QUICK LOGIC QL6325-E-6PQ208C, QL6325-E-6PQ208I, QL6325-E-6PQ208M, QL6325-E-6PS484C, QL6325-E-6PS484I Datasheet

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Preliminary

1

• • • • • •

Device Highlights

Flexible Programmable Logic

• 0.18

µ

m six layer metal CMOS Process

• 1.8/2.5/3.3 V Drive Capable I/O

• 1,536 Logic Cells

• 320,640 Max System Gates

•

Up to 310 I/O Pins

Embedded Dual Port SRAM

• Twenty-four 2,304-bit Dual Port High

Performance SRAM Blocks

• 55,300 RAM bits

• RAM/ROM/FIFO Wizard for Automatic

Configuration

• Configurable and Cascadable

Programmable I/O

• High performance Enhanced I/O (EIO)—

less than 3 ns Tco

• Programmable Slew Rate Control

• Programmable I/O Standards:

• LVTTL, LVCMOS, PCI, GTL+, SSTL2,

and SSTL3

• Eight Independent I/O Banks

• Three Register Configurations: Input,

Output, and Output Enable

Advanced Clock Network

• Nine Global Clock Networks:

• One Dedicated

• Eight Programmable

• 20 Quad-Net Networks—five per Quadrant

• 16 I/O Controls—two per I/O Bank

• Four phase locked loops

Embedded Computational Units

12 ECUs provide integrated Multiply, Add, and Accumulate Functions.

Figure 1: QL6325-E Eclipse-E Block

Diagram

Embedded RAM BlocksPLL PLL

Fabric

12 Embeded Computational Units

Embedded RAM BlocksPLL PLL

FPGA Combining Performance, Density, and Embedded RAM

QL6325-E Eclipse-E Data Sheet

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

2

Electrical Specifications

AC Characteristics*

*at VCC = 2.5 V, TA = 25° C, Worst Case Corner, Speed Grade = -7 (K = 1.16) The AC Specifications are provided from Table 1 to Table 10. Logic Cell diagrams and

waveforms are provided from Figure 2 to Figure 15.

Figure 2: Eclipse-E Logic Cell

Table 1: Logic Cells

Symbol Parameter Value

Logic Cells Min Max

t

PD

Combinatorial Delay of the longest path: time taken by th e combinatorial circuit to output

- 0.257 ns

t

SU

Setup time: time the synchronous input of the flip-flop must be stable before the active clock edge

0.22 ns -

t

HL

Hold time: time the synchronous input of the flip-flop must be stable after the active clock edge

0 ns -

t

CO

Clock-to-out delay: the amount of time taken by the flip-flop to output after the active clock edge.

- 0.255 ns

t

CWHI

Clock High Time: required minimum time the clock stays high 0.46 ns -

t

CWLO

Clock Low Time: required minimum time that the clock stays low 0.46 ns -

t

SET

Set Delay: time between when the flip-flop is ”set” (high) and when the output is consequently “set” (high)

- 0.18 ns

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

3

Figure 3: Logic Cell Flip-Flop

Figure 4: Logic Cell Flip-Flop Timings—First Waveform

t

RESET

Reset Delay: time between when the flip-flop is ”reset” (low) and when the output is consequently “reset” (low)

- 0.09 ns

t

SW

Set Width: time that the SET signal remains high/low 0.3 ns -

t

RW

Reset Width: time that the RESET signal remains high/low 0.3 ns -

Table 1: Logic Cells (Continued)

Symbol Parameter Value

Logic Cells Min Max

SET

D

CLK

RESET

Q

SET

RESET

Q

CLK

t

CWHI

(min)

t

CWLO

(min)

t

RESET

t

RW

t

SET

t

SW

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

4

Figure 5: Logic Cell Flip-Flop Timings—Second Waveform

Figure 6: Eclipse-E Global Clock Structure

Table 2: Eclipse-E Clock Delay

Clock Source Parameters Clock Performance

Global Dedicated

Logic Cells (Internal) Clock signal generated internally 1.51 ns (max)

Clock Pad Clock signal generated externally 2.06 ns (max) 1.73 ns (max)

CLK

D

Q

t

SU

t

HL

t

CO

Quad net

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

5

Figure 7: Global Clock Structure Schematic

Figure 8: RAM Module

Table 3: Eclipse-E Global Clock Delay

Clock Segment Parameter Value

Min Max

t

PGCK

a

a. When using a PLL, t

PGCK

and t

BGCK

are effectively zero due to delay adjustment by

Phase Locked Loop.

Global clock pin delay to quad net - 1.34 ns

t

BGCK

Global clock tree delay (quad net to flip-flop)

- 0.56 ns

Programmable Clock

External Clock

Global Clock Buffer

Global Clock

t

PGCK

t

BGCK

Clock Select

WA

WD

WE

WCLK

RE

RCLK

RA

RD

RAM Module

[9:0]

[17:0]

[9:0]

[17:0]

ASYNCRD

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

6

Figure 9: RAM Cell Synchronous Write Timing

Table 4: RAM Cell Synchronous Write Timing

Symbol Parameter Value

RAM Cell Synchronous Write Timing Min Max

t

SWA

WA setup time to WCLK: time the WRITE ADDRESS must be stable before the active edge of the WRITE CLOCK

0.675 ns -

t

HWA

WA hold t ime to WCLK: time the WRITE ADDRESS must be stable after the active edge of the WRITE CLOCK

0 ns -

t

SWD

WD setup time to WCLK: time the WRITE DATA must be stable before the active edge of the WRITE CLOCK

0.654 ns -

t

HWD

WD hold time to WCLK: time the WRITE DA T A must be stable after t he active edge of the WRITE CLOCK

0 ns -

t

SWE

WE setup time to WCLK: time the WRITE ENABLE must be stable before th e active edge of the WRITE CLOCK

0.623 ns -

t

HWE

WE hold time to WCLK: time the WRITE ENABLE must be stable after the active edge of the WRITE CLOCK

0 ns -

t

WCRD

WCLK to RD (WA = RA): time between the active WRITE CLOCK edge and the time when the data is available at RD

- 4.38 ns

t

SWA

t

SWD

t

SWE

t

HWA

t

HWD

t

HWE

t

WCRD

old data

new data

WCLK

WA

WD

WE

RD

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

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Figure 10: RAM Cell Synchronous & Asynchronous Read Timing

Table 5: RAM Cell Synchronous & Asynchronous Read Timing

Symbol

RAM Cell Synchronous Read Timing Value

Parameter Min Max

t

SRA

RA setup time to RCLK: time the READ ADDRESS must be stable before the active edge of the READ CLOCK

0.686 ns -

t

HRA

RA hold time to RCLK: time the READ ADDRESS must be stable after the active edge of the READ CLOCK

0 ns -

t

SRE

RE setup time to WCLK: time the READ ENABLE must be stable before the active edge of the READ CLOCK

0.243 ns -

t

HRE

RE hold time to WCLK: time the READ ENABLE must be stable after the active edge of the READ CLOCK

0 ns -

t

RCRD

RCLK to RD: time between the active READ CLOCK edge and the time when the data is available at RD

- 4.38 ns

RAM Cell Asynchronous Read Timing

r

PDRD

RA to RD: time between when the READ ADDRESS is input and when the DATA is output

- 2.06 ns

t

SRA

t

HRA

RCLK

RA

t

SRE

t

HRE

t

RCRD

old data

new data

RE

RD

r

PDRD

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

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Figure 11: Eclipse-E Cell I/O

