1) Press EJ button and take out paneltake out A screw in top cover of the unit;Use tweezer to prize up top cover as the blue arrow direction which showed as below picture
A
EJ
2 Use electrical screw bit to take out B,C two screws in left and right side of metal bracket; Then take out D,E screws in panel base
B
3Uplift the CD deck mechanism and take out FFC then take out deck mechanism
C
D
E
The procedure of disassemblin钮 the panel:
1Use electrical screw bit to take out five screws in back panel and separate back panel and front panel; Take out the back panel and then take out
KB board.
a. To check whether it is connect well of the ISO connector (4 PIN power input ). Whether it is loose of the 15A fuse of the
ISO connector, or insert non in place.
b. To check whether there is any contamination and bad contact on the 22 Pin male/female connector on the panel and main
board.
c. To check the power supply of main board B+ACC should be +12V; The voltage of stabilivolt of ACC power supply circuit
ZD3 (6V8) should be 6V8.
2011-11-16
NO Power
1
NO audio
2
output
d.To check the voltage of the 17 pin of U1 MCU should be +4V8.
e. To check the voltage of the 16 pin (AVDD) of U1 MCU (T5CL8) should be +5V; The output voltage of U4 (LM2950) should
be +5V.
f. To check the oscillation frequence of crystal XT4 shuold be 7.2MHz .
g.To check the resistor network of NR1 (4K7).
H. To check the voltage of the15 pin(Lamp Vcc) of CN5 should be 6V4.
a. To check whether the volume knob is turn to the minimum position.
b. To check whether the unit is at MUTE mode, press SOURCE button and check whether it is effective of the input sound
source.
c. To check whether the connection of 8 PIN audio output wire of ISO connector is correct; wrong connection or short circuit
to the ground will caused the protection of the power amplifier( no voltage output).
d . To check the circuit of power amplifier U3 (LV47002) and VOLUME U5(TDA7419).
e. To check the normal voltage of 22 PIN(MUTE) of power amplifier U3(LV47002) , normally should be 4V.
f. To check the voltage of 20 pin of audio processor U5TDA7419, should be +9V0.
g. To check the voltage of control PIN SCLSDAthe 1819 pinof audio processor U5TDA7419, should be +5V2.
3
AM/FM
Radio
abnormal
a. To check the antenna of the AM/FM tuner.
b. To check whether the strength of then input signal of the tuner is too weak.
c. To check the voltage of the 5 pin7 pin9 pin of the tuner, should be +5V0
d. To check the voltage of the 12 pin(SDA) of the tuner, should be +4V5; the 13 pin(SCL) should be +4V5; the 15 pin(RA-
RES) should be +4V9.
e. To check the L output voltage of the 10 pin of tuner should be 1V8, the 11 pin R output voltage , should be 1V8.
21
Page 22
NO.
failure
phenomena
failure causeremark
a. To check the antenna of the DAB tuner.
4
5
DAB Radio
CD defective
abnormal
b. To check whether the strength of then input signal of the tuner is too weak.
c. To check the supply voltage of the 1 pin of TUN1DAB-TUN should be +1V2the 2 pin should be +3V3.
a. To check whether the signal format of the disc is correspond to the request of the unit, whether there is any
contamination or damage or light leakage on the surface of the disc.
b. To check whether there is any abnormal of the rotation of the deck mecahnism, or whether the disc is enter in
position.
c. To check whether it is normal when reading USB?
d. To check whether the 17 P FFC of laser pick up is inserted in place, whether the socket of it is loose.
e. To check whether there is any contamination or foreign body on the surface of the laser pick up.
f. To check the servo board connector of CN20P1 and main board connector of CN9, whether the socket of it is loose.
j. To check the switch SW2 on the servo board.
h. To check the rotation mechanism of CD deck mechanism.
i. To check whether the rotation belt of deck mechanism is dislocation or loose.
6
USB/iPOD
defective
7AUX defective
a. To check whether the USB/iPOD signal format is correspond to the request of the unit.
b. To check the voltage of the the uppermost pin of the USB connector, should be +5V.
c. To check whether there is any wearing and scratch of the shrapnel and pin of the panel USB.
d. To check whether there is any contamination and bad contact on the male/female connector of the panel and main
board. If necessary, can exchange the panel to test whether the defective is occurred by the unit or panel.
a. To check the SOURCE shoule be in MP3-LINK mode.
b. To check the AUX IN input signal.
c. To check whether there is any contamination and bad contact on the male/female connector of the panel and main
board. If necessary, can exchange the panel to test whether the defective is occurred by the unit or panel.
