Datasheet PHD50N03LT, PHP50N03LT Datasheet (Philips)

Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT Logic level FET
FEATURES SYMBOL QUICK REFERENCE DATA
’Trench’ technology V
d
= 25 V
DSS
• Very low on-state resistance
= 48 A
D
• Stable off-state characteristics
• High thermal cycling performance R
g
21 m (VGS = 5 V)
DS(ON)
• Low thermal resistance
s
R
16 m (VGS = 10 V)
DS(ON)
GENERAL DESCRIPTION
N-channel enhancement mode logic level field-effect power transistor in a plastic envelope using ’trench’ technology. The combinationofverylow on-state resistance and low switching losses make this device the optimum choice in high speed computer motherboard d.c. to d.c. converters.
The PHP50N03LT is supplied in the SOT78 (TO220AB) conventional leaded package. The PHB505N03LT is supplied in the SOT404 surface mounting package. The PHD50N03LT is supplied in the SOT428 surface mounting package.
PINNING SOT78 (TO220AB) SOT404 SOT428
PIN DESCRIPTION
1 gate 2 drain
1
tab
tab
tab
3 source
tab drain
123
2
13
2
1
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DSS
V
DGR
V
GS
V
GSM
I
D
I
DM
P
D
Tj, T
Drain-source voltage Tj = 25 ˚C to 175˚C - 25 V Drain-gate voltage Tj = 25 ˚C to 175˚C; RGS = 20 k -25V Gate-source voltage - ± 15 V Pulsed gate-source voltage Tj 150˚C - ± 20 V Continuous drain current Tmb = 25 ˚C; VGS = 10 V - 48 A
Tmb = 100 ˚C; VGS = 10 V - 34 A Pulsed drain current Tmb = 25 ˚C - 180 A Total power dissipation Tmb = 25 ˚C - 86 W Operating junction and - 55 175 ˚C
stg
storage temperature
1 It is not possible to make connection to pin 2 of the SOT428 or SOT404 packages.
June 1998 1 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
R
th j-mb
R
th j-a
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GS(TO)
R
DS(ON)
g
fs
I
DSS
I
GSS
Q
g(tot)
Q
gs
Q
gd
t
d on
t
r
t
d off
t
f
L
d
L
d
L
s
C
iss
C
oss
C
rss
Thermal resistance junction - - 1.75 K/W to mounting base Thermal resistance junction SOT78 package, in free air - 60 - K/W to ambient SOT404 and SOT428 packages, pcb - 50 - K/W
mounted, minimum footprint
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 25 - - V voltage Tj = -55˚C 22 - - V Gate threshold voltage VDS = VGS; ID = 1 mA 1 1.5 2 V
Tj = 175˚C 0.5 - - V
Tj = -55˚C - - 2.3 V Drain-source on-state VGS = 10 V; ID = 25 A - 13 16 m resistance VGS = 10 V; ID = 25 A (SOT428 package) - 15 18 m
VGS = 5 V; ID = 25 A - 18 21 m
VGS = 5 V; ID = 25 A; Tj = 175˚C - - 39 m Forward transconductance VDS = 25 V; ID = 25 A 8 27 - S Zero gate voltage drain VDS = 25 V; VGS = 0 V; - 0.05 10 µA current Tj = 175˚C - - 500 µA Gate source leakage current VGS = ±5 V; VDS = 0 V - 10 100 nA
Total gate charge ID = 20 A; V
= 24 V; VGS = 10 V - 40 - nC
DD
Gate-source charge - 7 - nC Gate-drain (Miller) charge - 10 - nC
Turn-on delay time VDD = 15 V; ID = 25 A; - 10 20 ns Turn-on rise time VGS = 10 V; RG = 5 -5075ns Turn-off delay time Resistive load - 50 75 ns Turn-off fall time - 30 45 ns
Internal drain inductance Measured tab to centre of die - 3.5 - nH Internal drain inductance Measured from drain lead to centre of die - 4.5 - nH
(SOT78 package only) Internal source inductance Measured from source lead to source - 7.5 - nH
bond pad Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 1050 - pF
Output capacitance - 270 - pF Feedback capacitance - 140 - pF
June 1998 2 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
S
I
SM
V
SD
t
rr
Q
rr
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
W
DSS
Continuous source current - - 48 A (body diode) Pulsed source current (body - - 180 A diode) Diode forward voltage IF = 25 A; VGS = 0 V - 0.95 1.2 V
IF = 40 A; VGS = 0 V - 1.0 ­Reverse recovery time IF = 40 A; -dIF/dt = 100 A/µs; - 52 - ns
Reverse recovery charge VGS = -10 V; VR = 25 V - 0.08 - µC
Drain-source non-repetitive ID = 25 A; VDD 15 V; - 60 mJ unclamped inductive turn-off VGS = 10 V; RGS = 50 ; Tmb = 25 ˚C energy
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
D 25 ˚C
= f(Tmb)
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140 160 180
Normalised Current Derating
Tmb / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
June 1998 3 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT Logic level FET
ID, Drain current (Amps)
1000
100
10
RDS(ON) = VDS/ID
DC
Tmb = 25 C
1
1 10 100
VDS, Drain-source voltage (Volts)
PHP50N03T
tp = 10 us
100 us
1 ms 10 ms
Fig.3. Safe operating area
ID & IDM = f(VDS); IDM single pulse; parameter t
Zth j-mb / (K/W)
10
D =
1
0.5
0.2
0.1
0.1
0.05
0.02
0.01
0
1E-07 1E-05 1E-03 1E-01 1E+01
t / s
p
t
P
D
7528-30
p
t
D =
T
T
t
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
Drain-Source on resistance, RDS(on) (Ohms)
0.06
0.05
0.04
0.03
0.02
0.01
3 V
Tj = 25 C
0
0 1020304050607080
PHP45N03LT
3.5 V 4 V
ID, Drain current (Amps)
4.5 V
5 V
10 V
VGS = 15 V
Fig.6. Typical on-state resistance
R
p
Drain current, ID (A)
50
VDS = 25 V
40
30
20
10
0
0123456
= f(ID); parameter V
DS(ON)
175 C
Gate-source voltage, VGS (V)
Tj = 25 C
GS
PHP45N03LT
Fig.7. Typical transfer characteristics.
