Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
FEATURES SYMBOL QUICK REFERENCE DATA
• ’Trench’ technology V
d
= 30 V
DSS
• Very low on-state resistance
• Fast switching I
= 75 A
D
• Stable off-state characteristics
• High thermal cycling performance R
• Low thermal resistance
g
R
s
≤ 6 mΩ (VGS = 5 V)
DS(ON)
≤ 5 mΩ (VGS = 10 V)
DS(ON)
GENERAL DESCRIPTION
N-channel enhancement mode logic level field-effect power transistor in a plastic envelope using ’trench ’ technology.
Thedevicehasverylowon-stateresistance. Itis intended for use in dc to dc convertersand general purpose switching
applications.
The PHP130N03LT is supplied in the SOT78 (TO220AB) conventional leaded package.
The PHB130N03LT is supplied in the SOT404 surface mounting package.
PINNING SOT78 (TO220AB) SOT404
PIN DESCRIPTION
1 gate
2 drain
1
3 source
tab drain
tab
123
tab
2
13
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DSS
V
DGR
V
GS
I
D
I
DM
P
D
Tj, T
1 It is not possible to make connection to pin 2 of the SOT404 package.
January 1998 1 Rev 1.300
Drain-source voltage Tj = 25 ˚C to 175˚C - 30 V
Drain-gate voltage Tj = 25 ˚C to 175˚C; RGS = 20 kΩ -3 0V
Gate-source voltage - ± 13 V
Continuous drain current Tmb = 25 ˚C; VGS = 5 V - 75 A
Tmb = 100 ˚C; VGS = 5 V - 75 A
Pulsed drain current Tmb = 25 ˚C - 240 A
Total power dissipation Tmb = 25 ˚C - 187 W
Operating junction and - 55 175 ˚C
stg
storage temperature
Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
ESD LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
C
THERMAL RESISTANCES
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
R
th j-mb
R
th j-a
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
Electrostatic discharge Human body model (100 pF, 1.5 kΩ )-2 k V
capacitor voltage, all pins
Thermal resistance junction - - 0.8 K/W
to mounting base
Thermal resistance junction SOT78 package, in free air - 60 - K/W
to ambient SOT404 package, pcb mounted, minimum - 50 - K/W
footprint
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA; 30 - - V
voltage Tj = -55˚C 27 - - V
V
(BR)GSS
Gate-source breakdown IG = 1 mA 10 - - V
voltage
V
GS(TO)
Gate threshold voltage VDS = VGS; ID = 1 mA 1 1.5 2 V
Tj = 175˚C 0.5 - - V
Tj = -55˚C - - 2.3 V
R
DS(ON)
Drain-source on-state VGS = 5 V; ID = 25 A - 5 6 mΩ
resistance VGS = 10 V; ID = 25 A - 4.5 5 mΩ
VGS = 5 V; ID = 25 A; Tj = 175˚C - - 11 mΩ
g
I
fs
GSS
Forward transconductance VDS = 25 V; ID = 25 A 20 40 - S
Gate-source leakage current VGS = ± 5 V; VDS = 0 V; - 0.02 1 µ A
Tj = 175˚C - - 10 µ A
I
DSS
Zero gate voltage drain VDS = 30 V; VGS = 0 V; - 0.05 10 µ A
current Tj = 175˚C - - 500 µ A
Q
Q
Q
t
t
t
t
L
L
g(tot)
gs
gd
d on
r
d off
f
d
d
Total gate charge ID = 75 A; V
= 24 V; VGS = 5 V - 92 - nC
DD
Gate-source charge - 10 - nC
Gate-drain (Miller) charge - 36 - nC
Turn-on delay time VDD = 15 V; ID = 25 A; - 45 60 ns
Turn-on rise time VGS = 5 V; RG = 5 Ω - 120 170 ns
Turn-off delay time Resistive load - 225 300 ns
Turn-off fall time - 100 135 ns
Internal drain inductance Measured tab to centre of die - 3.5 - nH
Internal drain inductance Measured from drain lead to centre of die - 4.5 - nH
(SOT78 package only)
L
s
Internal source inductance Measured from source lead to source - 7.5 - nH
bond pad
C
iss
C
oss
C
rss
Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 5000 - pF
Output capacitance - 1150 - pF
Feedback capacitance - 500 - pF
January 1998 2 Rev 1.300
Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
S
I
SM
V
SD
t
rr
Q
rr
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
W
DSS