22
Page 23
TENTATIVE Version No.18052009
LV47002P Development Specification Proposal
(BTL 4 channel Car Audio Power Amplifier)
The LV47002P is the IC for 4-channel BTL power amplifier that is developed for car audio system.
Pch DMOS in the upper side of the output stage and Nch DMOS in the lower side of the output stage are
complimentary. High power and high quality sound are realized by that.
This IC incorporate various functions (standby switch, muting function, and various protection circuit) necessary for
car audio system. Also, it has a self-diagnosis function.
1. Application : 4-channel BTL power amplifier for car audio system
2. Package type : HZIP25
3. Functions and Features :
- High power : - Pomax=48W (typical)
(Vcc=15.2V, f=1kHz , JEITAmax , RL=4Ω)
- Built-in Self-diagnosis function (pin 25) : Signal output in case of output offset detection, shorting to VCC,
shorting to ground , and load shorting.
- Electric mirror noise decrease
- Built-in various protection circuit (shorting to ground, shorting to VCC, load shorting, over voltage and
thermal shut down )
- No external anti-oscillation part necessary.
Note1 : Please do not mistake connection.
A wrong connection may produce destruction, deterioration and damage for the IC or equipment.
Note2 : The protective circuit function is provided to temporarily avoid abnormal state such as incorrect output
connection. But, there is no guarantee that the IC is not destroyed by the accident.
The protective function do not operate of the operation guarantee range. If the outputs are connected
incorrectly, IC destruction may occur when used outside of the operation guarantee range.
Note3 : External parts, such as the anti-oscillation part, may become necessary depending on the set condition.
Check their necessity for each set.
Page 24
TENTATIVE 2
4. Maximum Ratings at Ta = 25℃℃℃℃
Parameter Symbol Conditions Ratings Unit
Maximum supply Voltage Vcc max 1 No signal, t=1 minute 26 V
Vcc max 2 During operations 18 V
Maximum output current Io peak Per channel 4.5/ch A
Allowable Power dissipation Pd max With an infinity heat sink 50 W
Operating temperature Topr -40 to 85 ℃
Storage temperature Tstg -40 to 150 ℃
Thermal resistance between the junction and case
5. Recommended operating range at Ta=25℃℃℃℃
Parameter Symbol Conditions Ratings Unit
Recommended supply voltage Vcc 14.4 V
Recommended load resistance RL op 4 Ω
Operating supply voltage range Vcc op A range not exceeding Pdmax 9 to 16 V
6. Electrical Characteristics at Ta=25℃℃℃℃, Vcc=14.4V, RL=4Ω, f=1kHz, Rg=600Ω
Parameter Symbol
Quiescent current Icco RL=∞, Rg=0Ω 200 400 mA
Standby current Ist Vst=0V 10 uA
Voltage gain VG Vo=0dBm 25 26 27 dB
Voltage gain difference ∆VG -1 +1 dB
Output power Po THD=10% 23 28 W
Pomax1 JEITA max 43 W
Pomax2 Vcc=15.2,JEITA max 48 W
θj-c 1 ℃/W
Conditions min typ max Unit
Output offset voltage Vn offset Rg=0Ω -100 +100 mV
Total harmonic distortion THD Po=4W 0.03 0.2 %
Channel separation CHsep Vo=0dBm, Rg=10kΩ 55 65 dB
Ripple rejection ratio SVRR Rg=0Ω, fr=100Hz , Vccr=0dBm 45 65 dB
Output noise voltage VNO Rg=0Ω, B.P.F.=20Hz to 20kHz 80 200 uVrms
Input resistance Ri 40 50 65 kΩ
Mute attenuation Matt Vo=20dBm ,MUTE : ON 75 90 dB
Vstby H AMP : ON 2.5 Vcc V Standby Pin
Control voltage
Control voltage
Output offset detection
Detection threshold voltage Vosdet ±1.2 ±1.8 ±2.4 V
Note : 0dBm = 0.775Vrms
Vstby L
Vmute H MUTE : OFF OPEN - Mute Pin
Vmute L
AMP : OFF 0.0 0.5 V
MUTE : ON 0.0 1.5 V
Note : Information in this document is subject to change without notice.
Page 25
TENTATIVE 3
7. LV47002P Test and Application circuit
a
cc
cc
cc
L
D
ile
ilter
rotective
circit
D
L
D
D
D
te
circit
te
D
Lo Level
te
L
tan
itch
rotective
circit
D
D
L
The components and constant values within the test circuit are used for confirmation of characteristics
and are not guarantees that incorrect or trouble will not occur in application equipment.
