Product specification
Supersedes data of 2001 Apr 06
2002 May 15
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
FEATURES
• Wide operating voltage from 2.0 to 6.0 V
• Symmetrical output impedance
• High noise immunity
• Low power dissipation
• Balanced propagation delays
• Very small 5 pins package
• Output capability: bus driver.
DESCRIPTION
The 74HC1G/HCT1G126 is a highspeed Si-gate CMOS
device.
The 74HC1G/HCT1G126 provides one non-inverting
buffer/line driver with 3-state output. The 3-state output is
controlled by the output enable input pin (OE). A LOW at
pin OE causes the output as assume a high-impedance
OFF-state.
The bus driver output currents are equal compared to the
74HC/HCT126.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=rf≤6.0 ns.
amb
SYMBOLPARAMETERCONDITIONS
t
PHL/tPLH
C
I
C
PD
propagation delay A to YCL= 15 pF; VCC= 5 V910ns
input capacitance1.51.5pF
power dissipation capacitancenotes 1 and 23027pF
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
2
× fi+(CL×V
CC
2
× fo) where:
CC
fi= input frequency in MHz;
fo= output frequency in MHz;
= output load capacitance in pF;
C
L
VCC= supply voltage in Volts.
2. For HC1G the conditions is VI= GND to VCC.
For HCT1G the conditions is VI= GND to VCC− 1.5 V.
TYPICAL
UNIT
HC1GHCT1G
FUNCTION TABLE
See note 1.
INPUTSOUTPUT
OEAY
HLL
HHH
LXZ
Note
1. H = HIGH voltage level;
L = LOW voltage level;
X = don’t care;
Z = high-impedance OFF-state.
2002 May 152
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
ORDERING INFORMATION
PACKAGES
TYPE NUMBER
74HC1G126GW−40 to +125 °C5SC88AplasticSOT353HN
74HCT1G126GW−40to+125°C5SC88AplasticSOT353TN
74HC1G126GV−40to+125°C5SC-74AplasticSOT753H26
74HCT1G126GV−40 to +125 °C5SC-74AplasticSOT753T26
PIN DESCRIPTION
PINSYMBOLNAME AND FUNCTION
1OEoutput enable input
2Adata input A
3GNDground (0 V)
4Ydata output Y
5V
TEMPERATURE
RANGE
CC
PINSPACKAGEMATERIALCODEMARKING
supply voltage
handbook, halfpage
handbook, halfpage
OE
GND
1
A
2
126
3
MNA124
V
5
Y
4
Fig.1 Pin configuration.
2
1
OE
MNA126
4
CC
handbook, halfpage
handbook, halfpage
OE
A
2
OE
1
Fig.2 Logic symbol.
A
Y
MNA125
4
Y
MNA127
Fig.3 IEC logic symbol.
2002 May 153
Fig.4 Logic diagram.
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
In accordancewith the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V);
notes 1 and 2.
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CC
I
IK
I
OK
I
O
I
CC
T
stg
P
D
supply voltage−0.5+7.0V
input diode currentVI< −0.5 V or VI>VCC+ 0.5 V−±20mA
output diode currentVO< −0.5 V or VO>VCC+ 0.5 V−±20mA
output source or sink current−0.5V<VO<VCC+ 0.5 V−±35.0mA
VCC or GND current−±70mA
storage temperature−65+150°C
power dissipation per packagefor temperature range from −40 to +125 °C;
−200mW
note 3
Notes
1. Stresses beyond those listed may cause permanent damage to the device. These are stress rating only and
functional operation of the device at these or any other conditions beyond those under ‘recommended operating
conditions’ is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device
reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
3. Above 55 °C the value of P
derates linearly with 2.5 mW/K.
D
2002 May 154
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
DC CHARACTERISTICS
Family 74HC1G
At recommended operating conditions; voltages are referenced to GND (ground=0V).
SYMBOLPARAMETER
V
IH
V
IL
V
OH
HIGH-level input voltage2.01.51.2−1.5−V
LOW-level input voltage2.0−0.80.5−0.5V
HIGH-level output
voltage
V
OL
I
LI
I
OZ
LOW-level output voltage VI=VIHor VIL;
input leakage currentVI=VCC or GND6.0−−1.0−1.0µA
3-state output current
OFF-state
I
CC
quiescent supply currentVI=VCC or GND;
TEST CONDITIONST
OTHER
V
(V)
CC
−40 to +85−40 to +125
MIN.TYP.
