Philips BLF900-110, BLF900S-110 Technical data

Philips BLF900-110, BLF900S-110 Technical data

BLF900-110

DISCRETE SEMICONDUCTORS

DATA SHEET

M3D379

M3D461

BLF900-110; BLF900S-110

Base station LDMOS transistors

Product specification

 

2004 Feb 04

Supersedes data of 2003 Sep 22

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Philips Semiconductors

Product specification

 

 

Base station LDMOS transistors

BLF900-110; BLF900S-110

 

 

 

 

FEATURES

Typical CDMA IS95 performance at standard settings with a supply voltage of 27 V, frequency of 881.5 MHz

and IDQ of 700 mA; adjacent channel bandwidth is 30 kHz, adjacent channel at ± 750 kHz:

APPLICATIONS

RF power amplifier for GSM, EDGE and CDMA base stations and multicarrier operations in the

800 to 1000 MHz frequency range.

Output power = 24 W (AV)

Gain = 15 dB

Efficiency = 27%

ACPR = 45 dBc at 750 kHz and BW = 30 kHz.

110 W CW performance

Easy power control

Excellent ruggedness

High power gain

Excellent thermal stability

Designed for broadband operation (800 to 1000 MHz)

Internally matched for ease of use.

PINNING - SOT502A

PIN

DESCRIPTION

 

 

1

drain

 

 

2

gate

 

 

3

source; connected to flange

 

 

DESCRIPTION

110 W LDMOS power transistor for base station applications at frequencies from 800 to 1000 MHz.

PINNING - SOT502B

PIN

DESCRIPTION

 

 

1

drain

 

 

2

gate

 

 

3

source; connected to flange

 

 

handbook, halfpage

1

 

 

 

 

 

 

 

 

1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3

 

 

2

3

 

 

 

 

 

 

 

2

 

 

 

 

 

 

 

 

 

 

 

 

 

Top view

 

MBK394

 

 

 

 

Top view

MBL105

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Leads are gold-plated.

 

 

 

 

 

Fig.1 Simplified outline SOT502A (BLF900-110).

 

 

Fig.2 Simplified outline SOT502B (BLF900S-110).

 

 

 

 

 

 

 

 

 

 

 

 

 

QUICK REFERENCE DATA

 

 

 

 

 

 

 

 

 

 

 

Typical RF performance at Th = 25 °C in a common source test circuit.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MODE OF OPERATION

 

f

 

VDS

 

PL

Gp

 

ηD

 

d3

ACPR 750

 

(MHz)

 

(V)

 

(W)

(dB)

 

(%)

 

(dBc)

(dBc)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2-tone, class-AB

f1 = 890.0; f2 = 890.1

 

27

 

100 (PEP)

17

 

38

 

33

CDMA (IS95)

 

881.5

 

27

 

24 (AV)

15

 

27

 

45

 

 

 

 

 

 

 

 

 

 

 

 

 

2004 Feb 04

2

Philips Semiconductors

 

 

Product specification

 

 

 

 

 

Base station LDMOS transistors

BLF900-110; BLF900S-110

 

 

 

 

 

ORDERING INFORMATION

 

 

 

 

 

 

 

 

 

TYPE NUMBER

 

 

 

PACKAGE

 

 

 

 

 

 

 

NAME

 

DESCRIPTION

VERSION

 

 

 

 

 

 

 

 

BLF900-110

 

Flanged LDMOST ceramic package; 2 mounting holes; 2 leads

SOT502A

 

 

 

 

 

BLF900S-110

 

Earless flanged LDMOST ceramic package; 2 leads

SOT502B

 

 

 

 

 

 

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 60134).

SYMBOL

PARAMETER

MIN.

MAX.

