Philips 74lvt20 DATASHEETS

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74LVT20
3.3V Dual 4-input NAND gate
Product specification 1996 Aug 28
INTEGRATED CIRCUITS
IC24 Data Handbook
74LVT203.3V Dual 4-input NAND gate
2
1996 Aug 28 853-1871 17244

QUICK REFERENCE DATA

SYMBOL PARAMETER
CONDITIONS
T
amb
= 25°C;
GND = 0V
TYPICAL UNIT
t
PLH
t
PHL
Propagation delay An, Bn, Cn, Dn to Y
n
CL = 50pF; V
CC
= 3.3V
3.4
3.2
ns
C
IN
Input capacitance
VI = 0V or 3.0V 3 pF
I
CCL
Total supply current
Outputs Low; V
CC
= 3.6V
0.5 mA

PIN CONFIGURATION

14 13 12 11 10
9 87
6
5
4
3
2
1
GND
V
CC
B1 A1 Y1
NC
D1 C1
A0 B0
Y
0
NC
C0 D0
SA00350

PIN DESCRIPTION

PIN
NUMBER
SYMBOL NAME AND FUNCTION
1, 2, 4, 5, 9,
10, 12, 13
An, Bn, Cn, Dn
Data inputs
6, 8 Yn Data outputs
7 GND Ground (0V)
14 V
CC
Positive supply voltage

LOGIC SYMBOL

D0 A1 B1A0 B0 C0 C1 D1
Y0 Y1
6 8
1 2 4 5 9 10 12 13
VCC = Pin 14 GND = Pin 7
SA00351

LOGIC DIAGRAM

VCC = Pin 14 GND = Pin 7
SA00352
Y0
6
1 2 4
A0 B0 C0
5
D0
Y1
8
9 10 12
A1 B1 C1
13
D1
SF00068
&
6
8
1
2 4
5
9
10 12
13

FUNCTION TABLE

INPUTS OUTPUT
Dna Dnb Dnc Dnd Qn
L X X X H X L X X H X X L X H X X X L H
H H H H L
NOTES:
H = High voltage level L = Low voltage level X = Don’t care

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
14-Pin Plastic SO –40°C to +85°C 74LVT20 D 74LVT20 D SOT108-1 14-Pin Plastic SSOP –40°C to +85°C 74LVT20 DB 74LVT20 DB SOT337-1 14-Pin PlasticTSSOP –40°C to +85°C 74LVT20 PW 74LVT20PW DH SOT402-1
LOGIC SYMBOL (IEEE/IEC)
Philips Semiconductors Product specification
74LVT203.3V Dual 4-input NAND gate
1996 Aug 28
3

ABSOLUTE MAXIMUM RATINGS

1, 2
SYMBOL
PARAMETER CONDITIONS RATING UNIT
V
CC
DC supply voltage –0.5 to +4.6 V
I
IK
DC input diode current VI < 0 –50 mA
V
I
DC input voltage
3
–0.5 to +7.0 V
I
OK
DC output diode current VO < 0 –50 mA
V
OUT
DC output voltage
3
Output in Off or High state –0.5 to +7.0 V
Output in High state –32
I
OUT
DC output current
Output in Low state 64
mA
T
stg
Storage temperature range –65 to 150 °C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

LIMITS
SYMBOL
PARAMETER
MIN MAX
UNIT
V
CC
DC supply voltage 2.7 3.6 V
V
I
Input voltage 0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level Input voltage 0.8 V
I
OH
High-level output current –20 mA Low-level output current 32
I
OL
Low-level output current; current duty cycle 50%, f 1kHz 48
mA
T
amb
Operating free-air temperature range –40 +85 °C
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