Philips 74alvt16240 DATASHEETS

74ALVT16240
16-bit inverting buffer/driver (3-State)
Product specification Replaces data sheet of 1997 May 02 IC23 Data Handbook
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1998 Feb 13
Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
74AL VT162402.5V/3.3V 16-bit inverting buffer/driver (3-State)

FEA TURES

16-bit bus interface
5V I/O compatibile
3-State buffers
Output capability: +64mA/-32mA
TTL input and output switching levels

DESCRIPTION

The 74ALVT16240 is a high-performance BiCMOS product designed for V to 5V .
This device is an inverting 16-bit buffer that is ideal for driving bus lines. The device features four Output Enables (1OE
), each controlling four of the 3-State outputs.
4OE
operation at 2.5V or 3.3V with I/O compatibility up
CC
, 2OE, 3OE,
Input and output interface capability to systems at 5V supply
Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs
Live insertion/extraction permitted
Power-up 3-State
No bus current loading when output is tied to 5V bus
Latch-up protection exceeds 500mA per JEDEC Std 17
ESD protection exceeds 2000V per MIL STD 883 Method 3015
and 200V per Machine Model

QUICK REFERENCE DATA

CONDITIONS
T
= 25°C
amb
t
PLH
t
PHL
C
C
I
CCZ
IN
O
Propagation delay nAx to nYx
Input capacitance nOE VI = 0V or V Output pin capacitance V
CL = 50pF
= 0V or V
I/O
CC
CC
Total supply current Outputs disabled 40 60 µA

ORDERING INFORMATION

PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA DWG NUMBER
48-Pin Plastic SSOP Type III –40°C to +85°C 74ALVT16240 DL AV16240 DL SOT370-1 48-Pin Plastic TSSOP Type II –40°C to +85°C 74ALVT16240 DGG AV16240 DGG SOT362-1
TYPICAL
2.5V 3.3V
2.5
1.9
1.7
1.7 3 3 pF 9 9 pF
ns

LOGIC SYMBOL

1A0
47
1A1
46
1A2
44
1A3
43
1OE
1
2A0
41
2A1
40
2A2
38
2A3
37
2OE
48
1Y
1Y
1Y
1Y
2Y0
2Y
2Y
2Y

LOGIC SYMBOL (IEEE/IEC)

1
0
1
2
3
1
2
3
3A0
2
36
3A1
35
3
3A2
5
33
3A3
32
6
3OE
25
4A0
8
30
4A1
9
29
4A2
11
27
4A3
12
26
4OE
24
0
3Y
3Y
1
3Y
2
3
3Y
4Y0
4Y
1
2
4Y
4Y
3
SW00004
13
14
16
17
19
20
22
23
1OE 2OE 3OE 4OE
1A1 1A2 1A3 1A4 2A1 2A2 2A3 2A4 3A1
3A2 3A3 3A4 4A1 4A2 4A3 4A4
48 25 24
47 46
44 43 41 40 38 37 36 35 33 32
30 29
27 26
EN1 EN2 EN3 EN4
2
1Y
1
1
2 1
3 1
4 1
3
1Y
5
1Y
6
1Y
8
2Y
9
2Y
11
2Y
12
2Y
13
3Y
14
3Y
16
3Y
17
3Y
19
4Y
20
4Y2
22
4Y
23
4Y
SW00231
1 2 3 4 1 2 3 4 1
2 3 4 1
3 4
1998 Feb 13 853-1975 18960
2
Philips Semiconductors Product specification
I
DC output current
mA
74ALVT162402.5V/3.3V 16-bit inverting buffer/driver (3-State)

PIN CONFIGURA TION

1
1OE
2
1Y0 1Y
1
3
GND
4
1Y
2
5
3
1Y
6 7
V
CC
8
2Y
0 1
2Y
9
GND
10
2Y
2
11
3
2Y
12
0
3Y
13
3Y
1
14
GND
15 16
3Y2
4
3Y
17 18
V
CC
4Y0
19 20
4Y
1
21
GND
22
4Y2
23
3
4Y
24
4OE
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
SW00006
2OE 1A0 1A1 GND 1A2 1A3
V
CC
2A0 2A1
GND 2A2 2A3 3A0 3A1 GND
3A2 3A3
V
CC
4A0 4A1 GND
4A2 4A3 3OE

PIN DESCRIPTION

PIN NUMBER SYMBOL NAME AND FUNCTION
47, 46, 44, 43, 41, 40, 38, 37, 36, 35, 33, 32, 30, 29, 27, 26
2, 3, 5, 6,
8, 9, 11, 12, 13, 14, 16, 17, 19, 20, 22, 23
1, 48, 25, 24
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42 V
1A0-1A3 2A0-2A3 3A0-3A3
Data inputs 4A0-4A3 1Y0-1Y3
2Y
0-2Y3
3Y0-3Y3
Data outputs 4Y0-4Y3
1OE, 2OE,
3OE, 4OE
Output enables
GND Ground (0V)
CC
Positive supply voltage

FUNCTION TABLE

Inputs Outputs
nOE nAx nYx
L L H L H L H X Z
H = High voltage level L = Low voltage level X = Don’t care Z = High Impedance “off” state

ABSOLUTE MAXIMUM RATINGS

SYMBOL
V
CC
I
IK
V
I
OK
V
OUT
OUT
T
stg
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
DC supply voltage -0.5 to +4.6 V DC input diode current VI < 0 -50 mA DC input voltage
I
DC output diode current VO < 0 -50 mA DC output voltage
p
Storage temperature range -65 to +150 °C
PARAMETER CONDITIONS RATING UNIT
3
3
1, 2
-0.5 to +7.0 V
Output in Off or High state -0.5 to +7.0 V
Output in Low state 128
Output in High state -64
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
1998 Feb 13
3
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