Philips BLF548 Datasheet

DISCRETE SEMICONDUCTORS
DATA SH EET
BLF548
UHF push-pull power MOS transistor
Product specification
October 1992
h
UHF push-pull power MOS transistor BLF548
FEATURES
High power gain
Easy power control
Good thermal stability
Gold metallization ensures
excellent reliability
Designed for broadband operation.
DESCRIPTION
Dual push-pull silicon N-channel enhancement mode vertical D-MOS transistor designed for communications transmitter applications in the UHF frequency range.
The transistor is encapsulated in a 4-lead, SOT262A2 balanced flange envelope, with two ceramic caps. The mounting flange provides the common source connection for the transistors.
PIN CONFIGURATION
12
MBB157
d
2
s
d
1
alfpage
g
2
g
1
55
Top view
34
MSB008
Fig.1 Simplified outline and symbol.
CAUTION
The device is supplied in an antistatic package. The gate-source input must be protected against static charge during transport and handling.
PINNING - SOT262A2
PIN DESCRIPTION
1 drain 1 2 drain 2 3 gate 1 4 gate 2 5 source
Product and environmental safety - toxic materials
This product contains beryllium oxide. The product is entirely safe provided that the BeO discs are not damaged. All persons who handle, use or dispose of this product should be aware of its nature and of the necessary safety precautions. After use, dispose of as chemical or special waste according to the regulations applying at the location of the user. It must never be thrown out with the general or domestic waste.
WARNING
QUICK REFERENCE DATA
RF performance at T
MODE OF OPERATION
= 25 °C in a push-pull common source test circuit.
h
f
(MHz)
V
(V)
DS
P
(W)
L
G
p
(dB)
η
(%)
D
CW, class-B 500 28 150 > 10 > 50
October 1992 2
UHF push-pull power MOS transistor BLF548
LIMITING VALUES
In accordance with the Absolute Maximum System (IEC 134). Per transistor section unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
±V
GS
I
D
P
tot
T
stg
T
j
THERMAL RESISTANCE
drain-source voltage 65 V gate-source voltage 20 V DC drain current 15 A total power dissipation up to Tmb = 25 °C; total device; both
330 W
sections equally loaded storage temperature 65 150 °C junction temperature 200 °C
SYMBOL PARAMETER CONDITIONS
R
th j-mb
R
th mb-h
thermal resistance from junction to mounting base
thermal resistance from mounting
Tmb = 25 °C; P
= 330 W;
tot
total device; both sections equally loaded total device; both sections equally loaded 0.15 K/W
base to heatsink
2
10
handbook, halfpage
I
D
(A)
10
(1)
MRA997
(2)
400
handbook, halfpage
P
tot
(W)
350
300
250
200
150
100
50
THERMAL
RESISTANCE
0.5 K/W
MRA532
(2)
(1)
1
110
(1) Current in this area may be limited by R (2) Tmb = 25 °C. Total device; both sections equally loaded.
VDS (V)
DS(on)
.
2
10
Fig.2 DC SOAR.
October 1992 3
0
0 20 40 60 80 100 120
(1) Continuous operation. (2) Short-time operation during mismatch. Total device; both sections equally loaded.
Fig.3 Power/temperature derating curves.
Th (
o
C)
UHF push-pull power MOS transistor BLF548
CHARACTERISTICS (per section)
T
= 25 °C unless otherwise specified.
j
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
I
DSS
I
GSS
V
GS(th)
g
fs
R
DS(on)
I
DSX
C
is
C
os
C
rs
drain-source breakdown voltage VGS = 0; ID = 40 mA 65 −− V drain-source leakage current VGS = 0; VDS = 28 V −−0.5 mA gate-source leakage current ±VGS = 20 V; VDS = 0 −−1 µA gate-source threshold voltage ID = 160 mA; VDS = 10 V 2 4V forward transconductance ID = 4.8 A; VDS = 10 V 2.4 3.5 S drain-source on-state resistance ID = 4.8 A; VGS = 10 V 0.25 0.3 on-state drain current VGS = 15 V; VDS = 10 V 16 20 A input capacitance VGS = 0; VDS = 28 V; f = 1 MHz 105 pF output capacitance VGS = 0; VDS = 28 V; f = 1 MHz 90 pF feedback capacitance VGS = 0; VDS = 28 V; f = 1 MHz 25 pF
handbook, halfpage
3
TC
(mV/K)
2
1
0
1
2
3
4
10
VDS= 10 V.
2
1
10
110
ID (A)
Fig.4 Temperature coefficient of gate-source
voltage as a function of drain current, typical values per section.
MRA524
25
handbook, halfpage
I
D
(A)
20
15
10
5
0
0 4 8 12 16
VDS = 10 V; Tj = 25 °C.
MRA529
VGS (V)
Fig.5 Drain current as a function of gate-source
voltage, typical values per section.
October 1992 4
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