Philips P32P4911A Datasheet

INTEGRATED CIRCUITS

DATA SH EET

P32P4911A

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

Product Speciﬁcation

1996 Jul 25

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

GENERAL DESCRIPTION

The Philips Semiconductors P32P4911A is a high performance BiCMOS read channel IC that provides all of the functions needed to implement an entire Partial Response Class 4 (PR4) read channel for zoned recording hard disk drive systems with data rates from 42 to 125 Mbit/s or 33 to 100 Mbit/s. Functional blocks include AGC, programmable filter, adaptive transversal filter, Viterbi qualifier, 8,9 GCR ENDEC, data synchronizer, time base generator, and FWR servo.

Programmable functions such as data rate, filter cutoff, filter boost, etc., are controlled by writing to the serial port registers so no external component changes are required to change zones.

The part requires a single +5V power supply. The Philips Semiconductors P32P4911A utilizes an advanced BiCMOS process technology along with advanced circuit design techniques which result in high performance devices with low power consumption.

FEATURES

General:

• Register programmable data rates from 42 to 125 Mbit/s or 33 to 100 Mbit/s

• Sampled data read channel with Viterbi qualification

• Programmable filter for PR4 equalization

• Five tap transversal filter with adaptive PR4 equalization

• 8/9 GCR ENDEC

• Data Scrambler/Descrambler

• Presettable Precoder State

• Programmable write precompensation

• Low operating power (0.925 W typical at 5V)

• Register programmable power management (<5 mW power down mode)

• 4-bit nibble and byte-wide bi-directional NRZ data interfaces

• 8-bit Direct Write mode automatically configured for RCLK = VCO/8

• Serial interface port for access to internal program storage registers

• Single power supply (5V ± 10%)

• Small footprint, 100-lead LQFP package

1996 Jul 25 2 853-1850 17093

Philips Semiconductors Product speciﬁcation

DSCLK

SSBYP

VIA+

VIA–

ON+

ON–

OD+

OD–

CPCNDP

LEVEL OR

HYSTERESIS

PULSE

QUAL

PARALLEL

INTERFACE

BYP

HOLD

LOWZ

FASTREC

CONV

AGC

CHARGE

PUMP

MUX

TEST

POINY

MUX

DECISION

DIRECTED

PHASE

DETECTOR

CHARGE

PUMP

CODE WORD

BOUNDRY

DETECTOR

DAMPING

CONTROL

RCLK

SBD

NRZ0–7

NRZP

VCO SYNC

PATTERN

GEN

WRITE

PRECOMP

DWR

DWI

WCLK

MUX

POWER

DOWN

CONTROL

SDEN

SCLK

SDATA

BYPS

PARALLEL

SERIAL

MUX

DATA SYNCHRONIZER

WG/WG

ATO

DSCLK

1/(N+1)

1/(M+1)

TIME BASE GENERATOR

RCLK

SYNC

FIELD

COUNTER

To SFC

TBGOUT

CWBD

WRITE

FLIP-FLOP

TBGOUT

CHANQUAL

TBGOUT

ASYMM FACTOR

LOW

ASYMM FACTOR

DACs

SQUELCH

VMIN

SFC

OFFSET

CANCEL

LOWZ

SFC

TPD

MUX

AGCRST

UFDC

VCC

AGCDEL

WRDEL

LZTO

FDTO

HOLD

LOWZ

SQUELCH

UFDC

SFC

MAXREF/2

SERVO

FASTREC

DUAL

“OR” TYPE

SYNC BYTE

DETECTOR

PARITY

GEN/CHK

FULLWAVE

RECTIFIER

VITERBI

DETECTOR

5–TAP

EQUALIZER

2-ADAPTIVE

2-PROG

AGC

CONTROL

LOGIC

SAMPLED

AGC

CHARGE

PUMP

PROGRAMMABLE

7TH-ORDER

LOW-PASS

FILTER

ASYMMETRIC 0’S

SERIAL

PORT

CONTROL

REGISTERS

AUTOMATIC

TRAINING & SYNC BYTE

GENERATOR

DESCRAMBLER

SCRAMBLER

PRECODER

9,8

((0,4/4)

DECODER

ATO

TEST

MUX

RCLK

CLOCK

GEN

AGC

AMP

DAC

FROM LEVEL

QUAL

VCO

CONTROL

LOGIC

2–BR

DAC

AGCREF

VRC

SREF

SDIEN

SEROUT

VPA

0.2V

2.3V WRT

VPA

REFERENCE

SELVRC

3.2V REFERENCE

NCLK

TPC

MUX

TPE

MUX

PARALLEL

SERIAL

9,8

((0,4/4)

ENCODER

NIBBLE

INTERFACE

CHARGE

PUMP

PHASE/

FREQ

DETECTOR

PHASE/

FREQ

DETECTOR

VRDT

TPB–

TPB+

TPA– TPA+

EQHOLD

PPOL

RDS/RDS

TPE

TPC– TPC+

TPD– TPD+

VRX

UFDC

FASTREC

LOWZ SFWR

AGND3 AGND2 AGND1 DGND2 DGND1

PDWN

VPA3 VPA2 VPA1 VPD2 VPD1

FLTR2– FLTR2+

FLTR1– FLTR1+

FREF

MAXREF

TPE

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

BLOCK DIAGRAM

SM00061

1996 Jul 25 3

Philips Semiconductors P32P4911A

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

Automatic Gain Control:

