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PM5371 TUDX
DATA SHEET
PMC-920525ISSUE 6SONET/SDH TRIBUTARY UNIT CROSS CONNECT
1
FEATURES
•
A single stage, non-blocking array of time switches for cross-connecting
SONET virtual tributaries (VTs) or SDH tributary units (TUs).
•
Provides non-blocking switching between two STS-3 (STM-1) byte serial input
streams and two STS-3 (STM-1) byte serial output streams.
•
Operates from a single 19.44 MHz clock.
•
Provides parity checking on input data buses and parity generation on output
data buses.
•
Allows programmable idle code insertion on a per VT or per TU basis.
•
Permits switching of any combination of SONET VT1.5, VT2, VT3, VT6, or
STS-1 channels. Permits switching of any combination of SDH TU11, TU12,
TU2, or TU3 channels.
•
Operates in conjunction with the PM5361 TUDX SONET/SDH Tributary Unit
Payload Processor which aligns SONET VTs or SDH TUs such that they can
be switched by the TUDX.
•
Cascadable in a systolic or bused manner to allow larger switching arrays to
be implemented. Provides control outputs that are programmable on a per
timeslot basis to facilitate construction of larger switching arrays.
•
Provides programmable delay to match data skew in the systolic array
application.
•
Provides a generic 8-bit microprocessor bus interface for configuration,
control, and status monitoring.
•
Low power, +5 Volt, CMOS technology. Device has TTL compatible inputs
and outputs.
•
160 pin metric quad flat pack (MQFP) package.
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APPLICATIONS
•
SONET and SDH Wideband Cross-Connects
•
SONET and SDH Add-Drop and Terminal Multiplexers
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REFERENCES
1. American National Standard for Telecommunications - Digital Hierarchy -
Optical Interface Rates and Formats Specification, ANSI T1.105-1988.
2. Bell Communications Research - SONET Transport Systems: Common
Generic Criteria, TR-TSY-000253, Issue 1, September 1989.
3. CCITT Blue Book, Recommendation G.708 - "Netwo rk Node Interface For
The Synchronous Digital Hierarchy", Volume III, Fascicle III.4, 1988.
4. CCITT Blue Book, Recommendation G.709 - "Synchronous Multiplexing
Structure", Volume III, Fascicle III.4, 1988.
5. CCITT Study Group XVIII, Report R 33 - "Recommendations Drafted By
Working Party XVIII/7" (Digital Hierarchies) To Be Approved In 1990 Including
Revised Draft Recommendations G.708 and G.709", June 1990.
6. Bell Communications Research - SONET Transport Systems: Common
Generic Criteria, TA-NWT-000253, Issue 6, September 1990.
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APPLICATION EXAMPLES
Larger switching arrays can be constructed in a variety of manners using arrays
of TUDX devices. Systolic or bused interconnect methods can be used, or a
hybrid of the two approaches.
Figure 1- 2 X 2 TUDX Switch Array Using Systolic Interconnect
SINL
TUDX
DOUTL
SINL
TUDX
DOUTL
'0'
SINR
IFP
OFP
'15'
ODEB
DOUTR
SINR
IFP
OFP
'15'
ODEB
DOUTR
'0'
'0'
'0'
SINL
SINR
SCLK
SFP
TUDX
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
DOUTL
IFP
OFP
ODEB
DOUTR
'5''10'
SINL
SINR
SCLK
SFP
TUDX
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
DOUTL
IFP
OFP
ODEB
DOUTR
'5'
'10'
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
'15'
'15'
Systolic interconnect of TUDX devices is illustrated above. In this 2 x 2 array of
devices, PCM data is distributed left to right and gathered top to bottom with the
PCM data being re-timed as it passes through each device. Each PCM data bus
drives a single device, regardless of the size of the array and thus systolic
interconnect allows large arrays to be implemented without the use of additional
devices. In this example no systolic delay is required for the upper left hand and
lower right hand TUDX in the array. The Systolic Delay Control Register of the
lower left hand TUDX is programmed to insert a 5 clock period delay in the
DINT/DINB buses, and a 5 clock period delay in the DOUTL/DOUTR bu ses. The
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Systolic Delay Control Register of the upper right hand TUDX is programmed to
insert a 5 clock period delay in the SINL/SINR buses, and the SOUTT/SOUTB
buses.
Figure 2- 2 X 2 TUDX Switch Array Using Bused Interconnect
'5'
'0'
SINL
DOUTL
TUDX
SINR
OFP
IFP
ODEB
DOUTR
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
SINL
DOUTL
SINR
TUDX
DOUTR
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
'0'
SINL
DOUTL
SINR
TUDX
DOUTR
SINL
DOUTL
TUDX
SINR
OFP
IFP
ODEB
DOUTR
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
'5'
'0'
OFP
IFP
ODEB
'0'
OFP
IFP
ODEB
'5''5'
Bused interconnect of TUDX devices is illustrated above. In this 2 x 2 array of
devices, PCM data is distributed left to right on a common bus and gathered top
to bottom using a wired-OR type bus. Using this interconnect approach,
additional devices must be used to drive the distribution bus and sample the
wired-OR bus. To maximize the size of array that can be achieved using a wiredOR bus, the AOUTL and AOUTR buses may be parallel connected with the
DOUTL and DOUTR buses on a bit by bit basis in order to provide higher drive
levels. Due to the higher fan out of these buses, and the RC delay on the wiredOR bus, this approach cannot be extended to very large arrays without additional
circuitry. This bused array approach provides the minimum data delay through
the array (when a cross connection is made between the DINT/DINB buses and
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PMC-920525ISSUE 6SONET/SDH TRIBUTARY UNIT CROSS CONNECT
the DOUTL/DOUTR buses) of nominally 275 clock periods versus 285 clock
periods using the systolic array approach.
Figure 3- 2 X 2 TUDX Switch Array Using Hybrid Interconnect
'0'
'0'
'0'
SINL
SINR
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
TUDX
DOUTL
OFP
IFP
ODEB
DOUTR
'5'
SINL
SINR
SCLK
SFP
DINTSOUTT
DINB
OFSEB
SOBEBAOBEB
TUDX
DOUTL
OFP
IFP
SOUTB
ODEB
DOUTR
'0'
SINL
SINR
SCLK
SFP
DINTSOUTT
DINBSOUTB
OFSEB
SOBEBAOBEB
TUDX
DOUTL
OFP
IFP
ODEB
DOUTR
'5'
SINL
SINR
SCLK
SFP
DINTSOUTT
DINB
OFSEB
SOBEBAOBEB
TUDX
DOUTL
OFP
IFP
SOUTB
ODEB
DOUTR
'0'
'0'
'10''10'
A hybrid approach using a mix of bused and systolic interconnect of TUDX
devices is illustrated above. In this 2 x 2 array of devices, PCM data is distributed
left to right on a common bus and gathered top to bottom with the PCM data
being re-timed as it passes through each device. Using this interconnect
approach, additional devices must be used to drive the distribution buses. This
approach overcomes the RC delay of the wired-OR bus by using systolic
interconnect from top to bottom. In this example the Systolic Delay Control
registers in the two bottom TUDX devices are programmed to delay the
DINT/DINB buses by five clock periods to match the delay seen at the
SINL/SINR inputs to these devices.
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BLOCK DIAGRAM
Figure 4- Overall Device
INPUT BUS FORMATTER
INPUT
DINT[8:0]
DINB[8:0]
SCLK
PAGE
SOBEB
SFP
OFSEB
BUS
FORMATTER
SWITCHING
TIME
SWITCH
ELEMENT
TIME
SWITCH
SINL[8:0]
SINR[8:0]
SOUTT[8:0]
SWITCHING
TIME
SWITCH
ELEMENT
TIME
SWITCH
SOUTB[8:0]
IFP
OFP
MBEB
RSTB
CS1B
CS2B
RDB
WRB
ALE
A[4:0]
D[7:0]
INTB
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MICRO
INTERFACE
OUTPUT BUS FORMATTER
ODEB
AOBEB
DOUTL[8:0]
AOUTL[8:0]
COUTL
AOUTR[8:0]
DOUTR[8:0]
COUTR
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Figure 5- Each Switching Element
DINT[7:0]
DINB[7:0]
SCLK
SFP
PAGE
RSTB
TSTB
BSB
RDB
WRB
TRSB
A[1:0]
PCM
PCM
TIMING
TIMING
GENERATOR
READ ADDRESS
COMMON
BUS
INTERFACE
DATA
MEMORY
WRITE ADDRESS
CONNECTION
MEMORY
DATA
MEMORY
READ
ADDRESS
PCM
PCM
IDLE
CODE
OUTPUT
MUX
CONTROL
DOUT[7:0]
MAKE
COUT
D[7:0]
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PM5371 TUDX
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PMC-920525ISSUE 6SONET/SDH TRIBUTARY UNIT CROSS CONNECT
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DESCRIPTION
The PM5371 TUDX SONET/SDH Tributary Unit Cross-Connect is a monolithic
integrated circuit that allows non-blocking switching of tributaries within two
SONET STS-3 or SDH STM-1 streams. Any tributary entering on either stream
can be connected to any same size tributary within either outgoing stream. The
TUDX can be programmed to cross-connect a mix of SONET VT1.5, VT2, VT3,
VT6, or STS-1 channels or SDH TU11, TU12, TU2, or TU3 channels.
Programmable idle code can also be inserted into any of these channels. The
TUDX allows cross-connection of up to 168 VT1.5 or TU11 streams, up to 126
VT2 or TU12 streams, or up to 42 VT6 or TU2 streams or any legal mix as
permitted by the SONET or SDH mappings.
The TUDX operates in conjunction with the PM5361 TUPP SONET/SDH
Tributary Unit Payload Processor which aligns SONET VTs or SDH TUs such that
they can be switched by the TUDX. Larger switches can be constructed using
arrays of TUDX devices. The TUDX is cascadable in a systolic or bused manner
and provides programmable control outputs that are useful in constructing larger
switching arrays.
