Philips PHB3N50E, PHP3N50E Datasheet

Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
FEATURES SYMBOL QUICK REFERENCE DATA
• Repetitive Avalanche Rated
• Fast switching V
d
= 500 V
DSS
• High thermal cycling performance I
• Low thermal resistance
g
s
= 3.4 A
D
R
DS(ON)
3
GENERAL DESCRIPTION
N-channel,enhancementmodefield-effect power transistor, intendedforusein off-line switched mode powersupplies, T.V.andcomputer monitor powersupplies, d.c. to d.c.converters, motor controlcircuitsand general purpose switching applications.
The PHP3N50E is supplied in the SOT78 (TO220AB) conventional leaded package. The PHB3N50E is supplied in the SOT404 surface mounting package.
PINNING SOT78 (TO220AB) SOT404
PIN DESCRIPTION
1 gate 2 drain
1
3 source
tab drain
tab
123
tab
2
13
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DSS
V
DGR
V
GS
I
D
I
DM
P
D
Tj, T
December 1998 1 Rev 1.200
Drain-source voltage Tj = 25 ˚C to 150˚C - 500 V Drain-gate voltage Tj = 25 ˚C to 150˚C; RGS = 20 k - 500 V Gate-source voltage - ± 30 V Continuous drain current Tmb = 25 ˚C; VGS = 10 V - 3.4 A
Tmb = 100 ˚C; VGS = 10 V - 2.2 A Pulsed drain current Tmb = 25 ˚C - 14 A Total dissipation Tmb = 25 ˚C - 83 W Operating junction and - 55 150 ˚C
stg
storage temperature range
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
AVALANCHE ENERGY LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
E
AS
E
AR
IAS, I
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
R
th j-mb
R
th j-a
Non-repetitive avalanche Unclamped inductive load, IAS = 2.1 A; - 212 mJ energy tp = 0.31 ms; Tj prior to avalanche = 25˚C;
VDD 50 V; RGS = 50 ; VGS = 10 V; refer
to fig:17 Repetitive avalanche energy1IAR = 3.4 A; tp = 2.5 µs; Tj prior to - 5.5 mJ
avalanche = 25˚C; RGS = 50 ; VGS = 10 V;
refer to fig:18 Repetitive and non-repetitive - 3.4 A
AR
avalanche current
Thermal resistance junction - - 1.5 K/W to mounting base Thermal resistance junction SOT78 package, in free air - 60 - K/W to ambient SOT404 package, pcb mounted, minimum - 50 - K/W
footprint
1 pulse width and repetition rate limited by Tj max.
December 1998 2 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
ELECTRICAL CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
VT
R
DS(ON)
V
GS(TO)
g
fs
I
DSS
I
GSS
Q
g(tot)
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
d
L
d
L
s
C
iss
C
oss
C
rss
(BR)DSS
j
Drain-source breakdown VGS = 0 V; ID = 0.25 mA 500 - - V voltage
/ Drain-source breakdown VDS = VGS; ID = 0.25 mA - 0.1 - %/K
voltage temperature coefficient Drain-source on resistance VGS = 10 V; ID = 1.7 A - 2.5 3 Gate threshold voltage VDS = VGS; ID = 0.25 mA 2.0 3.0 4.0 V Forward transconductance VDS = 30 V; ID = 1.7 A 1 2 - S Drain-source leakage current VDS = 500 V; VGS = 0 V - 1 25 µA
VDS = 400 V; VGS = 0 V; Tj = 125 ˚C - 30 250 µA Gate-source leakage current VGS = ±30 V; VDS = 0 V - 10 200 nA
Total gate charge ID = 3.4 A; V
= 400 V; VGS = 10 V - 26 30 nC
DD
Gate-source charge - 2 3 nC Gate-drain (Miller) charge - 13 17 nC
