Philips 74lvt00 DATASHEETS
INTEGRATED CIRCUITS
74LVT00
3.3V Quad 2-input NAND gate
Product specification 1996 Aug 15
IC24 Data Handbook
Philips Semiconductors Product specification
74L VT003.3V Quad 2-input NAND gate
QUICK REFERENCE DATA
CONDITIONS
T
SYMBOL PARAMETER
t
PLH
t
PHL
C
I
CCL
IN
Propagation delay
An or Bn
to Yn
CL = 50pF;
VCC = 3.3V
Input capacitance VI = 0V or 3.0V 3 pF
Total supply current Outputs Low; VCC = 3.6V 1 mA
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
14-Pin Plastic SO –40°C to +85°C 74LVT00 D 74LVT00 D SOT108-1
14-Pin Plastic SSOP –40°C to +85°C 74LVT00 DB 74LVT00 DB SOT337-1
14-Pin Plastic TSSOP –40°C to +85°C 74L VT00 PW 74LVT00PW DH SOT402-1
= 25°C;
amb
GND = 0V
TYPICAL UNIT
2.7
2.7
ns
LOGIC SYMBOL
12459101213
B1A0 B0 A1 A2 B2 A3 B3
Y0Y1Y2Y3
VCC = Pin 14
GND = Pin 7
36811
LOGIC SYMBOL (IEEE/IEC)
1
2
4
5
9
10
12
13
&
SA00334
PIN CONFIGURA TION
SA00333
14
V
CC
13
B3
12
A3
Y
11
3
B2
10
A2
9
Y2
87
GND
1
A0
2
B0
Y
3
0
4
A1
5
B1
1
6
Y
PIN DESCRIPTION
PIN
NUMBER
3
1, 2, 4, 5, 9,
10, 12, 13
3, 6, 8, 11 Yn Data outputs
6
7 GND Ground (0V)
14 V
8
11
SYMBOL NAME AND FUNCTION
An-Bn Data inputs
Positive supply voltage
CC
SF00004
1996 Aug 15 853-1858 17183
2
Philips Semiconductors Product specification
I
DC output current
mA
SYMBOL
PARAMETER
UNIT
74LVT003.3V Quad 2-input NAND gate
LOGIC DIAGRAM
1
A0
2
B0
4
A1
5
B1
9
A2
10
B2
12
VCC = Pin 14
GND = Pin 7
A3
13
B3
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
CC
I
IK
V
I
I
OK
V
OUT
OUT
T
stg
DC supply voltage –0.5 to +4.6 V
DC input diode current VI < 0 –50 mA
DC input voltage
DC output diode current VO < 0 –50 mA
DC output voltage
p
Storage temperature range –65 to 150 °C
PARAMETER CONDITIONS RATING UNIT
3
3
3
6
8
11
SA00360
1, 2
0
Y
Y
1
Y2
Y
3
FUNCTION TABLE
INPUTS OUTPUT
Dna Dnb Qn
L L H
L H H
H L H
H H L
NOTES:
H = High voltage level
L = Low voltage level
–0.5 to +7.0 V
Output in Off or High state –0.5 to +7.0 V
Output in High state –32
Output in Low state 64
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
LIMITS
MIN MAX
V
CC
V
V
V
I
OH
I
OL
∆t/∆v Input transition rise or fall rate; Outputs enabled 10 ns/V
T
amb
DC supply voltage 2.7 3.6 V
Input voltage 0 5.5 V
I
High-level input voltage 2.0 V
IH
Low-level Input voltage 0.8 V
IL
High-level output current –20 mA
Low-level output current 32 mA
Operating free-air temperature range –40 +85 °C
1996 Aug 15
3
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