No high speed clocks are required as the TUDX operates from a single 19.44
MHz clock. Parity checking is provided on input data buses and parity generation
is provided on output data buses. The TUDX is configured, controlled and
monitored via a generic 8-bit microprocessor bus interface.
The TUDX is implemented in low power, +5 Volt, CMOS technology. It has TTL
compatible inputs and outputs and is packaged in a 160 pin metric quad flat pack
(MQFP) package.
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PIN 80
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PIN DESCRIPTION
Pin NameTypePin
Function
No.
SCLKInput97The system clock (SCLK) provides timing for TUDX
internal operation. SCLK is a 19.44 MHz, nominally
50% duty cycle clock.
VCLKThe test vector clock (VCLK) provides timing for TUDX
production test.
SFPInput42The system frame pulse (SFP) determines the frame
boundaries on the DINT[8:0] and DINB[8:0] buses
(and SINL[8:0] and SINR[8:0] buses) when OFSEB is
high. SFP determines the frame boundaries on the
SOUTT[8:0] and SOUTB[8:0] buses when OFSEB is
low. SFP must be brought high once every frame (125
µs) to mark the first C1 byte of the transport envelope
frame of the buses in question. In systolic
applications where OFSEB is high, SFP marks the C1
byte of the SINL[8:0] and SINR[8:0] buses (or the
DINT[8:0] and DINB[8:0] buses) after the
programmable systolic delay has been inserted. See
the Application Examples and Functional Timing
sections for more information. SFP is sampled on the
rising edge of SCLK.
OFSEBInput160The active low output frame synchronization enable
(OFSEB) signal selects the system frame alignment
marked by SFP. When OFSEB is high, SFP is
coincident with the input frame pulse (IFP). When
OFSEB is low, SFP is coincident with the output frame
pulse (OFP). In most applications, OFSEB should be
held high. The OFSEB input has an integral pull up
resistor.
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Pin NameTypePin
Function
No.
IFPOutput82The input frame pulse (IFP) marks the frame
boundaries on the DINT[8:0] and DINB[8:0] buses (or
SINL[8:0] and SINR[8:0] buses). IFP pulses high for a
single SCLK period to mark the first C1 byte of the
transport envelope frame of the buses in question. In
systolic array applications, IFP marks the frame
boundaries of the SINL[8:0] and SINR[8:0] buses (or
the DINT[8:0] and DINB[8:0] buses) after the
programmable systolic delay has been inserted. See
the Application Examples and Functional Timing
sections for more information. IFP is updated on the
rising edge of SCLK.
OFPOutput83The output frame pulse (OFP) marks the frame
boundaries on the SOUTT[8:0] and SOUTB[8:0]
buses. OFP pulses high for a single SCLK period to
mark the first C1 byte of the transport envelope frame.
OFP is updated on the rising edge of SCLK.
DINT[0]
DINT[1]
DINT[2]
DINT[3]
Input3
The top data input bus (DINT[8:0]) carries
4
5
6
SONET/SDH frame data in byte serial format. The
DINT[8] bit is a parity bit which is not passed through
the TUDX. The TUDX may be configured to check for
even or odd input bus parity and generate interrupts
when parity errors occur. The DINT[8:0] bus is
DINT[4]
DINT[5]
7
sampled on the rising edge of SCLK.
8
DINT[6]
DINT[7]
DINT[8]
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11
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The bottom data input bus (DINB[8:0]) carries
SONET/SDH frame data in byte serial format. The
DINT[8] bit is a parity bit which is not passed through
the TUDX. The TUDX may be configured to check for
even or odd input bus parity and generate interrupts
when parity errors occur. The DINB[8:0] bus is
sampled on the rising edge of SCLK.
The left data output bus (DOUTL[8:0]) carries
SONET/SDH frame data in byte serial format. The
DOUTL[8] bit is a parity bit which is generated by the
TUDX. The TUDX may be configured to generate
even or odd parity. The DOUTL[8:0] bus is updated on
the rising edge of SCLK. DOUTL may be configured
as a normal output or as an open drain output, the
latter mode being useful for constructing larger
switching arrays.
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Output/
OD
Output
151
153
73
71
67
65
61
57
53
51
48
The right data output bus (DOUTR[8:0]) carries
SONET/SDH frame data in byte serial format. The
DOUTR[8] bit is a parity bit which is generated by the
TUDX. The TUDX may be configured to generate
even or odd parity. The DOUTR[8:0] bus is updated
on the rising edge of SCLK. DOUTR may be
configured as a normal output or as an open drain
output, the latter mode being useful for constructing
larger switching arrays.
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The left auxiliary data output bus (AOUTL[8:0]) carries
SONET/SDH frame data in byte serial format. The
AOUTL[8] bit is a parity bit which is generated by the
TUDX. The TUDX may be configured to generate
even or odd parity. The AOUTL[8:0] bus is updated on
the rising edge of SCLK. AOUTL may be configured
as a normal output or as an open drain output, the
latter mode being useful for constructing larger
switching arrays. The AOUTL output bus carries the
same information as the DOUTL bus and the two
buses may be parallel connected on a bit by bit basis
when additional output drive is required. The AOUTL
bus is held in a high impedance mode to save power
when not enabled.
The right auxiliary data output bus (AOUTR[8:0])
carries SONET/SDH frame data in byte serial format.
The AOUTR[8] bit is a parity bit which is generated by
the TUDX. The TUDX may be configured to generate
even or odd parity. The AOUTR[8:0] bus is updated
on the rising edge of SCLK. AOUTR may be
configured as a normal output or as an open drain
output, the latter mode being useful for constructing
larger switching arrays. The AOUTR output bus
carries the same information as the DOUTR bus and
the two buses may be parallel connected on a bit by
bit basis when additional output drive is required. The
AOUTR bus is held in a high impedance mode to save
power when not enabled.
AOBEBInput2The active low auxiliary output bus enable (AOBEB)
signal enables the AOUTL and AOUTR when low.
When AOBEB is high, the AOUTL and AOUTR output
buses are held in a high impedance mode to save
power. The AOBEB input has an integral pull up
resistor.
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The left systolic input bus (SINL[8:0]) carries
SONET/SDH frame data in byte serial format. The
SINL[8] bit is a parity bit which is not passed through
the TUDX. The TUDX may be configured to check for
even or odd input bus parity and generate interrupts
when parity errors occur. The SINL[8:0] bus is
sampled on the rising edge of SCLK. Data on the
SINL[8:0] bus is re-timed and may be routed to the
DOUTL[8:0] in place of information switched from the
DINT[8:0] bus, and is provided for constructing larger
switching arrays using systolic data flow.
The right systolic input bus (SINR[8:0]) carries
SONET/SDH frame data in byte serial format. The
SINR[8] bit is a parity bit which is not passed through
the TUDX. The TUDX may be configured to check for
even or odd input bus parity and generate interrupts
when parity errors occur. The SINR[8:0] bus is
sampled on the rising edge of SCLK. Data on the
SINR[8:0] bus is re-timed and may be routed to the
DOUTR[8:0] in place of information switched from the
DINB[8:0] bus, and is provided for constructing larger
switching arrays using systolic data flow.
SINR[8]
SOUTT[0]
SOUTT[1]
SOUTT[2]
SOUTT[3]
SOUTT[4]
SOUTT[5]
SOUTT[6]
SOUTT[7]
SOUTT[8]
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Output117
116
115
114
113
112
111
110
109
The left systolic output bus (SOUTT[8:0]) carries
SONET/SDH frame data in byte serial format. The
SOUTT[8] bit is a parity bit which is generated by the
TUDX. The TUDX may be configured to generate
even or odd parity. The SOUTT[8:0] bus is updated on
the rising edge of SCLK. The SOUTT[8:0] bus carries
a re-timed copy of the information sampled on the
DINT[8:0] bus and is provided for constructing larger
switching arrays using systolic data flow. The SOUTT
bus can be disabled to save power when not used.
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Pin NameTypePin
Function
No.
SOUTB[0]
SOUTB[1]
SOUTB[2]
SOUTB[3]
Output95
94
93
92
The right systolic output bus (SOUTB[8:0]) carries
SONET/SDH frame data in byte serial format. The
SOUTB[8] bit is a parity bit which is generated by the
TUDX. The TUDX may be configured to generate
even or odd parity. The SOUTB[8:0] bus is updated
on the rising edge of SCLK. The SOUTB[8:0] bus
SOUTB[4]
SOUTB[5]
91
90
carries a re-timed copy of the information sampled on
the DINB[8:0] bus and is provided for constructing
larger switching arrays using systolic data flow. The
SOUTB[6]
SOUTB[7]
SOUTB[8]
89
88
87
SOUTB bus can be disabled to save power when not
used.
SOBEBInput30The active low systolic output bus enable (SOBEB)
signal enables the SOUTT and SOUTB output buses
when low. When SOBEB is high, the SOUTT and
SOUTB output buses are held in a high impedance
mode to save power. The SOBEB input has an
integral pull up resistor.
COUTLOutput120The left control output signal (COUTL) is a software
programmable control stream (on a per timeslot basis)
that can be used for controlling external hardware
when constructing larger switching arrays. After reset,
COUTL defaults to always high until otherwise
programmed. COUTL is updated on the rising edge of
SCLK.
COUTROutput84The right control output bus (COUTR) is a software
programmable control stream (on a per timeslot basis)
that can be used for controlling external hardware
when constructing larger switching arrays. After reset,
COUTR defaults to always high until otherwise
programmed. COUTR is updated on the rising edge
of SCLK.
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Pin NameTypePin
Function
No.
ODEBInput1The active low open drain enable (ODEB) signal
configures the DOUTL and DOUTR output buses as
open drain outputs when low. When ODEB is high,
the DOUTL and DOUTR output buses are configured
as normal outputs. The ODEB input has an integral
pull up resistor.
PAGEInput41The page select (PAGE) signal selects the connection
memory pages that are used to control connections
within the TUDX. When PAGE is low, connection
memory page 0 of each switching element is used.