• Dual mode AGC, analog during acquisition, sampled during data reads

• Separate AGC level storage pins for data and servo

• Dual rate attack and decay charge pump for rapid AGC recovery (analog)

• Programmable, symmetric, charge pump currents for data reads (sampled)

• Charge pump currents track programmable data rate during data reads (sampled)

• Low drift AGC hold circuitry

• Low-Z circuitry at AGC input provides for rapid external coupling capacitor recovery

• AGC Amplifier squelch during Low-Z

• Wide bandwidth, precision full-wave rectifier

• Programmable AGC controls

– Separate external input pins for AGC hold, fast recovery, and Low-Z control

– Internal Low-Z and fast decay timing for rapid transient recovery and AGC acquisition. Timing set with external

resistors (2). Ultra fast decay current set with external resistor. AGC input impedance vs LOWZ = 5:1.

• 2-bit DAC to control AGC voltage in servo mode between 1.1 and 1.4 V

Filter/Equalizer:

• Programmable, 7-pole, continuous time filter provides: – Channel filter and pulse slimming equalization for equalization to PR4 – Programmable cutoff frequency from 4 to 34 MHz – Programmable boost /equalization of 0 to 13 dB – Programmable "zeros" equalization provides time asymmetry compensation – ±0.5 ns group delay variation from 0.3ƒc to ƒc, with ƒc = 34 MHz – Minimizes size and power – Low-Z switch at filter output for fast offset recovery – No external coupling capacitors required – DC offset compensation provided at filter output – Five tap transversal filter for fine equalization to PR4 – Self adapting inner taps (symmetric) – Programmable outer taps (symmetric, 4-bits) – Equalization hold input – "Zeros" channel quality output – Amplitude asymmetry factor output

Pulse Qualiﬁcation:

• Sampled Viterbi qualification of signal equalized to PR4

• Register programmable window or hysteresis pulse qualifier for servo reads

• Selectable RDS pulse width and polarity for servo gray code reads

1996 Jul 25 4

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

Time Base Generator:

• Less than 1% frequency resolution

• Up to 141 MHz frequency output

• Independent M and N divide-by registers

• No active external components required

Data Separator:

• Fully integrated data separator includes data synchronizer and 8,9 GCR ENDEC

• Register programmable to 125 Mbit/s operation

• Fast Acquisition, sampled data phase lock loop

• Decision directed clock recovery from data samples

• Adaptive clock recovery thresholds

• Programmable damping ratio for data synchronizer PLL is constant for all data rates

• Data scrambler/descrambler to reduce fixed pattern effects

• 4-bit nibble and byte-wide NRZ data interfaces

• Nibble clock is available during byte-wide mode

• Time base tracking, programmable write precompensation

• Differential PECL write data output

• Integrated sync byte detection, single byte or dual ("or" type)

• Semi-auto training and sync byte generation available for single sync byte operation

• Surface defect scan mode

P32P4911A

Servo:

• Wide bandwidth, precision full-wave rectifier

• Separate, automatically selected, registers for servo ƒc, boost, and threshold

• SEROUT and SREF pins to provide a differential full-wave rectified servo signal

• SELVRC and SDIEN control pins for dc gain and offset calibration

• AGCREF output to provide 2-bit DAC-controlled voltage for applications requiring a fixed gain in servo mode

1996 Jul 25 5

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

FUNCTIONAL DESCRIPTION

The Philips Semiconductors P32P4911A implements a complete high performance PR4 read channel, including an AGC, programmable filter/equalizer, adaptive transversal filter, Viterbi pulse qualifier, time base generator, data separator with 8,9 ENDEC and scrambler/descrambler, and FWR servo, that supports data rates from 42 to 125 Mbit/s. Data rates from 33 to 100 Mbit/s are supported by changing a single resistor.

A serial port is provided to write control data to the 17 internal program storage registers.

AGC Circuit Description

The automatic gain control (AGC) circuit is used to maintain a constant signal amplitude at the input of the pulse detector and sampled data processor while the input to the amplifier varies. The circuit consists of an AGC loop that includes an AGC amplifier, charge pump, programmable continuous time filter, and a precision, wide band, full wave rectifier. Depending on whether the read is of servo or data type, the specific blocks utilized in the loop are slightly different. Both loop paths are fully differential to minimize susceptibility to noise. AGC control can be programmably selected between direct and timed modes.