Figure 12: Eclipse-E Input Register Cell

E

R

Q

D

R

Q

E

R

Q

D

+

-

PAD

OUTPUT ENABLE

REGISTER

OUTPUT

REGISTER

INPUT

REGISTER

D

PAD

t

ISU

t

SID

+

-

Q

E

D

R

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

9

Table 6: Input Register Cell

Symbol Parameter: Input Register Cell Only

Value

Min Max

t

ISU

Input register setup time: the time the synchronous input of the flip-flop must be stable before the active clock edge

2.50 ns -

t

IHL

Input register hold time: the time the synchronous input of the flip-flop must be stable after the active clock edge

0 ns -

t

ICO

Input register clock-to-out: the time taken by the flip-flop to output after the active clock edge

- 1.08 ns

t

IRST

Input register reset delay: the time between when the flip-flop is “reset”(low) and when the output is consequently “reset” (low)

- 0.99 ns

t

IESU

Input register clock enable setup time: the time “enable” must be stable before the active clock edge

0.37 ns -

t

IEH

Input register clock enable hold time: the time “enable” must be stable after the active clock edge

0 ns -

Table 7: Standard Input Delays

Symbol Parameter Value

Standard Input Delays To get the total input delay add this delay to tISU Min Max

t

SID

(LVTTL) LVTTL input delay: Low Voltage TTL for 3.3 V applications - 0.34 ns

t

SID

(LVCMOS2)

LVCMOS2 input delay: Low Voltage CMOS for 2.5 V and lower applications

- 0.42 ns

t

SID

(LVCMOS18) LVCMOS18 input delay: Low Voltage CMOS for 1.8 V applications - t

SID

(GTL+) GTL+ input delay: Gunning Transceiver Logic - 0.68 ns

t

SID

(SSTL3) SSTL3 input delay: Stub Series Terminated Logic for 3.3 V - 0.55 ns

t

SID

(SSTL2) SSTL2 input delay: Stub Series Terminated Logic for 2.5 V - 0.61 ns

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

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Figure 13: Eclipse-E Input Register Cell Timing

Figure 14: Eclipse-E Output Register Cell

R

CLK

D

Q

ISU IHL

ICO

IESU

IEH

IRST

E

t

PAD

OUTPUT

REGISTER

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

11

Figure 15: Eclipse-E Output Register Cell Timing

Table 8: Eclipse-E Output Register Cell

Symbol Parameter Value

Output Register Cell Only Min Max

t

OUTLH

Output Delay low to high (90% of H) - 0.40 ns

t

OUTHL

Output Delay high to low (10% of L) - 0.55 ns

t

PZH

Output Delay tri-state to high (90% of H) - 2.94 ns

t

PZL

Output Delay tri-state to low (10% of L) - 2.34 ns

t

PHZ

Output Delay high to tri-State - 3.07 ns

t

PLZ

Output Delay low to tri-State - 2.53 ns

t

COP

Clock-to-out delay (does not include clock tree delays) -

3.15 ns (fast slew)

10.2 ns (slow slew)

Table 9: Output Slew Rates @ V

CCIO

= 3.3 V

Fast Slew Slow Slew

Rising Edge 2.8 V/ns 1.0 V/ns Falling Edge 2.86 V/ns 1.0 V/ns

Table 10: Output Slew Rates @ V

CCIO

= 2.5 V

Fast Slew Slow Slew

Rising Edge 1.7 V/ns 0.6 V/ns Falling Edge 1.9 V/ns 0.6 V/ns

L

H

L

H

t

OUTLH

t

OUTHL

L

H

Z

t

PZH

L

H

Z

t

PZL

L

H

Z

t

PLZ

L

H

Z

t

PHZ

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

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Table 11: Output Slew Rates @Vccio = 1.8 V

Fast Slew Slow Slew

Rising Edge - V/ns - V/ns Falling Edge - V/ns - V/ns

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

13

DC Characteristics

The DC Specifications are provided in Table 12 through Table 14.

Table 12: Absolute Maximum Ratings

Parameter Value Parameter Value

VCC Voltage -0.5 V to 3.6 V DC Input Current ±20 mA

V

CCIO

Voltage -0.5 V to 4.6 V ESD Pad Protection ±2000 V

INREF Voltage 2.7 V

Leaded Package

Storage Temperature

-65° C to + 150° C

Input V oltage -0.5 V to V

CCIO

+0.5 V

Laminate Package (BGA)

Storage Temperature

-55° C to + 125° C

Latch-up Immunity ±100 mA

Table 13: Operating Range

Symbol Parameter Military Industrial Commercial Unit

Min Max Min Max Min Max

V

CC

Supply Voltage 2.3 2.7 2.3 2.7 2.3 2.7 V

V

CCIO

I/O Input Tolerance Voltage 1.62 3.6 1.62 3.6 1.62 3.6 V TA Ambient Temperature -55 -40 85 0 70 °C TC Case Temperature - 125 - - - - °C

K Delay Factor -6 Speed Grade 0.42 1.35 0.43 1.26 0.46 1.23 n/a

-7 Speed Grade 0.42 1.27 0.43 1.19 0.46 1.16 n/a

Table 14: DC Characteristics

Symbol Parameter Conditions Min Max Units

I

I or I/O Input Leakage Current VI = V

CCIO

or GND -10 10 µA

I

OZ

3-State Output Leakage Current VI = V

CCIO

or GND -10 10 µA

C

I

Input Capacitance

a

a. Capacitance is sample tested only. Clock pins are 12 pF maximum.

--8pF

I

OS

Output Short Circuit Current

b

b. Only one output at a time. Duration should not exceed 30 seconds.

Vo = GND

V

o

= V

CC

-15 40

-180 210

mA mA

I

CC

D.C. Supply Current

c

c. For -6/-7 commercial grade devices only. Maximum ICC is 15 mA for

all industrial grade devices, and 25 mA for all military grade devices.

VI,Vo = V

CCIO

or GND - 10 mA

I

CCIO

D.C. Supply Current on V

CCIO

- 0 2 mA

I

CCIO

(DIF)

D.C. Supply Current on V

CCIO

for Differential I/O

---mA

I

REF

D.C. Supply Current on INREF - -10 10 µA

I

PD

Pad Pull-down (programmable) V

CCIO

= 3.6 V - 150 µA

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

14

Embedded Computational Unit (ECU)

Traditional Programmable Logic architectures do not implement arithmetic functions efficiently or effectively—these functions require high logic cell usage while garnering only moderate performance results.

The QL6325-E architecture allows for functionality above and beyond that achievable using programmable logic devices. By embedding a dynamically reconfigurable computational unit, the QL6325-E device can address various arithmetic functions efficiently. This approach offers greater performance than traditional programmable logic implementations. The embedded block is implemented at the transistor level as shown in Figure 16.

Figure 16: ECU Block Diagram

The 12 QL6325-E ECU blocks are placed next to the SRAM circuitry for efficient memory/instruction fetch and addressing for DSP algorithmic implementations.

Twelve 8-bit Multiply-Accumulate (MAC) functions can be implemented per cycle for a total of 1.2 billion MACs when clocked at 100 MHz. Additional MAC functions can be implemented in the programmable logic.

The modes for the ECU block are dynamically re-programmable through the programmable logic as shown in Table 15.

A[0:15]

B[0:15]

SIGN2

SIGN1

CIN

S1

S2 S3

A

B

C

D

3-4

decoder

8-bit

Multiplier

17 inc.

COUT

16-bit Adder

17-bit

Register

2-1

mux

2-1

mux

3-1

mux

Q[0:16]

CLK

RESET

DQ

00 01

10A[0:7]

A[8:15]

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

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Table 15: ECU Mode Select Criteria

TABLE 16.

Instruction

Operation

ECU Performance

a

, -7 WCC

b

a. tPD, tSU and tCO do not include routing paths in/out of the

ECU block.

b. Timing numbers represent -7 Worst Case Commercial

conditions.