When PAGE is high, connection memory page 1 of
each switching element is used. The PAGE input is
sampled on the rising edge of SCLK. Internally, a
change in the active connection memory page is held
off until the next switching frame boundary (a delay of
up to approximately 14 us). While such a page swap
is pending, accesses to the connection memory by
the microprocessor should be avoided. Such a
pending page swap results in a connection memory
busy indication which can be polled. The PAGE input
has an integral pull down resistor.
MBEBInput105The active low Motorola bus enable (MBEB) signal
configures the TUDX for Motorola bus mode where
the RDB/E signal functions as E, and the WRB/RWB
signal functions as RWB. When MBEB is high, the
TUDX is configured for Intel bus mode where the
RDB/E signal functions as RDB. The MBEB input has
an integral pull up resistor.
CS1BInput17The active low chip select #1 (CS1B) signal is low
during TUDX register accesses.
If CS1B and CS2B are not required (i.e., registers
accesses are controlled using the RDB and WRB
signals only), CS1B and CS2B must be connected to
an inverted version of the RSTB input.
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Pin NameTypePin
Function
No.
CS2BInput18The active low chip select #2 (CS2B) signal is low
during TUDX register accesses.
If CS1B and CS2B are not required (i.e., registers
accesses are controlled using the RDB and WRB
signals only), CS1B and CS2B must be connected to
an inverted version of the RSTB input.
RDBInput102The active low read enable (RDB) signal is low during
TUDX register read accesses while in Intel bus mode
(MBEB = 1). The TUDX drives the D[7:0] bus with the
contents of the addressed register while RDB, CS1B,
and CS2B are low.
EInput102The active high external access (E) signal is high
during TUDX register access while in Motorola bus
mode (MBEB = 0).
WRBInput101The active low write strobe (WRB) signal is low during
a TUDX register write accesses while in In tel bus
mode (MBEB = 1). The D[7:0] bus contents are
clocked into the addressed register on the rising WRB
edge while CS1B and CS2B are low.
RWBThe read/write select (RWB) signal selects between
TUDX register read and write accesses while in
Motorola bus mode (MBEB = 0). The TUDX drives the
D[7:0] bus with the contents of the addressed register
while CS1B and CS2B are low and RWB and E are
high. The D[7:0] bus contents are clocked into the
addressed register on the falling E edge while CS1B
and CS2B and RWB are low.
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1. All TUDX inputs and bidirectionals present minimum capacitive loading and
operate at TTL logic levels.
2. All TUDX digital outputs and bidirectionals have 2 mA drive capability, except
the INTB, SOUTT[8:0], SOUTB[8:0] outputs and D[7:0] bidirectionals, which
have 4 mA drive capability, and the DOUTL[8:0], DOUTR[8:0], AOUTL[8:0]
and AOUTR[8:0] outputs, which have 8 mA drive capability.
3. The VSSO and VSSI ground pins are not internally connected together.
Failure to connect these pins externally may cause malfunction or damage
the TUDX.
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4. The VDDO and VDDI power pins are not internally connected together.
Failure to connect these pins externally may cause malfunction or damage
the TUDX.
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9
FUNCTIONAL DESCRIPTION
9.1 Input Bus Formatter
The input bus formatter captures data sampled on the DINT and DINB buses
and distributes this data to the two switching elements within the TUDX. The
input bus formatter also re-times this captured data, delaying it 5 clock cycles
and outputs copies of the information from the DINT and DINB buses on the
SOUTT and SOUTB buses, respectively. When systolic interconnect is not used,
the SOUTT and SOUTB buses can be held in a high impedance mode to save
power by strapping the SOBEB input appropriately.
For systolic array applications, a programmable delay element provides
additional delay of 5, 10, or 15 clock cycles in the DINT and DINB data paths or
in the SOUTT and SOUTB data paths. For more information on the systolic array
application, see the Application Examples section.
The input bus formatter also provides timing signals for the other blocks within
the TUDX. The system clock, SCLK, is buffered and distributed to the switching
elements and the output bus formatter. Frame pulses for the incoming and
outgoing data streams, IFP and OFP, are generated with alignment dictated by
the system frame pulse input, SFP. These frame pulses are buffered and
distributed to the switching elements. One can select whether the SFP input will
generate a coincident IFP or OFP pulse using the OFSEB configuration input.
This option is useful when constructing larger switches using arrays of TUDX
devices. The input bus formatter generates the IFP and OFP outputs. Proper
generation of IFP and OFP requires that the input bus formatter be initialized
once per SONET/SDH frame (125 µs) by a pulse on the SFP input. In the
absence of a periodic SFP input, outputs IFP and OFP are not generated
correctly.
9.2 Output Bus Formatter
The output bus formatter selects the data to be output on the DOUTL and
DOUTR buses. This data is gathered from the switching elements or the SINL
and SINR buses, on a per timeslot basis, as programmed within the switching
elements. The output bus formatter also drives the COUTL and COUTR outputs
with control signals that are programmable, on a per timeslot basis, via the
switching elements. The delay from the SINL or SINR buses to the DOUTL or
DOUTR buses is 5 clock cycles. The delay from the DINT or DINB buses to the
DOUTL or DOUTR buses for a straight through connection (from each input
timeslot to its equivalent output timeslot) is 275 clock cycles (corresponding to
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one SONET STS-3 or SDH STM-1 row of 270 bytes plus 5 clock cycles of retiming delay).
For systolic array applications, a programmable delay element provides an
additional delay of 5, 10 or 15 clock cycles in the SINL and SINR data paths or in
the DOUTL and DOUTR data paths.
The output bus formatter can be configured to drive the DOUTL and DOUTR
buses rail to rail or drive the DOUTL and DOUTR buses as open drain outputs.
The open drain output option is selected by strapping the ODEB input
appropriately. A second set of output buses, the AOUTL and AOUTR buses,
carry the same data as the DOUTL and DOUTR buses, respectively. These pairs
of buses can be strapped together on a bit by bit basis in order to provide higher
drive capability. This is particularly useful in implementing wired-OR type output
buses. When not required, the AOUTL and AOUTR buses can be held in a high
impedance mode to save power by strapping the AOBEB input appropriately.
9.3 Switching Element
Each switching element implements two single stage, non-blocking time switches
that each process an STS-3 or STM-1 rate stream. The channelization of each
time switch corresponds to 9 byte columns within the SONET/SDH frame. Thus
the basic switching granularity is 576 kbit/s (9 x 64 kbit/s). The frame rate of
each time switch corresponds to 1/9th of the SONET/SDH frame rate. The frame
rate is thus 13.89 us (125 us ÷ 9). The frame processed by each time switch
corresponds to 270 byte rows within the SONET/SDH frame. Two time switches
that connect to a common output bus are grouped within each switching element
such that they can share a common connection memory.
Cross-connection of the various size s of VTs (or TUs) is accomplished by setting
up group connections. A VT1.5, for example, occupies three 9 byte columns
within the SONET/SDH frame and thus a VT1.5 cross-connection can be set up
by making three connections of 576 kbit/s each. A TU12, in contrast, occupies
four 9 byte columns and thus a TU12 cross-connection can be set up by making
four connections of 576 kbit/s each. The time switches are double buffered so as
to exhibit constant frame delay which preserves byte sequence integrity during
group connections, regardless of the size and routing of the group connection.
Note that the switching elements assume that the tributaries to be crossconnected occupy fixed 9 byte columns within the SONET STS-3 or SDH STM-1
frame. In order to cross-connect VT1.5, VT2, VT3, or VT6 tributaries within an
STS-3 stream or TU11, TU12, TU2, or TU3 tributaries within an STM-1 stream,
the STS-3 or STM-1 stream must be preprocessed with the PM5361 TUPP or an
equivalent circuit. Such processing must ensure that all STS-1 or AU-3 or AU-4
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pointer adjustments are absorbed into VT or TU pointer adjustments such that
the resulting STS-3 or STM-1 frame has its VTs or TUs occupying fixed,
appropriately phase aligned positions with respect to the overall transport
envelope frame, ready for switching.
The TUDX consists of two switching elements, each containing two time
switches, which results in a 2 by 2 array of time switches. Data from each of the
DINT and DINB buses is distributed and written into the two time switches in the
corresponding row. Data is collected for output on the DOUTL and DOUTR
buses from each of the two time switches in the corresponding column or
switching element, or from the associated SINL or SINR bus. The source of data
is programmable on a per timeslot basis within the switching elements. As only
one time switch in a column can source data during a given timeslot, time switch
outputs are powered down, rather than outputting data, 50% of the time.
In addition to implementing cross-connections, the switching elements are also
capable of inserting programmable idle code into outgoing timeslots. This idle
code is arbitrarily programmable on a per timeslot basis and thus through proper
programming, a fixed, arbitrary idle code can be inserted into any outgoing VT or
TU. This capability can be used to insert tributary path AIS or to insert fixed
codes used for system diagnostic purposes.
The switching elements are implemented in a classical manner with each having
a pair of data memories, a common connection memory, timing generator, output
multiplexer, and common bus interface.
9.3.1 Data Memories
The data memories each consist of two 270 x 8 RAMs implementing a double
buffered switch core. During each switching frame, data is written into sequential
locations in one page of memory, and read from the other page of memory
based on a list of addresses provided by the connection memory. At each
switching frame boundary (every 270 bytes) the function of the two memory
pages is reversed. The data memory is 8 bits wide to allow byte wide data to be
routed through the switching element. Two data memories are required, one for
each of the input buses connected to the switching element.
9.3.2 Connection Memory
The connection memory consists of a double buffered 270 x 13 RAM. During
each switching frame, information is sequentially read from the active memory
page and used to generate the read addresses for the data memory and control
the output multiplexer. Either connection memory can be written to or read from
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via the common bus interface and thus its contents are programmable. In this
manner, the switching action of the data memory and output multiplexer are
programmable on a per timeslot basis. Normally one would only write to the
inactive page, performing all the programming required to implement ones
desired connections, and then trigger a page swap at a frame boundary. Use of
a double buffered connection memory and active page swapping allows tributary
connections (which are implemented as group connections of 576 kbit/s
timeslots) to be coherently made or broken.