AGC OPERATION IN SERVO READ MODE During servo reads the loop consists of the AGC amplifier with a continuous dual rate charge pump, the programmable

continuous time filter, and the full wave rectifier. The gain of the AGC amplifier is controlled by the voltage stored on the BYPS hold capacitor (C at DP/DN (internal nodes) to the value programmed by the 2 SAGCLVL bits in the LDS register. These 2 bits allow adjustment of the filter's normal output voltage from 1.10 to 1.40 Vppd. Attack currents lower the voltage at the BYPS pin which reduces the amplifier gain. Decay currents raise the voltage at the BYPS pin which increases the amplifier gain. The sensitivity of the amplifier gain to changes in the BYPS voltage is approximately 38 dB/V. When the voltage at BYPS is equal to VRC, the gain from the AGC input to DP/DN will be about 24.9 dB. The charge pump is continuously driven by the instantaneous voltage at DP/DN. When the signal at DP/DN is greater than 100% of the programmed AGC level, the normal attack current (ICH) of 416.5 µA is used to reduce the amplifier gain. If the signal is greater than 125% of the programmed level, the fast attack current (I approach allows the AGC gain to be quickly decreased when it is too high and minimizes distortion when the proper AGC level has been acquired. The 100% and 125% levels are relative to the selected AGC level in servo mode.

A constant normal decay current (ID) of 24.5 µA acts to increase the amplifier gain when the signal at DP/DN is less than 100% of the programmed AGC level. The large ratio (416.5 µA:24.5µA) of the normal attack and normal decay currents enables the AGC loop to respond to the peak amplitudes of the incoming read signal rather than the average value. As a result the AGC loop will not be able to quickly increase its gain if required to do so. A fast recovery mode is provided to allow the gain to be rapidly increased to reduce recovery time between mode switches. In the fast recovery mode, the decay current is increased by a factor of 8 to 196 µA (I

1.74 mA (I

It is recommended that the fast recovery mode be asserted when the AGC fields from a sector are being read. Typically, this will be just after each transition of SG (Servo Gate), after powerup, and after WG/WG is de-asserted. For example, if C

BYPS

0.5 µs * 196 µA/500 pF = 196 mV, which will allow the gain to increase by 6 dB in that time. If FASTREC is asserted for

0.5 µs in non-servo mode and C

1000 pF = 98 mV, which will allow the gain to increase by 3 dB in that time. It is recommended that LOWZ be asserted for 0.5µs just prior to any assertion of FASTREC in order to null any internal DC offsets. However, it is possible to assert both LOWZ and FASTREC simultaneously to reduce sector overhead. This method should be evaluated under the actual system operating conditions.

The programmable AGC level in servo mode is provided to allow the servo demodulator dynamic range to be adjusted over a narrow range.

). This has the effect of speeding up the AGC loop between 4 and 8 times.

CHFR

is 500 pF and FASTREC is asserted for 0.5 µs in servo mode, the voltage at BYPS can increase at most by

). The dual rate charge pump drives C

BYPS

) of 3.5 mA is used to reduce the gain very quickly. This dual rate

CHF

DFR

is 1000 pF, then the voltage at BYP can increase at most by 0.5 µs * 196 µA/

BYP

with currents that drive the differential voltage

BYPS

) and the attack current is increased by a factor of 4.18 to

1996 Jul 25 6

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

AGC OPERATION IN DATA READ MODE For data reads, the loop described above is used until the data synchronizer is locked to the incoming VCO preamble,

except that the BYP hold capacitor (C the normal attack current is 416.5 µA, and the fast attack current is 3.5 mA. The fast recovery mode decay current is 196 µA and the fast recovery mode attack current is 1.74 mA. The above mentioned attack and decay currents are not scaled with the data rate setting. After the data synchronizer PLL is locked (SFC), the AGC loop is switched to include the AGC amplifier with a sampled charge pump, the programmable continuous time filter, full wave rectifier, and the sampling 5-tap equalizer to more accurately control the signal amplitude into the Viterbi qualifier. In this sampled AGC mode, a symmetrical attack and decay charge pump is used. The "1" sample amplitudes are sampled and held and compared to the ideal "1" value of 500 mV to generate the error current. The maximum charge pump current value can be programmed from the Sample Loop Control Register to 0, 34, 68, or 102 µA for maximum data rate and will scale downward with reduced Data Rate Register values.

AGC Control Modes

The AGC control mode is determined by the state of bit 6 (AGCSEL) of the Control Operating Register #1. If this bit is 0, then the direct, external AGC control method is selected, i.e., AGC uses external signals provided to the FASTREC, LOWZ, and HOLD input pins. If bit 6 is a 1, the timed AGC control method is selected for generating the internal hold, fast recovery, squelch, and Low-Z signals.

DIRECT AGC CONTROL MODE For maximum application flexibility, all AGC mode control inputs are to be externally provided. When the LOWZ input is

High, Low-Z mode is activated. In the Low-Z mode, the AGC amplifier input resistance is reduced to allow quick recovery of the AGC amplifier input AC coupling capacitors. The ratio of Low-Z to Non Low-Z resistance can be selected as either 15:1 or 5:1 by programming the LZTC bit in the Data Boost Register. During Low-Z mode, the time constant of the internal AC coupling networks at the filter outputs are also reduced by the ratio determined by the LZTC bit. This time constant is 300 ns in Low-Z and either 5 µs or 1.5 µs when not in Low-Z mode, depending on the state of the LZTC bit. Low-Z also forces the AGC amplifier gain to be reduced to near 0 V/V. This mode should be activated during and for a short time after a write operation. It should also be activated for a short time after each transition of the SG input and on initial power up.