Turn-on delay time VDD = 250 V; RD = 68 ; - 10 - ns Turn-on rise time RG = 18 -29-ns Turn-off delay time - 66 - ns Turn-off fall time - 32 - ns
Internal drain inductance Measured from tab to centre of die - 3.5 - nH Internal drain inductance Measured from drain lead to centre of die - 4.5 - nH
(SOT78 package only) Internal source inductance Measured from source lead to source - 7.5 - nH
bond pad Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 310 - pF
Output capacitance - 50 - pF Feedback capacitance - 28 - pF
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
S
I
SM
V
SD
t
rr
Q
rr
Continuous source current Tmb = 25˚C - - 3.4 A (body diode) Pulsed source current (body Tmb = 25˚C - - 14 A diode) Diode forward voltage IS = 3.4 A; VGS = 0 V - - 1.2 V
Reverse recovery time IS = 3.4 A; VGS = 0 V; dI/dt = 100 A/µs - 370 - ns Reverse recovery charge - 2.7 - µC
December 1998 3 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
PD%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
ID%
120 110 100
90 80 70 60 50 40 30 20 10
0
0 20 40 60 80 100 120 140
Tmb / C
= f(Tmb)
D 25 ˚C
Normalised Current Derating
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 10 V
D 25 ˚C
Zth j-mb, Transient thermal impedance (K/W)
10
D = 0.5
1
0.2
0.1
0.01
0.001
single pulse
1us
0.1
0.05
0.02
10us 100us
tp, pulse width (s)
1ms 1s
P
D
10ms 100ms
PHP2N60
t
D =
p
T
t
t
p
T
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
ID, Drain current (Amps)
8
Tj = 25 C
7 6 5 4 3 2 1 0
0 5 10 15 20 25 30
VDS, Drain-Source voltage (Volts)
Fig.5. Typical output characteristics
ID = f(VDS); parameter V
PHP3N50
7 V
VGS = 4.5 V
GS
10 V
5.5 V
.
6 V
5 V
ID, Drain current (Amps)
100
10
RDS(ON) = VDS/ID
1
DC
0.1 10 100 1000 10000
VDS, Drain-source voltage (Volts)
tp = 10 us
100 us
1 ms
10 ms
100 ms
PHP3N50
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
RDS(on), Drain-Source on resistance (Ohms)
6
4.5 V
5
Tj = 25 C
4
3
2
1
0
012345678
5 V 5.5 V
ID, Drain current (Amps)
VGS = 6 V
Fig.6. Typical on-state resistance
R
p
= f(ID); parameter V
DS(ON)
PHP3N50
10 V
7 V
.
GS
December 1998 4 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
ID, Drain current (Amps)
8
VDS > ID x RDS(on)max
7 6 5 4 3 2 1 0
0246810
Tj = 150 C
Tj = 25 C
VGS, Gate-Source voltage (Volts)
PHP3N50
Fig.7. Typical transfer characteristics.
ID = f(VGS); parameter T
gfs, Transconductance (S)
3
VDS > ID x RDS(on)max
2.5
Tj = 25 C
2
1.5
1
0.5
j
PHP3N50
150 C
VGS(TO) / V
4
3
2
1
0
-60 -40 -20 0 20 40 60 80 100 120 140
max.
typ.
min.
Tj / C
Fig.10. Gate threshold voltage
V
= f(Tj); conditions: ID = 0.25 mA; VDS = V
GS(TO)
1E-01
1E-02
1E-03
1E-04
1E-05
ID / A
SUB-THRESHOLD CONDUCTION
2 %
typ
.
GS
98 %
0
012345678
Fig.8. Typical transconductance
a
2
1
0
-60 -40 -20 0 20 40 60 80 100 120 140
ID, Drain current (A)
gfs = f(ID); parameter T
Normalised RDS(ON) = f(Tj)
Tj / C
.
j
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
= f(Tj); ID = 1.7 A; VGS = 10 V
1E-06
0 1 2 3 4
VGS / V
Fig.11. Sub-threshold drain current.