ID = f(VGS)
ID, Drain current (Amps)
80
15 V
10 V
70 60 50 40 30 20 10
0
0246810
5 V
VDS, Drain-Source voltage (Volts)
Tj = 25 C
PHP45N03LT
4.5 V
4 V
3.5 V
3 V
VGS = 2.5 V
Fig.5. Typical output characteristics
ID = f(VDS); parameter V
GS
Transconductance, gfs (S)
30
VDS = 25 V
25
20
175 C
15
10
5
0
0 1020304050
Drain current, ID (A)
Fig.8. Typical transconductance
gfs = f(ID)
PHP45N03LT
Tj = 25 C
June 1998 4 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT Logic level FET
a
2
1.5
1
0.5
0
-100 0 100 200 Tj / C
30V TrenchMOS
15050-50
Fig.9. Normalised drain-source on-state resistance.
VGS(TO) / V
2.5
2
1.5
1
max.
typ.
min.
a = R
DS(ON)/RDS(ON)25 ˚C
= f(Tj)
BUK959-60
C / pF
10000
1000
100
0.1 1 10 100
Fig.12. Typical capacitances, C
VDS / V
, C
iss
oss
C = f(VDS); VGS = 0 V; f = 1 MHz
VGS, Gate-Source voltage (Volts)
15
VDD=24V ID=20A Tj = 25C
10
5
PHP50N03LT
9528-30
Ciss
Coss Crss
, C
rss
.
0.5
0
-100 -50 0 50 100 150 200 Tj / C
Fig.10. Gate threshold voltage.
V
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
1E-01
1E-02
1E-03
1E-04
1E-05
1E-05
0 0.5 1 1.5 2 2.5 3
2% typ
Sub-Threshold Conduction
98%
Fig.11. Sub-threshold drain current.
ID = f(V
; VDS = V
GS)
GS
GS
0
0 1020304050
Qg, Gate charge (nC)
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG)
GS
IF / A
60
50
40
30
20
10
0
0 0.5 1 1.5 2
Tj / C = 175 25
VSDS / V
9528-30
Fig.14. Typical reverse diode current.
IF = f(V
SDS
)
June 1998 5 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT Logic level FET
WDSS%
120 110 100
90 80 70 60 50 40 30 20 10
0
20 40 60 80 100 120 140 160 180
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb)
DSS
L
VDS
VGS
0
RGS
T.U.T.
Fig.16. Avalanche energy test circuit.
W
= 0.5 LI
DSS
2
D
BV
DSS
/(BV
R 01
shunt
DSS−VDD
VDD
+
-
-ID/100
)
June 1998 6 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 2 g
10,3 max
1,3
3,7
4,5
max
3,0 max
not tinned
1,3
max
(2x)
123
2,54 2,54
2,8
3,0
13,5
min
0,9 max (3x)
5,9
min
15,8
max
0,6
2,4
Fig.17. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
June 1998 7 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
MECHANICAL DATA
Dimensions in mm Net Mass: 1.4 g
2.54 (x2)
MOUNTING INSTRUCTIONS
Dimensions in mm
10.3 max
11 max
15.4
0.85 max (x2)
4.5 max
1.4 max
0.5
Fig.18. SOT404 : centre pin connected to mounting base.
11.5
2.5
9.0
17.5
2.0
3.8
5.08
Fig.19. SOT404 : soldering pattern for surface mounting
.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
June 1998 8 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
MECHANICAL DATA
Dimensions in mm : Net Mass: 1.4 g
seating plane
1
2.285 (x2)
Fig.20. SOT428 : centre pin connected to mounting base.
MOUNTING INSTRUCTIONS
6.73 max
tab
2
3
1.1
6.22 max
10.4 max
0.5 min
0.8 max (x2)
Dimensions in mm
2.38 max
0.93 max
0.3
0.5
7.0
5.4
4 min
4.6
0.5
7.0
2.15
2.5
4.57
Fig.21. SOT428 : soldering pattern for surface mounting
1.5
.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
June 1998 9 Rev 1.500
Philips Semiconductors Product specification
TrenchMOS transistor PHP50N03LT, PHB50N03LT, PHD50N03LT
Logic level FET
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
June 1998 10 Rev 1.500
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