UNIT

 

 

 

 

 

VDS

drain-source voltage

75

V

VGS

gate-source voltage

±15

V

Tstg

storage temperature

65

+150

°C

Tj

junction temperature

200

°C

THERMAL CHARACTERISTICS

SYMBOL

PARAMETER

CONDITIONS

VALUE

UNIT

 

 

 

 

 

Rth(j-c)

thermal resistance from junction to case

Th = 25 °C, PL = 160 W (AV), note 1

0.9

K/W

Note

 

 

 

 

1. Thermal resistance is determined under specified RF operating conditions.

CHARACTERISTICS

Tj = 25 °C unless otherwise specified.

SYMBOL

PARAMETER

CONDITIONS

MIN.

TYP.

MAX.

UNIT

 

 

 

 

 

 

 

V(BR)DSS

drain-source breakdown voltage

VGS = 0; ID = 3 mA

75

V

VGSth

gate-source threshold voltage

VDS = 10 V; ID = 250 mA

4.5

5.5

V

IDSS

drain-source leakage current

VGS = 0; VDS = 28 V

3

μA

IDSX

on-state drain current

VGS = VGSth + 9 V; VDS = 10 V

31

A

IGSS

gate leakage current

VGS = ±15 V; VDS = 0

0.5

μA

gfs

forward transconductance

VDS = 20 V; ID = 7.5 A

7

S

RDSon

drain-source on-state resistance

VGS = VGSth + 9 V; ID = 9 A

90

mΩ

2004 Feb 04

3

Philips Semiconductors

Product specification

 

 

Base station LDMOS transistors

BLF900-110; BLF900S-110

 

 

APPLICATION INFORMATION

RF performance in a common source class-AB circuit. VDS = 27 V; f = 890 MHz; Th = 25 °C; unless otherwise specified.

SYMBOL

PARAMETER

 

 

 

CONDITIONS

MIN.

TYP.

 

MAX.

UNIT

 

 

 

 

 

 

 

 

 

 

Mode of operation: 2-tone CW, 100 kHz spacing, IDQ = 700 mA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

G

power gain

P

L

= 100 W (PEP)

16

 

17 (1)

 

dB

p

 

 

 

 

 

 

 

 

 

 

ηD

drain efficiency

 

 

 

 

35

 

38

 

%

IRL

input return loss

 

 

 

 

9

 

<6

dB

 

 

 

 

 

 

 

 

 

 

 

 

d3

third order intermodulation

 

 

 

 

33

 

27

dBc

 

distortion

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ruggedness

VSWR = 10 : 1 through all

no degradation in output power

 

 

phases; PL = 125 W (PEP)

 

 

 

 

 

 

Mode of operation: CDMA, IS95 (pilot, paging, sync and traffic codes 8 to 13), I DQ = 575 mA

 

 

 

 

 

 

 

 

 

 

 

 

 

Gp

power gain

PL = 24 W (AV)

15

 

dB

ηD

drain efficiency

PL = 24 W (AV)

27

 

%

ACPR 750

adjacent channel power ratio

at BW = 30 kHz

45

 

dBc

 

 

 

 

 

 

 

 

 

 

 

 

Note

 

 

 

 

 

 

 

 

 

 

 

1. Refer to RF Gain grouping table.

 

 

 

 

 

 

 

 

 

 

RF Gain grouping

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

GAIN(2)

 

 

 

 

 

CODE(1)

 

 

 

 

(dB)

 

 

 

 

 

 

 

 

 

MIN.

 

 

 

MAX.

 

 

 

 

 

 

 

 

 

 

 

 

 

B

 

 

 

16.0

 

 

 

16.5

 

 

 

 

 

 

 

 

 

 

 

 

 

C

 

 

 

16.5

 

 

 

17.0

 

 

 

 

 

 

 

 

 

 

 

 

 

D

 

 

 

17.0

 

 

 

17.5

 

 

 

 

 

 

 

 

 

 

 

 

 

E

 

 

 

17.5

 

 

 

18.0

 

 

 

 

 

 

 

 

 

 

 

 

 

Notes

1. 0.2 dB overlap is allowed for measurement repeatability. 2. For 2-tone at f1 = 890 MHz; f2 = 890.1 MHz.

2004 Feb 04

4

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