Philips BU4523AF Datasheet

Philips Semiconductors Product specification
Silicon Diffused Power Transistor BU4523AF
GENERAL DESCRIPTION
Enhanced performance, new generation, high-voltage, high-speed switching npn transistor in a plastic envelope intended for use in horizontal deflection circuits of colour television receivers and p.c monitors. Features exceptional tolerance to base drive and collector current load variations resulting in a very low worst case dissipation.
QUICK REFERENCE DATA
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
CESM
CEO
I
C
I
CM
tot
CEsat
I
Csat
t
f
PINNING - SOT199 PIN CONFIGURATION SYMBOL
Collector-emitter voltage peak value VBE = 0 V - 1500 V Collector-emitter voltage (open base) - 800 V Collector current (DC) - 11 A Collector current peak value - 29 A Total power dissipation Ths 25 ˚C - 45 W Collector-emitter saturation voltage IC = 8 A; IB = 2 A - 3.0 V Collector saturation current f = 16 kHz 8 - A
f = 70 kHz 6.5 - A
Fall time I
= 8 A; f = 16 kHz 0.3 0.4 µs
Csat
I
= 6.5 A; f = 70 kHz 0.14 - µs
Csat
PIN DESCRIPTION
1 base
case
c
2 collector
b
3 emitter
case isolated
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
C
I
CM
I
B
I
BM
-I P T T
CESM CEO
BM tot stg j
Collector-emitter voltage peak value VBE = 0 V - 1500 V Collector-emitter voltage (open base) - 800 V Collector current (DC) - 11 A Collector current peak value - 29 A Base current (DC) - 7 A Base current peak value - 10 A Reverse base current peak value
1
Total power dissipation Ths 25 ˚C - 45 W Storage temperature -55 150 ˚C Junction temperature - 150 ˚C
THERMAL RESISTANCES
12
3
e
-7A
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
R
th j-hs
R
th j-a
1 Turn-off current.
Junction to heatsink with heatsink compound - 2.8 K/W Junction to ambient in free air 35 - K/W
May 1998 1 Rev 1.100
Philips Semiconductors Product specification
Silicon Diffused Power Transistor BU4523AF
ISOLATION LIMITING VALUE & CHARACTERISTIC
Ths = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
isol
C
isol
STATIC CHARACTERISTICS
Ths = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
I
CES
I
CES
I
EBO
BV
EBO
CEOsust
CEsat
BEsat
h
FE
h
FE
Repetitive peak voltage from all R.H. 65 % ; clean and dustfree - - 2500 V three terminals to external heatsink
Capacitance from T2 to external f = 1 MHz - 22 - pF heatsink
Collector cut-off current
2
VBE = 0 V; VCE = V VBE = 0 V; VCE = V Tj = 125 ˚C
CESMmax
; - - 2.0 mA
CESMmax
- - 1.0 mA
Emitter cut-off current VEB = 6 V; IC = 0 A - - 100 µA Emitter-base breakdown voltage IB = 1 mA 7.5 12.5 - V Collector-emitter sustaining voltage IB = 0 A; IC = 100 mA; 800 - - V
L = 25 mH Collector-emitter saturation voltage IC = 8 A; IB = 2 A - - 3.0 V Base-emitter saturation voltage IC = 8 A; IB = 2 A 0.85 0.95 1.1 V DC current gain IC = 1 A; VCE = 5 V - 14 -
IC = 8 A; VCE = 5 V 4.2 5.8 7.3
DYNAMIC CHARACTERISTICS
Ths = 25 ˚C unless otherwise specified
SYMBOL PARAMETER CONDITIONS TYP. MAX. UNIT
Switching times (16 kHz line I deflection circuit) (IB2 = -4 A)
t
s
t
f
Turn-off storage time 4.5 5.5 µs Turn-off fall time 0.3 0.4 µs
Switching times (70 kHz line I deflection circuit) (IB2 = -3.9 A)
t
s
t
f
Turn-off storage time 2.3 - µs Turn-off fall time 0.14 - µs
= 8.0 A;IB1 = 1.6 A
Csat
= 6.5 A;IB1 = 1.3 A
Csat
2 Measured with half sine-wave voltage (curve tracer).
May 1998 2 Rev 1.100
Philips Semiconductors Product specification
Silicon Diffused Power Transistor BU4523AF
30-60 Hz
IC / mA
250 200
100
100R
6V
Fig.1. Test circuit for V
100-200R
Horizontal
Oscilloscope
Vertical
1R
.
CEOsust
+ 50v
ICsat
t
IB1
t
IB2
t
VCE
TRANSISTOR
IC
IB
DIODE
7.1us2.5us
14.2us
Fig.4. Switching times waveforms (70 kHz).
ICsat
90 %
IC
10 %
IB
ts
IB1
tf
t
0
VCE / V
Fig.2. Oscilloscope display for V
TRANSISTOR
IC
IB
VCE
DIODE
26us20us
64us
min
VCEOsust
CEOsust
ICsat
IB1
IB2
.
t
t
t
Fig.3. Switching times waveforms (16 kHz).
IBend
-VBB
- IB2
Fig.5. Switching times definitions.
+ 150 v nominal adjust for ICsat
Lc
LB
T.U.T.
Cfb
Fig.6. Switching times test circuit
t
.
May 1998 3 Rev 1.100
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