2.5V/3.3V 18-bit latched transceiver with
16-bit parity generator/checker (3-State)
Product specification
IC23 Data Handbook
1998 Jun 30
Philips Semiconductors Product specification
SYMBOL
PARAMETER
CONDITIONS
UNIT
2.5V/3.3V 18-bit latched transceiver with
16-bit parity generator/checker (3-State)
FEATURES
•Symmetrical (A and B bus functions are identical)
•Selectable generate parity or ”feed-through” parity for A-to-B and
B-to-A directions
•Independent transparent latches for A-to-B and B-to-A directions
•Selectable ODD/EVEN parity
•Continuously checks parity of both A bus and B bus latches as
and ERRB
ERRA
•Open-collector ERR output
•Ability to simultaneously generate and check parity
•Can simultaneously read/latch A and B bus data
•Output capability: +64 mA/–32mA
•Latch-up protection exceeds 500mA per Jedec Std 17
•ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
•Power up 3-State
•Power-up reset
•No bus current loading when output is tied to 5 V bus
•Live insertion/extraction permitted
•Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs
DESCRIPTION
The 74ALVT16899 is a high-performance BiCMOS product
designed for V
to 5V .
The 74ALVT16899 is a 16-bit to 16-bit parity transceiver with
separate transparent latches for the A bus and B bus. Either bus
operation at 2.5V or 3.3V with I/O compatibility up
CC
74AL VT16899
can generate or check parity. The parity bit can be fed-through with
no change or the generated parity can be substituted with the SEL
input.
The 74ALVT16899 features independent latch enables for the A and
B bus latches, a select pin for ODD/EVEN parity, and separate error
signal output pins for checking parity.
FUNCTIONAL DESCRIPTION:
The 74ALVT16899 has three principal modes of operation which are
outlined below. All modes apply to both the A-to-B and B-to-A
directions.
Transparent latch, Generate parity, Check A and B bus parity:
Bus A (B) communicates to Bus B (A), parity is generated and
passed on to the B (A) Bus as BPAR (APAR). If LEA and LEB are
High and the Mode Select (SEL
A0-A7 and B0-B7 can be checked and monitored by ERRA
ERRB
. (Fault detection on both input and output buses.)
Transparent latch, Feed-through parity, Check A and B bus
parity:
Bus A (B) communicates to Bus B (A) in a feed-through mode if SEL
is High. Parity is still generated and checked as ERRA and ERRB
and can be used as an interrupt to signal a data/parity bit error to the
CPU.
Latched input, Generate/Feed-through parity, Check A (and B)
bus parity:
Independent latch enables (LEA and LEB) allow other permutations
of:
•Transparent latch / 1 bus latched / both buses latched
•Feed-through parity / generate parity
•Check in bus parity / check out bus parity / check in and out bus
parity
) is Low, the parity generated from
and
QUICK REFERENCE DATA
TYPICAL
2.5 V
2.0
2.2
9.8
7.0
33pF
99pF
3.3 V
1.5
1.7
7.8
5.1
t
PLH
t
PHL
t
PLH
t
PHL
C
C
I
CCZ
I/O
CONDITIONS
T
= 25°C; GND = 0V
amb
Propagation delay
An to Bn or Bn to An
Propagation delay
An to ERRA
Input capacitanceVI = 0V or V
IN
Output capacitanceOutputs disabled; VO = 0V or V
Quiescent supply currentOutputs disabled4070µA
CL = 50pF
CL = 50pF
CC
CC
ORDERING INFORMATION
PACKAGESTEMPERATURE RANGE OUTSIDE NORTH AMERICANORTH AMERICADWG NUMBER
56-Pin Plastic SSOP Type III–40°C to +85°C74ALVT16899AV16899 DLSOT371-1
56-Pin Plastic TSSOP Type II–40°C to +85°C74ALVT16899 DGGAV16899 DGGSOT364-1
1998 Jun 30853-2090-19651
2
ns
ns
Philips Semiconductors Product specification
2.5V/3.3V 18-bit latched transceiver with 16-bit parity
generator/checker (3-State)
2.5V/3.3V 18-bit latched transceiver with 16-bit parity
generator/checker (3-State)
LOGIC SYMBOL
35678 10 11 12
1A0 1A1 1A2 1A3 1A4 1A5 1A6 1A7