4.53.152.4−3.15−V
6.04.23.2−4.2−V
4.5−2.11.35−1.35V
6.0−2.81.8−1.8V
VI=VIHor VIL;
2.01.92.0−1.9−V
IO= −20 µA
V
I=VIH
or VIL;
4.54.44.5−4.4−V
IO= −20 µA
V
I=VIH
or VIL;
6.05.96.0−5.9−V
IO= −20 µA
V
I=VIH
or VIL;
4.53.844.32−3.7−V
IO= −6.0 mA
V
I=VIH
or VIL;
6.05.345.81−5.2−V
IO= −7.8 mA
2.0−00.1−0.1V
IO=20µA
V
I=VIH
or VIL;
4.5−00.1−0.1V
IO=20µA
V
I=VIH
or VIL;
6.0−00.1−0.1V
IO=20µA
V
I=VIH
or VIL;
4.5−0.150.33−0.4V
IO= 6.0 mA
V
I=VIH
or VIL;
6.0−0.160.33−0.4V
IO= 7.8 mA
VI=VIHor VIL;
6.0−−5−10µA
VO=VCC or GND
6.0−−10−20µA
IO=0
(°C)
amb
(1)
MAX.MIN.MAX.
UNIT
Note
1. All typical values are measured at T
amb
=25°C.
2002 May 155
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
Family 74HCT1G
At recommended operating conditions; voltages are referenced to GND (ground=0V).
SYMBOLPARAMETER
V
IH
HIGH-level input
voltage
V
IL
LOW-level input
voltage
V
OH
HIGH-level output
voltage
V
OL
LOW-level output
voltage
I
LI
I
OZ
input leakage currentVI=VCC or GND5.5−−1.0−1.0µA
3-state output current
OFF-state
I
CC
quiescent supply
current
∆I
CC
additional supply
current per input
TEST CONDITIONST
OTHERVCC (V)
MIN.TYP.
4.5 to 5.5 2.01.6−2.0−V
4.5 to 5.5 −1.20.8−0.8V
VI=VIHor VIL;
4.54.44.5−4.4−V
IO= −20 µA
V
I=VIH
or VIL;
4.53.844.32−3.7−V
IO= −6.0 mA
VI=VIHor VIL;
4.5−00.1−0.1V
IO=20µA
V
I=VIH
or VIL;
4.5−0.160.33−0.4V
IO= 6.0 mA
VI=VIHor VIL;
5.5−−5−10µA
VO=VCC or GND
VI=VCC or GND;
5.5−−10−20µA
IO=0
VI=VCC− 2.1 V;
4.5 to 5.5 −−500−850µA
IO=0
(°C)
amb
−40 to +85−40 to +125
(1)
MAX.MIN.MAX.
UNIT
Note
1. All typical values are measured at T
amb
=25°C.
2002 May 156
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
AC CHARACTERISTICS
Type 74HC1G
GND = 0 V; tr=tf≤6.0 ns; CL=50pF.
SYMBOLPARAMETER
WAVEFORMSVCC(V)
t
PHL/tPLH
propagation
see Figs 5 and 72.0−24125−150ns
delay A to Y
t
PZH/tPZL
3-state output
see Figs 6 and 72.0−24155−190ns
enable time
OE to Y
t
PHZ/tPLZ
3-state output
see Figs 6 and 72.0−16155−190ns
disable time
OE to Y
Note
1. All typical values are measured at T
Type 74HCT1G
GND = 0 V; tr=tf≤6.0 ns; CL=50pF.
SYMBOLPARAMETER
WAVEFORMSVCC(V)
t
PHL/tPLH
propagation
see Figs 5 and 74.5−1130−36ns
delay A to Y
t
PZH/tPZL
3-state output
see Figs 6 and 74.5−1035−42ns
enable time
OE to Y
t
PHZ/tPLZ
3-state output
see Figs 6 and 74.5−1231−38ns
disable time
OE to Y
TEST CONDITIONST
−40 to +85−40 to +125
MIN.TYP.