Note : Information in this document is subject to change without notice.
Page 26
TENTATIVE 4
8. Explanation for the functions
1. Standby switch function (pin 4)
Threshold voltage of the pin 4 is set by about 2VBE.
The amplifier is turned on by the applied voltage of 2.5V or more. Also, the amplifier is turned off by the applied
voltage of 0.5V or less.
2. Muting function (pin 22)
Fig1 Standby equivalent circuit
The muted state is obtained by setting pin 22 to the ground potential, enabling audio muting.
The muting function is turned on by the applied voltage of 1V or less to the resistance of 10kΩ. And the muting
function is turn off when this pin opens.
Also, the time constant of the muting function is determined by external capacitor and resistor constants.
It is concerned with a pop noise in amplifier ON/OFF and mute ON/OFF. After enough examination, please set it.
Fig2 Mute equivalent circuit
3. ACGND pin (pin 16)
The capacitor of the pin 16 must use the same capacitance value as the input capacitor.
Also, connect to the same PREGND as the input capacitor.
Note : Information in this document is subject to change without notice.
Page 27
TENTATIVE 5
4. Self-diagnosis function (pin 25)
By detecting the unusual state of the IC, the signal is output to the pin 25.
Also, by controlling the standby switch after the signal of the pin 25 is detected by the microcomputer,
the burnout of the speaker can be prevented.
1) Shorting to VCC / Shorting to ground : The pin 25 becomes the low level.
2) Load shorting : The pin 25 is alternated between the low level and the high level according to the output signal.
3) Output offset detection : when the output offset voltage exceeds the detection threshold voltage,
the pin 25 becomes the low level.
* Note: The output offset abnormality is thought of as the leakage current of the input capacitor.
In addition, the pin 25 has become the NPN open collector output (active low).
The pin 25 must be left open when this function is not used.
5. Sound Quality (low frequencies)
By varying the value of input capacitor, low-frequency characteristic can be improved.
However, it is concerned the shock noise. Please confirm in each set when the capacitance value varies.
6. Pop noise
For pop noise prevention, it is recommended to use the muting function at the same time.
- Please turn on the muting function simultaneously with power supply on when the amplifier is
turned on. Next, turn off the muting function after the output DC potential stabilization.
- When the amplifier is turn off, turn off the power supply after turning on the muting function.
. Oscillation Stability
Pay due attention on the following points because parasitic oscillation may occur due to effects of the capacity
load, board layout, etc.
(1) Capacity load
When the capacitor is to be inserted between each output pin and GND so as to prevent electric mirror noise,
select the capacitance of maximum 1500 pF. (Conditions: Our recommended board, RL = 4Ω)
(2) Board layout
- Provide the VCC capacitor of 0.1µF in the position nearest to IC.
- PREGND must be independently wired and connected to the GND point that is as stable as possible,
such as the minus pin of the 2200µF VCC capacitor.
In case of occurrence of parasitic oscillation, any one of following parts may be added as a countermeasure.
Note that the optimum capacitance must be checked for each set in the mounted state.
- Series connection of CR (0.1µF and 2.2Ω) between BTL outputs
- Series connection of CR(0.1µF and 2.2Ω) between each output pin and GND.
Note : Information in this document is subject to change without notice.
Page 28
TENTATIVE 6
250
RL=Open
200
R=0Ω
150
100
Icco (mA)
50
0
681012141618
Icco - Vcc
Vcc (V)
14
RL=Open
R=0Ω
8
6
4
2
0
681012141618
(V)
N
V
12
10
Vcc (V)
VN - Vcc
50
f=1kHz
RL=4Ω
40
THD=10%
30
20
Po (W)
Po - Vcc(THD=10%)
all channel is similar
10
0
81012141618
Vcc (V)
10
1
THD - Po(f=1kHz)
Vcc=14.4V
RL=4Ω
f=1kHz
ch1
ch2
ch3
ch4
THD (%)
0.1
25
20
all channel is similar
15
10
Po (W)
Vcc=14.4V
RL=4Ω
5
THD=1%
0
10100100010000100000
f (Hz)
Po - f(THD=1%)
10
1
THD - Po(f=100Hz)
Vcc=14.4V
RL=4Ω
f=100Hz
ch1
ch2
ch3
ch4
THD (%)
0.1
0.01
0.1110100
Po (W)
THD - Po(f=10kHz)
10
Vcc=14.4V
RL=4Ω
f=10kHz
1
THD (%)
0.1
0.01
0.1110100
ch1
ch2
ch3
ch4
Po (W)
0.01
0.1110100
Po (W)
THD - f
10
Vcc=14.4V
RL=4Ω
Po=4W
1
THD (%)
0.1
0.01
10100100010000100000
ch1
ch2
ch3
ch4
f (Hz)
Note : Information in this document is subject to change without notice.
