Philips SA5222D Datasheet

INTEGRATED CIRCUITS
SA5222
Low-power FDDI transimpedance amp
Product specification 1995 Apr 26 IC19 Data Handbook
Philips Semiconductors
Philips Semiconductors Product specification

DESCRIPTION

The SA5222 is a low-power, wide-band, low noise transimpedance amplifier with differential outputs, optimized for signal recovery in FDDI fiber optic receivers. The part is also suited for many other RF and fiber optic applications as a general purpose gain block.

FEA TURES

Extremely low noise:
2.0pA
Hz
Single 5V supply
Low supply current: 9mA
Large bandwidth: 165MHz
Differential outputs
Low output offset
Low input/output impedances
High power-supply-rejection ratio: 55dB
Tight transresistance control
High input overload: 115µA
ESD protected
PIN DESCRIPTION
D Package
V
1
CC1
2
GND
1
3
IN
4
GND
1
Figure 1. Pin Configuration

APPLICATIONS

FDDI preamp
Current-to-voltage converters
Wide-band gain block
Medical and scientific instrumentation
Sensor preamplifiers
Single-ended to differential conversion
Low noise RF amplifiers
RF signal processing
V
8
OUT
7
6
OUT
5
GND
SD00360
CC2
2

ORDERING INFORMATION

DESCRIPTION TEMPERATURE RANGE ORDER CODE DWG #
8-Pin Plastic Small Outline (SO) package
-40 to +85°C
SA5222D SOT96-1

ABSOLUTE MAXIMUM RATINGS

SYMBOL PARAMETER RATING UNITS
V
CC1,2
T
A
T
J
T
STG
P
D
I
INMAX
NOTE:
1. Maximum power dissipation is determined by the operating ambient temperature and the thermal resistance θ
6.2mW/
°C above 25°C.
Power supply voltage 6 V Ambient temperature range -40 to +85
Junction temperature range -55 to +150 Storage temperature range -65 to +150
Power dissipation TA = 25oC (still air) Maximum input current 5 mA
1
0.78 W
= 158oC/W. Derate
JA

RECOMMENDED OPERATING CONDITIONS

SYMBOL PARAMETER RATING UNITS
V
CC1,2
T
A
T
J
Power supply voltage 4.5 to 5.5 V Ambient temperature range: SA grade -40 to +85 Junction temperature range: SA grade -40 to +105
°C °C °C
°C °C
1995 Apr 26 853-1582 15170
2
Philips Semiconductors Product specification
SYMBOL
PARAMETER
TEST CONDITIONS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
UNIT
T
SA5222Low-power FDDI transimpedance amplifier

DC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at TA = 25°C, and V
V V V
I
I
OMAX
I
INMAX
V
OMAX
Input bias voltage 1.3 1.55 1.8 V
IN
Output bias voltage 2.9 3.2 3.5 V
±
O
Output offset voltage 0 ±100 mV
OS
Supply current 6 9 12 mA
CC
Output sink/source current 1.5 2 mA
I
Input current (2% linearity) Test circuit 5, Procedure 2 ±60 ±90
IN
Maximum input current overload threshold Test circuit 5, Procedure 4 ±80 ±115 Maximum differential output voltage swing R

AC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at TA = 25°C and V
R
Transresistance (differential output)
T
R
R
R
f
R
C
R/V Transresistance power supply sensitivity VR/T
PSRR Power supply rejection ratio DC Tested, ∆VCC = ±0.5V –55 dB PSRR Power supply rejection ratio
I
INMAX
tr, tfRise and fall times 10 – 90% 2.2 ns
NOTES:
1. Bandwidth is tested into 50 load. Bandwidth into 1k load is approximately 165MHz.
2. Does not include Miller-multiplied capacitance of input device.
3. PSRR is output referenced and is circuit board layout dependent at higher frequencies. For best performance use a RF filter in VCC line.
4. Monitored in production via linearity and over load tests.
Output resistance
O
(differential output) Transresistance
T
(single-ended output) Output resistance
O
(single-ended output) Bandwidth (-3dB)
3dB
Input resistance 150
IN
Input capacitance
IN
1
2
Transresistance ambient temperature sensi­tivity
RMS noise current spectral density (referred
I
IN
to input) Integrated RMS noise current over the band-
width (referred to input) CS = 0pF f = 100MHz 25
I
T
CS = 1pF f = 50MHz 17
3
Maximum input amplitude for output duty cycle of 50 ±5%
t
Group delay f = 10MHz 2.2 ns
D
4
= V
CC1
= +5V, unless otherwise specified.
CC2
SA5222
Min Typ Max
= ∞, Test Circuit 5, Procedure 3 3.6 V
L
= V
CC1
=+5V , unless otherwise specified.
CC2
SA5222
Min Typ Max
DC tested, RL = ∞, Test Circuit 5,
Procedure 1
13.3 16.6 19.9 k
DC tested 30 60 90
DC tested, RL =
6.65 8.3 9.95 k
DC tested 15 30 45
Test Circuit 1 110 140 MHz
1
= V
CC1
TA = T
= 5 ±0.5V 1.0 %/V
CC2
A MAX
- T
A MIN
0.07
Test Circuit 2, f = 10MHz 2.0
Test circuit 2,
f = 50MHz
15
f = 150MHz 36
f = 100MHz 35f = 150MHz 55
f = 1.0MHz, Test Circuit 3 –34 dB
Test circuit 4 ±120 µA
µA µA
P-P
pF
%/oC
pAHz
nA
1995 Apr 26
3
Philips Semiconductors Product specification
SA5222Low-power FDDI transimpedance amplifier
TEST CIRCUITS
SINGLE-ENDED
V
OUT
R + 2 @ S21@ R
V
IN
1 + S22
-20
1 - S22
NETWORK ANALYZER
S-PARAMETER TEST SET
0.1uF
R=1k
GND
1
V
IN DUT
Z
O
RO = Z
= 50
O
PORT1 PORT2
50
Test Circuit 1: Bandwidth
Figure 2. Test Circuit1
TEST CIRCUITS (continued)
CC
OUT
OUT
RT+
RO = 2Z
20
20
GND
2
DIFFERENTIAL
V
OUT
R + 4 @ S21@ RRT+
V
IN
1 + S22
O
1 - S22
Z
.1uF
.1uF
O
50
= 50
-40
SD00361
5V
C
S
BIAS TEE
GND
1
SPECTRUM ANALYZER
V
CC
OUT
IN DUT
OUT
GND
.1µF
20
.1µF
20
2
Test Circuit 2: Noise
Figure 3. Test Circuit2
50
10µF
NE5209
10µF
50
SD00362
0.1uF
NC
GND
50
1
V
CC
OUT
IN DUT
OUT
PORT1 PORT2
.1uF
20
.1uF
20
GND
100
2
BAL.
Test Circuit 3: PSRR
Figure 4. Test Circuit4
NETWORK ANALYZER
S-PARAMETER TEST SET
NHO300HB
50
UNBAL.
CAL
TRANSFORMER
CONVERSION
LOSS = 9dB
SD00363
1995 Apr 26
4
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