9.3.3 Timing Generator
The timing generator consists of a frame counter and clock dividers. Buffered
versions of the various derived clocks are distributed to other blocks within the
switching element as are several phase delayed versions of the frame count, as
required in such a pipelined processing structure.
9.3.4 Output Multiplexer
The output multiplexer consists of logic that selects the source of information to
be output from the switching element. Such selection is controlled on a per
timeslot basis by the connection memory and is thus programmable. Output data
can be routed from the data memory, from the lower order bits of the connection
memory, or a null value can be inserted when no connection is being made. The
null value is chosen on the fly to minimize power dissipation. The ability to
source data from the connection memory itself is how programmable idle code
insertion is provided. During those timeslots when programmable idle code is
being inserted or no connection is being made through the switching element,
the reading of data from the data memory is suppressed in order to save power.
In addition to its selection function, the output multiplexer also re-times control
signals sourced by the connection memory that are used to control the output
bus formatter of the complete device.
9.3.5 Common Bus Interface
The common bus interface allows microprocessor access to the switching
element connection memory. Access is indirect, via registers located in the
common bus interface. Each connection memory access takes up to eight SCLK
cycles to complete as circuitry waits for opportunities when the connection
memory locations in question are not being accessed during the normal course
of switching element operation.
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9.4 Microprocessor Interface
The microprocessor interface block provides normal and test mode registers, and
the logic required to connect to the microprocessor interface. The normal mode
registers are required for normal operation, and test mode registers are used to
enhance the testability of the TUDX. The register set is accessed as follows:
Table 1- Register Memory Map
AddressRegister
00HTUDX Master Configuration
01HTUDX Connection Memory Control
02HTUDX Clock Monitor
03HTUDX Master Reset/Revision ID
04HTUDX Parity Configuration
05HTUDX Parity Error Interrupt Enable
06HTUDX Parity Error Interrupt Status
07HTUDX Systolic Delay Control
08HLeft Switch Element Connection Address High
09HLeft Switch Element Connection Address Low
0AHLeft Switch Element Connection Data High
0BHLeft Switch Element Connection Data Low
0CHRight Switch Element Connection Address High
0DHRight Switch Element Connection Address Low
0EHRight Switch Element Connection Data High
0FHRight Switch Element Connection Data Low
10HTUDX Master Test
11H-1FHReserved for Test
For all register accesses, CS1B and CS2B must be low.
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10
NORMAL MODE REGISTER DESCRIPTION
Normal mode registers are used to configure and monitor the operation of the
TUDX. Nor mal mode registers (as opposed to test mode registers) are selected
when TRS (A[4]) is low.
Notes on Normal Mode Register Bits:
1. Writing values into unused register bits has no effect. However, to ensure
software compatibility with future, feature-enhanced versions of the product,
unused register bits must be written with logic 0. Reading back unused bits
can produce either a logic 1 or a logic 0; hence unused register bits should be
masked off by software when read.
2. All configuration bits that can be written into can also be read back. This
allows the processor controlling the TUDX to determine the programming
state of the block.
3. Writeable normal mode register bits are cleared to logic 0 upon reset unless
otherwise noted.
4. Writing into read-only normal mode register bit locations does not affect
TUDX operation unless otherwise noted.
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Register 00H: Master Configuration
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3R/WSELEN0
Bit 2R/WSEREN0
Bit 1R/WCOUTLEN0
Bit 0R/WCOUTREN0
This register is used to enable the switching elements and the generation of the
programmable control output signals.
COUTLEN:
The COUTLEN bit enables the generation of the COUTL signal under control
of the left switching element; the switching element that routes between the
DINT and DOUTL buses, or DINB and DOUTL buses, respectively. After
reset, the COUTL signal is forced high, until the COUTLEN bit is set high.
COUTREN:
The COUTREN bit ernables the generation of the COUTR signal under
control of the right switching element; the switching element that routes
between the DINT and DOUTR buses, or DINB and DOUTR buses,
respectively. After reset, the COUTR signal is forced high, until the
COUTREN bit is set high.
SELEN:
The SELEN bit enables operation of the left switching element (the switching
element that routes between the DINT and DOUTL buses, or DINB and
DOUTL buses, respectively). After reset, the left switching element is held
reset to save power, until the SELEN bit is set high.
SEREN:
The SEREN bit enables operation of the right switching element (the
switching element that routes between the DINT and DOUTR buses, or DINB
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and DOUTR buses, respectively). After reset, the right switching element is
held reset to save power, until the SEREN bit is set high.
Note that a switching element cannot be programmed until it is enabled.
While a switching element is disabled, the output bus formatter will not select
it as a source of data, thus passing through data from the SINL or SINR bus,
as appropriate.
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Register 01H: Connection Memory Control
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3UnusedX
Bit 2RAPAGEX
Bit 1REPAGEX
Bit 0R/WIPAGE0
This register is used to control and monitor the selection of the active connection
memory page.
IPAGE:
The IPAGE bit is used to internally select the active connection memory page.
When IPAGE is set high, page 1 is selected. When IPAGE is cleared low,
page 0 is selected, provided that the external PAGE input is also low.
EPAGE:
The EPAGE bit can be read to determine the state of the external PAGE
input.
APAGE:
The APAGE bit can be read to determine the active connection memory
page. APAGE is the logical OR of the IPAGE bit and the PAGE input (which
can be read via the EPAGE bit).
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Register 02H: Clock Monitor
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3RDINBAX
Bit 2RDINTAX
Bit 1RSFPAX
Bit 0RSCLKAX
This register is used to monitor the integrity of TUDX timing input signals.
SCLKA:
The SCLKA bit indicates that SCLK is active when high. SCLKA is set high
by a low to high transition on SCLK and is set low immediately following a
read of this register. This bit is intended to be polled to detect a system failure
that freezes the SCLK signal.
SFPA:
The SFPA bit indicates that SFP is active when high. SFPA is set high by a
SCLK sampled low to high transition on SFP and is set low immediately
following a read of this register. This bit is intended to be polled to detect a
system failure that freezes the SFP signal.
DINTA:
The DINTA bit indicates that DINT bus is active when high. DINTA is set high
when all bits of the DINT[8:0] bus have changed low to high after sampled by
SCLK and is set low immediately following a read of this register. This bit is
intended to be polled to detect a system failure that freezes any of the
DINT[8:0] bits.
DINBA:
The DINBA bit indicates that DINB bus is active when high. DINBA is set
high when all bits of the DINB[8:0] bus have changed low to high after
sampled by SCLK and is set low immediately following a read of this register.
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This bit is intended to be polled to detect a system failure that freezes any of
the DINB[8:0] bits.
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Register 03H: Master Reset/Revision ID
BitTypeFunctionDefault
Bit 7R/WRESET0
Bit 6RID[6]0
Bit 5RID[5]0
Bit 4RID[4]0
Bit 3RID[3]0
Bit 2RID[2]0
Bit 1RID[1]0
Bit 0RID[0]0
This register allows the revision of the TUDX to be read by software permitting
graceful migration to support for newer, feature enhanced versions of the TUDX,
should revision of the TUDX occur. This register also allows the TUDX to be
reset.
ID[6:0]:
The ID bits can be read to provide a binary TUDX revision number.
RESET:
The RESET bit allows the TUDX to be reset under software control. If the
RESET bit is a logic 1, the entire TUDX is held in reset. This bit is not selfclearing; therefore, a logic 0 must be written to bring the TUDX out of reset.
Holding the TUDX in a reset state effectively puts it into a low powe r, stand-by
mode. A hardware reset clears the RESET bit, thus de-asserting the
software reset.
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Register 04H: Parity Configuration
BitTypeFunctionDefault
Bit 7R/WTODDO0
Bit 6R/WBODDO0
Bit 5R/WLODDO0
Bit 4R/WRODDO0
Bit 3R/WTODDI0
Bit 2R/WBODDI0
Bit 1R/WLODDI0
Bit 0R/WRODDI0
This register is used to configure the parity polarity expected on input buses and
generated on output buses.
RODDI, LODDI, BODDI, TODDI:
These bits configure the parity expected on input buses. When high, odd
parity is expected. When low, even parity is expected. The RODDI bit
configures the SINR bus, the LODDI bit configures the SINL bus, the BODDI
bit configures the DINB bus, and the TODDI bit configures the DINT bus.
RODDO, LO DDO, BODDO, TODDO:
These bits configure the parity generated on output buses. When high, odd
parity is generated. When low, even parity is generated. The RODDO bit
configures the DOUTR bus, the LODDO bit configures the DOUTL bus, the
BODDO bit configures the SOUTB bus, and the TODDO bit configures the
SOUTT bus. Note that bad parity can be introduced for diagnostic purposes
by manipulating these bits.
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Register 05H: Parity Error Interrupt Enable
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3R/WTPERE0
Bit 2R/WBPERE0
Bit 1R/WLPERE0
Bit 0R/WRPERE0
This register is used to enable parity errors to generate interrupts.
RPERE, LPERE, BPERE, TPERE:
These bits enable parity errors on their respective input buses to generate
interrupts. When high, parity error interrupt generation is enabled. When low,
parity error interrupt generation is disabled, however, the parity error
indications may still be polled. The RPERE bit configures the SINR bus, the
LPERE bit configures the SINL bus, the BPERE bit configures the DINB bus,
and the TPERE bit configures the DINT bus.
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Register 06H: Parity Error Interrupt Status
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3RTPERIX
Bit 2RBPERIX
Bit 1RLPERIX
Bit 0RRPERIX
This register is used to identify the source of a parity error interrupt and
acknowledge such an interrupt.
RPERI, LPERI, BPERI, TPERI:
These bits are set high when a parity error on their respective input buses is
detected. If enabled, an interrupt will also occur. These bits are cleared low
immediately following a read of this register causing any active interrupt to be
de-asserted. These bits are latching and will remain high following the
detection of a single parity error until this register is read. These bits retain
their event capture functionality when interrupt generation is disabled and
may be polled to detect parity errors. The RPERI bit monitors the SINR bus,
the LPERI bit monitors the SINL bus, the BPERI bit monitors the DINB bus,
and the TPERI bit monitors the DINT bus.