When theHOLD input is Low, the charge pumps are disabled. This de-activates the AGC loop. The AGC amplifier gain will be held constant at a level set by the voltage at the BYP or BYPS pins. The value of the capacitor placed at these pins should be selected to give adequate droop performance when in hold mode as well as to insure stability of the AGC loop when it is active.

The signal provided to the FASTREC input pin determines if the AGC is in fast recovery mode. During the fast recovery (FASTREC=1), the attack and decay currents are increased to allow faster recovery to the proper AGC level. If faster recovery than is provided by FASTREC alone is desired, an ultra fast recovery can be effected by connecting a resistor between the AGCRST pin and the positive supply VPA. If this resistor is present, whenever FASTREC is entered, the voltage on the BYP or BYPS capacitor will be pulled up. This causes an extremely rapid increase in the AGC amplifier gain. The ultra fast current will be disabled the first time that the signal at DP/DN reaches the 125% point. The FASTREC attack and decay currents are used as long as the FASTREC pin is held High.

) is used instead of BYPS and (C

BYP

). The normal decay current is 24.5 µA,

BYPS

TIMED AGC CONTROL MODE This timed AGC control mode differs from the direct control mode in that the external control inputs LOWZ, FASTREC,

and HOLD, are typically not used, and therefore, must be deasserted. The equivalent signals are generated internal to the P32P4911A. These internal signals are generated by one-shots that are triggered by various conditions of the WG/WG, SG, and PDWN inputs. The one-shot timings for the Low-Z and fastrec signals are set by the resistors connected to the WRDEL and AGCDEL input pins, respectively and analog ground. The time Low-Z period = 0.1 µs * (R is set by the resistor connected between the AGCRST input pin and VPA. In the timed mode, the AGC shall use the C

1996 Jul 25 7

+ 0.5) kΩ and the fast recovery period = 0.1 µs * (R

WRDEL

BYP

and C

for non-servo and servo modes respectively. The nominal and fast attack and decay currents are the

BYPS

+ 0.5) kΩ. The current for the ultra fast decay mode

AGCDEL

Philips Semiconductors Product speciﬁcation

Figure 1: AGC Timing (Internal) Diagrams - Power-On Mode

PDWN

AGC

INPUT

AGC LOWZ

FAST FILTER

OFFSET RECOVERY

AGC HOLD

AGC SQUELCH

AGC FAST RECOVERY

(ATTACK & DECAY)

AGC ULTRA

FAST RECOVERY

(DECAY)

Power-on gain recovery

AGC

OUTPUT

100%

125%

NORMAL ATTACK

ULTRA

FAST

DECAY

POWERED UP

FAST

ATTACK

Ultra fast decay current is disabled when signal is greater than 125% of nominal.

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

same in both of the P32P4911A's AGC control modes. In internally timed mode, the LOWZ, FASTREC, and HOLD input pins are logically OR'ed with their respective internal control signals but do not affect the internal sequencing of the one-shot generated AGC control signals.

1996 Jul 25 8

Philips Semiconductors Product speciﬁcation

Figure 2: AGC Timing Diagrams - Servo Mode

Servo mode gain recovery

AGC

INPUT

AGC OUTPUT

100%

125%

ULTRA

FAST

DECAY

AGC LOWZ

FAST FILTER

OFFSET RECOVERY

AGC HOLD

SQUELCH

AGC FAST RECOVERY

(ATTACK & DECAY)

AGC ULTRA

FAST RECOVERY

(DECAY)

FAST

ATTACK

Ultra fast decay current is disabled when signal is greater than 125% of nominal.

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

P32P4911A

1996 Jul 25 9

Philips Semiconductors Product speciﬁcation

Figure 3: AGC Timing Diagrams - Write Mode

Write mode gain recovery

AGC

INPUT

AGC

OUTPUT

100%

125%

ULTRA

FAST

DECAY

NORMAL

ATTACK

AGC LOWZ

FAST FILTER

AGC HOLD

AGC SQUELCH

AGC FAST RECOVERY

OFFSET RECOVERY

AGC ULTRA

FAST RECOVERY

(ATTACK & DECAY)

(DECAY)

FAST

ATTACK

Ultra fast decay current is disabled when

signal is greater than 125% of nominal.

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

P32P4911A

1996 Jul 25 10

Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

Pulse Qualiﬁcation Circuit Descriptions

This device utilizes three different types of pulse qualification, one exclusively for servo reads, one primarily for servo reads, and the other for data reads.

SERVO READ MODE For servo gray code reads, either a dual level (window type) qualifier or a hysteresis type level qualifier may be selected.

If the PDM bit in the Servo Filter Cutoff Register is set to 0, then the window qualifier is selected, and if the PDM bit is a 1, the hysteresis qualifier is selected. The polarity of the RDS/RDS is selected by the SMS bit (Servo Mode Select) in the Data Rate Register. If SMS=0 then RDS is active-Low and if SMS=1 then RDS is active-High.

