Philips 74f269 DATASHEETS

INTEGRATED CIRCUITS
74F269
8-bit bidirectional binary counter
Product specification 1996 Jan 05 IC15 Data Handbook
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Philips Semiconductors Product specification

FEA TURES

Synchronous counting and loading
Built-in look-ahead carry capability
Count frequency 115MHz typ
Supply current 95mA typ

DESCRIPTION

The 74F269 is a fully synchronous 8-stage Up/Down Counter featuring a preset capability for programmable operation, carry look-ahead for easy cascading and a U/D direction of counting. All state changes, whether in counting or parallel loading, are initiated by the rising edge of the clock.
TYPE
TYPICAL f
MAX
74F269 115MHz 95mA
input to control the
TYPICAL
SUPPLY CURRENT
(TOTAL)

PIN CONFIGURATION

1U/D 2
Q0
3
Q1
4
Q2
5
Q3
6
Q4
7
GND
8
Q5
9
Q6
10
Q7
11
CP
CEP CET
24
PE
23
P0
22
P1
21
P2
20
P3
19
V
18
P4
17
P5
16
P6
15
P7 TC
14 1312
SF00834

ORDERING INFORMA TION

DESCRIPTION
24-Pin Plastic Slim DIP (300mil) N74F269N SOT222-1
24-Pin Plastic SOL N74F269D SOT137-1
24-Pin Plastic SSOP type II N74F269DB SOT340-1
COMMERCIAL RANGE
VCC = 5V ±10%, T
= 0°C to +70°C
amb
CC
PKG DWG #

INPUT AND OUTPUT LOADING AND FAN-OUT TABLE

PINS DESCRIPTION
74F(U.L.)
HIGH/LOW
P0 - P7 Parallel Data inputs 1.0/1.0 20µA/0.6mA PE Parallel Enable input (active Low) 1.0/1.0 20µA/0.6mA U/D Up/Down count control input 1.0/1.0 20µA/0.6mA CEP Count Enable Parallel input (active Low) 1.0/1.0 20µA/0.6mA CET Count Enable Trickle input (active Low) 1.0/1.0 20µA/0.6mA CP Clock input 1.0/1.0 20µA/0.6mA TC Terminal Count output (active Low) 50/33 1.0mA/20mA Q0 - Q7 Flip-flop outputs 50/33 1.0mA/20mA
NOTE:
One (1.0) FAST Unit Load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOAD VALUE
HIGH/LOW
1996 Jan 05 853–0056 16186
2
Philips Semiconductors Product specification
OPERATING MODE
Parallel load
Hold (do nothing)
74F2698–bit bidirectional binary counter

LOGIC SYMBOL

23 22 21 20 18 17 16 15
P0 P1 P2 P3 P4 P5 P6 P7
24
PE
1
U/D
12
CEP
13
CET
11
CP
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
=Pin 19
V
CC
GND=Pin 7

APPLICATION

CP
U/D
PE
TC
234568910
SF00835
LOGIC SYMBOL (IEEE/IEC)
24
1
12 13
11
23
14
22 21
20 18 17 16 15
CTR DIV 256 M1[LOAD] M2[COUNT] M3[UP] M4[DOWN]
&
G5
EN6
2, 3, 5, 6 +/C7 2, 4, 5, 6–
[1]
1, 7D
[2] [4]
[8] [16] [32] [64]
[128]
3, 5, 6 CT=256
4, 5, 8 CT=0
2 3 4
5 6 8 9
10
14
SF00836
P0 P1 P2 P3 P4 P5 P6
PE U/D
CP CEP CET
Q0Q1 Q2 Q3 Q4 Q5 Q6 Q7
P7
TC
P0 P1 P2 P3 P4 P5 P6 P7
PE U/D
CP CEP CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
TC
P0 P1 P2 P3 P4 P5 P6 P7
PE U/D
CP CEP CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
TC
Figure 1. Synchronous Multistage Counting Scheme