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Register 07H: Systolic Delay Control
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5R/WSOUTEN0
Bit 4R/WSINEN0
Bit 3R/WDOUTEN0
Bit 2R/WDINEN0
Bit 1R/WDS10
Bit 0R/WDS00
This register is used to control the delay inserted into the SOUT, SIN, DOUT, and
DIN data paths. This feature is used in systolic array applications to match data
skew at the array boundaries for up to a 4 X 4 array without using external
components.
SOUTEN, SINEN, DOUTEN, DINEN:
These bits control the programmable delay elements, one of which is shared
between DIN and SOUT, the other between SIN and DOUT. The delay is
inserted when these bits are set high. It is not appropriate to set both DINEN
and SOUTEN high simultaneously, nor SINEN and DOUTEN. The delay
value for both delay elements is controlled by the DS1 and DS0 bits.
DS1, DS0:
The DS1 and DS0 bits select the delay value for both delay elements as
described in the following table:
Table 2- Systolic Delay Control
DS1DS0Delay V alue
000Not appropriate if any enable bits are logic 1.
01 5
10 10
11 15
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When constructing a 4 X 4 systolic array, program the individual TUDX devices
with the following binary codes:
Table 3- Systolic Array Delay Control
12 3 4
1
2
3
4
000000010001010010110011
000101000000000000100010
000110000000000000100001
001111001010001001000000
The systolic delays are applied to the TUDXs at the array periphery. In the first
(or top) row, the SINL[8:0] and SINR[8:0] buses are delayed by 0, 5, 10, and 15
additional clock periods (moving from left to right across the first row). In the
fourth (or bottom row, the DOUTL[8:0] and DOUTR[8:0] buses are delayed by 15,
10, 5, and 0 clock periods (again moving from left to right). In the first (or
leftmost) column, the DINT[8:0] and DINB[8:0] buses are delayed by 0, 5, 10,
and 15 clock periods (moving from the top to the bottom of the first column). In
the fourth (or rightmost) column, the SOUTT[8:0] and SOUTB[8:0] buses are
delayed by 15, 10, 5, and 0 clock periods (again moving from top to bottom). The
above array produces a 35 SCLK cycle delay between the input and output
busses.
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Register 08H,0CH: Connection Address High
BitTypeFunctionDefault
Bit 7R/WRWBX
Bit 6UnusedX
Bit 5UnusedX
Bit 4UnusedX
Bit 3UnusedX
Bit 2UnusedX
Bit 1R/WCMPX
Bit 0R/WCA8X
This register is used to trigger accesses to switching element connection
memory and specify the memory location to be accessed.
RWB:
The RWB bit selects the type of connection memory access. The completion
of a write access to this register will trigger a read of a switching element
connection memory if RWB is high. If RWB is low, the completion of a write
access to this register will trigger a write to a switching element connection
memory. The data to be written or data read is passed through the
Connection Data Low and Connection Data High registers. The connection
memory address and page to be accessed is determined by the Connection
Address Low and Connection Address High registers. A connection memory
access requires several SCLK cycles; completion of an access is indicated by
the BUSY bit in the Connection Data High register. The instantiation of the
Connection Address and Data registers utilized selects the switching element
to be programmed. Registers 08H-0BH control the left switching element,
and registers 0CH-0FH control the right switching element.
CMP:
The CMP bit, selects the connection memory page to be accessed. Selection
of which connection memory page is active is done using the PAGE input or
the Connection Memory Control register. A logic 1 on this bit directs the read
or write operation to the active page memory page. A logic 0 on this bit
directs the read or write operation to the inactive memory page. Accesses to
the active CM memory page are likely to be much longer than accesses to
the inactive memory page. This is because of the continual read accesses by
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the internal timeslot counter to the active memory page. Each CM page is
broken into two independent banks of 135 X13. This increases the micro's
access rate to active memory pages.
CA8:
The CA8 bit , together with the CA7-CA0 bits of the Connection Address Low
register selects the connection memory location to be accessed.
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Register 09H,0DH: Connection Address Low
BitTypeFunctionDefault
Bit 7R/WCA7X
Bit 6R/WCA6X
Bit 5R/WCA5X
Bit 4R/WCA4X
Bit 3R/WCA3X
Bit 2R/WCA2X
Bit 1R/WCA1X
Bit 0R/WCA0X
This register is used to specify the memory location in switching element
connection memory to be accessed.
CA7-CA0:
The CA7-CA0 bits , together with the CA8 bit of the Connection Address High
register select the connection memory location to be accessed. Connection
memory locations correspond to outgoing timeslots on the DOUTL or DOUTR
buses. Each timeslot carries a 9 x 64 kbit/s channel corresponding to one
column in a 270 x 9 byte STS-3 (or STM-1) frame. Connection memory
address 0 corresponds to the first column (the column that starts with the A1
byte of STS-1 #1 in an STS-3 stream) and address 269 corresponds to the
last column (the column that ends with the last SPE byte of STS-1 #3 in an
STS-3 stream). See the sections on Operation, Functional Timing, and
Application Examples.
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Register 0AH,0EH: Connection Data High
BitTypeFunctionDefault
Bit 7RBUSY0
Bit 6UnusedX
Bit 5UnusedX
Bit 4R/WCOUTX
Bit 3R/WMAKEX
Bit 2R/WIDLEX
Bit 1R/WTOPX
Bit 0R/WCD8X
This register is used to detect when accesses to switching element connection
memory are permitted and to pass data to connection memory during such
accesses.
BUSY:
The BUSY bit allows one to detect when a connection memory access is
permitted.
When a switching element connection memory access is triggered by writing
to the Connection Address High register, the BUSY bit is set high. The BUSY
bit returns low when the access is complete. In the case of a write access,
this means that one may begin manipulation of the various registers in
preparation for a subsequent access. In the case of a read, this means that
one may read valid data from the Connection Data High and Low registers
and then prepare for a subsequent access. While an access is in progress,
i.e. when the BUSY bit is high, no new data should be written to any of the
Connection Address or Connection Data registers. A connection memory
access requires a maximum of ~400 ns (i.e. eight 19.44 MHz clock cycles).
When a page swap is triggered via the Connection Memory Control register
or via the PAGE input, the BUSY bit is also set high. At the next switch frame
boundary (which can be up to ~ 14 us later) the page swap is implemented
and the BUSY bit returns low. During this intervening time, while a page
swap is pending, no new data should be written to any of the Connection
Address or Connection Data registers. Similarly, one should not trigger a
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page swap until any previously initiated connection memory access is
complete.
COUT:
The COUT bit controls one of the COUTL or COUTR signals during the
corresponding outgoing timeslot on the DOUTL or DOUTR buses. By
programming the COUT bit, one can control the COUTL or COUTR signals
on a per timeslot basis. The COUT bit of the left switching element controls
the COUTL signal, the COUT bit of the right switching element controls the
COUTR signal.
MAKE:
The MAKE bit enables a connection to be established through the switching
element in question for the corresponding outgoing timeslot. When the MAKE
bit is set high, the switching element in question routes the corresponding
timeslot onto the data path leading to the DOUTL or DOUTR buses, as
appropriate. The source bus and timeslot to be connected are selected by
the TOP bit and CD8-CD0 bits. When the MAKE bit is set low, the switching
element in question is held inactive to save power during the processing
interval for the corresponding timeslot. When the MAKE bit is set low, data
entering on the SINL or SINR bus is routed to the DOUTL or DOUTR bus, as
appropriate for the switching element in question.
IDLE:
The IDLE bit enables the insertion of programmable idle code into the
corresponding outgoing timeslot. When the IDLE bit is set high, the switching
element in question routes the connection data programmed through the
CD8-CD0 bits onto the data path leading to the DOUTL or DOUTR buses, as
appropriate. The mapping is CD7 to DOUTL[7] or DOUTR[7], CD6 to
DOUTL[6] or DOUTR[6], and so on. CD8 is not mapped to DOUTL[8] or
DOUTR[8]; DOUTL[8] and DOUTR[8] are parity bits generated by the TUDX.
In this case the connection data is not used to specify an incoming timeslot to
be connected to an outgoing timeslot, but is used directly to form a
programmable idle code. When the IDLE bit is set low, the switching element
in question implements a normal time switching function. Note that the IDLE
bit has no effect unless the MAKE bit is set high.
TOP
The TOP bit , selects the source of the connection to be established through
the switching element in question for the corresponding outgoing timeslot.
When TOP is high, the DINT bus is selected. When TOP is low, the DINB bus
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is selected. Note that the TOP bit has no effect unless the MAKE bit is set
high.
CD8
The CD8 bit , together with the CD7-CD0 bits of the Connection Data Low
register hold the connection memory data transfe rred dur ing connection
memory accesses.
Note that data read from the Connection Data High and Low registers reflects
the data read from the connection memories during the most recently
triggered read operation. It typically does not reflect the last data written to
these registers.
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Register 0BH,0FH: Connection Data Low
BitTypeFunctionDefault
Bit 7R/WCD7X
Bit 6R/WCD6X
Bit 5R/WCD5X
Bit 4R/WCD4X
Bit 3R/WCD3X
Bit 2R/WCD2X
Bit 1R/WCD1X
Bit 0R/WCD0X
This register is used to pass data to connection memory during switching
element connection memory accesses.
CD7-CD0:
The CD7-CD0 bits, together with the CD8 bit of the Connection Data High
register hold the connection memory data transfe rred dur ing connection
memory accesses. Connection memory data corresponds to incoming
timeslots on the DINT or DINB buses. Each timeslot carries a 9 x 64 kbit/s
channel corresponding to one column in a 270 x 9 byte STS-3 (or STM-1)
frame. Connection memory data of 0 corresponds to the first column (the
column that starts with the A1 byte of STS-1 #1 in an STS-3 stream) and data
of 269 corresponds to the last column (the column that ends with the last
SPE byte of STS-1 #3 in an STS-3 stream). Connection memory data may
also correspond to a programmable idle code. See the sections on
Operation, Functional Timing, and Application Examples.
Note that data read from the Connection Data High and Low registers reflects
the data read from the connection memories during the most recently
triggered read operation. It typically does not reflect the last data written to
these registers.
