0.5 to 3 ±0.2
over 3 to 6 ±0.3
over 6 to 30 ±0.5
over 30 to 120 ±0.8
over 120 to 400 ±1.2
The tolerance of size between
terminals is assumed to ±0.4
BC
BA
Y
10 912 1114 1316 1518 1720 19
8
7
6
5
AC
AD
AE
AR
AS
AP
DETAIL "A"
AW
AX
DETAIL "C"
Y
B
AQ
K
AE
AM
AZ
AY
Y
AL
AJ
Outline Drawing and Circuit Diagram
Dimensions Inches Millimeters
A 5.39 136.9
B 2.44 62.0
C 0.67+0.04/-0.02 17.0+1.0/-0.5
D 4.79 121.7
E 0.45 11.5
F 4.33±0.02 110.0±0.5
G 3.72 94.5
H 0.53 13.5
J 0.23 5.9
K 0.30 7.75
L 0.53 13.64
M 3.02 77.1
N 1.53 39.0
P 0.87 22.0
Q 0.65 16.5
R 0.55 14.0
S 0.47 12.0
T 0.24 6.0
U 0.31 8.0
V 0.37 6.5
W 0.61 15.64
X 0.81 20.71
Y 0.15±0.008 3.81±0.2
Z 0.9 22.86
AA 0.14 3.5
AB 0.22 Dia. 5.5 Dia.
Dimensions Inches Millimeters
AC 1.97±0.02 50.0±0.5
AD 2.26 57.5
AE 0.14 3.75
AF M5 M5
AG 0.27 7.0
AH 0.67 17.0
AJ 0.44±0.008 11.67±0.2
AK 0.81 20.5
AL 0.60±0.008 15.24±0.2
AM 0.12 3.0
AN 0.53 13.4
AP 0.49 12.5
AQ 0.18 Dia. 4.5 Dia.
AR 0.102 Dia. 2.6 Dia.
AS 0.088 Dia. 2.25 Dia.
AT 0.05 1.2
AU 0.02 0.65
AV 0.04 1.15
AW 0.54 13.7
AX 0.51 13.0
AY 0.75 19.12
AZ 0.021±0.008 0.55±0.2
BA 0.28±0.008 7.24±0.2
BB 0.43±0.008 11.42±0.2
BC 0.46±0.008 11.8±0.2
BD 0.15 3.81
BE 0.18 4.5
AW
Six IGBT + Brake
NX-Series Module
75 Amperes/1700 Volts
45°
AE
AK
AX
AG
Description:
Powerex IGBT Modules are
J
AN
designed for use in switching
applications. Each module
consists of six IGBT Transistors in
a three phase bridge configuration
and a seventh IGBT with freewheel diode for dynamic braking.
All components and interconnects
are isolated from the heat sinking
baseplate, offering simplified
system assembly and thermal
management.
Features:
£ Low Drive Power
£ Low V
CE(sat)
£ Discrete Super-Fast Recovery
Free-Wheel Diode
£ Isolated Baseplate for Easy
Heat Sinking
Applications:
£ AC Motor Control
£ Motion/Servo Control
£ Photovoltaic/Fuel Cell
Ordering Information:
Example: Select the complete
module number you desire from
the table below -i.e.
CM75RX-34SA is a 1700V (V
Absolute Maximum Ratings, Tj = 25°C unless otherwise specied
Inverter Part IGBT/Diode
Characteristics Symbol Rating Units
Collector-Emitter Voltage (VGE = 0V) V
Gate-Emitter Voltage (VCE = 0V) V
Collector Current (DC, TC = 125°C)
*2,*4
IC 75 Amperes
Collector Current (Pulse, Repetitive)*3 I
Total Power Dissipation (TC = 25°C)
*2,*4
P
Emitter Current*2 I
Emitter Current (Pulse, Repetitive)*3 I
1700 Volts
CES
±20 Volts
GES
150 Amperes
CRM
830 Watts
tot
*1
75 Amperes
E
*1
150 Amperes
ERM
Brake Part IGBT/Diode
Characteristics Symbol Rating Units
Collector-Emitter Voltage (VGE = 0V) V
Gate-Emitter Voltage (VCE = 0V) V
Collector Current (DC, TC = 125°C)
*2,*4
IC 50 Amperes
Collector Current (Pulse, Repetitive)*3 I
Total Power Dissipation (TC = 25°C)
*2,*4
P
Repetitive Peak Reverse Voltage (VGE = 0V) V
Forward Current*2 I
Forward Current (Pulse, Repetitive)*3 I
1700 Volts
CES
±20 Volts
GES
100 Amperes
CRM
600 Watts
tot
1700 Volts
RRM
*1
50 Amperes
F
*1
100 Amperes
FRM
Module
Characteristics Symbol Rating Units
Isolation Voltage (Terminals to Baseplate, RMS, f = 60Hz, AC 1 minute) V
Maximum Junction Temperature T
Maximum Case Temperature*4 T
Operating Junction Temperature, Continuous Operation (Under Switching) T
Storage Temperature T
*1 Represent ratings and characteristics of the anti-parallel, emitter-to-collector free wheeling
diode (FWDi).
*2 Junction temperature (Tj) should not increase beyond maximum junction
temperature (T
*3 Pulse width and repetition rate should be such that device junction temperature (Tj)
does not exceed T
*4 Case temperature (TC) and heatsink temperature (Ts) is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance should be measured just under the chips.
j(max)
) rating.
j(max)
rating.