S1 S2 S3

t

PD

t

SU

t

CO

0 0 0 Multiply

6.57 ns max

0 0 1 Multiply-Add

8.84 ns max

0 1 0 Accumulate

c

c. Internal feedback path in ECU restricts max clk frequency

to 238 MHz.

3.91 ns min

1.16 ns max

0 1 1 Add

3.14 ns max

1 0 0 Multiply (registered)

d

d. B [15:0] set to zero.

9.61 ns min

1.16 ns max

1 0 1 Multiply- Add (registered)

9.61 ns min

1.16 ns max

1 1 0 Multiply - Accumulate

9.61 ns min

1.16 ns max

1 1 1 Add (registered)

3.91 ns min

1.16 ns max

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

16

Phase Locked Loops (PLLs)

Instead of requiring extra components, designers simply need to instantiate one of the preconfigured models described in this section and listed in Table . The QuickLogic built-in PLLs support a wider range of frequencies than many other PLLs. Also, QuickLogic PLLs can be cascaded to support different ranges of frequency multiplications or divisions, driving the device at a faster or slower rate than the incoming clock frequency. Most importantly, they achieve a very short clock-to-out time—generally less than 3 ns. This low clock-to-out time is achieved by the PLL subtracting the clock tree delay through the feedback path, effectively making the clock tree delay zero.

Figure 17 illustrates a typical QuickLogic FPGA PLL.

Figure 17: PLL Block

F

in

represents a very stable high-frequency input clock and produces an accurate signal reference. This signal can either bypass the PLL entirely, thus entering the clock tree directly, or it can pass through the PLL itself.

Within the PLL, a voltage-controlled oscillator (VCO) is added to the circuit. The external F

in

signal and the local VCO form a control loop. The VCO is multiplied or divided down to the reference frequency, so that a phase detector (the crossed circle in Figure 17) can compare the two signals. If the phases of the external and local signals are not within the tolerance required, the phase detector sends a signal through the charge pump and loop filter (Figure 17). The charge pump generates an error voltage to bring the VCO back into alignment and the loop filter removes any high frequency noise before the error voltage enters the VCO. This new VCO signal enters the clock tree to drive the chip's circuitry.

F

out

represents the clock signal that emerges from the output pad (the output signal PLLPAD_OUT is explained in Table 18). This clock signal is meaningful only when the PLL is configured for external use; otherwise, it remains in high Z state, as shown in the post-simulation waveform.

vco

Filter

FIN

FOUT

+

-

1st Quadrant 2nd Quadrant

3rd Quadrant

4th Quadrant

Clock Tree

Frequency Divide

Frequency Multiply

1

.

_

.

2

.

_

.

4

.

_

.

4

.

_

.

2

.

_

.

1

.

_

PLL Bypass

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

17

Most QuickLogic products contain four PLLs, one to be used in each quadrant. The PLL presented in Figure 17 controls the clock tree in the fourth Quadrant of its FPGA. As previously noted, QuickLogic PLLs compensate for the additional delay created by the clock tree itself by subtracting the clock tree delay through the feedback path.

For more specific information on the Phase Locked Loops, please refer to QuickLogic Application Note 58.

PLL Modes of Operation

QuickLogic PLLs have eight modes of operation, based on the input frequency and desired output frequency—Table 17 indicates the features of each mode.

Table 17: PLL Mode Frequencies

PLL Model Output Frequency Input Frequency Range

a

a. The input frequency can range from 16 MHz to 250 MHz, while output frequency ranges from

25 MHz to 250 MHz. When you add PLLs to your top-level design, be sure that the PLL mode matches your desired input and output frequencies.

Output Frequency Range

PLL_HF

b

b. HF stands for high frequency and LF stands for low frequency.

Same as input frequency 66 MHz–150 MHz 66 MHz–150 MHz

PLL_LF Same as input frequency 25 MHz–133 MHz 25 MHz–133 MHz PLL_MULT2HF 2 × input frequency 50 MHz–125 MHz 100 MHz–250 MHz PLL_MULT2LF 2

×

input frequency 16 MHz–50 MHz 32 MHz–100 MHz

PLL_DIV2HF 1/2 × input frequency 100 MHz–250 MHz 50 MHz–125 MHz

PLL_DIV2LF 1/2

×

input frequency 50 MHz–100 MHz 25 MHz–50 MHz

PLL_MULT4 4 × input frequency 16 MHz–40 MHz 64 MHz–160 MHz

PLL_DIV4 1/4

×

input frequency 100 MHz–300 MHz 25 MHz–75 MHz

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

18

PLL Signals

Table 18 summarizes the key signals in QuickLogic’s PLLs.

Table 18: PLL Signals

Signal Name Description

PLLCLK_IN

a

a. Because PLLCLK_IN and PLL_RESET signals have INPAD, and

PLLPAD_OUT has OUTP AD, you do not have to add additional pads to your design

Input clock signal

PLL_RESET

Active High Reset If PLL_RESET is asserted, then CLKNET_OUT and

PLLPAD_OUT are reset to 0. This signal must be asserted and then released in order for the LOCK_DETECT to work.

ONn_OFFCHIP

PLL output This signal selects whether the PLL will drive the internal

clock network or be used off-chip. This is a static signal, not a dynamic signal.

Tied to GND = outgoing signal drives internal gates. Tied to VCC = outgoing signal used off-chip.

CLKNET_OUT

Out to internal gates This signal bypasses the PLL logic before driving

the internal gates. Note that this signal cannot be used in the same quadrant where the PLL signal is used (PLLCLK_OUT).

PLLCLK_OUT

Out from PLL to internal gates This signal can drive the internal gates

after going through the PLL. For this to work, ONn_OFFCHIP must be tied to GND.

PLLPAD_OUT

Out to off-chip This outgoing signal is used off-chip. For this to work,

ONn_OFFCHIP signal must be tied to VCC.

LOCK_DETECT

Active High Lock detection signal NOTE: For simulation purposes,

this signal gets asserted after 10 clock cycles. However, it can take a maximum of 200 clock cycles to sync with the input clock upon release of the RESET signal.

Table 19: DC Input and Output Levels

a

INREF V

IL

V

IH

V

OL

V

OH

I

OLIOH

V

MINVMAXVMIN

V

MAX

V

MIN

V

MAX

V

MAX

V

MIN

mA mA

LVTTL n/a n/a -0.3 0.8 2.2 V

CCIO

+ 0.3 0.4 2.4 2.0 -2.0

LVCMOS2 n/a n/a -0.3 0.7 1.7 V

CCIO

+ 0.3 0.7 1.7 2.0 -2.0

LVCMOS18 n/a n/a -0.3 0.63 1.2 V

CCIO

+ 0.3 0.7 1.7 2.0 -2.0

GTL+ 0.88 1.12 -0.3 INREF - 0.2 INREF + 0.2 V

CCIO

+ 0.3 0.6 n/a 40 n/a

PCI n/a n/a -0.3 0.3 x V

CCIO

0.5 x V

CCIO

V

CCIO

+ 0.5 0.1 x V

CCIO

0.9 x V

CCIO

1.5 -0.5

SSTL2 1.15 1.35 -0.3 INREF - 0.18 INREF + 0.18 V

CCIO

+ 0.3 0.74 1.76 7.6 -7.6

SSTL3 1.3 1.7 -0.3 INREF

- 0.2 INREF + 0.2 V

CCIO

+ 0.3 1.10 1.90 8 -8

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

19

NOTE:

All CLK and IOCTRL pins are clamped to the V

ded

rail. Therefore, these pins can be

driven up to V

ded

+ 0.3 V.

