INTEGRATED CIRCUITS
74ABT843
9-bit interface latch with set and reset (3-State)
Product specification
1998 Jan 16
Supersedes data of 1995 Sep 06 IC23 Data Handbook
m n r
Philips Semiconductors |
Product specification |
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9-bit bus interface latch with set and reset
74ABT843
(3-State)
FEATURES
•High speed parallel latches
•Extra data width for wide address/data paths or buses carrying parity
•Ideal where high speed, light loading, or increased fan-in are required with MOS microprocessors
•Slim DIP 300 mil package
•Broadside pinout
•Output capability: +64mA/±32mA
•Latch-up protection exceeds 500mA per Jedec Std 17
•ESD protection exceeds 2000V per MIL STD 883 Method 3015 and 200V per Machine Model
•Power-up 3-State
•Power-up reset
DESCRIPTION
The 74ABT843 Bus interface latch is designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider data/address paths of buses carrying parity.
The 74ABT843 consists of nine D-type latches with 3-State outputs. In addition to the LE and OE pins, it has a Master Reset (MR) pin and Preset (PRE) pin. These pins are ideal for parity bus interfacing in high performance systems. When MR is Low, the outputs are Low if OE is Low. When MR is High, data can be entered into the latch.
When PRE is Low, the outputs are High, if OE is Low. PRE overrides MR.
QUICK REFERENCE DATA
SYMBOL |
PARAMETER |
CONDITIONS |
TYPICAL |
UNIT |
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Tamb = 25°C; GND = 0V |
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tPLH |
Propagation delay |
CL = 50pF; VCC = 5V |
5.0 |
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tPHL |
Dn to Qn |
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CIN |
Input capacitance |
VI = 0V or VCC |
4 |
pF |
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COUT |
Output capacitance |
Outputs disabled; |
7 |
pF |
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VO = 0V or VCC |
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ICCZ |
Total supply current |
Outputs disabled; VCC = 5.5V |
500 |
nA |
ORDERING INFORMATION
PACKAGES |
TEMPERATURE RANGE |
OUTSIDE NORTH AMERICA |
NORTH AMERICA |
DWG NUMBER |
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24-Pin Plastic DIP |
±40°C to +85°C |
74ABT843 N |
74ABT843 N |
SOT222-1 |
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24-Pin plastic SO |
±40°C to +85°C |
74ABT843 D |
74ABT843 D |
SOT137-1 |
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24-Pin Plastic SSOP Type II |
±40°C to +85°C |
74ABT843 DB |
74ABT843 DB |
SOT340-1 |
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24-Pin Plastic TSSOP Type I |
±40°C to +85°C |
74ABT843 PW |
74ABT843PW DH |
SOT355-1 |
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PIN CONFIGURATION |
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PIN DESCRIPTION |
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1 |
24 |
VCC |
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PIN NUMBER |
SYMBOL |
FUNCTION |
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OE |
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Output enable input |
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D0 |
2 |
23 |
Q0 |
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1 |
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OE |
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(active-Low) |
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D1 |
3 |
22 |
Q1 |
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2, 3, 4, 5, 6, |
D0-D8 |
Data inputs |
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D2 |
4 |
21 |
Q2 |
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7, 8, 9, 10 |
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D3 |
5 |
20 |
Q3 |
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23, 22, 21, 20, |
Q0-Q8 |
Data outputs |
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D4 |
6 |
19 |
Q4 |
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19,18, 17, 16, 15 |
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TOP VIEW |
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11 |
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Master reset input (active-Low) |
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D5 |
7 |
18 |
Q5 |
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MR |
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D6 |
8 |
17 |
Q6 |
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13 |
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LE |
Latch enable input (active rising |
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D7 |
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16 |
Q7 |
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edge) |
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14 |
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Preset input (active-Low) |
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D8 |
10 |
15 |
Q8 |
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PRE |
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11 |
14 |
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12 |
GND |
Ground (0V) |
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MR |
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PRE |
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GND |
12 |
13 |
LE |
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24 |
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VCC |
Positive supply voltage |
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SA00250 |
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1998 Jan 16 |
2 |
853-1620 18864 |
Philips Semiconductors |
Product specification |
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9-bit bus interface latch with set and reset
74ABT843
(3-State)
LOGIC SYMBOL |
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LOGIC SYMBOL (IEEE/IEC) |
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1 |
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EN |
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11 |
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R |
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2 |
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6 |
7 |
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10 |
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14 |
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S2 |
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C1 |
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D0 |
D1 |
D2 |
D3 |
D4 |
D5 |
D6 |
D7 |
D8 |
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13 |
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LE |
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2 |
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1D |