ID = f(V
Junction capacitances (pF)
1000
100
10
1
1 10 100 1000
Fig.12. Typical capacitances, C
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
; conditions: Tj = 25 ˚C; VDS = V
GS)
Ciss
Coss
Crss
VDS, Drain-Source voltage (Volts)
, C
iss
PHP3N50
oss
, C
GS
rss
.
December 1998 5 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
VGS, Gate-Source voltage (Volts)
15
ID = 3.4 A
Tj = 25 C
10
5
0
0 10203040
Qg, Gate charge (nC)
240 V
100 V
PHP3N50
VDD = 400 V
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); parameter V
GS
Switching times (ns)
1000
VDD = 250 V
VGS = 10 V RD = 68 Ohms
Tj = 25 C
100
td(off)
tf
tr
10
td(on)
1
0 102030405060
RG, Gate resistance (Ohms)
Fig.14. Typical switching times; t
d(on)
DS
, tr, t
PHP3N50
, tf = f(RG)
d(off)
IF, Source-Drain diode current (Amps)
20
VGS = 0 V
15
10
5
0
0 0.5 1 1.5
VSDS, Source-Drain voltage (Volts)
150 C
PHP3N50
Tj = 25 C
Fig.16. Source-Drain diode characteristic.
IF = f(V
Non-repetitive Avalanche current, IAS (A)
10
1
VDS
tp
ID
0.1 1E-06 1E-05 1E-04 1E-03 1E-02
); parameter T
SDS
Tj prior to avalanche = 25 C
125 C
Avalanche time, tp (s)
j
PHP3N50E
Fig.17. Maximum permissible non-repetitive
avalanche current (IAS) versus avalanche time (tp);
unclamped inductive load
Normalised Drain-source breakdown voltage
1.15
V(BR)DSS @ Tj V(BR)DSS @ 25 C
1.1
1.05
1
0.95
0.9
0.85
-100 -50 0 50 100 150 Tj, Junction temperature (C)
Fig.15. Normalised drain-source breakdown voltage
V
(BR)DSS/V(BR)DSS 25 ˚C
= f(Tj)
;
Maximum Repetitive Avalanche Current, IAR (A)
10
1
0.1
0.01 1E-06 1E-05 1E-04 1E-03 1E-02
Avalanche time, tp (s)
Tj prior to avalanche = 25 C
125 C
PHP3N50E
Fig.18. Maximum permissible repetitive avalanche
current (IAR) versus avalanche time (tp)
December 1998 6 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
MECHANICAL DATA
Dimensions in mm Net Mass: 2 g
10,3 max
1,3
3,7
4,5 max
3,0 max
not tinned
1,3
max
(2x)
123
2,54 2,54
2,8
3,0
13,5
min
0,9 max (3x)
5,9
min
15,8
max
0,6
2,4
Fig.19. SOT78 (TO220AB); pin 2 connected to mounting base.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Refer to mounting instructions for SOT78 (TO220) envelopes.
3. Epoxy meets UL94 V0 at 1/8".
December 1998 7 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
MECHANICAL DATA
Dimensions in mm Net Mass: 1.4 g
2.54 (x2)
MOUNTING INSTRUCTIONS
Dimensions in mm
10.3 max
11 max
15.4
0.85 max (x2)
4.5 max
1.4 max
0.5
Fig.20. SOT404 : centre pin connected to mounting base.
11.5
2.5
9.0
17.5
2.0
3.8
5.08
Fig.21. SOT404 : soldering pattern for surface mounting
.
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide.
2. Epoxy meets UL94 V0 at 1/8".
December 1998 8 Rev 1.200
Philips Semiconductors Product specification
PowerMOS transistors PHP3N50E, PHB3N50E Avalanche energy rated
DEFINITIONS
Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
Philips Electronics N.V. 1998
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
December 1998 9 Rev 1.200
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