(1)
4.5−1025−30ns
6.0−921−26ns
4.5−1031−38ns
6.0−826−32ns
4.5−1231−38ns
6.0−1126−32ns
=25°C.
amb
TEST CONDITIONST
−40 to +85−40 to +125
MIN.TYP.
(1)
(°C)
amb
MAX.MIN.MAX.
(°C)
amb
MAX.MIN.MAX.
UNIT
UNIT
Note
1. All typical values are measured at T
amb
=25°C.
2002 May 157
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
AC WAVEFORMS
For HC1G: VM= 50%; VI= GND to V
For HCT1G: VM= 1.3 V; VI= GND to 3.0 V.
handbook, full pagewidth
OE input
LOW-to-OFF
OFF-to-LOW
HIGH-to-OFF
OFF-to-HIGH
GND
V
I
V
M
t
PHL
V
M
handbook, halfpage
A input
Y output
CC
Fig.5 The input (A) to output (Y) propagation delays.
V
I
V
M
GND
output
output
V
CC
GND
t
PLZ
t
PHZ
output
enabled
VOL +0.3 V
VOH −0.3 V
output
disabled
t
PZL
t
PZH
t
PLH
MNA121
V
M
V
M
output
enabled
MNA129
For HC1G: VM= 50%; VI= GND to V
For HCT1G: VM= 1.3 V; VI= GND to 3.0 V.
CC
Fig.6 The 3-state enable and disable times.
2002 May 158
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
S
handbook, full pagewidth
PULSE
GENERATOR
V
CC
V
I
R
D.U.T.
T
V
O
RL =
1000 Ω
C
L
MNA232
V
1
CC
open
GND
TESTS
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
open
V
CC
GND
1
Definitions for test circuit:
CL= Load capacitance including jig and probe capacitance (see “AC characteristics” for values).
RL= Load resistance (see “AC characteristics” for values).
RT= Termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig.7 Load circuitry for switching times.
2002 May 159
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
PACKAGE OUTLINES
Plastic surface mounted package; 5 leadsSOT353
D
y
45
132
e
1
e
b
p
wBM
A
A
1
E
H
E
detail X
Q
L
p
AB
X
v M
A
c
012 mm
scale
DIMENSIONS (mm are the original dimensions)
A
UNIT
mm
A
1.1
0.8
OUTLINE
VERSION
SOT353
max
0.1
1
b
cD
p
0.30
0.20
IEC JEDEC EIAJ
0.25
0.10
2.2
1.8
(2)
E
1.35
1.3
1.15
REFERENCES
e
e
1
0.65
2002 May 1510
H
2.2
2.0
L
Qywv
p
E
0.45
0.15
0.25
0.15
0.20.10.2
EUROPEAN
PROJECTION
ISSUE DATE
97-02-28SC-88A
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
Plastic surface mounted package; 5 leadsSOT753
D
y
E
H
E
AB
X
v M
A
45
Q
A
A
1
c
132
L
p
3.1
2.7
b
p
wBM
012 mm
scale
H
e
E
1.7
0.95
1.3
REFERENCES
E
3.0
2.5
e
DIMENSIONS (mm are the original dimensions)
A
UNIT
mm
A
0.100
1.1
0.013
0.9
OUTLINE
VERSION
SOT753SC-74A
b
cD
p
1
0.40
0.26
0.25
0.10
IEC JEDEC JEITA
2002 May 1511
L
Qywv
p
0.6
0.33
0.2
0.23
0.20.10.2
detail X
EUROPEAN
PROJECTION
ISSUE DATE
02-04-16
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
SOLDERING
Introduction to soldering surface mount packages
Thistextgivesaverybriefinsighttoacomplextechnology.
A more in-depth account of soldering ICs can be found in
our
“Data Handbook IC26; Integrated Circuit Packages”
(document order number 9398 652 90011).
There is no soldering method that is ideal for all surface
mount IC packages. Wave soldering can still be used for
certainsurfacemountICs,butitisnot suitable for fine pitch
SMDs. In these situations reflow soldering is
recommended.
Reflow soldering
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
totheprinted-circuitboardbyscreen printing, stencilling or
pressure-syringe dispensing before package placement.