DUAL LEVEL (WINDOW) QUALIFIER During servo reads (SG High) a dual level type of pulse qualifier is used. The level qualification thresholds are set by a

6-bit DAC which is controlled by the Servo Level Threshold Register (LDS). The register value is relative to the peak voltage at the output of the continuous time filter, derived off of the same reference voltage internal to the chip. The positive and negative thresholds are equal in magnitude. The state of the adaptive threshold level enable (ALE) bit in the WP/LT Register does not affect this DAC's reference. The RDS/RDS and the PPOL outputs of the level qualifier indicate a qualified servo pulse and the polarity of the pulse, respectively. The RDS/RDS and PPOL outputs are only active when the SG input is High.

HYSTERESIS QUALIFIER The hysteresis qualifier performs the same as the window qualifier except that the hysteresis qualifier guarantees that

the second of two consecutive pulses of the same polarity will not be qualified. The hysteresis qualifier will only qualify pulses of alternating polarity.

DATA READ MODE In data read mode (RG High), the dual level qualifier used for servo reads, is used during VCO sync field counting. Its

qualification thresholds are set by a 6-bit DAC which is controlled by the Data Level Threshold Register (LD). The register value is relative to the peak voltage at output of the continuous time filter and the DAC both referenced to band gap voltage. The positive and negative thresholds are equal in magnitude. The state of the adaptive threshold level enable (ALE) bit in the WP/LT Register does not affect the DAC's reference until the sync field count has been achieved. The RDS/RDS and the PPOL outputs of the level qualifier are not active in data read mode.

VITERBI QUALIFIER The second type of pulse qualification, the Viterbi qualifier, is only used during data read mode after the sync field count

has been achieved. The Viterbi qualifier has two significant blocks, one that feeds the other. The first block is the sampled pulse detector and the second is the survival sequence register.

The sampled pulse detector performs the pulse acquisition/detection in the sampled domain. It acquires pulses by comparing the code clock sampled analog waveform to the positive and negative thresholds established by the programmable Viterbi threshold window. The threshold window is defined to be the difference between the positive and negative threshold levels. The threshold window, Vth, is set by a 7-bit DAC which is controlled by the Viterbi Detector Threshold Register (VDT). While the window size is fixed by the programmed Vth value, the actual positive and negative thresholds track the most positive and the most negative samples of the equalized input signal. For example, the Viterbi positive signal threshold, Vpt = Vpeak (+) max if the previous detected level was (+). If the previous detect level was (-), Vpt = Vpeak(-)max + Vth, where Vpeak(-)max is the maximum amplitude of the previously detected negative signal. Normally Vth is set to equal Vpeak (approx. 500 mV).

After the pulses have been detected they must be further qualified by the survival sequence registers and associated logic. This logic guarantees that for sequential pulses of the same polarity within the maximum run length, only the latest is qualified. In this way, only the pulse of greatest amplitude will be qualified.

1996 Jul 25 11

Philips Semiconductors Product speciﬁcation

Figure 4: Viterbi Detection

Viterbi

Threshold

WIndow

Viterbi

Detector

Output

+ pulse detect

- pulse detect

For sequential pulses of the same polarity, the latest is selected by the survival sequence register logic since it is always of greater magnitude.

+th

-th

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

The Viterbi qualifier is implemented as two parallel qualifiers that operate on interleaved samples. Each qualifier has a survival sequence register length of 5.

To facilitate media scan testing, the Viterbi survival sequence register may be bypassed by setting the BYPSR bit in the Viterbi Detector Threshold (VDT) register.

Programmable Filter Circuit Description

The on-chip, continuous time, low pass filter has register programmable cutoff and boost settings, and provides both normal and differentiated outputs. It is a 7th order filter that provides a 0.05°phase equiripple response. The group delay is relatively constant up to twice the cutoff frequency. For pulse slimming two zero programmable boost equalization is provided with no degradation to the group delay performance. The differentiated output is created by a single-pole, single-zero differentiator. Both the boost and the filter cutoff frequency for data reads and the filter cutoff frequency for servo reads are programmed through internal 7-bit DACs, which are accessed via the serial port logic. The nominal boost range at the cutoff frequency is 0 to 13 dB for data reads and is controlled by the Data Boost Register. In servo mode, the boost can be programmed in 2 dB steps from 0 to 6 dB by programming the two FBS bits (bits 6 and 7) in the Filter Boost Servo register. The cutoff frequency, ƒc is variable from 4 to 34 MHz and controlled by the Data Cutoff Register or Servo Cutoff Register in the servo mode. The cutoff and boost values for servo reads are automatically switched when servo mode is entered.

The filter zero locations can be programmed asymmetrically about zero to compensate for MR head time asymmetry. The asymmetry is adjusted by programming the 6 FGD bits (bits 0-5) in the Filter Boost Servo register. The asymmetric zeros are not usable while in servo mode.

The normal low pass filter is of a seven-pole two-real-zero type. Figure 5 illustrates the transfer function normalized to 1 rad/s. The response can be denormalized to the cutoff frequency of ƒc (Hz) by replacing s by s/2πƒc, while the boost and group delay equalization are controlled by varying the α and β.