Page 29
TENTATIVE 7
1
0
all channel is similar
-1
Vcc=14.4V
-2
Response (dB)
RL=4Ω
Vo=0dBm
-3
10100100010000100000
f (Hz)
f-Response
150
Vcc=14.4V
RL=4Ω
100
(µVrms)
NO
50
V
0
10100100010000100000
VNO - Rg
ch1
ch2
ch3
ch4
Rg (Ω
80
60
40
Vcc=14.4V
CH.sep (dB)
RL=4Ω
20
Rg=10kΩ
Vo=0dBm
0
10100100010000100000
CH.Sep - f(CH1→→→→)
ch1→ch2
ch1→ch3
ch1→ch4
f (Hz)
80
60
40
Vcc=14.4V
RL=4Ω
CH.sep (dB)
20
Rg=10kΩ
Vo=0dBm
0
10100100010000100000
CH.Sep - f(CH3
→→→→
)
ch3→ch1
ch3→ch2
ch3→ch4
f (Hz)
80
60
40
Vcc=14.4V
RL=4Ω
CH.sep (dB)
20
Rg=10kΩ
Vo=0dBm
0
10100100010000100000
CH.Sep - f(CH2→→→→)
ch2→ch1
ch2→ch3
ch2→ch4
f (Hz)
80
60
40
Vcc=14.4V
RL=4Ω
CH.sep (dB)
20
Rg=10kΩ
Vo=0dBm
0
10100100010000100000
CH.Sep - f(CH4→→→→)
ch4→ch1
ch4→ch2
ch4→ch3
f (Hz)
80
60
40
VccR=0dBm
fR=100Hz
Rg=0Ω
SVRR (dB)
RL=4Ω
20
CVcc=0.1μF
0
81012141618
SVRR - Vcc
Vcc (V)
ch1
ch2
ch3
ch4
80
60
40
SVRR (dB)
20
Vcc=14.4V
VccR=0dBm
Rg=0Ω
RL=4Ω
CVcc=0.1μF
0
10100100010000100000
SVRR - f
fR (Hz)
Note : Information in this document is subject to change without notice.
R
ch1
ch2
ch3
ch4
Page 30
TENTATIVE 8
4
RL=4Ω
R=0Ω
3
2
Vosdet (V)
1
Offset DIAG - Vcc
Detection Level
60
f=1kHz
RL=4Ω
50
Pd=Vcc×Icc-Po×4ch
40
30
Pd (W)
20
10
Pd - Po
Vcc=14.4V
Vcc=16V
0
81012141618
Vcc (V)
250
200
150
100
Vcc=14.4V
RL=Open
R=0Ω
Icco - Vst
Icco (mA)
50
0
0.01.02.03.04.05.0
Vst (V)
0
0.1110100
Po (W)
100
80
60
40
Mute ATT(dB)
20
0
0.01.02.03.04.05.0
Mute ATT - V Mute
Vcc=14.4V
RL=4Ω
Vo=20dBm
V Mute(V)
Note : Information in this document is subject to change without notice.
The MSM56V16160F is a 2-Bank × 524,288-word × 16-bit Synchronous dynamic RAM fabricated in
Oki’s silicon-gate CMOS technology. The device operates at 3.3V. The inputs and outputs are LVTTL
compatible.
Note : The same power supply voltage must be provided to every VCC pin and VCCQ pin.
The same GND voltage level must be provided to every V
pin and VSSQ pin.
SS
2/31
Page 34
FEDD56V16160F-02
1
Semiconductor
PIN DESCRIPTION
CLKFetches all inputs at the “H” edge.
CS
CKE
Address
A11
RAS
CAS
WE
Disables or enables device operation by asserting or deactivating all inputs except CLK, CKE,
UDQM and LDQM.
Masks system clock to deactivate the subsequent CLK operation.
If CKE is deactivated, system clock will be masked so that the subsequent CLK operation is
deactivated. CKE should be asserted at least one cycle prior to a new command.