55
28
56
29OEB
LEA
LEB
SEL
1
ODD/EVEN
OEA
2
1B0 1B1 1B2 1B3 1B4 1B5 1B6 1B7
54 52 51 50 49 47 46 45
PARITY AND ERROR FUNCTION TABLE
INPUTSOUTPUTS
SELODD/EVEN
xPAR
(A or B)
HHH
HHL
HLH
HLL
LHH
LHL
LLH
LLL
H = High voltage level
L = Low voltage level
t = Transmit–if the data path is from A→B then ERRt
r = Receive–if the data path is from A→B then ERRr is ERRB
* Blocked if latch is not transparent
Σ of High
Inputs
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
13
1APAR
1ERRA
1ERRB
1BPAR
44
xPAR
(B or A)
H
H
L
L
H
H
L
L
H
L
H
L
L
H
L
H
is ERRA
14
43
ERRtERRr*
27 25 24 23 22 20 19 18
2A0 2A1 2A2 2A3 2A4 2A5 2A6 2A7
55
28
56
29
H
LEA
LEB
SEL
1
ODD/EVEN
OEA
2
OEB
2B0 2B1 2B2 2B3 2B4 2B5 2B6 2B7
30 32 33 34 35 37 38 39
H
L
L
H
H
L
H
H
HEven
H
L
H
L
L
H
L
H
H
L
H
HOdd
H
H
H
HEven
H
H
LOdd
L
Mode
L
Mode
L
Mode
Mode
74ALVT16899
17
2APAR
2ERRA
2ERRB
2BPAR
40
PARITY MODES
Feed-through/check parity
Generate parity
16
41
SH00083
1998 Jun 30
4
Philips Semiconductors Product specification
2.5V/3.3V 18-bit latched transceiver with 16-bit parity
generator/checker (3-State)
BLOCK DIAGRAM
9–bit
Transparent
Latch
LEA
A0
A1
A2
A3
A4
A5
A6
A7
APAR
LE
Parity
Generator
9–bit
Output
Buffer
1
mux
0
9–bit
Output
Buffer
9–bit
Transparent
Latch
OE
74ALVT16899
OEB
B0
B1
B2
B3
B4
B5
B6
B7
BPAR
OEA
SEL
ODD/
EVEN
OE
mux
1
0
Parity
Generator
LE
(1 of 2 parity blocks)
FUNCTION TABLE
INPUTSOPERATING MODE
OEB OEASELLEALEB
HHXXX3-State A bus and B bus (input A & B simultaneously)
HLLLHB → A, transparent B latch, generate parity from B0 - B7, check B bus parity
HLLHHB → A, transparent A & B latch, generate parity from B0 - B7, check A & B bus parity
HLLXLB → A, B bus latched, generate parity from latched B0 - B7 data, check B bus parity
HLHXHB → A, transparent B latch, parity feed-through, check B bus parity
HLHHHB → A, transparent A & B latch, parity feed-through, check A & B bus parity
LHLHXA → B, transparent A latch, generate parity from A0 - A7, check A bus parity
LHLHHA → B, transparent A & B latch, generate parity from A0 - A7, check A & B bus parity
LHLLXA → B, A bus latched, generate parity from latched A0 - A7 data, check A bus parity
LHHHLA → B, transparent A latch, parity feed-through, check A bus parity
LHHHHA → B, transparent A & B latch, parity feed-through, check A & B bus parity
LLXXXOutput to A bus and B bus (NOT ALLOWED)
H = High voltage level
L = Low voltage level
X = Don’t care
LEB
ERRA
ERRB
SH00084
1998 Jun 30
5
Philips Semiconductors Product specification
I
DC out ut current
mA
SYMBOL
PARAMETER
UNIT
I
mA
2.5V/3.3V 18-bit latched transceiver with 16-bit parity
74ALVT16899
generator/checker (3-State)
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
V
I
V
I
OK
OUT
OUT
T
CC
IK
stg
DC supply voltage-0.5 to +4.6V
DC input diode currentVI < 0-50mA
DC input voltage
I
DC output diode currentVO < 0-50mA
DC output voltage
p
Storage temperature range-65 to +150°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create ju nction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
PARAMETERCONDITIONSRATINGUNIT
3
3
RECOMMENDED OPERATING CONDITIONS
V
CC
V
V
V
I
OH
OL
∆t/∆vInput transition rise or fall rate; Outputs enabled1010ns/V
T
amb
DC supply voltage2.32.73.03.6V
Input voltage05.505.5V
I
High-level input voltage1.72.0V
IH
Input voltage0.70.8V
IL
High-level output current–8–32mA
Low-level output current832
Low-level output current; current duty cycle ≤ 50%; f ≥ 1kHz2464
Operating free-air temperature range–40+85–40+85°C
1, 2
-0.5 to +7.0V
Output in Off or High state-0.5 to +7.0V
Output in Low state128
Output in High state-64
2.5V RANGE LIMITS 3.3V RANGE LIMITS
MINMAXMINMAX
1998 Jun 30
6
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