1996 Jul 25 12

Philips Semiconductors Product speciﬁcation

SM00010

s2–s+1.31703

s2+1.68495s+1.31703

2.95139

+1.54203s+2.95139

5.37034

+1.14558s+5.37034

0.86133

s+0.86133

Normal

Differential

Figure 5: Programmable Filter Normalized Transfer Function

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

With a zero at the origin, the filter provides a time-differentiated filter output. This is used in time qualification of the peak detection. To ease the timing requirement in peak detection of a signal slightly above the qualification threshold, the time-differentiated output is purposely delayed by 1.2 ns relative to the normal low pass output.

The normal low pass output feeds the data qualifier (DP/DN), and the differentiated output feeds the clock comparator (CP/CN).

Five definitions are introduced for the programmable filter control discussion (Figure 6): Cutoff Frequency: The cutoff frequency is the -3 dB low pass bandwidth with no boost and group delay equalization, i.e.

α=0 and β=0. Actual Boost: The amount of peaking in magnitude response at the cutoff frequency due to α≠0 and/or β≠0. Alpha Boost: The amount of peaking in magnitude response at the cutoff frequency due toα≠0 and without group delay

equalization. In general, the actual boost with group delay equalization is higher than the alpha boost. However, with >3 dB alpha boost, the difference is minimal. α=1.31703 x (10

Group Delay ∆%: The group delay ∆% is the percentage change in absolute group delay at DC with respect to that without equalization applied (β=0). β=0.04183 * GD%.

Group Delay Variation: The group delay variation is the change in group delay from DC to the cutoff frequency. This can be expressed as a percentage defined as: (change in group delay ÷ absolute group delay with β=0) * 100%. An alternative is to express the group delay variation in nanoseconds. Because the absolute group delay variation in nanoseconds is scaled by the programmed cutoff frequency, the percentage expression is used in this specification.

BOOST(dB)/20

-1)

1996 Jul 25 13

Philips Semiconductors Product speciﬁcation

Figure 6: Filter Magnitude Response

Frequency (MHz)

Magnitude (dB)

SM00011

–5

–10

–15

–20

1 10 100

Cutoff = 10MHz (i) 0dB Alpha Boost & 0% Group Delay Change

(ii) 13dB Alpha Boost & +30% Group Delay Change

–3dB Cutoff Frequency

Actual Boost, same as Alpha Boost with 0%

Group Delay Change or Alpha Boost is large

Actual –3dB Bandwidth

with Boost & Group

Delay Equalization

(i)

(ii)

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

P32P4911A

1996 Jul 25 14

Philips Semiconductors Product speciﬁcation

Figure 7: Filter Group Delay Response

1 10 100

Cutoff = 0MHz (i) 0dB Alpha Boost & 0% Group Delay Change

(ii) 13dB Alpha Boost & +30% Group Delay Change

DC Group Delay Change

Programmable from

–30% to +30%

(i)

(ii)

Group Delay Variation from

‘DC’ to Cutoff Frequency

PRML Read Channel with PR4, 8/9 ENDEC, FWR Servo

Absolute Group Delay (ns)

P32P4911A

Frequency (MHz)

SM00012

FILTER OPERATION Direct coupled differential signals from the AGC amplifier output are applied to the filter. The programmable bandwidth

and equalization characteristics of the filter are controlled by 3 internal DACs. The registers for these DACs (FC, FB, and FGD) are programmed through the serial port. The current reference for the DACs is set using a single external resistor connected from pin VRX to ground. The voltage at pin VRX is proportional to absolute temperature (PTAT), hence the current for the DACs is a PTAT reference current. This establishes the excellent temperature stability for the filter characteristics.

The cutoff frequency can be set independently in the servo mode and the data mode. In the data mode, the cutoff frequency is controlled by the Data Cutoff Register. In the servo mode, the cutoff frequency is controlled by the Servo Cutoff Register.

CUTOFF CONTROL The programmable cutoff frequency from 4 to 34 MHz is set by the 7-bit linear FC DAC. The FC register holds the 7-bit

DAC control value. The cutoff frequency is set as: ƒc (MHz) = 0.301 * FC - 1.142 44 ≤ FC ≤ 117 for servo zones

ƒc (MHz) = 0.277 * FCS + 0.08 14 ≤ FCS ≤ 43 The filter cutoff (ƒc) is defined as the -3 dB bandwidth with no boost applied. When boost/equalization is applied, the

actual -3 dB point will move out. The ratio of the actual -3 dB bandwidth to the programmed cutoff is tabulated in Table 1 as a function of applied boost and group delay equalization.