Package Thermal Characteristics

Thermal Resistance Equations:

θ

JC

= (TJ - TC)/P

θ

JA

= (TJ - TA)/P

P

MAX

= (T

JMAX

- T

AMAX

)/

θ

JA

Parameter Description:

θ

JC

: Junction-to-case thermal resistance

θ

JA

: Junction-to-ambient thermal resistance

T

J

: Junction temperature

T

A

: Ambient temperature P: Power dissipated by the device while operating P

MAX

: The maximum power dissipation for the device

T

JMAX

: Maximum junction temperature

T

AMAX

: Maximum ambient temperature

NOTE:

Maximum junction temperature (T

JMAX

) is 150º C. To calculate the maximum power

dissipation for a device package look up

θ

JA

from Table 20, pick an appropriate T

AMAX

and use:

P

MAX

= (150º C - T

AMAX

)/

θ

JA

a. The data provided in Table 19 are JEDEC and PCI Specifications. QuickLogic devices ei-

ther meet or exceed these requirements. See preceding Table 1 through Table 14 and

Figure 1 through Figure 17 for data specific to QuickLogic I/Os.

Table 20: Package Thermal Characteristics

Package Description θJA (º C/W) @ various flow rates (m/sec) θ

JC

(º C/W)

Pin Count Package Type 0 0.5 1 2

484 PBGA 28.0 26.0 25.0 23.0 9.0 280 LF-PBGA 18.5 17.0 15.5 14.0 7.0 208 PQFP 26.0 24.5 23.0 22.0 11.0

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

20

Kv and Kt Graphs

Figure 18: Voltage Factor vs. Supply Voltage

Figure 19: Te mperature Factor vs. Operating Temperature

Voltage Factor vs. Supply Voltage

0.9200

0.9400

0.9600

0.9800

1.0000

1.0200

1.0400

1.0600

1.0800

1.1000

2.25 2.3 2.35 2.4 2.45 2.5 2.55 2.6 2.65 2.7 2.75

Supply Voltage (V)

Kv

Temperatur e Factor vs. Operating Temperature

0.85

0.90

0.95

1.00

1.05

1.10

1.15

-60 -40 -20 0 20 40 60 80

Junction Temperature C

Kt

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

21

Power vs. Operating Frequency

The basic power equation which best models power consumption is given below:

P

TOTAL

= 0.350 + f[0.0031

η

LC

+ 0.0948

η

CKBF

+ 0.01

η

CLBF

+ 0.0263

η

CKLD

+

0.543

η

RAM

+ 0.20

η

PLL

+ 0.0035

η

INP

+ 0.0257

η

OUTP

] (mW)

Where

•

η

LC

is the total number of logic cells in the design

•

η

CKBF

= # of clock buffers

•

η

CLBF

= # of column clock buffers

•

η

CKLD

= # of loads connected to the column clock buffers

•

η

RAM

= # of RAM blocks

•

η

PLL

= # of PLLs

•

η

INP

is the number of input pins

•

η

OUTP

is the number of output pins

NOTE:

To learn more about power consumption, please refer to Application Note #60.

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

22

Power-up Sequencing

Figure 20: Power-up Requirements

The following requirements must be met when powering up a device (refer to Figure 20):

•

When ramping up the power supplies keep (V

CCIO

-VCC)

MAX

≤ 500 mV . Deviation from this

recommendation can cause permanent damage to the device.

•

V

CCIO

must lead VCC when ramping the device.

•

The power supply must be greater than or equal to 400 µs to reach VCC. Ramping to V

CC/VCCIO

before reaching 400 µs can cause the device to behave improperly.

Voltage

V

CCIO

V

CC

(V

CCIO

-VCC)

MAX

400 us

V

CC

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

23

Joint Test Access Group (JTAG)

Figure 21: JTAG Block Diagram

Microprocessors and Application Specific Integrated Circuits (ASICs) pose many design challenges, one problem being the accessibility of test points. The Joint Test Access Group (JT AG) formed in response to this challenge, resulting in IEEE standard 1149.1, the Standard T est Access Port and Boundary Scan Architecture.

The JTAG boundary scan test methodology allows complete observation and control of the boundary pins of a JTAG-compatible device through JTAG software. A Test Access Port (TAP) controller works in concert with the Instruction Register (IR), which allow users to run three required tests along with several user-defined tests.

JTAG tests allow users to reduce system debug time, reuse test platforms and tools, and reuse subsystem tests for fuller verification of higher level system elements.

TCK

TMS

TRSTB

RDI

TDO

Instruction Decode

&

Control Logic

TAp Controller

State Machine

(16 States)

Instruction Register

Boundary-Scan Register

(Data Register)

Mux

Bypass

Register

Mux

Internal

Register

I/O Registers

User Defined Data Register

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

24

The 1149.1 standard requires the following three tests:

•

Extest Instruction. The Extest instruction performs a PCB interconnect test. This test

places a device into an external boundary test mode, selecting the boundary scan register to be connected between the T AP's T est Data In (TDI) and T est Data Out (TDO) pins. Boundary scan cells are preloaded with test patterns (via the Sample/Preload Instruction), and input boundary cells capture the input data for analysis.

•

Sample/Preload Instruction. This instruction allows a device to remain in its functional

mode, while selecting the boundary scan register to be connected between the TDI and TDO pins. For this test, the boundary scan register can be accessed via a data scan operation, allowing users to sample the functional data entering and leaving the device.

•

Bypass Instruction. The Bypass instruction allows data to skip a device's boundary scan

entirely, so the data passes through the bypass register. The Bypass instruction allows users to test a device without passing through other devices. The bypass register is connected between the TDI and TDO pins, allowing serial data to be transferred through a device without affecting the operation of the device.

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

25

Pin Descriptions

Figure 22: I/O Banks with Relevant Pins

Table 21: JTAG Pin Descriptions

Pin Function Description

TDI/RSI

Test Data In for JTAG/RAM init. Serial Data In

Hold HIGH during normal operation. Connects to serial PROM data in for RAM initialization. Connect to V

CC

if unused

TRSTB/RRO

Active low Reset for JTAG/RAM init. reset out

Hold LOW during normal operation. Connects to serial PROM reset for RAM initialization. Connect to GND if unused

TMS Test Mode Select for JTAG

Hold HIGH during normal operation. Connect to V

CC

if not used

for JTAG

TCK Test Clock for JTAG

Hold HIGH or LOW during normal operation. Connect to VCC or ground if not used for JTAG

TDO/RCO

Test data out for JTAG/RAM init. clock out

Connect to serial PROM clock for RAM initialization. Must be left unconnected if not used for JTAG or RAM initialization

IO BANK A IO BANK B

V

CCIO

(A)

INREF(A)

IOCTRL(A)

IO(A)

V

CCIO

(A)

INREF(A)

IOCTRL(A)

IO(A)

IO BANK C IO BANK D

V

CCIO

(C)

INREF(C)

IOCTRL(C)

IO(C)

V

CCIO

(D)

INREF(D)

IOCTRL(D)

IO(D)

IO BANK F IO BANK E

V

CCIO

(F)

INREF(F)

IOCTRL(F)

IO(F)

V

CCIO

(E)

INREF(E)

IOCTRL(E)

IO(E)

IO BANK HIO BANK G

(H)

INREF(H)

IOCTRL(H)

IO(H)

V

CCIO

V

CCIO

(G)

INREF(G)

IOCTRL(G)

IO(G)

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

26

Table 22: Dedicated Pin Descriptions

Pin Function Description

GCLK Global clock network driver

Low skew global clock. This pin provides access to a dedicated, distributed network capable of driving the CLOCK, SET, RESET, F1, and A2 inputs to the Logic Cell, READ, and WRITE CLOCKS, Read and Write Enables of the Embedded RAM Blocks, CLOCK of the ECUs, and Output Enables of the I/Os.

