Philips 74f08 DATASHEETS
INTEGRATED CIRCUITS
74F08
Quad two-input AND gate
Product specification 1995 Apr 19
IC15 Data Handbook
Philips Semiconductors
Philips Semiconductors Product specification
74F08Quad 2-input AND gate
•74F08 Available for industrial range (–40°C to +85°C)
TYPE
TYPICAL
PROPAGATION
DELAY
74F08 4.1ns 7.1mA
TYPICAL
SUPPLY CURRENT
(TOTAL)
PIN CONFIGURATION
D0a
1
D0b
2
Q0
3
D1a
4
D1b
5
Q1
6
GND
14
V
CC
D3b
13
D3a
12
Q3
11
D2b
10
D2a
9
Q2
87
SF00038
ORDERING INFORMA TION
DESCRIPTION
COMMERCIAL RANGE
VCC = 5.0V ±10%, T
= 0°C to +70°C
amb
VCC = 5.0V ±10%, T
14-pin plastic DIP N74F08N I74F08N SOT27-1
14-pin plastic SO N74F08D I74F08D SOT108-1
INDUSTRIAL RANGE
= –40°C to +85°C
amb
PKG DWG #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW
Dna, Dnb Data inputs 1.0/1.0 20µA/0.6mA
Qn Data output 50/33 1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC DIAGRAM
VCC = Pin 14
GND = Pin 7
LOGIC SYMBOL
= Pin 14
V
CC
GND = Pin 7
1
D0a
2
D0b
4
D1a
5
D1b
9
D2a
10
D2b
12
D3a
13
D3b
12459101213
D0a D0bD1a D2a D2b D3a D3bD1b
Q0 Q1 Q2 Q3
36811
3
6
8
11
SF00052
SF00040
Q3
Q0
Q1
Q2
FUNCTION TABLE
INPUTS OUTPUT
Dna Dnb Qn
L L L
L H L
H L L
H H H
NOTES:
H = High voltage level
L = Low voltage level
LOGIC SYMBOL (IEEE/IEC)
1
2
4
5
9
10
12
13
&
3
6
8
11
SF00053
1995 Apr 19 853–0328 15145
2
Philips Semiconductors Product specification
T
Operating free-air temperature range
SYMBOL
PARAMETER
UNIT
T
O erating free-air tem erature range
SYMBOL
PARAMETER
TEST CONDITIONS
1
UNIT
VOHHigh-level output voltage
VOLLow-level output voltage
ICCSupply current (total)
74F08Quad 2-input AND gate
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
I
OUT
T
CC
IN
OUT
amb
stg
Supply voltage –0.5 to +7.0 V
Input voltage –0.5 to +7.0 V
Input current –30 to +5 mA
Voltage applied to output in High output state –0.5 to V
Current applied to output in Low output state 40 mA
p
p
Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
V
V
V
I
I
I
CC
Ih
IL
IK
OH
OL
amb
Supply voltage 4.5 5.0 5.5 V
High-level input voltage 2.0 V
Low-level input voltage 0.8 V
Input clamp current –18 mA
High-level output current –1 mA
Low-level output current 20 mA
p
p
PARAMETER RATING UNIT
CC
V
Commercial range 0 to +70 °C
Industrial range –40 to +85 °C
LIMITS
MIN NOM MAX
Commercial range 0 +70 °C
Industrial range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
MIN TYP
p
p
V
IK
I
I
I
IH
I
IL
I
OS
Input clamp voltage VCC = MIN, II = I
Input current at maximum input
voltage
High-level input current VCC = MAX, VI = 2.7V 20 µA
Low-level input current VCC = MAX, VI = 0.5V –0.6 mA
Short-circuit output current
pp
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, IOH = MAX ±5%V
VCC = MIN, VIL = MAX ±10%V
VIH = MIN, I
= MAX ±5%V
Ol
IK
VCC = MAX, VI = 7.0V 100 µA
3
VCC = MAX –60 –150 mA
I
CCHVCC
I
CCLVCC
= MAX VIN = 4.5V 5.5 8.3 mA
= MAX VIN = GND 8.6 12.9 mA
CC
CC
CC
CC
2.5 V
2.7 3.4 V
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, T
3. Not more than one output should be shorted at a time. For testing I
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
tests should be performed last.
OS
2
MAX
0.30 0.50 V
0.30 0.50 V
–0.73 –1.2 V
1995 Apr 19
3
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