Feb.1999
Symbol
I
DRM
VTM
VFGT !
VRGT !
VRGT #
VFGT #
IFGT !
IRGT !
IRGT #
IFGT #
VGD
Rth (j-a)
(dv/dt)c
Test conditions
T
j=125°C, VDRM applied
T
c=25°C, ITM=1.2A, Instantaneous measurement
T
j=25°C, VD=6V, RL=6Ω, RG=330Ω
T
j=25°C, VD=6V, RL=6Ω, RG=330Ω
T
j=125°C, VD=1/2VDRM
Junction to case
✽4
Unit
mA
V
V
V
V
V
mA
mA
mA
mA
V
°C/W
V/µs
Typ.
—
—
—
—
—
—
—
—
—
—
—
—
—
!
@
#
$
!
@
#
$
✽2.Measurement using the gate trigger characteristics measurement circuit.
✽3.The critical-rate of rise of the off-state commutating voltage is shown in the table below.
✽4.Mounted on 25mm × 25mm × t0.7mm ceramic plate with solder.
Test conditions
Voltage
class
8
V
DRM
(V)
400
Unit
V/µs
Commutating voltage and current waveforms
(inductive load)
(dv/dt) c
Min.
2
MITSUBISHI SEMICONDUCTOR 〈TRIAC〉
BCR08AS-8
LOW POWER USE
NON-INSULATED TYPE, PLANAR PASSIVATION TYPE
ELECTRICAL CHARACTERISTICS
Parameter
Repetitive peak off-state current
On-state voltage
Gate trigger voltage
✽2
Gate trigger current
✽2
Gate non-trigger voltage
Thermal resistance
Critical-rate of rise of off-state
commutating voltage
1. Junction temperature
T
j=125°C
2. Rate of decay of on-state commutating current
(di/dt)
c=–0.4A/ms
3. Peak off-state voltage
V
D=400V
Limits
Min.
—
—
—
—
—
—
—
—
—
—
0.1
—
✽3
Max.
1.0
2.0
2.0
2.0
2.0
2.0
5
5
5
10
—
65
—
10
–1
10
1
7
5
3
2
012
10
0
7
5
3
2
345
4
4
Tj = 125°C
Tj = 25°C
10023 5710
1
4
2
23 5710
2
44
6
8
10
0
MAXIMUM ON-STATE CHARACTERISTICS
ON-STATE CURRENT (A)
ON-STATE VOLTAGE (V)
RATED SURGE ON-STATE CURRENT
SURGE ON-STATE CURRENT (A)
CONDUCTION TIME
(CYCLES AT 60Hz)