Slects bank to be activated during row address latch time and selects bank for precharge and
read/write during column address latch time. A11=”L” : Bank A, A11=”H” : Bank B
Functionality depends on the combination. Fo r details, see the function truth table.
MSM56V16160F
UDQM,
LDQM
DQiData inputs/outputs are multiplexed on the same pin.
Masks the read data of two clocks lat er when UDQM and LDQM are set “H” at the “H” edg e of the
clock signal. M asks the write da ta of the sa me clock w hen UDQM and LDQM are set “H” at the “H”
edge of the clock signal. UDQM controls upper byte and LDQM controls lower byte.
3/31
Page 35
FEDD56V16160F-02
A0−A11
C
K
1
Semiconductor
BLOCK DIAGRAM
CKE
CL
CS
RAS
CAS
WE
UDQM
LDQM
Timing
Register
A11
8
8
Progra-
ming
Register
Bank
Controlle
r
Internal
Col.
Address
Counter
Column
Address
Buffers
8
Latency
& Burst
Controller
Column
Decoders
I/O
ontroller
Input
Data
Registe
r
MSM56V16160F
Input
Buffers
1616
Sense
Amplifiers
Internal
Row
Address
Counter
Row
12
Address
Buffers
Row
Decoder
s
Row
12
Decoder
s
Word
Drivers
Word
Drivers
8Mb
Memory
Cells
8Mb
Memory
Cells
Sense
Amplifiers
Column
Decoders
16
Read
Data
Registe
r
Output
Buffers
DQ1
1616
−DQ16
4/31
Page 36
FEDD56V16160F-02
1
Semiconductor
ELECTRICAL CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS
ParameterSymbolValueUnit
Voltage on Any Pin Relative to V
SS
VCC Supply VoltageV
Storage TemperatureT
Power DissipationP
Short Circuit Output CurrentI
Operating TemperatureT
RECOMMENDED OPERATIING CONDITIONS
VIN, V
*: Ta = 25°C
MSM56V16160F
OUT
, VCCQ–0.5 to 4.6V
CC
stg
D*
OS
opr
–0.5 to VCC+ 0.5V
–55 to 150°C
600mW
50mA
-20 to 85°C
(Voltages referenced to VSS = 0V)
ParameterSymbolMin.Typ.Max.Unit
Power Supply VoltageVCC, VCCQ3.03.33.6V
Input High VoltageV
Input Low Voltag eV
RAS Precharge Timet
RAS Pulse Widtht
RAS to CAS Delay Timet
Write Recovery Timet
RAS to RAS Bank Active Delay
Time
Refresh Timet
Power-down Exit setup Timet
Input Level Transition Timet
CAS to CAS Delay Time (Min.)l
Clock Disable Time from CKEl
Data Output High Impedance Time
from UDQM, LDQM
t
l
OHZ
t
OH
RC
RP
RAS
RCD
WR
RRD
REF
RDEtSI
T
CCD
CKE
DOZ
88
33
7090
2030
48100,00060100,000ns
2030ns
815ns
2020ns
6464ms
+1CLKtSI +1CLKns
33ns
11Cycle
11Cycle
22Cycle
ns
ns3
ns
ns
Dada Input Mask Time from UDQM ,
LDQM
l
DOD
00Cycle
8/31
Page 40
FEDD56V16160F-02
1
Semiconductor
AC CHARACTERISTICS (2/2)
ParameterSymbol
Data Input Mask Time from Write
Command
Data Output High Impedance Time
from Precharge Command
l
DWD
l
ROH
Active Command Input Time from
Mode Register Set Command Input
l
MRD
(Min.)
Write Command Input Time from
Output
l
OWD
Notes: 1. AC measurements assume that t
MSM56V16160
F-8F-10
Min.Max.Min.Max.
00Cycle
CLCLCycle
22Cycle
22Cycle
= 1ns.
T
MSM56V16160F
Note 1,2
UnitNote
2. The reference level for timing of input signals is 1.4V.
3. Output load.
Z=50Ω
Output
4. The access time is defined at 1.4V.
5. If t
is longer than 1ns, then the reference level for timing of input signals is VIH and VIL.
