Philips 74LVT00PW, 74LVT00DB, 74LVT00D Datasheet

INTEGRATED CIRCUITS

74LVT00

3.3V Quad 2-input NAND gate

Product specification 1996 Aug 15
IC24 Data Handbook

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Philips Semiconductors Product specification

74L VT003.3V Quad 2-input NAND gate

QUICK REFERENCE DATA

CONDITIONS

T

SYMBOL PARAMETER

t

PLH

t

PHL

C

I

CCL

IN

Propagation delay
An or Bn
to Yn

CL = 50pF;
VCC = 3.3V

Input capacitance VI = 0V or 3.0V 3 pF
Total supply current Outputs Low; VCC = 3.6V 1 mA

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER

14-Pin Plastic SO –40°C to +85°C 74LVT00 D 74LVT00 D SOT108-1
14-Pin Plastic SSOP –40°C to +85°C 74LVT00 DB 74LVT00 DB SOT337-1
14-Pin Plastic TSSOP –40°C to +85°C 74L VT00 PW 74LVT00PW DH SOT402-1

= 25°C;

amb

GND = 0V

TYPICAL UNIT

2.7

2.7

ns

LOGIC SYMBOL

12459101213

B1A0 B0 A1 A2 B2 A3 B3

Y0Y1Y2Y3

VCC = Pin 14
GND = Pin 7

36811

LOGIC SYMBOL (IEEE/IEC)

1
2

4
5

9

10

12
13

&

SA00334

PIN CONFIGURA TION

SA00333

14

V

CC

13

B3

12

A3
Y

11

3

B2

10

A2

9

Y2

87

GND

1

A0

2

B0
Y

3

0

4

A1

5

B1

1

6

Y

PIN DESCRIPTION

PIN

NUMBER

3

1, 2, 4, 5, 9,

10, 12, 13
3, 6, 8, 11 Yn Data outputs

6

7 GND Ground (0V)

14 V

8

11

SYMBOL NAME AND FUNCTION

An-Bn Data inputs

Positive supply voltage

CC

SF00004

1996 Aug 15 853-1858 17183

2

Philips Semiconductors Product specification

I

DC output current

mA

SYMBOL

PARAMETER

UNIT

74LVT003.3V Quad 2-input NAND gate

LOGIC DIAGRAM

1

A0

2

B0

4

A1

5

B1

9

A2

10

B2

12

VCC = Pin 14
GND = Pin 7

A3

13

B3

ABSOLUTE MAXIMUM RATINGS

SYMBOL

V

CC

I

IK

V

I

I

OK

V

OUT

OUT

T

stg

DC supply voltage –0.5 to +4.6 V
DC input diode current VI < 0 –50 mA
DC input voltage
DC output diode current VO < 0 –50 mA
DC output voltage

p

Storage temperature range –65 to 150 °C

PARAMETER CONDITIONS RATING UNIT

3

3

3

6

8

11

SA00360

1, 2

0

Y

Y

1

Y2

Y

3

FUNCTION TABLE

INPUTS OUTPUT

Dna Dnb Qn

L L H

L H H
H L H
H H L

NOTES:

H = High voltage level
L = Low voltage level

–0.5 to +7.0 V

Output in Off or High state –0.5 to +7.0 V

Output in High state –32

Output in Low state 64

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .

2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.

3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

LIMITS

MIN MAX

V

CC

V
V
V
I

OH

I

OL

∆t/∆v Input transition rise or fall rate; Outputs enabled 10 ns/V

T

amb

DC supply voltage 2.7 3.6 V
Input voltage 0 5.5 V

I

High-level input voltage 2.0 V

IH

Low-level Input voltage 0.8 V

IL

High-level output current –20 mA
Low-level output current 32 mA

Operating free-air temperature range –40 +85 °C

1996 Aug 15

3