Philips 74LVC08APW, 74LVC08ADB, 74LVC08AD, 74LVC08PW, 74LVC08DB Datasheet

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74LVC08A

Quad 2-input AND gate

Product specification
IC24 Data Handbook

1997 Jun 30

INTEGRATED CIRCUITS

Philips Semiconductors Product specification

74L VC08AQuad 2-input AND gate

2

1997 Jun 30 853-1996 18167

FEA TURES

•Wide supply voltage range of 1.2 V to 3.6 V

•In accordance with JEDEC standard no. 8-1A

•Inputs accept voltages up to 5.5 V

•CMOS low power consumption

•Direct interface with TTL levels

DESCRIPTION

The 74LVC08A is a high-performance, low-power, low-voltage,
Si-gate CMOS device and superior to most advanced CMOS
compatible TTL families.

Inputs can be driven from either 3.3 V or 5 V devices. This feature
allows the use of these devices as translators in a mixed 3.3 V/5 V
environment.

The 74LVC08A provides the 2-input AND function.

QUICK REFERENCE DA TA

GND = 0 V; T

amb

= 25°C; tr = tf 2.5 ns

SYMBOL

PARAMETER CONDITIONS TYPICAL UNIT

t

PHL/tPLH

Propagation delay
nA, nB to nY

CL = 50 pF;
V

CC

= 3.3 V

2.6 ns

C

I

Input capacitance 5.0 pF

C

PD

Power dissipation capacitance per gate Notes 1 and 2 28 pF

NOTES:

1. C

PD

is used to determine the dynamic power dissipation

(P

D

in µW)

P

D

= CPD × V

CC

2

× fi  (CL × V

CC

2

× fo) where:

fi = input frequency in MHz; CL = output load capacity in pF;
f

o

= output frequency in MHz; VCC = supply voltage in V;

 (C

L

× V

CC

2

× fo) = sum of the outputs.

2. The condition is VI = GND to V

CC.

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER

14-Pin Plastic SO –40°C to +85°C 74LVC08A D 74LVC08A D SOT108-1
14-Pin Plastic SSOP Type II –40°C to +85°C 74LVC08A DB 74LVC08A DB SOT337-1
14-Pin Plastic TSSOP Type I –40°C to +85°C 74LVC08A PW 74LVC08APW DH SOT402-1

PIN CONFIGURATION

14
13
12
11
10

9
87

6

5

4

3

2

1

GND

V

CC

3B
3A
3Y

4Y

4B
4A

1A
1B

2Y

1Y
2A
2B

SY00034

PIN DESCRIPTION

PIN NUMBER SYMBOL NAME AND FUNCTION

1, 4, 9, 12 1A – 4A

p

2, 5, 10, 13 1B – 4B

Data inputs

3, 6, 8, 11 1Y – 4Y Data outputs
7 GND Ground (0 V)
14 V

CC

Positive supply voltage

LOGIC SYMBOL

SV00435

1A
1B

2A
2B

3A

1Y

3B
4A

4B

2Y

3Y

4Y

3

6

8

11

1
2

4
5

9

10
12

13

Philips Semiconductors Product specification

74LVC08AQuad 2-input AND gate

1997 Jun 30

3

LOGIC SYMBOL (IEEE/IEC)

SV00436

1
2

3

4
5

6

8

9

10

11

12
13

&

&

&

&

LOGIC DIAGRAM (ONE GA TE)

SV00415

A

Y

B

FUNCTION T ABLE

INPUTS OUTPUTS

nA nB nY

L L L
L H L
H L L
H H H

NOTES:

H = HIGH voltage level
L = LOW voltage level

RECOMMENDED OPERATING CONDITIONS

LIMITS

SYMBOL

PARAMETER

CONDITIONS

MIN MAX

UNIT

V

CC

DC supply voltage (for max. speed performance) 2.7 3.6 V

V

CC

DC supply voltage (for low-voltage applications) 1.2 3.6 V

V

I

DC input voltage range 0 5.5 V

V

O

DC output voltage range; output HIGH or LOW state 0 V

CC

V

T

amb

Operating ambient temperature range in free-air –40 +85 °C

tr, t

f

Input rise and fall times

VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V

0
0

20
10

ns/V

ABSOLUTE MAXIMUM RATINGS

1

In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).

SYMBOL

PARAMETER CONDITIONS RATING UNIT

V

CC

DC supply voltage –0.5 to +6.5 V

I

IK

DC input diode current VIt 0 –50 mA

V

I

DC input voltage Note 2 –0.5 to +6.5 V

I

OK

DC output diode current V

O

uVCC or VO t 0

"50

mA

V

O

DC output voltage; output HIGH or LOW state Note 2 –0.5 to VCC +0.5 V

I

O

DC output source or sink current VO = 0 to V

CC

"50

mA

I

GND

, I

CC

DC VCC or GND current

"100

mA

T

stg

Storage temperature range –65 to +150 °C
Power dissipation per package

P

TOT

– plastic mini-pack (SO) above +70°C derate linearly with 8 mW/K 500
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K 500

mW

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .

2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.