I/O(A) Input/Output pin

The I/O pin is a bi-directional pin, configurable to either an inputonly, output-only, or bi-directional pin. The A inside the parenthesis means that the I/O is located in Bank A. If an I/O is not used, SpDE (QuickWorks Tool) provides the option of tying that pin to GND, V

CC,

or TriState during programming.

V

CC

Power supply pin Connect to 2.5 V supply

V

CCIO

(A) Input voltage tolerance pin

This pin provides the flexibility to interface the device with either a

3.3 V , 2.5 V , or 1.8 V device. The A inside the parenthesis means that V

CCIO

is located in BANK A. Every I/O pin in Bank A will be

tolerant of V

CCIO

input signals and will output V

CCIO

level signals.

This pin must be connected to either 3.3 V, 2.5 V, or 1.8 V.

GND Ground pin Connect to ground

PLLIN PLL clock input Clock input for PLL

DEDCLK Dedicated clock pin

Low skew global clock. This pin provides access to a dedicated, distributed clock network capable of driving the CLOCK inputs of all sequential elements of the device (e.g. RAM, Flip Flops).

GNDPLL Ground pin for PLL Connect to GND

INREF(A) Differential reference voltage

The INREF is the reference voltage pin for GTL+, SSTL2, and STTL3 standards. Follow the recommendations provided in

Table 19

for the appropriate standard. The A inside the parenthesis means that INREF is located in BANK A. This pin should be tied to GND if not needed.

PLLOUT PLL output pin Dedicated PLL output pin; otherwise, may be left unconnected

IOCTRL(A) Highdrive input

This pin provides fast RESET , SET, CLOCK, and ENABLE access to the I/O cell flip-flops, providing fast clock-to-out and fast I/O response times. This pin can also double as a high-drive pin to the internal logic cells. The A inside the parenthesis means that IOCTRL is located in Bank A. There is an internal pulldown resistor to Ground on this pin. This pin should be tied to Ground if it is not used. For backwards compatibility with Eclipse, it can be tied to Vcc or Ground. If tied to Vcc, it will draw no more than 20 µA per IOCTRL pin due to the pulldown resistor.

(Sheet 1 of 2)

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

27

Vpump Charge Pump Disable

This pin disables the internal charge pump for lower static power operation. T o disable the charge pump, connect Vpump to 3.3 V. If the Disable Charge Pump feature is not used, connect Vpump to Ground. For backwards compatibility with Eclipse and EclipsePlus devices, connect Vpump to Ground.

Vded

Voltage tolerance for clocks, JTAG, and IOCTRL/V oltage Drive for PLLOUT and JTAG pins

This pin specifies the input voltage tolerance for CLK, JT AG, and IOCTRL dedicated input pins, as well as the output voltage drive for PLLOUT and JTAG pins. If the PLLs are used, Vded must be the same as V

CC

PLL. For backwards compatibility with Eclipse and

EclipsePlus devices, connect Vded to 2.5 V.

VccPLL Power Supply pin for PLL

Connect to 2.5 V supply or 3.3 V supply. For backwards compatibility with Eclipse and EclipsePlus devices, connect to

2.5 V.

Table 22: Dedicated Pin Descriptions

Pin Function Description

(Sheet 2 of 2)

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

28

Recommended Unused Pin Terminations for the Eclipse-E Devices

All unused, general purpose I/O pins can be tied to VCC, GND, or HIZ (high impedance) internally using the Configuration Editor. This option is given in the bottom-right corner of the placement window. T o use the Placement Editor, choose Constraint

>

Fix Placement in the Option pull-

down menu of SpDE. The rest of the pins should be terminated at the board level in the manner presented in Table 23.

208 PQFP Pinout Diagram

Table 23: Recommended Unu sed Pin Terminations

Signal Name Recommended Termination

PLLOUT<x>

a

a. x represents a number.

Unused PLL output pins must be connected to either VCC or GND so that their associated input buffer never floats. Utilized PLL output pins that route the PLL clock outside of the chip should not be tied to either V

CC

or GND.

IOCTRL<y>

b

b. y represents an aphabetical character.

Any unused pins of this type must be connected to either VCC or GND.

CLK/PLLIN<x> Any unused clock pins should be connected to V

CC

or GND.

PLLRST<x>

If a PLL module is not used, then the associated PLLRST<x> must be connected to VCC, under normal operation use it as needed.

INREF<y>

If an I/O bank does not require the use of INREF signal the pin should be connected to GND.

Eclipse-E

QL6325-E-6PQ208C

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

29

208 PQFP Pinout Table

Table 24: 208 PQFP Pinout Table

PQFP Function PQFP Function PQFP Function PQFP Function PQFP Function

1

PLLRST(3)

43

IO(B)

85

IO(D)

127

CLK(5),PLLIN(3)

169

IOCTRL(G)

2

V

CCPLL

(3)

44

V

CCIO

(B)

86

V

CC

128

CLK(6)

170

INREF(G)

3

GND

45

IO(B)

87

IO(D)

129

Vded

171

IOCTRL(G)

4

GND

46

V

CC

88

IO(D)

130

CLK(7)

172

IO(G)

5

IO(A)

47

IO(B)

89

V

CC

131

V

CC

173

IO(G)

6

IO(A)

48

IO(B)

90

IO(D)

132

CLK(8)

174

IO(V)

7

IO(A)

49

GND

91

IO(D)

133

TMS

175

V

CC

8

V

CCIO

(A)

50

TDO

92

IOCTRL(D)

134

IO(F)

176

IO(G)

9

IO(A)

51

PLLOUT(1)

93

INREF(D)

135

IO(F)

177

V

CCIO

(G)

10

IO(A)

52

GNDPLL(2)

94

IOCTRL(D)

136

IO(F)

178

GND

11

IOCTRL(A)

53

GND

95

IO(D)

137

GND

179

IO(G)

12

V

CC

54

V

CCPLL

(2)

96

IO(D)

138

V

CCIO

(F)

180

IO(G)

13

INREF(A)

55

PLLRST(2)

97

IO(D)

139

IO(F)

181

IO(G)

14

IOCTRL(A)

56

V

CC

98

V

CCIO

(D)

140

IO(F)

182

V

CC

15

IO(A)

57

IO(C)

99

IO(D)

141

IO(F)

183

TCK

16

IO(A)

58

GND

100

IO(D)

142

IO(F)

184

V

CC

17

IO(A)

59

IO(C)

101

Vpump

143

IO(F)

185

IO(H)

18

IO(A)

60

V

CCIO

(C)

102

PLLOUT(0)

144

IOCTRL(F)

186

IO(H)

19

V

CCIO

(A)

61

IO(C)

103

GND

145

INREF(F)

187

IO(H)

20

IO(A)

62

IO(C)

104

GNDPLL(1)

146

V

CC

188

GND

21

GND

63

IO(C)

105

PLLRST(1)

147

IOCTRL(F)

189

V

CCIO

(H)

22

IO(A)

64

IO(C)

106

V

CCPLL

(1)

148

IO(F)

190

IO(H)

23

TDI

65

IO(C)

107

IO(E)

149

IO(F)

191

IO(H)

24

CLK(0)

66

IO(C)

108

GND

150

V

CCIO

(F)

192

IOCTRL(H)

25

CLK(1)

67

IOCTRL(C)

109

IO(E)

151

IO(F)

193

IO(H)

26

V

CC

68

INREF(C)

110

IO(E)

152

IO(F)

194

INREF(H)

27

CLK(2),PLLIN(2)

69

IOCTRL(C)

111

V

CCIO

(E)

