Philips Semiconductors Product specification
PowerMOS transistors PHP10N40E, PHB10N40E, PHW10N40E
Avalanche energy rated
ELECTRICAL CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
Drain-source breakdown VGS = 0 V; ID = 0.25 mA 400 - - V
voltage
∆V
(BR)DSS
/ Drain-source breakdown VDS = VGS; ID = 0.25 mA - 0.1 - %/K
∆T
j
voltage temperature
coefficient
R
DS(ON)
Drain-source on resistance VGS = 10 V; ID = 5.3 A - 0.42 0.55 Ω
V
GS(TO)
Gate threshold voltage VDS = VGS; ID = 0.25 mA 2.0 3.0 4.0 V
g
fs
Forward transconductance VDS = 30 V; ID = 5.3 A 3.5 6 - S
I
DSS
Drain-source leakage current VDS = 400 V; VGS = 0 V - 1 25 µA
VDS = 320 V; VGS = 0 V; Tj = 125 ˚C - 30 250 µA
I
GSS
Gate-source leakage current VGS = ±30 V; VDS = 0 V - 10 200 nA
Q
g(tot)
Total gate charge ID = 10.6 A; V
DD
= 320 V; VGS = 10 V - 90 110 nC
Q
gs
Gate-source charge - 7 9 nC
Q
gd
Gate-drain (Miller) charge - 49 60 nC
t
d(on)
Turn-on delay time VDD = 200 V; RD = 18 Ω; - 13 - ns
t
r
Turn-on rise time RG = 9.1 Ω -65-ns
t
d(off)
Turn-off delay time - 108 - ns
t
f
Turn-off fall time - 70 - ns
L
d
Internal drain inductance Measured from tab to centre of die - 3.5 - nH
L
d
Internal drain inductance Measured from drain lead to centre of die - 4.5 - nH
(SOT78 package only)
L
s
Internal source inductance Measured from source lead to source - 7.5 - nH
bond pad
C
iss
Input capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 1080 - pF
C
oss
Output capacitance - 190 - pF
C
rss
Feedback capacitance - 110 - pF
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS
Tj = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
S
Continuous source current Tmb = 25˚C - - 10.6 A
(body diode)
I
SM
Pulsed source current (body Tmb = 25˚C - - 42 A
diode)
V
SD
Diode forward voltage IS = 10.6 A; VGS = 0 V - - 1.2 V
t
rr
Reverse recovery time IS = 10.6 A; VGS = 0 V; dI/dt = 100 A/µs - 330 - ns
Q
rr
Reverse recovery charge - 4.8 - µC
December 1998 3 Rev 1.200