MODE SELECT FUNCTION TABLE

INPUTS OUTPUTS
CP U/D CEP CET PE P
↑ ↑ ↑ ↑ ↑ ↑
X X X l l L (a) X X X l h H (a) h l l h X Count Up (a) Count Up
l l l h X Count Down (a) Count Down X h l h X q X X h h X q
n
H = High voltage level h = High voltage level one setup prior to the Low-to-High clock transition L = Low voltage level l = Low voltage level one setup time prior to the Low-to-High clock transition q = Lower case letters indicate the state of the referenced output prior to the Low-to-High clock transition X = Don’t care = Low-to-High clock transition (a)= TC
is Low when CET is Low and the counter is at Terminal Count. Terminal Count Up is with all Qn outputs High and Terminal Count
Down is with all Qn outputs Low.
Q
n
n n
TC
(a)
H
P0 P1 P2 P3 P4 P5 P6 P7
PE U/D
CP CEP CET
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
Most significant 8-bit counterLeast significant 8-bit counter
TC
SF00851
1996 Jan 05
3
Philips Semiconductors Product specification
74F2698–bit bidirectional binary counter

LOGIC DIAGRAM

2
23
P0
P1
P2
P3
P4
DETAIL A
22
DETAIL A
21
DETAIL A
20
DETAIL A
18
DETAIL A
Q0
3
Q1
4
Q2
5
Q3
6
Q4
8
17
P5
P6
P7
PE CP
U/D
CEP
CET
Pn
DETAIL A
16
DETAIL A
15
DETAIL A
24
11
1
12 13
TOGGLE
DETAIL A
Q
D
QCP
Q5
9
Q6
10
Q7
14
TC
V
=Pin 19
CC
GND=Pin 7
1996 Jan 05
PE CP
SF00837
4
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
NO TAG
VOHHigh-level output voltage
V
VOLLow-level output voltage
V
ICCSupply current (total)
CC
74F2698–bit bidirectional binary counter

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V V I
IN
V I
OUT
T T
CC IN
OUT
amb stg
Supply voltage –0.5 to +7.0 V Input voltage –0.5 to +7.0 V Input current –30 to +5 mA Voltage applied to output in High output state –0.5 to V Current applied to output in Low output state 40 mA Operating free-air temperature range 0 to +70 °C Storage temperature –65 to +150 °C

RECOMMENDED OPERATING CONDITIONS

V V V I I I T
CC IH
IL IK OH OL
amb
Supply voltage 4.5 5.0 5.5 V High-level input voltage 2.0 V Low-level input voltage 0.8 V Input clamp current –18 mA High-level output current –1 mA Low-level output current 20 mA Operating free-air temperature range 0 70 °C
PARAMETER RATING UNIT
CC
V
LIMITS
MIN NOM MAX

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL PARAMETER TEST CONDITIONS
V
IK
I
I
I
IH
I
IL
I
OS
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, I
1996 Jan 05
LIMITS
UNIT
p
p
VCC = MIN, VIL = MAX ±10%V VIH = MIN, IOH = MAX ±5%V VCC = MIN, VIL = MAX ±10%V VIH = MIN, IOL = MAX ±5%V
Input clamp voltage VCC = MIN, II = I
MIN
CC
CC
CC
CC
IK
2.5
2.7 3.4
TYP
NO TAG
MAX
0.30 0.50
0.30 0.50
–0.73 –1.2 V Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA High-level input current VCC = MAX, VI = 2.7V 20 µA Low-level input current VCC = MAX, VI = 0.5V –0.6 mA Short-circuit output current
pp
= 5V, T
CC
NO TAG
= 25°C.
amb
tests should be performed last.
OS
VCC = MAX –60 –150 mA
I
CCH
VCC = MAX
I
CCL
PE=CET=CEP=U/D=GND, Pn=4.5V, CP=
PE=CET=CEP=U/D=GND, Pn=GND, CP=
, the use of high-speed test apparatus and/or sample-and-hold
OS
93 120 mA
98 125 mA
5
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