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M3D088
1. Description
2. Features
BSH111
N-channel enhancement mode field-effect transistor
Rev. 02 — 26 April 2002 Product data
N-channel enhancement mode field-effect transistor in a plastic package using
TrenchMOS™ technology.
Product availability:
BSH111 in SOT23.
■ TrenchMOS™ technology
■ Very fast switching
■ Low threshold voltage
■ Subminiature surface mount package.
3. Applications
■ Battery management
■ High speed switch
■ Logic level translator.
4. Pinning information
Table 1: Pinning - SOT23, simplified outline and symbol
Pin Description Simplified outline Symbol
1 gate (g)
2 source (s)
3 drain (d)
12
Top view
3
MSB003
SOT23
g
MBB076
d
s
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor
5. Quick reference data
Table 2: Quick reference data
Symbol Parameter Conditions Typ Max Unit
V
I
D
P
T
R
DS
tot
j
DSon
drain-source voltage (DC) 25 °C ≤ Tj≤ 150 °C - 55 V
drain current (DC) Tsp=25°C; VGS= 4.5 V - 335 mA
total power dissipation Tsp=25°C - 0.83 W
junction temperature - 150 °C
drain-source on-state resistance VGS= 4.5 V; ID= 500 mA 2.3 4.0 Ω
= 2.5 V; ID= 75 mA 2.4 5.0 Ω
V
GS
= 1.8 V; ID= 75 mA 3.1 8.0 Ω
V
GS
6. Limiting values
Table 3: Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DS
V
DGR
V
GS
I
D
I
DM
P
tot
T
stg
T
j
Source-drain diode
I
S
I
SM
drain-source voltage (DC) 25 °C ≤ Tj≤ 150 °C - 55 V
drain-gate voltage (DC) 25 °C ≤ Tj≤ 150 °C; RGS=20kΩ -55V
gate-source voltage - ±10 V
drain current (DC) Tsp=25°C; VGS= 4.5 V;
- 335 mA
Figure 2 and 3
T
= 100 °C; VGS= 4.5 V; Figure 2 - 212 mA
sp
peak drain current Tsp=25°C; pulsed; tp≤ 10 µs;
- 1.3 A
Figure 3
total power dissipation Tsp=25°C; Figure 1 - 0.83 W
storage temperature −65 +150 °C
junction temperature −65 +150 °C
source (diode forward) current (DC) Tsp=25°C - 335 mA
peak source (diode forward) current Tsp=25°C; pulsed; tp≤ 10 µs - 1.3 A
9397 750 09629
Product data Rev. 02 — 26 April 2002 2 of 13
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor
03aa17
200
Tsp (°C)
P
P
der
(%)
der
120
80
40
0
0
P
tot
----------------------
P
tot 25 C°()
50 100 150
100%×=
Fig 1. Normalized total power dissipation as a
function of solder point temperature.
10
150
T
03aa25
sp
200
(°C)
I
(%)
der
120
80
40
0
0
50 100
VGS≥ 4.5 V
I
I
der
D
------------------ -
I
D25C°()
100%×=
Fig 2. Normalized continuous drain current as a
function of solder point temperature.
03aa71
I
(A)
D
1
-1
10
-2
10
1
Limit R
DSon
= VDS/ I
D
tp=10µs
100µs
1ms
DC
10
10 ms
100 ms
VDS (V)
Tsp=25°C; IDM is single pulse.
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage.
2
10
9397 750 09629
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Product data Rev. 02 — 26 April 2002 3 of 13
Philips Semiconductors
BSH111
N-channel enhancement mode field-effect transistor
7. Thermal characteristics
Table 4: Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
R
th(j-sp)
R
th(j-a)
thermal resistance from junction to
solder point
thermal resistance from junction to
ambient
7.1 Transient thermal impedance
mounted on metal clad
substrate; Figure 4
minimum footprint; mounted on
printed circuit board
- - 150 K/W
- 350 - K/W
3
10
Z
th(j-sp)
(K/W)
2
δ = 0.5
10
0.2
0.1
0.05
10
0.02
single pulse
1
-5
10
-4
10
-3
10
-2
10
-1
10
P
δ =
t
p
T
1
Mounted on metal clad substrate.
Fig 4. Transient thermal impedance from junction to solder point as a function of pulse duration.
t
p
T
t
tp (s)
03aa69
10
9397 750 09629
© Koninklijke Philips Electronics N.V. 2002. All rights reserved.
Product data Rev. 02 — 26 April 2002 4 of 13