Philips 74LVC00APW, 74LVC00ADB, 74LVC00AD Datasheet

INTEGRATED CIRCUITS

74LVC00A

Quad 2-input NAND gate

Product specification
Supersedes data of 1997 Aug 11
IC24 Data Handbook

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1998 Apr 28

Philips Semiconductors Product specification

Data inputs

74L VC00AQuad 2-input NAND gate

FEA TURES

•Wide supply range of 1.2V to 3.6V

•Complies with JEDEC standard no. 8-1A

•Inputs accept voltages up to 5.5V

•CMOS low power consumption

•Direct interface with TTL levels

•5-volt tolerant inputs, for interfacing with 5-volt logic

DESCRIPTION

The 74LVC00A is a high-performance, low power, low-voltage,
Si-gate CMOS device and superior to most advanced CMOS
compatible TTL families.

Inputs can be driven from either 3.3 V or 5 V devices. This feature
allows the use of these devices as translators in a mixed 3.3 V/5 V
environment.

Schmitt-trigger action at all inputs makes the circuit tolerant for
slower input rise and fall times.

The 74LVC00A provides the 2-input NAND function.

QUICK REFERENCE DATA

GND = 0 V; T

SYMBOL

NOTES:

1. C

is used to determine the dynamic power dissipation (PD in µW)

PD

= CPD  V

P

D

f

= input frequency in MHz; CL = output load capacity in pF;

i

= output frequency in MHz; VCC = supply voltage in V;

f

o

 (C

L

= 25°C; tr =tf 2.5 ns

amb

t

PHL

t

PLH

C

I

C

PD

2

CC

2

 V

 fo) = sum of the outputs.

CC

PARAMETER CONDITIONS TYPICAL UNIT

Propagation delay
nA, nB to nY

CL = 50 pF;
VCC = 3.3 V

3.0 ns

Input capacitance 5.0 pF
Power dissipation capacitance per gate VI = GND to V

x fi  (CL  V

2

 fo) where:

CC

CC

1

28 pF

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER

14-Pin Plastic SO –40°C to +85°C 74LVC00A D 74LVC00A D SOT108-1
14-Pin Plastic SSOP Type II –40°C to +85°C 74LVC00A DB 74LVC00A DB SOT337-1
14-Pin Plastic TSSOP Type I –40°C to +85°C 74LVC00A PW 74LVC00APW DH SOT402-1

PIN CONFIGURATION

1A

1

1B

2

1Y

3

2A

4

2B

5

2Y

6

GND

LOGIC SYMBOL (IEEE/IEC)

1
2

4
5

9

10

12
13

&

&

&

&

SY00034

SV00378

LOGIC SYMBOL

1A

14

V

CC

4B

13

4A

12

4Y

11

3B

10

3A

9

3Y

87

1

1B

2

2A

4

2B

5

3A

9

3B

10

4A

12

4B

13

1Y

3

2Y

6

3Y

8

4Y

11

SY00035

PIN DESCRIPTION

PIN

3

6

NUMBER

1, 4, 9, 12 1A – 4A

2, 5, 10, 13 1B – 4B

3, 6, 8, 11 1Y – 4Y Data outputs

8

7 GND Ground (0 V)

14 V

11

SYMBOL NAME AND FUNCTION

p

CC

Positive supply voltage

1998 Apr 28 853-2017 19310

2

Philips Semiconductors Product specification

SYMBOL

PARAMETER

CONDITIONS

UNIT

mW

74LVC00AQuad 2-input NAND gate

LOGIC DIAGRAM (ONE GATE)

A

Y

B

SV00379

RECOMMENDED OPERATING CONDITIONS

T

V
V

tr, t

CC
CC

V

V

amb

O

DC supply voltage (for max. speed performance) 2.7 3.6 V
DC supply voltage (for low-voltage applications) 1.2 3.6 V
DC Input voltage range 0 5.5 V

I

DC output voltage range 0 V
Operating ambient temperature range in free-air –40 +85 °C

Input rise and fall times

f

FUNCTION TABLE

nA nB nY

L L H

L H H
H L H
H H L

NOTES:

H = HIGH voltage level
L =LOW voltage level

VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V

INPUTS OUTPUTS

LIMITS

MIN MAX

CC

0
0

20
10

V

ns/V

ABSOLUTE MAXIMUM RATINGS

1

Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)

SYMBOL

V

CC

I

IK

V

I

I

OK

V

O

I

O

I

, I

GND

CC

T

stg

DC supply voltage (for max. speed
performance)

DC input diode current VI 0 –50 mA
DC input voltage Note 2 –0.5 to +5.5 V
DC output diode current V
DC output voltage Note 2 –0.5 to VCC + 0.5 V
DC output source or sink current VO = 0 to V
DC VCC or GND current 100 mA
Storage temperature range –65 to +150 °C

PARAMETER CONDITIONS RATING UNIT

–0.5 to +6.5 V

VCC or VO  0 50 mA

O

CC

50 mA

Power dissipation per package

P

TOT

– plastic mini-pack (SO) above +70°C derate linearly with 8 mW/K 500
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K 500

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .

2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

1998 Apr 28

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