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Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

Table 1: Ratio of Actual -3dB Bandwidth to Cutoff Frequency

Alpha Boost

0 dB 1.62 1.47 1.31 1.16 1.06 1.01 1.00 1 1.74 1.62 1.50 1.38 1.28 1.21 1.19 2 1.87 1.79 1.71 1.63 1.56 1.51 1.49 3 2.01 1.96 1.91 1.87 1.83 1.80 1.79 4 2.14 2.11 2.09 2.07 2.05 2.04 2.03 5 2.25 2.24 2.23 2.22 2.21 2.20 2.20 6 2.35 2.34 2.34 2.33 2.33 2.32 2.32 7 2.44 2.44 2.43 2.43 2.42 2.42 2.42 8 2.52 2.52 2.51 2.51 2.51 2.51 2.51 9 2.59 2.59 2.59 2.59 2.59 2.59 2.59 10 2.67 2.66 2.66 2.66 2.66 2.66 2.66 11 2.73 2.73 2.73 2.73 2.73 2.73 2.73 12 2.80 2.80 2.80 2.80 2.80 2.80 2.80 13 2.87 2.87 2.86 2.86 2.86 2.86 2.86

BOOST CONTROL The programmable alpha boost from 0 to 13 dB is set by the 7-bit linear FB DAC in data mode or 2-bit linear FBS DAC

in servo mode. The FB register holds the 7-bit DAC control value and the FBS register holds the 2-bit control value. The alpha boost in data mode is set as:

Alpha Boost (dB) = 20 log [0.021848 * FB + 0.000046 * FC * FB + 1] 0 ≤ FB ≤ 127 The alpha boost in servo mode is set as: Alpha Boost (dB) = 2 * FBS 0 ≤ FBS ≤ 3 That is, the boost in servo mode can be changed in 2 dB steps from 0 to 6 dB. The programmed alpha boost is the magnitude gain at the cutoff frequency with no group delay equalization. When finite

group delay equalization is applied, the actual boost is higher than the programmed alpha boost. However, the difference becomes negligible when the programmed alpha boost is >3 dB. Table 2 tabulates the actual boost as a function of the applied alpha boost and group delay equalization.

±30% ±25% ±20% ±15% ±10% ±5% ±0%

Group Delay %

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Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

Table 2: Ratio of Actual -3dB Bandwidth to Cutoff Frequency

Alpha Boost

0 dB 2.81 2.12 1.47 .89 0.42 0.11 0.00 1 3.36 2.76 2.21 1.72 1.33 1.09 1.00 2 3.97 3.45 2.99 2.58 2.27 2.07 2.00 3 4.63 4.19 3.80 3.47 3.21 3.05 3.00 4 5.34 4.97 4.65 4.38 4.17 4.04 4.00 5 6.10 5.79 5.52 5.30 5.14 5.03 5.00 6 6.89 6.64 6.42 6.24 6.11 6.03 6.00 7 7.72 7.51 7.34 7.19 7.09 7.02 7.00 8 8.58 8.41 8.27 8.15 8.07 8.02 8.00 9 9.47 9.33 9.22 9.12 9.05 9.01 9.00 10 10.4 10.3 10.2 10.1 10.1 10.0 10.0 11 11.3 11.2 11.1 11.1 11.0 11.0 11.0 12 12.2 12.2 12.1 12.1 12.0 12.0 12.0 13 13.2 13.1 13.1 13.1 13.0 13.0 13.0

GROUP DELAY EQUALIZATION The group delay∆% can be programmed between -30% to +30% by the 6-bit linear FGD DAC. The FGD register holds

the 6-bit DAC control value. The group delay ∆% is set as: Group Delay ∆% = 0.9783 * (FGD4:0) - 0.665 0 ≤ FGD4:0 ≤ 31 and FGD5 = sign bit The group delay ∆% is defined to be the percentage change of the absolute group delay due to equalization from the

absolute group delay without equalization at DC. The current reference for the filter DACs is set using a single 12.1 kΩ resistor, from the VRX pin to ground. The voltage

at VRX is proportional-to-absolute-temperature (PTAT). The outputs of the filter are internally AC coupled to the qualifier inputs and buffers for the filter monitoring test points

TPC+/TPC- and TPD+/TPD-.

±30% ±25% ±20% ±15% ±10% ±5% ±0%

Group Delays ∆%

Internal AC Coupling

The conventional external ac coupling at the filter to qualifier interface has been replaced by a pair of feedback circuits, one for the normal and one for the differentiated outputs of the filter. The offset of the filter outputs are sensed, integrated, and fed back to the filter output stage. The feedback loop forces the filter offset nominally to zero. In the normal read mode, (LOWZ=0), the integration time constant is set to 5 µs until the sync field counter reaches the programmed SFC count. At the SFC count, the offset sensing is switched into sampled mode and the time constant is reduces to 300 ns. In sampled mode the offset correction voltage is generated from the zeros qualified by the quantizer. This ensures that the sampled voltage level, not DP/DN, will be offset free.

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Philips Semiconductors Product speciﬁcation

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

Amplitude Asymmetry Detection and Correction

In the presence of amplitude asymmetry, such as that generated by MR heads, the sampled data processor (SDP) will be presented with zeros generated in one of two ways. The first is due the lack of a magnetic transition and will be referred to as a "real" zero. The second is produced by the superposition of adjacent +1 and -1 magnetic transitions and results in zero samples that shall be referred to as "cancelled" zeros. In the presence of amplitude asymmetry from an MR head, the "real" zeros are zero, but the "cancelled" zeros are offset by the difference between the +1 and -1 samples.

The offset correction circuit forces the ground reference of the sampled data processor to the center of the "real" and "cancelled" zero sample levels.

The integration time constant is increased by a factor of 4 to 1.0 µs, after the sync byte has been detected.