153

GND

195

V

CC

28

CLK(3),PLLIN(1)

70

IO(C)

112

IO(E)

154

IO(F)

196

IOCTRL(H)

29

Vded

71

IO(C)

113

V

CC

155

PLLOUT(3)

197

IO(H)

30

CLK(4),

DEDCLK,PLLIN(0)

72

V

CCIO

(C)

114

IO(E)

156

GNDPLL(0)

198

IO(H)

31

IO(B)

73

IO(C)

115

IO(E)

157

GND

199

IO(H)

32

IO(B)

74

IO(C)

116

IO(E)

158

V

CCPLL

(0)

200

IO(H)

33

GND

75

GND

117

IOCTRL(E)

159

PLLRST(0)

201

IO(H)

34

V

CCIO

(B)

76

V

CC

118

INREF(E)

160

GND

202

IO(H)

35

IO(B)

77

IO(C)

119

IOCTRL(E)

161

IO(G)

203

V

CCIO

(H)

36

IO(B)

78

TRSTB

120

IO(E)

162

V

CCIO

(G)

204

GND

37

IO(B)

79

V

CC

121

IO(E)

163

IO(G)

205

IO(H)

38

IO(B)

80

IO(D)

122

V

CCIO

(E)

164

IO(G)

206

PLLOUT(2)

39

IOCTRL(B)

81

IO(D)

123

GND

165

V

CC

207

GND

40

INREF(B)

82

IO(D)

124

IO(E)

166

IO(G)

208

GNDPLL(3)

41

IOCTRL(B)

83

GND

125

IO(E)

167

IO(G)

42

IO(B)

84

V

CCIO

(D)

126

IO(E)

168

IO(G)

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

30

280 PBGA Pinout Diagram

Top

Bottom

Eclipse-E

QL6325-E-6PT280C

Pin A1 Corner

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•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