T
50pF (External Load)
9/31
Page 41
FEDD56V16160F-02
C
R
C
W
1
Semiconductor
TIMING CHART
Read & Write Cycle (Same Bank) @CAS
CLK
CKE
S
AS
t
RCD
AS
CAS Latency====2, Burst Length====4
CASCAS
t
RC
MSM56V16160F
t
RP
ADDR
A11
A10
DQ
E
UDQM,
RaCa0
Row Active
t
OH
Qa1
Qa0
t
AC
Read CommandPrecharge Command
Qa2
t
Qa3
OHZ
RbRa
Row Active
Cb0Rb
Db0 Db1Db2 Db3
t
WR
Write CommandPrecharge Command
10/31
Page 42
FEDD56V16160F-02
C
R
C
W
Q
1
Single Bit Read-Write-Read Cycle (Same Page) @CAS
Semiconductor
CAS Latency====2, Burst Length=4
CASCAS
t
CH
CLK
t
CC
t
CL
High
CKE
S
t
HI
t
SI
AS
I
t
t
SI
HI
CCD
AS
t
SI
t
SI
ADDR
t
SI
RaCcCbCa
MSM56V16160F
A11
A10
DQ
E
UDQM,
M
LD
t
HI
BSBSBSBSBS
Ra
Row Active
t
AC
t
OLZ
t
Read Command
t
OHZ
Qa
OH
l
OWD
Write Command
t
HI
t
HI
Db
t
SI
t
HI
t
SI
Read Command
Qc
Precharge Command
11/31
Page 43
FEDD56V16160F-02
1
Semiconductor
MSM56V16160F
*Note: 1. When CS is set “High” at a clock transition from “Low” to “High ”, all inputs except CKE, UDQM
and LDQM are invalid.
2. When issuing an active, read or write command, the bank is selected by A11.
A11Active, read or write
0Bank A
1Bank B
3. The auto precharge function is enabled or disabled by the A10 input when the read or write command
is issued.
A10A11Operation
00After the end of burst, bank A holds the idle status.
10After the end of burst, bank A is precharged automatically.
01After the end of burst, bank B holds the idle status.
11After the end of burst, bank B is precharged automatically.
4. When issuing a precharge command, the bank to be prechar ged is s elected by the A10 an d A 1 1 inpu ts.
A10A11Operation
00Bank A is precharged.
01Bank B is precharged.
1XBoth banks A and B are precharged.
5. The input data and the write command are latched by the same clock (Write latency=0).
6. The output is forced to high impedance by (1CLK+ t
) after UDQM, LDQM entry.
OHZ
12/31
Page 44
FEDD56V16160F-02
C
RASC
W
1
Page Read & Write Cycle (Same Bank) @CAS
Semiconductor
CAS Latency====2, Burst Length=4
CASCAS
CLK
CKE
S
Bank A Active
AS
I
CCD
ADDR
MSM56V16160F
High
Cc0Cd0Ca0Cb0
A11
A10
DQ
Qa0 Qa1 Qb0 Qb1Dc0 Dc1Dd0
l
OWD
t
WR
Note 2
∗
E
Note 1
∗
UDQM,
LDQM
Read Command
Read Command
Write Command
Write Command
Precharge Command
*Note: 1. To write data before a burst read ends, UDQM and LDQM should be asserted three cycles prior to the
write command to avoid bus contention.
2. To assert row precharge before a burst write ends, wait t
after the last write data input.
WR
Input data during the precharge input cycle will be masked internally.
13/31
Page 45
FEDD56V16160F-02
CS R
C
W
A
C
C
C
1
Semiconductor
Read & Write Cycle with Auto Precharge @ Burst Length====4
CLK
CKE
AS
AS
ADDR
Ra
t
RRD
Rb
Ca
High
Cb
MSM56V16160F
A11
A10
E
AS Latency=1
DQ
UDQM,
LDQM
AS Latency=2
DQ
UDQM,
LDQM
AS Latency=3
DQ
Ra
Rb
Qa0