Several methods exist for reflowing; for example,
convection or convection/infrared heating in a conveyor
type oven. Throughput times (preheating, soldering and
cooling) vary between 100 and 200 seconds depending
on heating method.
Typical reflow peak temperatures range from
215 to 250 °C. The top-surface temperature of the
packages should preferable be kept below 220 °C for
thick/large packages, and below 235 °C for small/thin
packages.
Wave soldering
Conventional single wave soldering is not recommended
forsurfacemountdevices(SMDs)orprinted-circuitboards
with a high component density, as solder bridging and
non-wetting can present major problems.
To overcome these problems the double-wave soldering
method was specifically developed.
If wave soldering is used the following conditions must be
observed for optimal results:
• Use a double-wave soldering method comprising a
turbulent wave with high upward pressure followed by a
smooth laminar wave.
• For packages with leads on two sides and a pitch (e):
– larger than or equal to 1.27 mm, the footprint
longitudinal axis is preferred to be parallel to the
transport direction of the printed-circuit board;
– smaller than 1.27 mm, the footprint longitudinal axis
must be parallel to the transport direction of the
printed-circuit board.
The footprint must incorporate solder thieves at the
downstream end.
• Forpackageswithleadsonfoursides,the footprint must
be placed at a 45° angle to the transport direction of the
printed-circuit board. The footprint must incorporate
solder thieves downstream and at the side corners.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Manual soldering
Fix the component by first soldering two
diagonally-opposite end leads. Use a low voltage (24 V or
less) soldering iron applied to the flat part of the lead.
Contact time must be limited to 10 seconds at up to
300 °C.
When using a dedicated tool, all other leads can be
soldered in one operation within 2 to 5 seconds between
270 and 320 °C.
2002 May 1512
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
Suitability of surface mount IC packages for wave and reflow soldering methods
2. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the
3. These packages are not suitable for wave soldering. On versions with the heatsink on the bottom side, the solder
cannot penetrate between the printed-circuit board and the heatsink. On versions with the heatsink on the top side,
the solder might be deposited on the heatsink surface.
4. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction.
The package footprint must incorporate solder thieves downstream and at the side corners.
5. Wave soldering is suitable for LQFP, TQFP and QFP packages with a pitch (e) larger than 0.8 mm; it is definitely not
suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
6. Wave soldering is suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
2002 May 1513
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
DATA SHEET STATUS
PRODUCT
DATA SHEET STATUS
Objective dataDevelopmentThis data sheet contains data from the objective specification for product
Preliminary dataQualificationThis data sheet contains data from the preliminary specification.
Product dataProductionThis data sheet contains data from the product specification. Philips
(1)
STATUS
(2)
DEFINITIONS
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Changes will be
communicated according to the Customer Product/Process Change
Notification (CPCN) procedure SNW-SQ-650A.
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
DEFINITIONS
Short-form specification The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Limiting values definition Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
attheseoratanyotherconditionsabovethosegiveninthe
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Application information Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
norepresentationorwarrantythatsuch applications will be
suitable for the specified use without further testing or
modification.
DISCLAIMERS
Life support applications These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result inpersonal injury. Philips
Semiconductorscustomersusingorsellingthese products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Right to make changes Philips Semiconductors
reserves the right to make changes, without notice, in the
products, including circuits, standard cells, and/or
software, described or contained herein in order to
improve design and/or performance. Philips
Semiconductors assumes no responsibility or liability for
theuseofanyoftheseproducts,conveys no licence or title
under any patent, copyright, or mask work right to these
products,andmakesnorepresentationsorwarrantiesthat
these products are free from patent, copyright, or mask
work right infringement, unless otherwise specified.
2002 May 1514
Philips SemiconductorsProduct specification
Bus buffer/line driver; 3-state74HC1G126; 74HCT1G126
NOTES
2002 May 1515
Philips Semiconductors – a w orldwide compan y
Contact information
For additional information please visit http://www.semiconductors.philips.com.Fax: +31 40 27 24825
For sales offices addresses send e-mail to: sales.addresses@www.semiconductors.philips.com.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Printed in The Netherlands613508/03/pp16 Date of release:2002 May 15Document order number: 9397 750 09719
SCA74
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