INTEGRATED CIRCUITS
DATA SH EET
74HC1G125; 74HCT1G125
Bus buffer/line driver; 3-state
Product specification
File under Integrated Circuits, IC06
1998 Nov 10
Philips Semiconductors Product specification
Bus buffer/line driver; 3-state 74HC1G125; 74HCT1G125
FEATURES
• Wide operating voltage:
2.0 to 6.0 V
• Symmetrical output impedance
• High noise immunity
• Low power dissipation
• Balanced propagation delays
• Very small 5 pins package
• Output capability: bus driver.
DESCRIPTION
The 74HC1G/HCT1G125 is a
high-speed Si-gate CMOS device.
The 74HC1G/HCT1G125 provides
one non-inverting buffer/line driver
with 3-state output. The 3-state output
is controlled by the output enable
input (
OE). A HIGH at OE causes the
output as assume a high-impedance
OFF-state.
The bus driver output currents are
equal compared to the
74HC/HCT125.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=tf≤6.0 ns.
amb
SYMBOL PARAMETER CONDITIONS
t
PHL/tPLH
C
I
C
PD
propagation delay
inA to outY
input capacitance 1.5 1.5 pF
power dissipation
CL= 15 pF;
VCC=5V
notes 1 and 2 30 27 pF
capacitance
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
2
× fi+ ∑ (CL× V
CC
2
× fo) where:
CC
fi= input frequency in MHz;
fo= output frequency in MHz;
CL= output load capacitance in pF;
VCC= supply voltage in V;
∑ (CL× V
2. For HC1G the condition is VI= GND to V
2
× fo) = sum of outputs.
CC
CC.
For HCT1G the condition is VI= GND to VCC− 1.5 V.
PINNING
TYP.
UNIT
HC1G HCT1G
910ns
FUNCTION TABLE
See note 1.
INPUTS OUTPUT
OE inA outY
LL L
LH H
HX Z
Note
1. H = HIGH voltage level;
L = LOW voltage level;
X = don’t care;
Z = high-impedance OFF state.
PIN SYMBOL DESCRIPTION
1 OE output enable input
2 inA data input
3 GND ground (0 V)
4 outY data output
5V
CC
DC supply voltage
1998 Nov 10 2
Philips Semiconductors Product specification
Bus buffer/line driver; 3-state 74HC1G125; 74HCT1G125
ORDERING INFORMATION
OUTSIDE NORTH
PACKAGES
AMERICA
TEMPERATURE
RANGE
PINS PACKAGE MATERIAL CODE MARKING
74HC1G125GW −40 to +125 °C 5 SC-88A plastic SOT353 HM
74HCT1G125GW 5 SC-88A plastic SOT353 TM
handbook, halfpage
OE
inA
GND
1
2
125
3
MNA117
V
5
CC
outY
4
handbook, halfpage
inA outY
2
1
OE
4
MNA118
handbook, halfpage
Fig.1 Pin configuration.
2
1
OE
MNA119
4
Fig.3 IEC logic symbol.
handbook, halfpage
Fig.2 Logic symbol.
inA
OE
Fig.4 Logic diagram.
outY
MNA120
1998 Nov 10 3
Philips Semiconductors Product specification
Bus buffer/line driver; 3-state 74HC1G125; 74HCT1G125
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER
UNIT CONDITIONS
MIN. TYP. MAX. MIN. TYP. MAX.
74HC1G04 74HCT1G04
V
CC
V
I
V
O
T
amb
DC supply voltage 2.0 5.0 6.0 4.5 5.0 5.5 V
input voltage 0 − V
output voltage 0 − V
operating ambient
−40 +25 +125 −40 +25 +125 °C see DC and AC
CC
CC
0 − V
0 − V
CC
CC
temperature
V
V
characteristics
per device
t
, t
r
f
input rise and fall times
except for Schmitt
trigger inputs
−−1000 −−−ns VCC= 2.0 V
−−500 −−500 ns V
−−400 −−−ns V
CC
CC
= 4.5 V
= 6.0 V
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134); voltages are referenced to GND (ground = 0 V).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
±I
IK
±I
OK
±I
O
DC supply voltage −0.5 +7.0 V
DC input diode current VI< −0.5 V or VI>VCC+ 0.5 V; note 1 − 20 mA
DC output diode current VO< −0.5V or VO>VCC+ 0.5 V; note 1 − 20 mA
DC output source or sink
−0.5V < VO<VCC+ 0.5 V; note 1 − 12.5 mA
current standard outputs
±I
CC
DC VCC or GND current for
note 1 − 25 mA
types with standard outputs
T
stg
P
D
storage temperature −65 +150 °C
power dissipation per package temperature range: −40 to +125 °C; note 2 − 200 mW
Notes
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. Above 55 °C the value of P
derates linearly with 2.5 mW/K.
D
1998 Nov 10 4
Philips Semiconductors Product specification
Bus buffer/line driver; 3-state 74HC1G125; 74HCT1G125
DC CHARACTERISTICS
Family 74HC1G
Additional type data to the recommended operating conditions; voltages are referenced to GND (ground = 0 V).
T
SYMBOL PARAMETER
V
IH
HIGH-level input
voltage
V
IL
V
OH
LOW-level input voltage − 0.8 0.5 − 0.5 V 2.0
HIGH-level output
voltage; all outputs
V
OH
HIGH-level output
voltage; standard
outputs
V
OL
LOW-level output
voltage; all outputs
V
OL
LOW-level output
voltage; standard
outputs
I
I
I
CC
input leakage current −−1.0 − 1.0 µA 6.0 VI=VCCor GND
quiescent supply
current
(°C)
amb
−40 to +85 −40 to +125
MIN. TYP.
(1)
MAX. MIN. MAX.
UNIT
1.5 1.2 − 1.5 − V 2.0
3.15 2.4 − 3.15 − 4.5
4.2 3.2 − 4.2 − 6.0
− 2.1 1.35 − 1.35 4.5
− 2.8 1.8 − 1.8 6.0
1.9 2.0 − 1.9 − V 2.0 VI=VIHor VIL:
4.4 4.5 − 4.4 − 4.5
5.9 6.0 − 5.9 − 6.0
4.13 4.32 − 3.7 − V 4.5 VI=VIHor VIL;
5.63 5.81 − 5.2 − 6.0 V
− 0 0.1 − 0.1 V 2.0 VI=VIHor VIL;
− 0 0.1 − 0.1 4.5
− 0 0.1 − 0.1 6.0
− 0.15 0.33 − 0.4 V 4.5 VI=VIHor VIL;
− 0.16 0.33 − 0.4 6.0 V
−−10 − 20 µA 6.0 VI=VCCor GND;
TEST CONDITIONS
VCC (V) OTHER
−IO=20µA
−IO= 2.0 mA
or VIL;
I=VIH
−IO= 2.6 mA
IO=20µA
IO= 2.0 mA
or VIL;
I=VIH
IO= 2.6 mA
IO=0
Note
1. All typical values are measured at T
amb
=25°C.
1998 Nov 10 5