependent on the WR pulse width. An arbitrarily wide pulse width will hold
A
pin is the center point of a two resistor divider (each resistor is 2.4kX) connected from VCCto ground. Total ladder input resistance is the sum
REF/2
CC
to5VDCinput voltage range will therefore require a minimum supply voltage of 4.950 VDCover temperature
DC
Figure 1
.
e
25§C.
e
410 kHz. At higher clock frequencies accuracy can degrade.
CLK
e
CLK
REF
and CS
410 kHz,
/2eNC, T
s
T
T
MIN
, unless otherwise specified.
A
MAX
]
DC
DC
DC
DC
e
4.75 V
CC
e
4.75 V
CC
e
4.75 V
CC
0.4 V
DC
5V
DC
A
e
12.55.0mA
DC
e
25§C4.56mA
A
e
25§C9.016mA
A
e
25§C
does not exceed the supply voltage by more than 50 mV, the output
IN
2.015V
0.8V
0.0051mA
b
b
1
DC
2.4V
DC
4.5V
0.005mA
0.4V
0.1
b
100mA
0.13mA
supply. Be careful, during testing at low VCClevels (4.5V),
CC
pulse (see Timing Diagrams).
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
DC
3
Typical Performance Characteristics
Delay From Falling Edge of
Logic Input Threshold
Voltage vs Supply Voltage
RD
to Output Data Valid
vs Load Capacitance
Output Current vs
Temperature
CLK IN Schmitt Trip Levels
vs Supply Voltage
TRI-STATE Test Circuits and Waveforms
TL/H/5675– 3
TL/H/5675– 5
4
t1H,C
t
t0H,C
t
TL/H/5675– 2
e
10 pF
L
e
20 ns
r
e
10 pF
L
e
20 ns
r
TL/H/5675– 4
TL/H/5675– 6
Timing Diagrams
TL/H/5675– 7
Output Enable and Reset INTR
Note: All timing is measured from the 50% voltage points.
BYTE SEQUENCING FOR THE 20-PIN ADC1001
Byte8-Bit Data Bus Connection
Order
MSB
1stBit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2
2ndBit 1 Bit 0000000
TL/H/5675– 8
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
LSB
5
Functional Description
The ADC1001 uses an advanced potentiometric resistive
ladder network. The analog inputs, as well as the taps of
this ladder network, are switched into a weighted capacitor
array. The output of this capacitor array is the input to a
sampled data comparator. This comparator allows the successive approximation logic to match the analog difference
input voltage[V
The most significant bit is tested first and after 10 comparisons (80 clock cycles) a digital 10-bit binary code (all
e
‘‘1’’s
full-scale) is transferred to an output latch and then
an interrupt is asserted (INTR
sition). The device may be operated in the free-running
mode by connecting INTR
ensure start-up under all possible conditions, an external
WR
pulse is required during the first power-up cycle. A conversion in process can be interrupted by issuing a second
start command.
On the high-to-low transition of the WR
SAR latches and the shift register stages are reset. As long
as the CS
main in a reset state.
periods after at least one of these inputs makes a low-tohigh transition.
A functional diagram of the A/D converter is shown in
ure 1
. All of the inputs and outputs are shown and the major
logic control paths are drawn in heavier weight lines.
The conversion is initialized by taking CS
neously low. This sets the start flip-flop (F/F) and the resulting ‘‘1’’ level resets the 8-bit shift register, resets the Interrupt (INTR) F/F and inputs a ‘‘1’’ to the D flop, F/F1, which
is at the input end of the 10-bit shift register. Internal clock
signals then transfer this ‘‘1’’ to the Q output of F/F1. The
AND gate, G1, combines this ‘‘1’’ output with a clock signal
to provide a reset signal to the start F/F. If the set signal is
no longer present (either WR
reset and the 10-bit shift register then can have the ‘‘1’’
(a)bVIN(b)]to taps on the R network.
IN
makes a high-to-low tran-
to the WR inut with CSe0. To
input the internal
input and WR input remain low, the A/D will re-
Conversion will start from 1 to 8 clock
Fig-
and WR simulta-
or CS is a ‘‘1’’) the start F/F is
clocked in, which allows the conversion process to continue. If the set signal were to still be present, this reset pulse
would have no effect and the 10-bit shift register would continue to be held in the reset mode. This logic therefore allows for wide CS
and WR signals and the converter will start
after at least one of these signals returns high and the internal clocks again provide a reset signal for the start F/F.
After the ‘‘1’’ is clocked through the 10-bit shift register
(which completes the SAR search) it causes the new digital
word to transfer to the TRI-STATE output latches. When
this XFER signal makes a high-to-low transition the one
shot fires, setting the INTR F/F. An inverting buffer then
supplies the INTR
output signal.
Note that this SET control of the INTR F/F remains low for
aproximately 400 ns. If the data output is continuously enabled (CS
and RD both held low), the INTR output will still
signal the end of the conversion (by a high-to-low transition), because the SET
input can control the Q output of
the INTR F/F even though the RESET input is constantly at
a ‘‘1’’ level. This INTR
duration of the SET
output will therefore stay low for the
signal.
When data is to be read, the combination of both CS and
RD
being low will cause the INTR F/F to be reset and the
TRI-STATE output latches will be enabled.
Zero and Full-Scale Adjustment
Zero error can be adjusted as shown in
forced to
a
2.5 mV (a(/2 LSB) and the potentiometer is
Figure 2
.VIN(a)is
adjusted until the digital output code changes from 00 0000
0000 to 00 0000 0001.
Full-scale is adjusted as shown in
input. With V
less 1(/2 LSBs (V
the digital output code changes from 11 1111 1110 to 11
(a) forced to the desired full-scale voltage
IN
b
1(/2 LSBs), V
FS
Figure 3
, with the V
/2 is adjusted until
REF
REF
1111 1111.
/2
NOTE: VIN(b) should be biased so
t
b
(b)
that V
wiper is set at most negative
voltage position.
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or2. A critical component is any component of a life
systems which, (a) are intended for surgical implantsupport device or system whose failure to perform can
into the body, or (b) support or sustain life, and whosebe reasonably expected to cause the failure of the life
failure to perform, when properly used in accordancesupport device or system, or to affect its safety or
with instructions for use provided in the labeling, caneffectiveness.
be reasonably expected to result in a significant injury
to the user.
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