31.2
(Tr/UN, VN)
(Di/UP, VP, WP)
4000 Volts
ISO
175 °C
j(max)
125 °C
C(max)
-40 ~ +150 °C
j(op)
-40 ~ +125 °C
stg
99.0
22.9
33.7052.6
63.4
91.5
80.7
102.3
Tr
39.6
28.8
20.6
00
Tr
UP
Tr
Di
UN
UP
Di
UN
0
22.2
33.0
Each mark points to the center position of each chip.
Turn-on Switching Energy per Pulse Eon VCC = 1000V, IC = IE = 75A, — 17.1 — mJ
Turn-off Switching Energy per Pulse E
Reverse Recovery Energy per Pulse E
Internal Lead Resistance R
Per Switch,TC = 25°C
Internal Gate Resistance rg Per Switch — 0 — Ω
*1 Represent ratings and characteristics of the anti-parallel, emitter-to-collector free wheeling
diode (FWDi).
*4 Case temperature (TC) and heatsink temperature (Ts) is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance should be measured just under the chips.
*5 Pulse width and repetition rate should be such as to cause negligible temperature rise.
VCE = V
CES
VGE = V
GES
IC = 7.5mA, VCE = 10V 5.4 6.0 6.6 Volts
GE(th)
IC = 75A, VGE = 15V, Tj = 25°C*5 — 2.0 2.5 Volts
CE(sat)
IC = 75A, VGE = 15V, Tj = 25°C*5 — 1.9 2.4 Volts
CE(sat)
— — 20 nF
ies
VCE = 10V, VGE = 0V — — 1.6 nF
oes
— — 0.36 nF
res
— — 200 ns
d(on)
RG = 10Ω, Inductive Load — — 700 ns
d(off)
*1
IE = 75A, VGE = 0V, Tj = 25°C*5 — 4.1 5.3 Volts
EC
*1
IE = 75A, VGE = 0V, Tj = 25°C*5 — 4.0 5.2 Volts
EC
*1
VCC = 1000V, IE = 75A, VGE = ±15V — — 200 ns
rr
*1
RG = 10Ω, Inductive Load — 2.0 — µC
rr
VGE = ±15V, RG = 10Ω, — 23.0 — mJ
off
*1
Tj = 150°C, Inductive Load — 15.9 — mJ
rr
CC' + EE'
Main Terminals-Chip, — — 4.0 mΩ
, VGE = 0V — — 1.0 mA
CES
, VCE = 0V — — 0.5 µA
GES
*4
99.0
22.9
33.7052.6
Tr
39.6
31.2
(Tr/UN, VN)
28.8
(Di/UP, VP, WP)
20.6
00
Tr
VP
UP
Di
UP
Tr
Tr
Di
VN
UN
VP
Di
Di
VN
UN
63.4
80.7
Tr
WP
Di
WP
LABEL SIDE
91.5
102.3
Th
Tr
Di
WN
Br
Di
WN
Tr
Br
40.7
37.0
34.0
26.2
22.0
02/14 Rev. 1
0
Each mark points to the center position of each chip.
Turn-on Switching Energy per Pulse Eon VCC = 1000V, IC = IF = 50A, — 9.7 — mJ
Turn-off Switching Energy per Pulse E
Reverse Recovery Energy per Pulse E
Internal Gate Resistance rg — 0 — Ω
*1 Represent ratings and characteristics of the anti-parallel, emitter-to-collector free wheeling
diode (FWDi).
*4 Case temperature (TC) and heatsink temperature (Ts) is measured on the surface
(mounting side) of the baseplate and the heatsink side just under the chips.
Refer to the figure to the right for chip location.
The heatsink thermal resistance should be measured just under the chips.
*5 Pulse width and repetition rate should be such as to cause negligible temperature rise.
VCE = V
CES
VGE = V
GES
IC = 5mA, VCE = 10V 5.4 6.0 6.6 Volts
GE(th)
IC = 50A, VGE = 15V, Tj = 25°C*5 — 2.0 2.5 Volts
CE(sat)
IC = 50A, VGE = 15V, Tj = 25°C*5 — 1.9 2.4 Volts
CE(sat)
— — 13 nF
ies
VCE = 10V, VGE = 0V — — 1.1 nF
oes
— — 0.24 nF
res
— — 200 ns
d(on)
RG = 13Ω, Inductive Load — — 700 ns
d(off)
VR = V
RRM
*1
VCC = 1000V, IF = 50A, VGE = ±15V — — 200 ns
rr
*1
RG = 13Ω, Inductive Load — 1.3 — µC
rr
VGE = ±15V, RG = 13Ω, — 11.2 — mJ
off
*1
Tj = 150°C, Inductive Load — 9.8 — mJ
rr
, VGE = 0V — — 1.0 mA
CES
, VCE = 0V — — 0.5 µA
GES
, VGE = 0V — — 1.0 mA
RRM
99.0
22.9
33.7052.6
Tr
39.6
31.2
(Tr/UN, VN)
28.8
(Di/UP, VP, WP)
20.6
00
Tr
VP
UP
Di
UP
Tr
Tr
Di
VN
UN
VP
Di
Di
VN
UN
63.4
80.7
Tr
WP
Di
WP
LABEL SIDE
91.5
102.3
Th
Tr
Di
WN
Br
Di
WN
Tr
Br
40.7
37.0
34.0
26.2
22.0
0
Each mark points to the center position of each chip.