Philips (Now NXP) BSH111 Schematic [ru]

M3D088

1. Description

2. Features

BSH111
N-channel enhancement mode field-effect transistor
Rev. 02 — 26 April 2002 Product data
N-channel enhancement mode field-effect transistor in a plastic package using TrenchMOS™ technology.
Product availability:
TrenchMOS™ technology
Very fast switching
Low threshold voltage
Subminiature surface mount package.

3. Applications

Battery management
High speed switch
Logic level translator.

4. Pinning information

Table 1: Pinning - SOT23, simplified outline and symbol
Pin Description Simplified outline Symbol
1 gate (g) 2 source (s) 3 drain (d)
12
Top view
3
MSB003
SOT23
g
MBB076
d
s
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor

5. Quick reference data

Table 2: Quick reference data
Symbol Parameter Conditions Typ Max Unit
V I
D
P T R
DS
tot j DSon
drain-source voltage (DC) 25 °C Tj≤ 150 °C - 55 V drain current (DC) Tsp=25°C; VGS= 4.5 V - 335 mA total power dissipation Tsp=25°C - 0.83 W junction temperature - 150 °C drain-source on-state resistance VGS= 4.5 V; ID= 500 mA 2.3 4.0
= 2.5 V; ID= 75 mA 2.4 5.0
V
GS
= 1.8 V; ID= 75 mA 3.1 8.0
V
GS

6. Limiting values

Table 3: Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DS
V
DGR
V
GS
I
D
I
DM
P
tot
T
stg
T
j
Source-drain diode
I
S
I
SM
drain-source voltage (DC) 25 °C Tj≤ 150 °C - 55 V drain-gate voltage (DC) 25 °C Tj≤ 150 °C; RGS=20k -55V gate-source voltage - ±10 V drain current (DC) Tsp=25°C; VGS= 4.5 V;
- 335 mA
Figure 2 and 3
T
= 100 °C; VGS= 4.5 V; Figure 2 - 212 mA
sp
peak drain current Tsp=25°C; pulsed; tp≤ 10 µs;
- 1.3 A
Figure 3
total power dissipation Tsp=25°C; Figure 1 - 0.83 W storage temperature 65 +150 °C junction temperature 65 +150 °C
source (diode forward) current (DC) Tsp=25°C - 335 mA peak source (diode forward) current Tsp=25°C; pulsed; tp≤ 10 µs - 1.3 A
9397 750 09629
Product data Rev. 02 — 26 April 2002 2 of 13
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor
03aa17
200
Tsp (°C)
P
P
der
(%)
der
120
80
40
0
0
P
tot
----------------------
P
tot 25 C°()
50 100 150
100%×=
Fig 1. Normalized total power dissipation as a
function of solder point temperature.
10
150
T
03aa25
sp
200
(°C)
I
(%)
der
120
80
40
0
0
50 100
VGS≥ 4.5 V
I
I
der
D
------------------ -
I
D25C°()
100%×=
Fig 2. Normalized continuous drain current as a
function of solder point temperature.
03aa71
I (A)
D
1
-1
10
-2
10
1
Limit R
DSon
= VDS/ I
D
tp=10µs
100µs
1ms
DC
10
10 ms
100 ms
VDS (V)
Tsp=25°C; IDM is single pulse.
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage.
2
10
9397 750 09629
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Product data Rev. 02 — 26 April 2002 3 of 13
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor

7. Thermal characteristics

Table 4: Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
R
th(j-sp)
R
th(j-a)
thermal resistance from junction to solder point
thermal resistance from junction to ambient

7.1 Transient thermal impedance

mounted on metal clad substrate; Figure 4
minimum footprint; mounted on printed circuit board
- - 150 K/W
- 350 - K/W
3
10
Z
th(j-sp) (K/W)
2
δ = 0.5
10
0.2
0.1
0.05
10
0.02
single pulse
1
-5
10
-4
10
-3
10
-2
10
-1
10
P
δ =
t
p
T
1
Mounted on metal clad substrate.
Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration.
t
p
T
t
tp (s)
03aa69
10
9397 750 09629
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Product data Rev. 02 — 26 April 2002 4 of 13
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor

8. Characteristics

Table 5: Characteristics
Tj=25°C unless otherwise specified
Symbol Parameter Conditions Min Typ Max Unit
Static characteristics
V
(BR)DSS
drain-source breakdown voltage
V
I
DSS
I
GSS
R
GS(th)
DSon
gate-source threshold voltage ID= 1 mA; VDS=VGS;
drain-source leakage current VDS= 44 V; VGS=0V
gate-source leakage current VGS= ±8 V; VDS= 0 V - 10 100 nA drain-source on-state
resistance
Dynamic characteristics
g
Q Q Q C C C t t
fs
g(tot) gs
gd iss oss rss
on off
forward transconductance VDS= 10 V; ID= 200 mA;
total gate charge ID= 0.5 A; VDS=44V; gate-source charge - 0.05 - nC gate-drain (Miller) charge - 0.5 - nC input capacitance VGS=0V; VDS=10V; output capacitance - 7 30 pF reverse transfer capacitance - 4 10 pF turn-on time VDD= 50 V; RD= 250 ; turn-off time - 11 15 ns
ID=10µA; VGS=0V
=25°C5575-V
T
j
= 55 °C50--V
T
j
Figure 9
=25°C 0.4 1.0 1.3 V
T
j
= 150 °C 0.3 - - V
T
j
= 55 °C - - 2.5 V
T
j
=25°C - 0.01 1.0 µA
T
j
= 150 °C--10µA
T
j
VGS= 2.5 V; ID=75mA;
Figure 7 and 8
=25°C - 2.4 5
T
j
= 150 °C - - 7.4
T
j
= 4.5 V; ID= 500 mA;
V
GS
Figure 7 and 8
=25°C - 2.3 4
T
j
= 1.8 V; ID=75mA;
V
GS
Figure 7 and 8
=25°C - 3.1 8
T
j
100 380 - mS
Figure 11
- 1.0 - nC
=8V;Figure 14
V
GS
-1740pF
f = 1 MHz; Figure 12
- 4 10 ns
=10V; RG=50Ω;
V
GS
=50
R
GS
9397 750 09629
Product data Rev. 02 — 26 April 2002 5 of 13
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
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