Qa1 Qa2 Qa3 Db0 Db1 Db2 Db3
A-Bank Precharge Start
Qa1 Qa2 Qa3
-Bank Precharge Start
Qa0
Qa1 Qa2 Qa3 Db0 Db1 Db2 Db3
Db0 Db1 Db2 Db3 Qa0
UDQM,
LDQM
Row Active
(A-Bank)
Row Active
(B-Bank)
A Bank Read with
Auto Precharge
t
-
B Bank Write with
Auto Precharge
WR
B Bank Precharge
Start Point
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FEDD56V16160F-02
C
R
C
W
1
Semiconductor
Bank Interleave Random Row Read Cycle @CAS Latency=2, Burst Length=4
LHHHXXNOP (Continue Row Active after Bur st ends)
LHHLXXTerm Burst --> Row Active
LHLHBACA, A10
LHLLBACA, A10
LLHHBARA
LLHLBAA10Term Burst, execute Row Prechar ge
LLLXX XILLEGAL
HXXXXXNOP (Continue Row Active after Burst ends )
LHHHXXNOP (Continue Row Active after Bur st ends)
LHHLXXTerm Burst --> Row Active
LHLHBACA, A10
LHLLBACA, A10
LLHHBARA
LLHLBAA10
LLLXX XILLEGAL
HXXXXXNOP (Continue Burst to End and enter Ro w Precharge)
LHHHXXNOP (Continue Burst to End and e nter Row Precharge)
LHHLBA X
LHLHBACA, A10
LHLLXXILLEGAL
LLHXBARA, A10
LLLXX XILLEGAL
HXXXXXNOP (Continue Burst to End and enter Row Precharge)
LHHHXXNOP (Continue Burst to End and enter Row Precharge)
LHHLBA X
LHLHBACA, A10
BAADDRAction
ILLEGAL
ILLEGAL
NOP
Auto-Refresh or Self-Refresh
ILLEGAL
Term Burst, start new Burst Read
Term Burst, start new Burst Write
ILLEGAL
Term Burst, start new Burst Read
Term Burst, start new Burst Write
ILLEGAL
Term Burst, execute Row Pr echarge
ILLEGAL
ILLEGAL
ILLEGAL
ILLEGAL
ILLEGAL
2
2
4
5
2
3
3
2
3
3
2
2
2
2
2
2
MSM56V16160F
3
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Page 60
FEDD56V16160F-02
1
Semiconductor
FUNCTION TRUTH TABLE (Table 2) (2/2)
Current
1
State
Write with
Auto
Precharge
Precharge
Write
Recovery
Row Active
Refresh
Mode
Register
Access
CSRAS CASWE
LHLLXXILLEGAL
LLHXBARA, A10
LLLXX XILLEGAL
HXXXX X
LHHHX X
LHHLBA X
LHLXBA CA
LLHHBARA
LLHLBAA10
LLLXX XILLEGAL
HXXXX X NOP
LHHHX X NOP
LHHLBA X
LHLXBA CA
LLHHBARA
LLHLBAA10
LLLXX XILLEGAL
HXXXX X
LHHHX X
LHHLBA X
LHLXBA CA
LLHHBARA
LLHLBAA10
LLLXX XILLEGAL
HXXXX X
LHHXX X
LHLXXXILLEGAL
LLHXXXILLEGAL
LLLXX XILLEGAL
HXXXX X NOP
LHHHX X NOP
LHHLXXILLEGAL
LHLXXXILLEGAL
LLXXXXILLEGAL
BAADDRAction
ILLEGAL
NOP --> Idle after t
NOP --> Idle after t
ILLEGAL
ILLEGAL
ILLEGAL
NOP
ILLEGAL
ILLEGAL
ILLEGAL
ILLEGAL
NOP --> Row Active after t
NOP --> Row Active after t
ILLEGAL
ILLEGAL
ILLEGAL
ILLEGAL
NOP --> Idle after t
NOP --> Idle after t
2
2
2
2
4
2
2
2
2
2
2
2
2
ABBREVIATIONS
RA = Row Address BA = Bank Address NOP = No OPeration command
CA = Column AddressAP = Auto Precharge
MSM56V16160F
RP
RP
RCD
RCD
RC
RC
∗
Notes :1. All inputs are enabled when CKE is set high for at least 1 cycle prior to the inputs.
2. Illegal to bank in specified state, but may be legal in some cases depending on the state of bank
selection.
3. Satisfy the timing of l
and tWR to prevent bus contention.
