Philips PCA1601U-10, PCA1604U, PCA1604U-10, PCA1608U, PCA1611U Technical data

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INTEGRATED CIRCUITS

DATA SH EET

PCA16xx series

32 kHz watch circuits with EEPROM

Product speciﬁcation Supersedes data of 1997 Apr 21 File under Integrated Circuits, IC16

1997 Dec 12

Philips Semiconductors Product speciﬁcation

32 kHz watch circuits with EEPROM PCA16xx series

FEATURES

• 32 kHz oscillator, amplitude regulated with excellent frequency stability

• High immunity of the oscillator to leakage currents

• Time calibration electrically programmable and

reprogrammable (via EEPROM)

• A quartz crystal is the only external component required

• Very low current consumption; typically 170 nA

• Detector for silver-oxide or lithium battery voltage levels

• Indication for battery end-of-life

ORDERING INFORMATION

TYPE

NUMBER

PCA1601U/10 − chip on foil − PCA1602T PMFP8 plastic micro ﬂat package; 8 leads (straight) SOT144-1 PCA1603U/7 − chip with bumps on tape − PCA1604U − chip in tray − PCA1604U/10 − chip on foil − PCA1605U/7 − chip with bumps on tape − PCA1606U/10 − chip on foil − PCA1607U − chip in tray − PCA1608U − chip in tray − PCA1611U − chip in tray − PCA1621U/7 − chip with bumps on tape − PCA1621U/10 − chip on foil − PCA1622U − chip in tray − PCA1623U/7 − chip with bumps on tape − PCA1624U − chip in tray − PCA1625U/7 − chip with bumps on tape − PCA1626U − chip in tray − PCA1627U/7 − chip with bumps on tape − PCA1628U − chip in tray − PCA1629U/7 − chip with bumps on tape −

NAME DESCRIPTION VERSION

• Stop function for accurate timing

• Power-on reset for fast testing

• Various test modes for testing the mechanical parts of

the watch and the IC.

GENERAL DESCRIPTION

The PCA16xx series devices are CMOS integrated circuits specially suited for battery-operated, quartz-crystal-controlled wrist-watches, with bipolar stepping motors.

PACKAGE

(1)

Note

1. Figure 1 and Chapter “Package outline” show details of standard package, available for specified devices and for

large orders only. Chapter “Chip dimensions and bonding pad locations” shows exact pad locations for other delivery formats.

1997 Dec 12 2

Philips Semiconductors Product speciﬁcation

32 kHz watch circuits with EEPROM PCA16xx series

PINNING

SYMBOL PIN DESCRIPTION

TEST 2 test output OSC IN 3 oscillator input OSC OUT 4 oscillator output V

M1 6 motor 1 output M2 7 motor 2 output RESET 8 reset input

1 ground (0 V)

5 positive supply voltage

TEST

OSC IN

OSC OUT

1 2

PCA16xxT

3 4

MSA973

8 7 6 5

RESET M2 M1

Fig.1 Pin configuration, PCA16xxT, (PMFP8).

FUNCTIONAL DESCRIPTION AND TESTING Motor pulse

The motor pulse width (t

) and the cycle times (tT) are

given in Chapter “Available types”.

Voltage level detector

The supply voltage is compared with the internal voltage reference V

LIT

and V

every minute. The first voltage

EOL

level detection is carried out 30 ms after a RESET.

Lithium mode

If a lithium voltage is detected (V

≥ V

), the circuit will

LIT

operate in the lithium mode. The motor pulse will be produced with a 75% duty factor.

Silver-oxide mode

If the voltage level detected is between V

LIT

and V

EOL

, the

circuit will operate in silver-oxide mode.

Battery end-of-life

If the battery end-of-life is detected (VDD≤ V

(1)

EOL

), the motor pulse will be produced without chopping. To indicate this condition, bursts of 4 pulses are produced every 4 s.

Power-on reset

For correct operation of the Power-on reset the rise time of V

from 0 V to 2.1 V should be less than 0.1 ms.

All resettable flip-flops are reset. Additionally the polarity of the first motor pulse is positive: VM1− VM2≥ 0V.

Customer testing

An output frequency of 32 Hz is provided at RESET (pin 8) to be used for exact frequency measurement. Every minute a jitter occurs as a result of time calibration, which occurs 90 to 150 ms after disconnecting the RESET from VDD.