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11
TEST FEATURES DESCRIPTION
Simultaneously asserting the CS1B, CS2B, RDB and WRB inputs low causes all
output pins and the data bus to be held in a high-impedance state, provided that
the MBEB input is held high. This test feature may be used for board testing.
Test mode registers are used to apply test vectors during production testing of
the TUDX. Test mode registers (as opposed to normal mode registers) are
selected when TRS (A[4]) is high.
Test mode registers may also be used for board testing. When all of the
constituent Telecom System Blocks within the TUDX are placed in test mode 0,
device inputs may be read and device outputs may be forced via the
microprocessor interface (refer to the section "Test Mode 0" for details).
Table 4- Test Mode Register Memory Map
AddressRegister
00H-0FHNormal Mode Registers
10HTUDX Master Test
11H-13HInput Formatter Test Registers
14H-17HOutput Formatter Test Registers
18HLeft Switch Element Test Register 0
19HLeft Switch Element Test Register 1
1AHLeft Switch Element Test Register 2
1BHLeft Switch Element Test Register 3
1CHRight Switch Element Test Register 0
1DHRight Switch Element Test Register 1
1EHRight Switch Element Test Register 2
1FHRight Switch Element Test Register 3
Notes on Test Mode Register Bits:
1. Writing values into unused register bits has no effect. However, to ensure
software compatibility with future, feature-enhanced versions of the product,
unused register bits must be written with logic 0. Reading back unused bits
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can produce either a logic 1 or a logic 0; hence unused register bits should be
masked off by software when read.
2. Writable test mode register bits are not initialized upon reset unless otherwise
noted.
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Register 10H: Master Test
BitTypeFunctionDefault
Bit 7UnusedX
Bit 6UnusedX
Bit 5UnusedX
Bit 4WPMCTSTX
Bit 3WMOTOTST0
Bit 2R/WIOTST0
Bit 1WHIZDATA0
Bit 0R/WHIZIO0
This register is used to enable TUDX test features. All bits, except PMCTST, are
reset to zero by a reset of the TUDX.
HIZIO,HIZDATA:
The HIZIO and HIZDATA bits control the three state modes of the TUDX .
While the HIZIO bit is a logic 1, all output pins of the TUDX except the data
bus are held in a high-impedance state. The microprocessor interface is still
active. While the HIZDATA bit is a logic 1, the data bus is also held in a highimpedance state which inhibits microprocessor read cycles.
IOTST:
The IOTST bit is used to allow normal microprocessor access to the test
registers and control the test mode in each TSB block in the TUDX for board
level testing. When IOTST is a logic 1, all blocks are held in test mode and
the microprocessor may write to a block's test mode 0 registers to manipulate
the outputs of the block and consequently the device outputs (refer to the "I/O
Test Mode Details" in the "Test Features" section).
MOTOTST:
The MOTOTST bit is used to test the MOTOROLA interface. When
MOTOTST is logic 1 and the MBEB input is logic 0 the OFSEB and SOBEB
inputs are used to replace the function of E and RWB, respectively. This is
done because the fixed waveform shapes assigned to the RDB_E and
WRB_RWB inputs can not be used to test MOTOROLA type microprocessor
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interface logic. This mode is also used to test the D.C. drive capability of the
D[7:0] device pins.
PMCTST:
The PMCTST bit is used to configure the TUDX for PMC's manufacturing
tests. When PMCTST is set to logic 1, the TUDX microprocessor port
becomes the test access port used to run the PMC "canned" manufacturing
test vectors. The PMCTST bit is logically "ORed" with the IOTST bit, and can
only be cleared by setting CSB to logic 1.
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11.1 I/O T est Mode
In the I/O test mode, the TUDX allows the logic levels on the device inputs to be
read through the microprocessor interface, and allows the device outputs to be
forced to either logic level through the microprocessor interface.
To enable the I/O test mode, the IOTST bit in the Master Test register is set to
logic 1.
Reading the following address locations returns the values for the indicated
inputs.
SOUTT is abbreviated to SOT to fit the above table.
SOUTB is abbreviated to SOB to fit the above table.
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DOUTL is abbreviated to DOL to fit the above table.
DOUTR is abbreviated to DOR to fit the above table.
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12
OPERATION
12.1 Basic Connection Memory Access
12.1.1 Connection Memory Read
To perform a connection memory read, one selects an address in the range 0269, encodes this as a 9 bit binary value and writes the lower 8 bits of this value
into the Connection Address Low register. The upper bit of this address is then
written into the Connection Address High register while also setting the RWB bit
in the Connection Address High register to 1 and selecting the desired
connection memory page. The trailing edge of the write to the Connection
Address High register triggers the internal connection memory access by the
TUDX and a read access is performed due to the RWB bit being a 1. The access
requires up to ~400 ns to complete and one must wait this long or poll the BUSY
bit in the Connection Data High register to determine that the access has
completed. Once the access has completed as indicated by the BUSY bit going
low, one can then read valid data in the Connection Data High and Low registers
which was extracted during the just completed connection memory read access.
Note that once a connection memory read access is triggered by writing to the
Connection Address High register, no further changes should be made to the
Connection Address High or Low registers until the access has completed.
Similarly, prior to initiating any read access, one must ensure that any previously
triggered access or page swap has completed before one begins to alter relevant
register contents.
12.1.2 Connection Memory Write
To perform a connection memory write, one selects the data to be written and
writes this data into the Connection Data High and Low registers. One then
selects an address in the range 0-269, encodes this as a 9 bit binary va lue and
writes the lower 8 bits of this value into the Connection Address Low register.
The upper bit of this address is then written into the Connection Address High
register while also setting the RWB bit in the Connection Address High register to
0 and selecting the desired connection memory page. The trailing edge of the
write to the Connection Address High register triggers the internal connection
memory access by the TUDX and a write access is performed due to the RWB
bit being a 0. The access requires up to ~400 ns to complete and one must wait
this long or poll the BUSY bit in the Connection Data High register to determine
that the access has completed. Once the access has completed as indicated by
the BUSY bit going low, one is free to begin set up for subsequent accesses.
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Note that once a connection memory write access is triggered by writing to the
Connection Address High register, no further changes should be made to the
Connection Address High or Low registers or the Connection Data High or Low
registers until the access has completed. Similarly, prior to initiating any write
access, one must ensure that any previously triggered access or page swap has
completed before one begins to alter relevant register contents.
12.2 Connection Set Up
To set up a connection, one must program connections for all of the 9 x 64 kbit/s
timeslots that together constitute the tributary being connected. In the case of a
VT1.5 or TU11, three connections must be programmed; in the case of a VT2 or
TU12, four connections; and in the case of a VT6 or TU2, twelve connections.
Any channel or tributary that can be constructed as a multiple of the basic 9 x 64
kbit/s timeslot may be switched using group connections.
To illustrate connection set up, consider the steps required to set up a VT1.5
cross-connection. For example, consider cross-connecting VT1.5 #1 of VT group
#1 in STS-1 #1 of the STS-3 stream on the DINT bus to VT1.5 #4 of VT group #7
in STS-1 #3 of the STS-3 stream on the DOUTL bus. The incoming VT1.5
occupies the 13th, 100th, and 187th columns in the STS-3 frame as shown in
Figure 1. The outgoing VT1.5 occupies the 96th, 183rd and 270th columns in the
STS-3 frame. To make the connection one must connect each incoming timeslot
occupied by the incoming VT1.5 to each outgoing timeslot occupied by the
outgoing VT1.5 in the order in which the timeslots are utilized, i.e. 13th timeslot to
96th timeslot, 100th timeslot to 183rd timeslot, and 187th timeslot to 270th
timeslot. The info rmation that must be written to the Connection Address and
Connection Data registers of the left switching element is as follows:
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Table 7- Connection Set Up
Connection
Address
Connection
Data
Connection/Notes
005FH0A0CH13th timeslot cross connects to 96th timeslot
CA=95, CD=12
COUT=0, MAKE=1, IDLE=0, TOP=1
00B6H0963H100th timeslot cross connects to 183rd timeslot
CA=182, CD=99
COUT=0, MAKE=1, IDLE=0, TOP=1
010DH09BAH187th timeslot cross connects to 270th timeslot
To enable idle code insertion, one must program idle code insertion for all of the
9 x 64 kbit/s timeslots that together constitute the tributary being affected. In the
case of a VT1.5 or TU11, three insertions must be programmed; in the case of a
VT2 or TU12, four insertions; and in the case of a VT6 or TU2, twelve insertions.
Any channel or tributary that can be constructed as a multiple of the basic 9 x 64
kbit/s timeslot may be overwritten with idle code using a group insertion.
To illustrate idle code insertion set up, consider the steps required to set up idle
code insertion into a TU12. For example, consider inserting idle code into TU12
#1 of TUG2 #1 in VC3/AU3 #1 of the STM-1 stream on the DOUTR bus. The
outgoing TU12 occupies the 13th, 76th, 142nd and 208th columns in the STM-1
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frame. To enable idle code insertion one must program idle code insertion for
each outgoing timeslot occupied by the outgoing TU12. One would normally
program the same idle code value for all timeslots occupied by the TU12 and
choose a value that results in a useful status indication in the TU12, such as all
ones for tributary path AIS. The information that must be written to the
Connection Address and Connection Data registers of the right switching
element is as follows:
Table 8- Idle Code Insertion
Connection
Address
Connection
Data
Connection/Notes
000CH0DFFHAll ones inserted into 13th timeslot
CA=12, CD=all ones
COUT=0, MAKE=1, IDLE=1, TOP=0
004BH0DFFHAll ones inserted into 76th timeslot
CA=75, CD=all ones
COUT=0, MAKE=1, IDLE=1, TOP=0
008DH0DFFHAll ones inserted into 142nd timeslot
CA=141, CD=all ones
COUT=0, MAKE=1, IDLE=1, TOP=0
00CFH0DFFHAll ones inserted into 208th timeslot
CA=207, CD=all ones
COUT=0, MAKE=1, IDLE=1, TOP=0
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13
FUNCTIONAL TIMING
The DINT, DINB, SINL and SINR buses are nominally frame aligned, as are the
DOUTL, DOUTR, SOUTT, and SOUTB buses. This alignment may be altered for
use in systolic array applications when required. There is nominally a five clock
cycle offset between the frame alignment of the input buses and the output
buses. The SFP input, which synchronizes the frame alignment of the TUDX
PCM buses, can be configured to mark the frame alignment of either the input or
output buses, depending on the strapping of the OFSEB input. The timing of the
AOUTL and AOUTR buses is identical to that of the DOUTL and DOUTR buses,
respectively.