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14 |
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PRE |
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3 |
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22 |
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11 |
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MR |
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4 |
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21 |
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1 |
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OE |
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5 |
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20 |
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Q0 |
Q1 Q2 |
Q3 Q4 |
Q5 Q6 |
Q7 |
Q8 |
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6 |
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19 |
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7 |
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18 |
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23 |
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21 |
20 |
19 |
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17 |
16 |
15 |
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8 |
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17 |
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9 |
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16 |
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SA00251 |
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10 |
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15 |
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SA00252 |
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FUNCTION TABLE
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INPUTS |
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OUTPUTS |
OPERATING MODE |
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LE |
Dn |
Qn |
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OE |
PRE |
MR |
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L |
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L |
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X |
X |
X |
H |
Preset |
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L |
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H |
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L |
X |
X |
L |
Clear |
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L |
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H |
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H |
H |
L |
L |
Transparent |
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L |
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H |
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H |
H |
H |
H |
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L |
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H |
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H |
↓ |
l |
L |
Latched |
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L |
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H |
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H |
↓ |
h |
H |
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H |
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X |
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X |
X |
X |
Z |
High impedance |
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L |
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H |
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H |
L |
X |
NC |
Hold |
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H |
= |
High voltage level |
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h |
= |
High voltage level one set-up time prior to the High-to-Low LE transition |
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L |
= |
Low voltage level |
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l |
= |
Low voltage level one set-up time prior to the High-to-Low LE transition |
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NC= |
No change |
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X |
= |
Don't care |
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Z |
= |
High impedance ªoffº state |
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↓ = |
High-to-Low transition |
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1998 Jan 16 |
3 |
Philips Semiconductors |
Product specification |
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9-bit bus interface latch with set and reset
74ABT843
(3-State)
LOGIC DIAGRAM
D0 |
D1 |
D2 |
D3 |
D4 |
D5 |
D6 |
D7 |
D8 |
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2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
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10 |
14 |
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PRE |
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P |
P |
P |
P |
P |
P |
P |
P |
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P |
D |
D |
D |
D |
D |
D |
D |
D |
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D |
L Q |
L Q |
L Q |
L Q |
L Q |
L Q |
L Q |
L Q |
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L Q |
C |
C |
C |
C |
C |
C |
C |
C |
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C |
11 |
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MR |
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13 |
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LE |
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1 |
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OE |
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23 |
22 |
21 |
20 |
19 |
18 |
17 |
16 |
15 |
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Q0 |
Q1 |
Q2 |
Q3 |
Q4 |
Q5 |
Q6 |
Q7 |
Q8 |
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SA00253 |
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL |
PARAMETER |
CONDITIONS |
RATING |
UNIT |
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VCC |
DC supply voltage |
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±0.5 to +7.0 |
V |
IIK |
DC input diode current |
VI < 0 |
±18 |
mA |
VI |
DC input voltage3 |
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±1.2 to +7.0 |
V |
IOK |
DC output diode current |
VO < 0 |
±50 |
mA |
V |
DC output voltage3 |
output in Off or High state |
±0.5 to +5.5 |
V |
OUT |
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IOUT |
DC output current |
output in Low state |
128 |
mA |
Tstg |
Storage temperature range |
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±65 to 150 |
°C |
NOTES:
1.Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under ªrecommended operating conditionsº is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2.The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3.The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jan 16 |
4 |
Philips Semiconductors |