CCD
4. NOP to bank precharging or in idle state. Precharges activated bank by BA or A10.
5. Illegal if any bank is not idle.
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Page 61
FEDD56V16160F-02
1
Semiconductor
FUNCTION TRUTH TABLE for CKE (Table 2)
Current State (n) CKEn-1CKEn
Self Refresh
6
HX XXXX XINVALID
LHHXXXXExit Self Refresh --> ABI
LHLHHHXExit Self Refresh --> ABI
LHLHHLXILLEGAL
LHLHLXXILLEGAL
LHLLXXXILLEGAL
LLXXXXXNOP (Maintain Self Refresh)
6
Power Down
HX XXXX XINVALID
LHHXXXXExit Power Down --> ABI
LHLHHHXExit Power Down --> ABI
LHLHHLXILLEGAL
LHLHLXXILLEGAL
LHLLXXX
LLXXXXXNOP (Continue power down mode)
7
All Banks Idle
(ABI)
HHXXXXXRefer to Table 1
HLHXXXXEnter Power Down
HLLHHHXEnter Power Down
HLLHHLXILLEGAL
HLLHLXXILLEGAL
HLLLHLXILLEGAL
HLLLLHXEnter Self Refresh
HL LLLL XILLEGAL
LL XXXX XNOP
Any State Other
than Listed
Above
HHXXXXXRefer to Operations in Table 1
HLXXXXXBegin Clock Suspend Next Cycle
LHXXXXXEnable Clock of Next Cycle
LLXXXXXContinue Clock Suspension
CSRAS CASWE
ADDR Action
ILLEGAL
MSM56V16160F
6
*Notes :6 . If the minimum set-up t ime t
asynchronously so that a command can be input in the same internal clock cycle.
7. Power-down and self-refresh can be entered only when all the banks are in an idle state.
is satisfied when CKE transition from “L” to “H”, CKE operates
PDE
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Page 62
FEDD56V16160F-02
1
Semiconductor
MSM56V16160F
NOTICE
1. The information contained herein can change without notice owing to product and/or technical improvements.
Before using the product, please make sure that the information being referred to is up-to-date.
2. The outline of action and examples for application circuits described herein have been chosen as an explanation
for the standard action and performance of the product. When planning to use the product, please ensure that
the external conditions are reflected in the actual circuit, assembly, and program designs.
3. When designing your product, please use our product below the specified maximum ratings and within the
specified operating ranges including, but not limited to, operating voltage, power dissipation, and operating
temperature.
Oki assumes no responsibility or liability whatsoever for any failure or unusual or
4.
unexpected operation resulting from misuse, neglect, improper installation, repair, alteration
or accident, improper handling, or unusual physical or elect rical stress including, but not
limited to, exposure to parameters beyond the specified maximum ratings or operation
outside the specified operating range.
5. Neither indemnity against nor license of a third party’s industrial and intellectual property right, etc. is granted
by us in connection with the use of the product and/or the information and drawings contained herein. No
responsibility is assumed by us for any infringement of a third party’s right which may result from the use
thereof.
6. The products listed in this document are intended for use in general electronics equipment for commercial
applications (e.g., office automation, communication equipment, measurement equipment, consumer
electronics, etc.). These products are not authorized for use in any system or application that requires special or
enhanced quality and reliability characteristics nor in any system or application where the failure of such
system or application may result in the loss or damage of property, or death or injury to humans.
Such applications include, but are not limited to, traffic and automotive equipment, safety devices, aerospace
equipment, nuclear power control, medical equipment, and life-support systems.
7. Certain products in this document may need government approval before they can be exported to particular
countries. The purchaser assumes the responsibility of determining the legality of export of these products and
will take appropriate and necessary steps at their own expense for these.
8. No part of the contents contained herein may be reprinted or reproduced without our prior permission.
Copyright 2001 Oki Electric Industry Co., Ltd.
31/31
Page 63
Confidential
S5L8035Ui (Preliminary Spec) PRODUCT OVERVIEW
S5L8035Ui
CDMP3 SOC
V1.1
1-1
Page 64
Confidential
PRODUCT OVERVIEW S5L8035Ui (Preliminary Spec)
1 PRODUCT OVERVIEW
INTRODUCTION
S5L8035Ui Audio MP3CDP SoC provides a cost-effective solution for Audio CD application. The S5L8035Ui SoC
solution presents a rich set of features for a typical stand-alone Audio CD system: high-quality audio processing,
fully embedded CD front-end (RF, servo control, and CD-DSP), up to 4megabit flash memory support. S5L8035
also includes the following components: a 16-bit CPU with 24-bit audio DSP coprocessor, SDRAM, Serial-Flash,
4-channel timers, I/O ports, audio PWM processor, 1-channel UARTs with handshake, IIC-BUS interface, IIS
interface, SPI interface, PLLs for clock generation.
Ui
Especially, one newly adopted feature of S5L8035
CalmADM, a cost effective MCU+DSP solution based on Samsung’s 16-bit MCU (CalmRISC16) and Samsung’s
24-bit audio DSP (CalmMAC24). CalmADM performs both system control and high quality audio processing like
decoding of MP3 and decoding of WMA streams with additional special effects. The S5L8035
standard 65nm CMOS technology. Its low power and static design is suitable for power-sensitive applications.
Ui micro-architecture make the solution more cost effective.