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Figure 9- Input/Output Bus Timing (systolic delay disabled)
SCLK
SFP (OFSEB=1)
SFP (OFSEB=0)
IFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
OFP
DOUTL[8:0]/
AOUTL[8:0]
DOUTR[8:0]/
AOUTR[8:0]
SOUTT[8:0]
SOUTB[8:0]
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
A1A1 A2A2 A2C1C1 C1A1
The input/output bus timing diagram (Figure 9) illustrates the frame alignment
through the TUDX when the programmable systolic delay is set to zero for every
bus. SFP must occur once every SONET/SDH frame (9 rows), and is illustrated
marking the C1 byte position in the incoming stream (DINT, DINB) or the
outgoing stream (SOUTT, SOUTB) as selected by the OFSEB input. Output
OFP always marks the C1 byte position in the SOUTT and SOUTB streams.
OFP marks the C1 byte position in the DOUTL/DOUTR streams when a crossconnection has not been made through the device (the SINL/SINR streams flow
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through the TUDX without modification). If a cross connection is made between
the DINT/DINB streams and the DOUTL/DOUTR streams, then the data on
DOUTL and DOUTR is delayed by 270 bytes due to the cross connection delay.
In figure 4, output OFP would mark the E2 byte position in the SONET/SDH
frame (i.e. the row immediately before the C1 row) if a cross connection is made
between DINT/DINB and DOUTL/DOUTR.
Figure 10- Input/Output Bus Timing (systolic delay applied to SINL/SINR)
SCLK
SFP (OFSEB=1)
IFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
OFP
DOUTL[8:0]/
AOUTL[8:0]
DOUTR[8:0]/
AOUTR[8:0]
SOUTT[8:0]
SOUTB[8:0]
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
456789101112131415
7+N
7+N
C1C1C1A2A2A2
26927012345678910
C1C1C1A2A2A2
26927012345678910
C1C1C1A2A2A2
26927012345678910
C1C1C1A2A2A2
26927012345678910
The input/output bus timing diagram (Figure 10) illustrates the frame alignmen t
through the TUDX when the programmable systolic delay is applied to the
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SINL/SINR buses. It is assumed that a cross connection has not been made
through the device (the DOUTL/DOUTR streams are delayed versions of the
SINL/SINR streams). The SINL/SINR streams are delayed by N bytes (N=0, 5,
10, or 15) depending on the value programmed in the Systolic Delay Control
Register. This delay may be used in systolic array applications where the
SINL/SINR streams must be offset as they enter the array through the first (or
top) row.
Figure 11- Input/Output Bus Timing (systolic delay applied to
DINT/DINB)
SCLK
SFP (OFSEB=1)
IFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
OFP
DOUTL[8:0]/
AOUTL[8:0]
DOUTR[8:0]/
AOUTR[8:0]
SOUTT[8:0]
7+N
7+N
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
269 27012345678910
C1C1C1A2A2A2
269 27012345678910
C1C1C1A2A2A2
269 27012345678910
SOUTB[8:0]
269 27012345678910
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The input/output bus timing diagram (Figure 11) illustrates the frame alignmen t
through the TUDX when the programmable systolic delay is applied to the
DINT/DINB buses. It is assumed that a cross connection has not been made
through the device (the DOUTL/DOUTR streams are delayed versions of the
SINL/SINR streams). The DINT/DINB streams are delayed by N bytes (N=0, 5,
10, or 15) depending on the value programmed in the Systolic Delay Control
Register. This delay may be used in systolic array applications where the
DINT/DINB streams must be offset as they enter the array through the first (or
leftmost) column.
Figure 12- Input/Output Bus Timing (systolic delay applied to
DOUTL/DOUTR)
SCLK
SFP (OFSEB=1)
IFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
OFP
DOUTL[8:0]/
AOUTL[8:0]
DOUTR[8:0]/
AOUTR[8:0]
SOUTT[8:0]
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
456789101112131415
C1C1C1A2A2A2
456789101112131415
7-N
7-N
C1C1C1A2A2A2
269 27012345678910
SOUTB[8:0]
269 27012345678910
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The input/output bus timing diagram (Figure 13) illustrates the frame alignmen t
through the TUDX when the programmable systolic delay is applied to the
DOUTL/DOUTR buses. It is assumed that a cross connection has not been
made through the device (the DOUTL/DOUTR streams are delayed versions of
the SINL/SINR streams). The DOUTL/DOUTR streams are delayed by N bytes
(N=0, 5, 10, or 15) depending on the value programmed in the Systolic Delay
Control Register. This delay may be used in systolic array applications where the
DOUTL/DOUTR streams mu st be aligned as they exit the array from the last (or
bottom) row.
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Figure 13- Input/Output Bus Timing (systolic delay applied to
SOUTT/SOUTB)
SCLK
SFP (OFSEB=1)
IFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
OFP
DOUTL[8:0]/
AOUTL[8:0]
DOUTR[8:0]/
AOUTR[8:0]
SOUTT[8:0]
SOUTB[8:0]
C1C1C1A2A2A2
45678912+N
C1C1C1A2A2A2
456789
12+N
C1C1C1A2A2A2
456789
12+N
C1C1C1A2A2A2
456789
12+N
269 27012347+N
A2
269 2701234
4-N78910
4-N78910
7+N
6
6
C1C1C1A2A2
C1C1C1A2
C1C1C1A2
C1C1C1A2
The input/output bus timing diagram (Figure 13) illustrates the frame alignmen t
through the TUDX when the programmable systolic delay is applied to the
SOUTT/SOUTB buses. It is assumed that a cross connection has not been
made through the device (the DOUTL/DOUTR streams are delayed versions of
the SINL/SINR streams). The SOUTT/SOUTB streams are delayed by N bytes
(N=0, 5, 10, or 15) depending on the value programmed in the Systolic Delay
Control Register. This offset may be used in systolic array applications where the
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SOUTT/SOUTB streams must be delayed as they exit the array through the last
(or rightmost) column. This timing diagram differs from the previous three
systolic delay timing diagrams in that the output frame pulse (OFP) is delayed
identically to the SOUTT/SOUTB buses through the TUDX. OFP is delayed so
that each outgoing frame pulse from the last (or rightmost) column marks the
correct frame position in the SOUTT/SOUTB buses.
Figure 14- Page Timing
DINT/DINB
SCLK
PAGE
SFP
Col 269 Col 270
valid
A1A2A1A1A2A2C1
The page timing diagram (Figure 14) illustrates the sampling of the PAGE input
relative to the 270 byte row. The TUDX samples PAGE once per row during
column 269 as illustrated (it is assumed that no systolic delay is applied to the
DINT/DINB buses). PAGE is always sampled eight SCLK periods before SFP is
sampled (note that SFP must be set high once every nine rows while PAGE is
sampled once every row).
In systolic array applications, the individual TUDX frame alignments are offset.
These frame alignment offsets must be taken into account when changing the
PAGE input to ensure coherent connection memory page selection.
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14 ABSOLUTE MAXIMUM RATINGS
Table 9- TUDX Maximum Ratings
Ambient Temperature under Bias-40°C to +85°C
Storage Temperature-40°C to +125°C
Supply Voltage-0.5V to +6.0V
Voltage on Any Pin-0.5V to VDD+0.5V
Static Discharge Vol tage±500 V
Latch-Up Current±100 mA
DC Input Current±20 mA
Lead Temperature+230°C
Absolute Maximum Junction Temperature+150°C
Power Dissipation1.5 W
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15 D.C. CHARACTERISTICS
(TA = -40°C to +85°C, VDD = 5 V ±10%)
Table 10- TUDX D.C. Characteristics
SymbolParameterMinTypMaxUnitsConditions
V
V
V
V
V
IL
IH
OL
OH
T+
Input Low
Voltage
Input High
Voltage
Output or
Bidirectional
Low Voltage
Output or
Bidirectional
High V oltage
Reset Input
High V oltage
-0.50.8VoltsGuaranteed Input LOW
Voltage
2.0V
+0.5
VoltsGuaranteed Input HIGH
DD
Voltage
0.4V oltsVDD = min, IOL = 4 mA
for D[7:0] and INTB, 8
mA for DOUTL[8:0],
DOUTR[8:0],
AOUTL[8:0], and
AOUTR[8:0] and 2 mA
for all others, Note 3
2.4V oltsVDD = min, IOH = 4 mA
for D[7:0], 8 mA for
DOUTL[8:0],
DOUTR[8:0],
AOUTL[8:0], and
AOUTR[8:0] and 2 mA
for all others, Note 3
4.03.2Volts
V
T-
Reset Input
0.8Volts
Low Voltage
V
TH
Reset Input
0.5Volts
Hysteresis
Voltage
I
ILPU
Input Low
+20+200µAVIL = GND, Notes 1, 3
Current
I
IHPU
Input High
-100µAVIH = VDD, Notes 1, 3
Current
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SymbolParameterMinTypMaxUnitsConditions
I
ILPD
I
IHPD
I
IL
I
IH
C
IN
C
OUT
C
IO
I
DDOP1
Input Low
Current
Input High
Current
Input Low
Current
Input High
Current
Input
Capacitance
Output
Capacitance
Bidirectional
Capacitance
Operating
Current All
Connections
0+10µAVIL = GND, Notes 4, 3
-200-20µAVIH = VDD, Notes 4, 3
0+10µAVIL = GND, Notes 2, 3
-100µAVIH = VDD, Notes 2, 3
5pFExcluding Package,
Package Typically 2 pF
5pFExcluding Package,
Package Typically 2 pF
5pFExcluding Package,
Package Typically 2 pF
150mAV
= 5.5 V, Outputs
DD
Unloaded, SCLK =
19.44 MHz, Alternating
Data, All Connections
I
DDOP2
Operating
Current
Switching
Elements
Not Enabled
50mAV
= 5.5 V, Outputs
DD
Unloaded, SCLK =
19.44 MHz, Alternating
Data, Switching
Elements Not Enabled
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Notes on D.C. Characteristics:
1. Input pin or bidirectional pin with internal pull-up resistor.
2. Input pin or bidirectional pin without internal pull-up resistor
3. Negative currents flow into the device (sinking), positive currents flow out of
the device (sourcing).