31

280 PBGA Pinout Table

Table 25: 280 PBGA Pinout Table

PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function

A1

PLLOUT<3>

C10

CLK<5>

/PLLIN<3>

E19

IOCTRL<D>

K16

I/O<C>

R4

I/O<H>

U13

I/O

A2

GNDPLL<0>

C11

V

CCIO

<E>

F1

INREF<G>

K17

I/O<D>

R5

GND

U14

IOCTRL

A3

I/O<F>

C12

I/O<E>

F2

IOCTRL<G>

K18

I/O<C>

R6

GND

U15

V

CCIO

A4

I/O<F>

C13

I/O<E>

F3

I/O<G>

K19

TRSTB

R7

V

CC

U16

I/O

A5

I/O<F>

C14

I/O<E>

F4

I/O<G>

L1

I/O<H>

R8

V

CC

U17

TDO

A6

IOCTRL<F>

C15

V

CCIO

<E>

F5

GND

L2

I/O<H>

R9

GND

U18

PLLRST<2>

A7

I/O<F>

C16

I/O<E>

F15

V

CC

L3

V

CCIO

<H>

R10

GND

U19

I/O

A8

I/O<F>

C17

I/O<E>

F16

IOCTRL<D>

L4

I/O<H>

R11

V

CC

V1

PLLOUT<2>

A9

I/O<F>

C18

I/O<E>

F17

I/O<D>

L5

V

CC

R12

V

CC

V2

GNDPLL<3>

A10

CLK<7>

C19

I/O<E>

F18

I/O<D>

L15

GND

R13

V

CC

V3

GND

A11

I/O<E>

D1

I/O<G>

F19

I/O<D>

L16

I/O<C>

R14

Vded

V4

I/O<A>

A12

I/O<E>

D2

I/O<G>

G1

I/O<G>

L17

V

CCIO

<C>

R15

GND

V5

I/O<A>

A13

I/O<E>

D3

I/O<F>

G2

I/O<G>

L18

I/O<C>

R16

I/O<C>

V6

IOCTRL<A>

A14

IOCTRL<E>

D4

I/O<F>

G3

IOCTRL<G>

L19

I/O<C>

R17

V

CCIO

<C>

V7

I/O<A>

A15

I/O<E>

D5

I/O<F>

G4

I/O<G>

M1

I/O<H>

R18

I/O<C>

V8

I/O<A>

A16

I/O<E>

D6

I/O<F>

G5

V

CC

M2

I/O<H>

R19

I/O<C>

V9

I/O<A>

A17

I/O<E>

D7

I/O<F>

G15

V

CC

M3

I/O<H>

T1

I/O<H>

V10

CLK<1>

A18

PLLRST<1>

D8

I/O<F>

G16

I/O<D>

M4

I/O<H>

T2

I/O<H>

V11

CLK<4>

DEDCLK/PLLIN<0>

A19

GND

D9

CLK<8>

G17

I/O<D>

M5

V

CC

T3

I/O<A>

V12

I/O

B1

PLLRST<0>

D10

I/O<E>

G18

I/O<D>

M15

V

CC

T4

I/O<A>

V13

I/O

B2

GND

D11

I/O<E>

G19

I/O<D>

M16

INREF<C>

T5

I/O<A>

V14

INREF

B3

I/O<F>

D12

I/O<E>

H1

I/O<G>

M17

I/O<C>

T6

IOCTRL<A>

V15

I/O

B4

I/O<F>

D13

INREF<E>

H2

I/O<G>

M18

I/O<C>

T7

I/O<A>

V16

I/O

B5

I/O<F>

D14

I/O<E>

H3

I/O<G>

M19

I/O<C>

T8

I/O<A>

V17

I/O

B6

INREF<F>

D15

I/O<E>

H4

I/O<G>

N1

IOCTRL<H>

T9

I/O<A>

V18

GNDPLL<2>

B7

I/O<F>

D16

I/O<D>

H5

V

CC

N2

I/O<H>

T10

I/O<A>

V19

GND

B8

I/O<F>

D17

I/O<D>

H15

V

CC

N3

I/O<H>

T11

CLK<3>

/PLLIN<1>

W1

GND

B9

TMS

D18

I/O<D>

H16

V

CC

N4

I/O<H>

T12

I/O

W2

PLLRST<3>

B10

CLK<6>

D19

I/O<D>

H17

I/O<D>

N5

V

CC

T13

I/O

W3

I/O<A>

B11

I/O<E>

E1

I/O<G>

H18

I/O<D>

N15

V

CC

T14

I/O

W4

I/O<A>

B12

I/O<E>

E2

I/O<G>

H19

I/O<D>

N16

I/O<C>

T15

I/O

W5

I/O<A>

B13

IOCTRL<E>

E3

V

CCIO

<G>

J1

I/O<G>

N17

I/O<C>

T16

I/O

W6

I/O<A>

B14

I/O<E>

E4

I/O<F>

J2

I/O<G>

N18

IOCTRL<C>

T17

V

CCPLL

<2>

W7

I/O<A>

B15

I/O<E>

E5

GND

J3

V

CCIO

<G>

N19

IOCTRL<C>

T18

I/O

W8

I/O<A>

B16

I/O<E>

E6

V

CC

J4

I/O<G>

P1

I/O<H>

T19

I/O

W9

TDI

B17

V

CCPLL

<1>

E7

V

CC

J5

GND

P2

I/O<H>

U1

I/O<A>

W10

CLK<2>

/PLLIN<2>

B18

GNDPLL<1>

E8

Vded

J15

V

CC

P3

IOCTRL<H>

U2

I/O<A>

W11

I/O

B19

PLLOUT<0>

E9

V

CC

J16

I/O<C>

P4

INREF<H>

U3

V

CCPLL

<3>

W12

I/O

C1

I/O<F>

E10

GND

J17

V

CCIO

<D>

P5

V

CC

U4

I/O<A>

W13

I/O

C2

V

CCPLL

<0>

E11

GND

J18

I/O<D>

P15

GND

U5

V

CCIO

<A>

W14

IOCTRL

C3

I/O<F>

E12

V

CC

J19

I/O<D>

P16

I/O<C>

U6

INREF<A>

W15

I/O

C4

I/O<F>

E13

V

CC

K1

V

CC

P17

I/O<C>

U7

I/O<A>

W16

I/O

C5

V

CCIO

<F>

E14

GND

K2

TCK

P18

I/O<C>

U8

I/O<A>

W17

I/O

C6

IOCTRL<F>

E15

Vpump

K3

I/O<G>

P19

I/O<C>

U9

V

CCIO

<A>

W18

I/O

C7

I/O<F>

E16

I/O<D>

K4

I/O<G>

R1

I/O<H>

U10

CLK<0>

W19

PLLOUT<1>

C8

I/O<F>

E17

V

CCIO

<D>

K5

GND

R2

I/O<H>

U11

V

CCIO

C9

V

CCIO

<F>

E18

INREF<D>

K15

GND

R3

V

CCIO

<H>

U12

I/O

www.quicklogic.com

•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

32

484 PBGA Pinout Diagram

Top

Bottom

Eclipse-E

QL6325-E-6PS484C

20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1

A B C

E

D

F G H

K

J

L M N

R

P

T U V

Y

W

22 21

AB

AA

Pin A1 Corner

Pin A1

www.quicklogic.com

•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

33

484 PBGA Pinout Table

Table 26: 484 PBGA Pinout Table

PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function

A1

I/O<A>

C1

I/O<A>

E1

IOCTRL<A>

G1

I/O<A>

J1

I/O<A>

L1

CLK<4>

DEDCLK/PLLIN<0>

A2

PLLRST<3>

C2

I/O<A>

E2

I/O<A>

G2

I/O<A>

J2

I/O<A>

L2

CLK<0>

A3

I/O<A>

C3

V

CCPLL

<3>

E3

I/O<A>

G3

I/O<A>

J3

I/O<A>

L3

CLK<2>/PLLIN<2>

A4

I/O<A>

C4

PLLOUT<2>

E4

I/O<A>

G4

I/O<A>

J4

I/O<A>

L4

I/O<A>

A5

I/O<A>

C5

I/O<A>

E5

I/O<A>

G5

I/O<A>

J5

I/O<A>

L5

I/O<A>

A6

I/O<H>

C6

I/O<H>

E6

I/O<H>

G6

I/O<A>

J6

I/O<A>

L6

I/O<A>

A7

I/O<H>

C7

I/O<H>

E7

N/C

G7

GND

J7

I/O<A>

L7

GND

A8

IOCTRL<H>

C8

I/O<H>

E8

I/O<H>

G8

I/O<H>

J8

V

CC

L8

GND

A9

I/O<H>

C9

IOCTRL<H>

E9

I/O<H>

G9

I/O<H>

J9

GND

L9

GND

A10

N/C

C10

I/O<H>

E10

I/O<H>

G10

I/O<H>

J10

V

CC

L10

GND

A11

N/C

C11

I/O<H>

E11

V

CC

G11

I/O<G>

J11

V

CC

L11

GND

A12

TCK

C12

I/O<H>

E12

I/O<G>

G12

GND

J12

GND

L12

GND

A13

I/O<G>

C13

I/O<G>

E13

I/O<G>

G13

I/O<G>

J13

V

CC

L13

GND

A14

I/O<G>

C14

I/O<G>

E14

I/O<G>

G14

I/O<G>

J14

GND

L14

V

CC

A15

I/O<G>

C15

I/O<G>

E15

IOCTRL<G>

G15

I/O<G>

J15

V

CC

L15

V

CC

A16

I/O<G>

C16

I/O<G>

E16

I/O<G>

G16

Vpump

J16

I/O<F>

L16

CLK<6>

A17

I/O<G>

C17

I/O<G>

E17

INREF<G>

G17

V

CCIO

<F>

J17

V

CCIO

<F>

L17

V

CCIO

<F>

A18

I/O<G>

C18

I/O<G>

E18

I/O<G>

G18

I/O<F>

J18

I/O<F>

L18

I/O<F>

A19

I/O<F>

C19

I/O<F>

E19

I/O<F>

G19

I/O<F>

J19

I/O<F>

L19

CLK<8>

A20

GND

C20

GNDPLL<0>

E20

I/O<F>

G20

I/O<F>

J20

I/O<F>

L20

I/O<F>

A21

PLLOUT<3>

C21

I/O<F>

E21

I/O<F>

G21

INREF<F>

J21

I/O<F>

L21

I/O<F>

A22

I/O<F>

C22

I/O<F>

E22

I/O<F>

G22

I/O<F>

J22

I/O<F>

L22

I/O<F>

B1

I/O<A>

D1

I/O<A>

F1

I/O<A>

H1

I/O<A>

K1

TDI

M1

I/O

B2

GND

D2

I/O<A>

F2

INREF<A>

H2

I/O<A>

K2

I/O<A>

M2

I/O

B3

GNDPLL<3>

D3

I/O<A>

F3

I/O<A>

H3

I/O<A>

K3

I/O<A>

M3

I/O

B4

GND

D4

I/O<A>

F4

I/O<A>

H4

I/O<A>

K4

I/O<A>

M4

CLK<3>/PLLIN<1>

B5

I/O<A>

D5

I/O<A>

F5

I/O<A>

H5

IOCTRL<A>

K5

I/O<A>

M5

I/O

B6

I/O<H>

D6

I/O<H>

F6

V

CCIO

<A>

H6

V

CCIO

<A>

K6

V

CCIO

<A>

M6

V

CCIO

B7

I/O<H>

D7

I/O<H>

F7

V

CCIO

<H>

H7

I/O<H>

K7

I/O<A>

M7

CLK<1>

B8

INREF<H>

D8

I/O<H>

F8

I/O<H>

H8

GND

K8

V

CC

M8

V

CC

B9

I/O<H>

D9

I/O<H>

F9

V

CCIO

<H>

H9

V

CC

K9

V

CC

M9

V

CC

B10

I/O<H>

D10

I/O<H>

F10

I/O<H>

H10

V

CC

K10

GND

M10

GND

B11

I/O<H>

D11

I/O<H>

F11

V

CCIO

<H>

H11

V

ded

K11

GND

M11

GND

B12

N/C

D12

I/O<G>

F12

V

CCIO

<G>

H12

GND

K12

GND

M12

GND

B13

N/C

D13

I/O<G>

F13

I/O<G>

H13

V

CC

K13

GND

M13

GND

B14

N/C

D14

I/O<G>

F14

V

CCIO

<G>

H14

V

CC

K14

V

CC

M14

GND

B15

I/O<G>

D15

IOCTRL<G>

F15

N/C

H15

GND

K15

V

CC

M15

GND

B16

I/O<G>

D16

I/O<G>

F16

V

CCIO

<G>

H16

I/O<F>

K16

I/O<F>

M16

GND

B17

I/O<G>

D17

I/O<G>

F17

N/C

H17

I/O<F>

K17

I/O<F>

M17

I/O<E>

B18

I/O<G>

D18

I/O<F>

F18

I/O<F>

H18

I/O<F>

K18

I/O<F>

M18

I/O<E>

B19

PLLRST<0>

D19

V

CCPLL

<0>

F19

I/O<F>

H19

I/O<F>

K19

I/O<F>

M19

I/O<E>

B20

I/O<F>

D20

I/O<F>

F20

IOCTRL<F>

H20

I/O<F>

K20

I/O<F>

M20

CLK<7>

B21

I/O<F>

D21

I/O<F>

F21

I/O<F>

H21

I/O<F>

K21

I/O<F>

M21

CLK<5>/PLLIN<3>

B22

I/O<F>

D22

I/O<F>

F22

IOCTRL<F>

H22

I/O<F>

K22

I/O<F>

M22

TMS

(Sheet 1 of 2)

