Philips 74ABT08N, 74ABT08DB, 74ABT08D, 74ABT08PW Datasheet

INTEGRATED CIRCUITS

74ABT08

Quad 2-input AND gate

Product specification

1995 Sep 18

IC23 Data Handbook

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Philips Semiconductors	Product specification
Quad 2-input AND gate	74ABT08

QUICK REFERENCE DATA

CONDITIONS

SYMBOL

PARAMETER

Tamb = 25°C;

TYPICAL

UNIT

GND = 0V

tPLH

Propagation

2.4

delay

ns

tPHL

An or Bn to Yn

CL = 50pF;

1.9

VCC = 5V

tOSLH

Output to

0.4

ns

tOSHL

Output skew

CIN

Input

VI = 0V or VCC

3

pF

capacitance

ICC

Total supply

Outputs disabled;

50

μA

current

VCC = 5.5V

PIN CONFIGURATION

A0

1

14

VCC

B0

B3

2

13

Y0

A3

3

12

A1

Y3

4

11

B1

B2

5

10

Y1

A2

6

9

GND

Y2

7

8

SA00342

LOGIC SYMBOL

1

2

4

5

9

10

12

13

A0

B0

A1

B1

A2

B2

A3

B3

Y0

Y1

Y2

Y3

VCC = Pin 14

3

6

8

11

GND = Pin 7

SA00343

ORDERING INFORMATION

LOGIC DIAGRAM

	A0				1		3
					2							Y0
	B0
					4
	A1							6
					5							Y1
	B1
	A2				9		8
					10							Y2
	B2
					12		11
VCC = Pin 14	A3				13							Y3
	B3
GND = Pin 7											SA00344

PIN DESCRIPTION

PIN		SYMBOL				NAME AND FUNCTION
NUMBER
1, 2, 4, 5, 9,				An-Bn		Data inputs
10, 12, 13
3, 6, 8, 11				Yn		Data outputs
7				GND		Ground (0V)
14				VCC		Positive supply voltage
LOGIC SYMBOL (IEEE/IEC)
			1			&	3
			2
			4				6
			5
				9			8
	10
		12					11
	13							SA00363

FUNCTION TABLE

		INPUTS			OUTPUT
		An		Bn	Yn
		L		L	L
		L		H	L
		H		L	L
		H		H	H
NOTES:
H	=	High voltage level
L	=	Low voltage level

PACKAGES	TEMPERATURE RANGE	OUTSIDE NORTH AMERICA	NORTH AMERICA	DWG NUMBER
14-Pin Plastic DIP	±40°C to +85°C	74ABT08 N	74ABT08 N	SOT27-1
14-Pin plastic SO	±40°C to +85°C	74ABT08 D	74ABT08 D	SOT108-1
14-Pin Plastic SSOP Type II	±40°C to +85°C	74ABT08 DB	74ABT08 DB	SOT337-1
14-Pin Plastic TSSOP Type I	±40°C to +85°C	74ABT08 PW	74ABT08PW DH	SOT402-1

1995 Sep 18

2

853-1806 15752

Philips Semiconductors	Product specification
Quad 2-input AND gate	74ABT08

ABSOLUTE MAXIMUM RATINGS1, 2

SYMBOL	PARAMETER	CONDITIONS	RATING	UNIT
VCC	DC supply voltage		±0.5 to +7.0	V
IIK	DC input diode current	VI < 0	±18	mA
VI	DC input voltage3		±1.2 to +7.0	V
IOK	DC output diode current	VO < 0	±50	mA
V	DC output voltage3	output in Off or High state	±0.5 to +5.5	V
OUT
IOUT	DC output current	output in Low state	40	mA
Tstg	Storage temperature range		±65 to 150	°C

NOTES:

1.Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under ªrecommended operating conditionsº is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2.The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.

3.The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

SYMBOL	PARAMETER		LIMITS		UNIT
		MIN		MAX
VCC	DC supply voltage	4.5		5.5	V
VI	Input voltage	0		VCC	V
VIH	High-level input voltage	2.0			V
VIL	Low-level input voltage			0.8	V
IOH	High-level output current			±15	mA
IOL	Low-level output current			20	mA
t/ v	Input transition rise or fall rate	0		5	ns/V
Tamb	Operating free-air temperature range	±40		+85	°C

DC ELECTRICAL CHARACTERISTICS

						LIMITS
SYMBOL	PARAMETER		TEST CONDITIONS	Tamb = +25°C			Tamb = ±40°C		UNIT
							to +85°C
				MIN	TYP	MAX	MIN	MAX
VIK	Input clamp voltage	VCC = 4.5V; IIK = ±18mA			±0.9	±1.2		±1.2	V
VOH	High-level output voltage	VCC = 4.5V; IOH = ±15mA; VI = VIL or VIH		2.5	2.9		2.5		V
VOL	Low-level output voltage	VCC = 4.5V; IOL = 20mA; VI = VIL or VIH			0.35	0.5		0.5	V
II	Input leakage current	VCC = 5.5V; VI = GND or 5.5V			±0.01	±1.0		±1.0	μA
IOFF	Power-off leakage current	VCC = 0.0V; VO or VI ≤ 4.5V			±5.0	±100		±100	μA
ICEX	Output High leakage current	VCC = 5.5V; VO = 5.5V; VI = GND or VCC			5.0	50		50	μA
I	Output current1	V	= 5.5V; V = 2.5V	±50	±75	±180	±50	±180	mA
O		CC	O
ICC	Quiescent supply current	VCC = 5.5V; VI = GND or VCC			2	50		50	μA
ICC	Additional supply current per	VCC = 5.5V; One data input at 3.4V, other			0.25	500		500	μA
	input pin2	inputs at VCC or GND

NOTES:

1.Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2.This is the increase in supply current for each input at 3.4V.

1995 Sep 18

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