AMPLITUDE ASYMMETRY MONITOR POINT An amplitude asymmetry quality factor "Qasym" may be selected to be output on the ATO output pin by programming

the ASEL bits in the Power Down Register. This signal is derived by computing the average distance of the "real" and "canceled" zeros from the sampled data processor's system ground which was established between the two zeros levels by the offset correction circuit. The average distance is a measure of the asymmetry present in the MR read back signal. A gain of 4 from the sampled values is utilized and is low pass filtered with a time constant that is programmable to one of four different values by programming the two QTC bits in the Control Operating Mode Register #2.

The signal is then buffered and differentially multiplexed to the ATO pin. The signal is referenced to MAXREF/2. The asymmetry quality factor can be held at the value present at sync byte detect by setting the FREZQ bit in the WP/LT

Register. The value will be held for 10 ms and is NOT reset. The ATO output may also be externally filtered to provide time constants that are appropriate for averaging over major portions of, or an entire sector. The capacitors on externally added filters must be externally reset. Note that any external filtering added to ATO output pin will affect both the amplitude asymmetry monitor signal and the equalization quality monitor signal since they are both muxed to the ATO output pin.

Adaptive Equalizer Circuit Description

Up to 7 dB of equalization for fine shaping of the incoming read signal to the PR4 waveshape is provided by a 5 tap, sampled analog, transversal filter. This filter provides a self adaptive multiplier coefficient for the inner taps and a programmable coefficient for the outer taps. Both inner taps use the same coefficient (km1), and both outer taps use the same coefficient (km2).

For the adaptive inner taps, the value of km1 is adjusted to force "zero" samples to zero volts. A special equalizer training pattern, located after the VCO sync field in the sector format, is used to provide an optimum signal for the equalizer to adapt to. The adaptive property of these taps is enabled or disabled by the AEE bit in the Sample Loop Register. If the adaptive property is enabled, whether adaptation occurs only during the training pattern or both during the training pattern and the user data is controlled by the AED bit in the Sample Loop Register.

The adaptation can be observed when the equalizer control voltage is selected as the TPA+/TPA- output. The equalizer control voltage is approximately related to km1 by:

km1 = 0.009 * Date Rate (Mbit/s) * (TPA+ - TPA-) The multiplier coefficients for the adaptive taps can be held for up to 10 ms if the EQHOLD input is brought High after

sync byte detect has occurred during a previous read in which proper training has occurred. The EQHOLD input pin may be asserted at any time during a read cycle and the adaptive coefficient Km1 present at that time will be held, provided no leakage occurs, until the EQHOLD input is de-asserted.

The multiplier coefficient, km2, for the outer taps is programmable between +0.117 and -0.135 by the 4 km bits (bits 4-7) in the Control Operating Mode Register #2

1996 Jul 25 18

Philips Semiconductors Product speciﬁcation

Figure 8: Block Diagram of 5-Tap Equalizer

yn = k

xn + k

n-1

+ x

n-2

+ km1 x

n-3

+ km2 x

n-4

need more boost decrease km

need less boost increase km

0V 0V

n-1

n-2

n-3

n-4

km1 coefficient adapts to force ’0’ samples to 0V

SM00026

PRML Read Channel with PR4,

P32P4911A

8/9 ENDEC, FWR Servo

EQUALIZATION QUALITY MONITOR POINT An equalization quality factor "Q" may be selected to be output on the ATO output pin by programming the ATOSEL bits

in the Power Down Register and should be used as a guide for selection of the appropriate value for km2. This signal is derived by computing the absolute distance of the "real" and "canceled" zeros from the sampled data processor's system ground which was established between the two zeros levels by the offset correction circuit. Then the asymmetry factor (QASYM) is subtracted and the resulting signal is full wave rectified and low pass filtered using one of the four time constants that may be programmed with the two QTC bits in the Control Operating Mode Register #2. The signal is then buffered and differentially multiplexed to the ATO pin. The overall gain to the ATO pin is 4. The signal is referenced to MAXREF/2.

The equalization quality factor can be held at the value present at sync byte detect by setting the FREZQ bit in the WP/LT Register. The value will be held for approx. 10 ms and is NOT reset. The ATO output may also be externally filtered to provide time constants that are appropriate for averaging over major portions of, or an entire sector. The capacitors on externally added filters must be externally reset.

Time Base Generator Circuit Description

The time base generator (TBG) is a PLL based circuit, that provides a programmable reference frequency to the data separator for constant density recording applications. This time base generator output frequency can be programmed with a less than 1% accuracy via the M, N and DR Registers. The TBG output frequency, Fout, should be programmed as close as possible to ((9/8) * NRZ Data Rate). The time base also supplies the timing reference for write precompensation so that the precompensation tracks the reference time base period.

The time base generator requires an external passive loop filter to control its PLL locking characteristics. This filter is fully-differential and balanced in order to reduce the effects of common mode noise.

In read, write and idle modes, the programmable time base generator is used to provide a stable reference frequency for the data separator. In the write and idle modes, the Time Base Generator output, when selected by the Control Test Mode Register, can be monitored at the TPB+ and TPB- test pins. In the read mode, the TBG output should not be selected for output on the test pins so that the possibility of jitter in the data separator PLL is minimized.

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