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QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

34

N1

I/O

P16

I/O<E>

T9

N/C

V2

I/O

W17

I/O<D>

AA10

I/O<C>

N2

I/O

P17

I/O<E>

T10

TRSTB

V3

I/O

W18

I/O<E>

AA11

I/O<C>

N3

I/O

P18

I/O<E>

T11

GND

V4

I/O

W19

I/O<E>

AA12

I/O<D>

N4

I/O

P19

I/O<E>

T12

N/C

V5

I/O

W20

I/O<E>

AA13

I/O<D>

N5

I/O

P20

I/O<E>

T13

I/O<D>

V6

I/O<C>

W21

I/O<E>

AA14

I/O<D>

N6

I/O

P21

I/O<E>

T14

N/C

V7

I/O<C>

W22

I/O<E>

AA15

I/O<D>

N7

I/O

P22

I/O<E>

T15

I/O<D>

V8

I/O<C>

Y1

I/O

AA16

I/O<D>

N8

V

CC

R1

I/O

T16

GND

V9

N/C

Y2

I/O

AA17

I/O<D>

N9

V

CC

R2

INREF

T17

I/O<E>

V10

I/O<C>

Y3

V

CCPLL

<2>

AA18

I/O<D>

N10

GND

R3

I/O

T18

I/O<E>

V11

I/O<C>

Y4

I/O<C>

AA19

I/O<E>

N11

GND

R4

I/O

T19

I/O<E>

V12

V

CC

Y5

I/O<C>

AA20

GNDPLL<1>

N12

GND

R5

I/O

T20

I/O<E>

V13

N/C

Y6

I/O<C>

AA21

I/O<E>

N13

GND

R6

I/O

T21

IOCTRL<E>

V14

I/O<D>

Y7

I/O<C>

AA22

I/O<E>

N14

V

CC

R7

I/O

T22

I/O<E>

V15

I/O<D>

Y8

IOCTRL<C>

AB1

I/O

N15

V

CC

R8

GND

U1

IOCTRL

V16

INREF<D>

Y9

I/O<C>

AB2

GNDPLL<2>

N16

I/O<E>

R9

V

CC

U2

I/O

V17

I/O<D>

Y10

I/O<C>

AB3

PLLRST<2>

N17

V

CCIO

<E>

R10

V

CC

U3

IOCTRL

V18

I/O<E>

Y11

I/O<D>

AB4

I/O

N18

I/O<E>

R11

GND

U4

I/O

V19

I/O<E>

Y12

I/O<D>

AB5

I/O

N19

I/O<E>

R12

Vded

U5

I/O

V20

I/O<E>

Y13

I/O<D>

AB6

I/O<C>

N20

I/O<E>

R13

V

CC

U6

I/O<C>

V21

I/O<E>

Y14

I/O<D>

AB7

I/O<C>

N21

I/O<E>

R14

V

CC

U7

V

CCIO

<C>

V22

I/O<E>

Y15

IOCTRL<D>

AB8

IOCTRL<C>

N22

I/O<E>

R15

GND

U8

N/C

W1

I/O

Y16

I/O<D>

AB9

I/O<C>

P1

I/O

R16

I/O<D>

U9

V

CCIO

<C>

W2

I/O

Y17

I/O<D>

AB10

I/O<C>

P2

I/O

R17

V

CCIO

<E>

U10

I/O<C>

W3

I/O

Y18

I/O<E>

AB11

I/O<C>

P3

I/O

R18

I/O<E>

U11

V

CCIO

<C>

W4

I/O

Y19

PLLOUT<0>

AB12

I/O<D>

P4

I/O

R19

I/O<E>

U12

V

CCIO

<D>

W5

I/O

Y20

PLLRST<1>

AB13

I/O<D>

P5

I/O

R20

I/O<E>

U13

I/O<D>

W6

I/O<C>

Y21

I/O<E>

AB14

I/O<D>

P6

V

CCIO

R21

I/O<E>

U14

V

CCIO

<D>

W7

N/C

Y22

I/O<E>

AB15

I/O<D>

P7

I/O

R22

I/O<E>

U15

N/C

W8

I/O<C>

AA1

TDO

AB16

IOCTRL<D>

P8

V

CC

T1

I/O

U16

V

CCIO

<D>

W9

I/O<C>

AA2

PLLOUT<1>

AB17

I/O<D>

P9

GND

T2

I/O

U17

V

CCIO

<E>

W10

I/O<C>

AA3

GND

AB18

I/O<D>

P10

V

CC

T3

I/O

U18

I/O<E>

W11

I/O<C>

AA4

I/O

AB19

I/O<E>

P11

GND

T4

I/O

U19

I/O<E>

W12

I/O<D>

AA5

I/O<C>

AB20

GND

P12

V

CC

T5

I/O

U20

IOCTRL<E>

W13

I/O<D>

AA6

I/O<C>

AB21

V

CCPLL

<1>

P13

V

CC

T6

V

CCIO

U21

I/O<E>

W14

I/O<D>

AA7

I/O<C>

AB22

I/O<E>

P14

GND

T7

GND

U22

INREF<E>

W15

I/O<D>

AA8

INREF<C>

P15

V

CC

T8

I/O<C>

V1

I/O

W16

N/C

AA9

I/O<C>

Table 26: 484 PBGA Pinout Table (Continued)

PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function PBGA Function

(Sheet 2 of 2)

www.quicklogic.com

•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

35

Ordering Information

Figure 23: Ordering Information

Contact Information

Telephone: 408 990 4000 (US)

416 497 8884 (Canada) 44 1932 57 9011 (Europe) 49 89 930 86 170 (Germany)

852 8106 9091 (Asia)

81 45 470 5525 (Japan) E-mail: info@quicklogic.com Support: support@quicklogic.com Web site: http://www.quicklogic.com/

Revision History

Table 27: Revision History

Revision Date Comments

A

December

2002

Brian Faith, Andreea Rotaru

QL 6325-E - 6 PQ208 C

QuickLogic device

Eclipse-E device

part number

Speed Grade

6 = Faster 7 = Fastest

Operating Range

C = Commercial

I = Industrial

M = Military

Package Code

PQ208 = 208-pin PQFP PT280 = 280-pin FPBGA (0.8 mm) PS484 = 484-pin BGA (1.0 mm)

www.quicklogic.com

•

QL6325-E Eclipse-E Data Sheet Rev A

Preliminary

36

Copyright and Trademark Information

The information contained in this document and the accompanying software programs is protected by copyright. All rights are reserved by QuickLogic Corporation. QuickLogic Corporation reserves the right to modify this document without any obligation to notify any person or entity of such revision. Copying, duplicating, selling, or otherwise distributing any part of this product without the prior written consent of an authorized representative of QuickLogic is prohibited.

QuickLogic and the QuickLogic logo, pASIC, Vi aLink, DeskFab, and Q uickW orks are registered trademarks of QuickLogic Corporation; Eclipse, QuickFC, QuickDSP, QuickDR, QuickSD, QuickT ools, QuickCore, QuickPro, SpDE, WebASIC, and W ebESP are trademarks of QuickLogic Corporation.

QUICK LOGIC QL6325-E-6PQ208C, QL6325-E-6PQ208I, QL6325-E-6PQ208M, QL6325-E-6PS484C, QL6325-E-6PS484I Datasheet

Specifications and Main Features

Frequently Asked Questions

User Manual