Continuous source current - - 75 A
(body diode)
Pulsed source current (body - - 240 A
diode)
Diode forward voltage IF = 25 A; VGS = 0 V - 0.85 1.2 V
IF = 75 A; VGS = 0 V - 1.0 Reverse recovery time IF = 75 A; -dIF/dt = 100 A/µ s; - 100 - ns
Reverse recovery charge VGS = -10 V; VR = 25 V - 0.6 - µ C
Drain-source non-repetitive ID = 75 A; VDD ≤ 15 V; - 500 mJ
unclamped inductive turn-off VGS = 5 V; RGS = 50 Ω ; Tmb = 25 ˚C
energy
PD%
120
110
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140 160 180
Normalised Power Derating
Tmb / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/P
D 25 ˚C
= f(Tmb)
ID (A) Current Derating
140
120
100
80
60
40
20
0
0 20 40 60 80 100 120 140 160 180
Limited by package
Tmb / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/I
= f(Tmb); conditions: VGS ≥ 5 V
D 25 ˚C
January 1998 3 Rev 1.300
Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
Drain current, ID (A)
1000
RDS(ON) = VDS / ID
100
DC
10
1
1 10 100
Drain-source voltage, VDS (V)
7506-30
tp = 10 us
100 us
1 ms
10 ms
100 ms
Fig.3. Safe operating area. Tmb = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter t
Zth / (K/W)
1E+00
0.5
1E-01
1E-02
0.2
0.1
0.05
0.02
t
p
P
D
0
D =
T
RDS(ON) / mOhm
10
8
6
4
2
0
0 2 04 06 08 01 0 0
3
ID / A
Fig.6. Typical on-state resistance, Tj = 25 ˚C
R
p
ID / A
100
80
60
t
p
T
t
40
20
= f(ID); parameter V
DS(ON)
Tj / C = 175
25
9506-30
3.5
4
5
6
.
GS
9506-30
1E-03
1E-07 1E-05 1E-03 1E-01 1E+01
t / s
Fig.4. Transient thermal impedance.
Z
= f(t); parameter D = tp/T
th j-mb
ID / A
100
3.5 6
80
60
40
20
5
VGS / V =
0
024681 0
VDS / V
Fig.5. Typical output characteristics, Tj = 25 ˚C
ID = f(VDS); parameter V
BUK9506-30
3
2.8
2.6
2.4
2.2
.
GS
0
012345
VGS / V
Fig.7. Typical transfer characteristics.
ID = f(VGS) ; conditions: VDS = 25 V; parameter T
gfs / S
100
80
60
40
20
0
0 2 04 06 08 01 0 0
Tj / C = 25
175
ID / A
9506-30
Fig.8. Typical transconductance, Tj = 25 ˚C
j
.
gfs = f(ID); conditions: VDS = 25 V
January 1998 4 Rev 1.300
Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
a
2
1.5
1
0.5
0
-100 0 100 200
Tj / C
30V TrenchMOS
150 50 -50
Fig.9. Normalised drain-source on-state resistance.
a = R
DS(ON)/RDS(ON)25 ˚C
VGS(TO) / V
2.5
max.
2
typ.
1.5
min.
1
= f(Tj); ID = 25 A; VGS = 5 V
BUK959-60
C / pF
10000
1000
100
0.1 1 10 100
Fig.12. Typical capacitances, C
VDS / V
, C
iss
oss
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
VGS / V
5
4
3
2
VDS / V = 6 24
9506-30
Ciss
Coss
Crss
, C
rss
9506-30
.
0.5
0
-100 -50 0 50 100 150 200
Tj / C
Fig.10. Gate threshold voltage.
V
= f(Tj); conditions: ID = 1 mA; VDS = V
GS(TO)
1E-01
1E-02
1E-03
1E-04
1E-05
1E-05
0 0.5 1 1.5 2 2.5 3
2% typ
Sub-Threshold Conduction
98%
Fig.11. Sub-threshold drain current.
ID = f(V
; conditions: Tj = 25 ˚C; VDS = V
GS)
GS
GS
1
0
0 2 04 06 08 01 0 0
QG / nC
Fig.13. Typical turn-on gate-charge characteristics.
V
= f(QG); conditions: ID = 75 A; parameter V
GS
IF / A
100
80
60
40
20
0
0 0.5 1 1.5 2
Tj / C = 175 25
VSDS / V
DS
9506-30
Fig.14. Typical reverse diode current.
IF = f(V
); conditions: V
SDS
= 0 V; parameter T
GS
j
January 1998 5 Rev 1.300
Philips Semiconductors Product specification
TrenchMOS transistor PHP130N03LT, PHB130N03LT
Logic level FET
WDSS%
120
110
100
90
80
70
60
50
40
30
20
10
0
20 40 60 80 100 120 140 160 180
Tmb / C
Fig.15. Normalised avalanche energy rating.
W
% = f(Tmb); conditions: ID = 75 A
DSS
L
VDS
VGS
0
RGS
T.U.T.
Fig.16. Avalanche energy test circuit.
W
= 0.5 ⋅ LI
DSS
2
D
⋅ BV
DSS
/( BV
R 01
shunt
DSS−VDD
VDD
+
-
-ID/100
)
January 1998 6 Rev 1.300