4. Input pin or bidirectional pin with internal pull-down resistor.
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Address to Valid Read Set-up Time25ns
Address to Valid Read Hold Time20ns
Address to Latch Set-up Time20ns
Address to Latch Hold Time20ns
Valid Latch Pulse Width20ns
RWB to Valid Read Set-up Time25ns
RWB to Valid Read Hold Time20ns
Latch to Read Set-up0ns
Latch to Read Hold20ns
Valid Read to Valid Data Propagation Delay80ns
Valid INTB De-asserted to Output Hi-Z50ns
Valid Read De-asserted to Output Hi-Z20ns
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Figure 15- Microprocessor Interface Read Access Timing For Intel Mode
tS
AR
A[4:0]
ALE
(CS1B+CS2B+RDB)
INTB
D[7:0]
tS
ALR
Valid Address
tV
L
tS
LR
tH
AR
tH
ALR
tH
LR
tZ
INT
tP
RD
Valid Data
tZ
RD
Notes on Microprocessor Interface Read Timing In Intel Mode:
1. Output propagation delay time is the time in nanoseconds from the 1.4 Volt
point of the reference signal to the 1.4 Volt point of the output.
2. Maximum output propagation delays are measured with a 100 pF load on the
Microprocessor Interface data bus, (D[7:0]).
3. A valid read cycle is defined as a logical OR of the CS1B, CS2B and the RDB
signals.
4. Microprocessor Interface timing applies to normal mode register accesses
only.
5. In non-multiplexed address/data bus architectures, ALE should be held high,
parameters tS
6. Parameter tH
, tH
ALR
and tSAR are not applicable if address latching is used.
AR
, tVL, and tSLR are not applicable.
ALR
7. When a set-up time is specified between an input and a clock, the set-up time
is the time in nanoseconds from the 1.4 Volt point of the input to the 1.4 Volt
point of the clock.
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8. When a hold time is specified between an input and a clock, the hold time is
the time in nanoseconds from the 1.4 Volt point of the clock to the 1.4 Volt
point of the input.
Figure 16- Microprocessor Interface Read Access Timing For Motorola
Mode
tS
AR
A[4:0]
RWB
ALE
(!CS1B&!CS2B&E)
INTB
Valid Address
tH
tS
RWB
tS
ALR
tV
L
tS
LR
tH
ALR
RWB
tH
tZ
AR
INT
tH
LR
tZ
RD
tP
RD
D[7:0]
Valid Data
Notes on Microprocessor Interface Read Timing in Motorola Mode:
1. Output propagation delay time is the time in nanoseconds from the 1.4 Volt
point of the reference signal to the 1.4 Volt point of the output.
2. Maximum output propagation delays are measured with a 100 pF load on the
Microprocessor Interface data bus, (D[7:0]).
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3. A valid read cycle is defined as a logical AND of the inverted CS1B, the
inverted CS2B and the RDB signals.
4. Microprocessor Interface timing applies to normal mode register accesses
only.
5. In non-multiplexed address/data bus architectures, ALE should be held high,
parameters tS
ALR
, tH
, tVL, and tSLR are not applicable.
ALR
6. Parameter tH
and tSAR are not applicable if address latching is used.
AR
7. When a set-up time is specified between an input and a clock, the set-up time
is the time in nanoseconds from the 1.4 Volt point of the input to the 1.4 Volt
point of the clock.
8. When a hold time is specified between an input and a clock, the hold time is
the time in nanoseconds from the 1.4 Volt point of the clock to the 1.4 Volt
point of the input.
Address to Valid Write Set-up Time25ns
Data to Valid Write Set-up Time20ns
Address to Latch Set-up Time20ns
Address to Latch Hold Time20ns
RWB to Valid Write Set-up Time25ns
tH
RWB
tV
L
tS
LW
tH
LW
tH
DW
tH
AW
tV
WR
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RWB to Valid Write Hold Time20ns
Valid Latch Pulse Width20ns
Latch to Write Set-up0ns
Latch to Write Hold20ns
Data to Valid Write Hold Time20ns
Address to Valid Write Hold Time20ns
V alid Write Pulse Width40ns
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Figure 17- Microprocessor Interface Write Access Timing For Intel Mode
tS
AW
A[4:0]
(CS1B+CS2B+WRB)
D[7:0]
ALE
tS
ALW
tV
L
Valid Address
tS
LW
tH
ALW
tV
WR
tS
DW
Valid Data
tH
tH
tH
DW
LW
AW
Notes on Microprocessor Interface Write Timing In Intel Mode:
1. A valid write cycle is defined as a logical OR of the CS1B, CS2B and WRB.
2. Microprocessor Interface timing applies to normal mode register accesses
only.
3. In non-multiplexed address/data bus architectures, ALE should be held high,
parameters tS
4. Parameters tH
ALW
AW
, tH
ALW
and tS
, tVL, and tSLW are not applicable.
are not applicable if address latching is used.
AW
5. Output propagation delay time is the time in nanoseconds from the 1.4 Volt
point of the reference signal to the 1.4 Volt point of the output.
6. When a set-up time is specified between an input and a clock, the set-up time
is the time in nanoseconds from the 1.4 Volt point of the input to the 1.4 Volt
point of the clock.
7. When a hold time is specified between an input and a clock, the hold time is
the time in nanoseconds from the 1.4 Volt point of the clock to the 1.4 Volt
point of the input.
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Figure 18- Microprocessor Interface Write Access Timing For Motorola
Mode
tS
AW
A[4:0]
Valid Address
RWB
ALE
(!CS1B&!CS2B&E)
D[7:0]
tS
RWB
tS
ALW
tV
tS
L
LW
tH
ALW
tV
WR
tS
DW
Valid Data
tH
RWB
tH
LW
tH
AW
tH
DW
Notes on Microprocessor Interface Write Timing In Motorola Mode:
1. A valid write cycle is defined as a logical AND of the inverted CS1B, inverted
CS2B and the E signal when RWB is low.
2. Microprocessor Interface timing applies to normal mode register accesses
only.
3. In non-multiplexed address/data bus architectures, ALE should be held high,
parameters tS
4. Parameters tH
ALW
AW
, tH
ALW
and tS
, tVL, and tSLW are not applicable.
are not applicable if address latching is used.
AW
5. Output propagation delay time is the time in nanoseconds from the 1.4 Volt
point of the reference signal to the 1.4 Volt point of the output.
6. When a set-up time is specified between an input and a clock, the set-up time
is the time in nanoseconds from the 1.4 Volt point of the input to the 1.4 Volt
point of the clock.
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7. When a hold time is specified between an input and a clock, the hold time is
the time in nanoseconds from the 1.4 Volt point of the clock to the 1.4 Volt
point of the input.
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17
TUDX TIMING CHARACTERISTICS
(TA = -40°C to +85°C, VDD = 5 V ±10%)
Table 13- TUDX Input (Figure 19)
SymbolDescriptionMinMaxUnits
SCLK Frequency (nominally
20MHz
19.44MHz )
SCLK Duty Cycle4060%
tS
tH
tS
tH
tS
tH
DIN
DIN
SFP
SFP
PAGE
PAGE
DIN Set-up Time4ns
DIN Hold Time3ns
SFP Set-Up Time4ns
SFP Hold Time3ns
PAGE Set-Up Time4ns
PAGE Hold Time3ns
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Figure 19- Input Timing
SCLK
SFP
DINT[8:0]
DINB[8:0]
SINL[8:0]
SINR[8:0]
tS
tS
tS
tS
tS
tS
SFP
DIN
DIN
DIN
DIN
PAGE
tH
tH
tH
tH
tH
tH
SFP
DIN
DIN
DIN
DIN
PAGE
PAGE
Notes on Input Timing:
1. When a set-up time is specified between an input and a clock, the set-up time
is the time in nanoseconds from the 1.4 Volt point of the input to the 1.4 Volt
point of the clock.
2. When a hold time is specified between an input and a clock, the hold time is
the time in nanoseconds from the 1.4 Volt point of the clock to the 1.4 Volt
point of the input.
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ODEB = 0, AOBEB = 1, load = 600 ohm pullup and 50 pF , including 10 pF
output capacitance.
SymbolDescriptionMinMaxUnits
TPDOUTSCLK High to DOUT Valid Propagation
540ns
Delay
Table 17- Parallel Bused Output Configuration
ODEB = 0, AOBEB = 0, load = 300 ohm pullup and 100 pF , including 20 pF
output capacitance due to parallel DOUT/AOUT output connection.
SymbolDescriptionMinMaxUnits
tPDOUTSCLK High to DOUT Valid Propagation
540ns
Delay
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Figure 20- Output Timing
SCLK
tP
DOUT
DOUTL[8:0]/
AOUTL[8:0]
tP
COUT
COUTL
tP
DOUT
DOUTR[8:0]/
AOUTR[8:0]
COUTR
SOUTT[8:0]
SOUTB[8:0]
IFP
OFP
tP
tP
tP
tP
tP
COUT
DOUT
DOUT
FP
FP
Notes on Output Timing:
1. Output propagation delay time is the time in nanoseconds from the 1.4 Volt
point of the reference signal to the 1.4 Volt point of the output signal in the
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systolic application and to the 2.4 Volt point of the output signal in the bused
(open drain) applications.
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Corporate Information:info@pmc-sierra.com
Application Information:apps@pmc-sierra.com
Web Site:http://www.pmc-sierra.com
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