Product specification |
|
|
|
|
9-bit bus interface latch with set and reset
74ABT843
(3-State)
RECOMMENDED OPERATING CONDITIONS
SYMBOL |
PARAMETER |
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LIMITS |
UNIT |
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Min |
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Max |
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VCC |
DC supply voltage |
4.5 |
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5.5 |
V |
VI |
Input voltage |
0 |
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VCC |
V |
VIH |
High-level input voltage |
2.0 |
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V |
VIL |
Low-level input voltage |
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0.8 |
V |
IOH |
High-level output current |
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±32 |
mA |
IOL |
Low-level output current |
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64 |
mA |
t/ v |
Input transition rise or fall rate |
0 |
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10 |
ns/V |
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Tamb |
Operating free-air temperature range |
±40 |
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+85 |
°C |
DC ELECTRICAL CHARACTERISTICS
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LIMITS |
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SYMBOL |
PARAMETER |
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TEST CONDITIONS |
Tamb = +25°C |
Tamb = ±40°C |
UNIT |
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to +85°C |
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Min |
Typ |
Max |
Min |
Max |
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VIK |
Input clamp voltage |
VCC = 4.5V; IIK = ±18mA |
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±0.9 |
±1.2 |
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±1.2 |
V |
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VCC = 4.5V; IOH = ±3mA; VI = VIL or VIH |
2.5 |
2.9 |
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2.5 |
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V |
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VOH |
High±level output voltage |
VCC = 5.0V; IOH = ±3mA; VI = VIL or VIH |
3.0 |
3.4 |
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3.0 |
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V |
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VCC = 4.5V; IOH = ±32mA; VI = VIL or VIH |
2.0 |
2.4 |
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2.0 |
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V |
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VOL |
Low±level output voltage |
VCC = 4.5V; IOL = 64mA; VI = VIL or VIH |
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0.42 |
0.55 |
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0.55 |
V |
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VRST |
Power±up output low |
VCC = 5.5V; IO = 1mA; VI = VCC or GND |
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0.13 |
0.55 |
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0.55 |
V |
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voltage3 |
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II |
Input leakage current |
VCC = 5.5V; VI = GND or 5.5V |
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±0.01 |
±1.0 |
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±1.0 |
μA |
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IOFF |
Power-off leakage current |
VCC = 0.0V; VO or VI ≤ 4.5V |
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±5.0 |
±100 |
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±100 |
μA |
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Power-up/down 3±state |
VCC = 2.0V; VO = 0.5V; V |
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= VCC; VI = |
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IPU/IPD |
OE |
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±5.0 |
±50 |
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±50 |
μA |
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output current4 |
GND or VCC |
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IOZH |
3-State output High current |
VCC = 5.5V; VO = 2.7V; VI = VIL or VIH |
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5.0 |
50 |
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50 |
μA |
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IOZL |
3-State output Low current |
VCC = 5.5V; VO = 0.5V; VI = VIL or VIH |
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±5.0 |
±50 |
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±50 |
μA |
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ICEX |
Output high leakage current |
VCC = 5.5V; VO = 5.5V; VI = GND or VCC |
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5.0 |
50 |
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50 |
μA |
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I |
Output current1 |
V |
= 5.5V; V = 2.5V |
±50 |
±80 |
±180 |
±50 |
±180 |
mA |
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O |
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CC |
O |
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ICCH |
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VCC = 5.5V; Outputs High, VI = GND or VCC |
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0.5 |
250 |
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250 |
μA |
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ICCL |
Quiescent supply current |
VCC = 5.5V; Outputs Low, VI = GND or VCC |
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25 |
34 |
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34 |
mA |
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ICCZ |
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VCC = 5.5V; Outputs 3-State; |
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0.5 |
250 |
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250 |
μA |
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VI = GND or VCC |
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ICC |
Additional supply current per |
VCC = 5.5V; one input at 3.4V, |
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0.5 |
1.5 |
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1.5 |
mA |
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input pin2 |
other inputs at VCC or GND |
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NOTES:
1.Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2.This is the increase in supply current for each input at 3.4V.
3.For valid test results, data must not be loaded into the flip±flops (or latches) after applying the power.
4.This parameter is valid for any VCC between 0V and 2.1V with a transition time of up to 10msec. For VCC = 2.1V to VCC = 5V 10%, a transition time of up to 100μsec is permitted.
1998 Jan 16 |
5 |