Connecting the RESET to VDD stops the motor pulses leaving them in a HIGH impedance 3-state condition and a 32 Hz signal without jitter is produced at the TEST pin. A debounce circuit protects accidental stoppages due to mechanical shock to the watch (t

= 14.7 to 123.2 ms).

DEB

Connecting RESET to VSS activates Tests 1 and 2 and disables the time calibration.

Test 1, VDD>V

. Normal function takes place except

EOL

the voltage detection cycle (tV) is 125 ms and the cycle time tT1 is 31.25 ms. At pin TEST a minute signal is available at 8192 times its normal frequency.

(2)

Test 2

, VDD<V

. The voltage detection cycle (tV) is

EOL

31.25 ms and the motor pulse period (tT2) = 31.25 ms. Test and reset mode are terminated by disconnecting the

RESET pin. Test 3, VDD> 5.1 V. Motor pulses with a time period of

tT3= 31.25 ms and n × 122 µs are produced to check the contents of the EEPROM. At pin TEST the motor pulse period signal (tT) is available at 1024 times its normal frequency. The circuit returns to normal operation when VDD< 2.5 V between two motor pulses.

(2) Only applicable for types with the battery end-of-life detector.

(1) Only available for types with a 1 s motor pulse.

1997 Dec 12 3

Philips Semiconductors Product speciﬁcation

32 kHz watch circuits with EEPROM PCA16xx series

Time calibration

Taking a normal quartz crystal with frequency 32768kHz, frequency deviation (∆f/f) of ±15 × 10−6 and CL= 8.2 pF; the oscillator frequency is offset (by using non-symmetrical internal oscillator input and output capacitances of 10 pF and 15 pF) such that the frequency deviation is positive-only. This positive deviation can then be compensated for to maintain time-keeping accuracy.

Once the positive frequency deviation is measured, a corresponding number ‘n’ (see Table 1) is programmed into the device’s EEPROM. This causes n pulses of frequency 8192 Hz to be inhibited every minute of operation, which achieves the required calibration.

The programming circuit is shown in Fig.2. The required number n is programmed into EEPROM by varying V

according to the steps shown in Fig.3, which are explained below:

1. The positive quartz frequency deviation (∆f/f) is

measured, and the corresponding values of n are found according to Table 1.

2. VDD is increased to 5.1 V allowing the contents of the

EEPROM to be checked from the motor pulse period tT3 at nominal frequency.

3. V

is decreased to 2.5 V during a motor pulse to

initialize a storing sequence.

4. The first VDD pulse to 5.1 V erases the contents of EEPROM.

5. When the EEPROM is erased a logic 1 is at the TEST pin.

6. VDD is increased to 5.1 V to read the data by pulsing VDD n times to 4.5 V. After the n edge, VDD is decreased to 2.5 V.

7. VDD is increased to 5.1 V to store n bits in the EEPROM.

8. VDD is decreased to 2.5 V to terminate the storing sequence and to return to operating mode.

9. VDD is increased to 5.1 V to check writing from the motor pulse period tT3.

10. VDD is decreased to the operation voltage between two motor pulses to return to operating mode. (Decreasing VDD during the motor pulse would restart the programming mode).

The time calibration can be reprogrammed up to 100 times.

Table 1 Quartz crystal frequency deviation, n and t

FREQUENCY

DEVIATION

∆f/f

−6

(× 10

)

(1)

NUMBER OF

PULSES

(n)

0 31.250

(ms)

+2.03 1 31.372 +4.06 2 31.494

... ... ...

+127.89 63 38.936

Notes

1. Increments of 2.03 × 10−6/step.

2. Increments of 122 µs/step.

(2)

SIGNAL GENERATOR

32 kHz

TEST

OSC IN

OSC OUT

PCA16xx

SERIES

RESET

MSA975

Fig.2 Circuit for programming the time calibration.

1997 Dec 12 4

Philips Semiconductors Product speciﬁcation

32 kHz watch circuits with EEPROM PCA16xx series

MSA948

CHECKING

STORINGDATA INPUTERASURECONTENT CHECKING

123 n

DDP

∆ V

9 10

edge

t = 1 µs

min.

0.1 ms

t = 5 ms

for programming.

Fig.3 V

t = 5 ms

3 4 5 6 7 8 9 10

4.5

5.1

V (V)

1997 Dec 12 5

2.5

(1) (1) (1) (1)

1 2

1.5

0 (V )

(1) Rise and fall time should be greater than 400 µs/V for immediately correct checking.

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