The BLF574 is a new, 50 V, push-pull transistor using NXP Semiconductors’ 6th
generation of high voltage LDMOS technology. The two push-pull sections of the device
are completely independent of each other inside the package. The gates of the device are
internally protected by the integrated ElectroStatic Discharge (ESD) diode.
The device is unmatched and is designed for use in applications below 600 MHz where
very high power and efficiency are required. Typical applications are FM/VHF broadcast,
laser or Industrial Scientific and Medical (ISM) applications.
Great care has been taken during the design of the high voltage process to ensure that
the device achieves high ruggedness. This is a critical parameter for successful broadcast
operations. The device can withstand greater than a 10
full operating power.
Another design goal was to minimize the size of the application circuit. This is important in
that it allows amplifier designers to maximize the power in a given amplifier size. The
design highlighted in this application note achieves over 600 W in the 88
band in a space smaller than 50.8
as wide as the transistor itself, enabling transistor mounting in the final amplifier to be as
close as physically possible while still providing adequate room for the circuit
implementation.
AN10714
Using the BLF574 in the 88 MHz to 108 MHz FM band
: 1 VSWR for all phase angles at
MHz to 108 MHz
mm × 101.6 mm (2 ” × 4 ”). The circuit only needs to be
This application note describes the design and the performance of the BLF574 for
Class-B CW and FM type applications in the 88
[1] The semirigid cable length is defined in Figure 4.
[2] Contact your local NXP Semiconductors sales person for the artwork file containing the dimensions.
[3] N-male connector mounted as close to the package as possible.
Care has been taken to minimize board space for the desig n. Figure 5 shows how 600 W
can be generated in a space only as wide as the transistor itself.
AN10714
Using the BLF574 in the 88 MHz to 108 MHz FM band
Fig 5.Photograph of the BLF574 circuit board
3.Amplifier design
3.1Mounting considerations
To ensure good thermal cont act, a heatsink compo und (such as Dow Corning 340) shou ld
be used when mounting the BLF574 in the SOT539A package to the heatsink. Improved
thermal contact is obtainable when the devices are soldered on to the heatsink. This
lowers the junction temperature at high operating power and results in slightly better
performance.
When greasing the part down, care must be taken to ensure that the amount of grease is
kept to an absolute minimum. The NXP Semiconductors’ website can be consulted for
application notes on the recommended mounting procedure for this type of device or from
your local NXP salesperson.
3.2Bias circuit
A temperature compensated bias circuit is used and comprises the following:
An 8 V voltage regulator (Q1) supplies the bias circui t. The temper ature sensor (Q2) must
be mounted in good thermal contact with the device under test (Q3). The quiescent
current is set using a potentiometer (R1). The gate voltage correction is approximately
The −2.2 mV/°C at its base is generated by Q2. This is then multiplied by the R14 : R15
ratio for a temperature slope (i.e. approximately −15
provided by the transistor is the reason it is used rather than a diode. A portion of the
−15
The amount of temperature compensation is set by resistor R4. The ideal value of which
proved to be 2
compensation. However, they are used for baseband stability and to improve IMD
asymmetry at lower power levels.
3.3Amplifier alignment
There are several points in the circuit that allow performance parameters to be readily
traded off against one another. In general, the following areas o f th e circu it h ave th e m ost
impact on the circuit operating frequency and P
are listed in order of sensitivity, with the most sensitive tuning elements listed first.
Effect of changing the output capacitors (C12 and C13):
• This is a key tuning point in the circuit. This point has the strongest influence on the
Using the BLF574 in the 88 MHz to 108 MHz FM band
mV/°C is applied to the potentiometer (R1).
kΩ. The values of R11 and R13 are not important for temperature
trade-off between efficiency and linearity.
AN10714
mV/°C). The multiplication function
performance. The modification areas
L(1dB)
Effect of the length of the output balun (B2):
• The frequency can be shifted by modifying this element. Typically, the longer the
balun, the more the response is shifted to lower frequencies. Conversely, a short
balun shifts the response to higher frequencies.
Effect of changing the output 4 : 1 transformers (T3 and T4):
• The frequency can be shifted by modifying these elements. In general, longer
transformers shift the whole response to a lower frequency. Shortening the
transformers shifts the response to higher frequencies. Changes in efficiency and
P
is seen when the characteristic impedance of these transformers is changed.
L(1dB)
Effect of changing the output capacit or (C14):
• Changing this output capacitor has an ef fect of tilting the respo nse over the band. The
efficiency or P
modifying C14.
Effect of adding capacitance off the drain (C10, C11 , C15, and C16):
• A small adjustment in the trade-off between ef ficiency and P
made by changing these capacitors.
performance can be made more consistent over the band by
Application noteRev. 01 — 26 January 2010 13 of 21
NXP Semiconductors
41
5.Input and output impedance
The BLF574 input and output impedances are given in Table 3. These are generated from
a first order equivalent circuit of the device and ca n be u sed to get the first-pass matching
circuits.
Time-to-Failure (TTF) is defined as the expected time elap sed until 0.1 % of the devices of
a sample size fail. This is different from Mean-Time-to-Failure (MTBF), where half the
devices would have failed and is orders of magnitude are shorter. The predominant failure
mode for LDMOS devices is electromigration. The TTF for this mode is primarily
dependant on junction temperature (T
device junction temperature is measured and in-depth knowledge is obt ained of the
average operating current for the application, the TTF can be calculated using
and the related procedure.
7.1Calculating TTF
The first step uses the thermal resistance (Rth) of the device to calculate the junction
temperature. The R
the device is soldered down to the heat sink, this same value can be used to determine T
If the device is greased down to the heatsink, the R
Application noteRev. 01 — 26 January 2010 17 of 21
from the junction to the device flange for the BLF574 is 0.25 °C/W . If
th
) added to the effect of current density. Once the
j
Figure 14
value becomes 0.4 °C/W.
th(j-h)
.
j
NXP Semiconductors
Example: Assuming the device is running at 600 W with the RF output power at 70 %
efficiency on a heatsink (e.g. 40 °C). T
efficiency for the given heatsink temperature:
AN10714
Using the BLF574 in the 88 MHz to 108 MHz FM band
can be determined based on the operating
j
• Dissipated power (P
• Temperature rise (T
• Junction temperature (T
) = 257 W
d
) = Pd × Rth = 257 W × (0.4 °C/W) = 103 °C
r
) = Th + Tr = 40 °C + 103 °C = 143 °C
j
Based on this, the TTF can be estimated using a device greased-down heatsink as
follows:
• The operating current is just above 17 A
• T
= 140 °C
j
The curve in Figure 14 intersects the x-axis at 17 A. At this point, it can be estimated that
it would take 100 years for 0.1 % of the devices to fail.
001aal311
TTF
(y)
5
10
4
10
3
10
2
10
10
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
1
020168124
(1) Tj = 100 °C.
(2) Tj = 110 °C.
(3) Tj = 120 °C.
(4) Tj = 130 °C.
(5) Tj = 140 °C.
(6) Tj = 150 °C.
(7) Tj = 160 °C.
(8) Tj = 170 °C.
(9) Tj = 180 °C.
(10) Tj = 190 °C.
(11) Tj = 200 °C.
Application noteRev. 01 — 26 January 2010 18 of 21
NXP Semiconductors
2
8.Test configuration block diagram
AN10714
Using the BLF574 in the 88 MHz to 108 MHz FM band
SIGNAL
GENERATOR
E4437B
SPINNER
SWITCH
DRIVER
AMPLIFIER
Ophir 5127
Fig 15. BLF574 test configuration
9.PCB layout diagrams
NETWORK
ANALYZER
HP8753D
103010
COUPLER
HP778D
ANZAC
CH132
DUT
POWER
METER
E4419B
POWER
SENSOR
HP8481A
TENULINE
30 dB
1 kW
SPECTRUM
ANALYZER
Rhode & Schwarz
FSEB
NARDA
3020A
10 dB
PA D
ANZAC
CH132
RF LOW PASS
FILTER
POWER
SENSOR
HP8481A
001aal31
Please contact your local NXP Semiconductors’ salesperson for copies of the PCB layout
files.
10. Abbreviations
Table 4.Abbreviations
AcronymDescription
CWContinuous Wave
ESDElectroStatic Discharge
FMFrequency Modulation
IMDInterModulation Distortion
IRLInput Return Loss
LDMOSTLaterally Diffused Metal-Oxide Semiconductor Transistor
PARPeak-to-Average power Ratio
PCBPrinted-Circuit Board
SMTSurface Mount Technology
VHFVery High Frequency
VSWRVoltage Standing Wave Ratio
Application noteRev. 01 — 26 January 2010 19 of 21
NXP Semiconductors
11. Legal information
AN10714
Using the BLF574 in the 88 MHz to 108 MHz FM band
11.1Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
11.2Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconduct ors does not give any repr esentatio ns or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonabl y be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
11.3Trademarks
Notice: All referenced brands, prod uct names, service names and trad emarks
are the property of their respective owners.
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.