ESD withstand voltage
acc. to ANSI/ESDA/JEDEC JS-001 (HBM, Class 2)
op
min.
max.
stg
min.
max.
CE
C
I
CS
EC
tot
V
ESD
max.30 V
max.50 mA
max.100 mA
max.7 V
max.100 mW
max.2 kV
-40 °C
100 °C
-40 °C
100 °C
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LPT 80 A
Characteristics
TA = 25 °C
ParameterSymbolValues
Wavelength of max sensitivityλ
Spectral range of sensitivityλ
S max
10%
typ.880 nm
typ.450 ... 1100
nm
Dimensions of chip areaL x Wtyp.0.55 x 0.55
mm x mm
Radiant sensitive areaAtyp.0.11 mm²
Half angleφtyp.35 °
Photocurrent
= 5 V; Std. Light A; Ev = 1000 lx
V
CE
Dark current
V
= 20 V; E = 0
CE
Rise time
I
= 1 mA; λ = 0 nm; VCC = 5 V; RL = 1 kΩ
C
Fall time
I
= 1 mA; λ = 0 nm; VCC = 5 V; RL = 1 kΩ
C
Collector-emitter saturation voltage
3)
I
PCE
I
CE0
t
r
t
f
V
CEsat
typ.3200 µA
typ.
max.
1 nA
50 nA
typ.10 µs
typ.10 µs
typ.150 mV
Threefold saturated
Capacitance
V
= 0 V; f = 1 MHz; E = 0
CE
Thermal resistance junction ambient realR
C
CE
thJA
typ.7.5 pF
max.750 K / W
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LPT 80 A
OHF04042
λ
0˚20˚40˚60˚80˚100˚120˚0.40.60.81.0
100˚
90˚
80˚
70˚
60˚
50˚
0˚10˚20˚30˚40˚
0
0.2
0.4
0.6
0.8
1.0
ϕ
Relative Spectral Sensitivity
S
= f (λ)
rel
S
rel
100
%
80
70
60
50
40
30
20
10
4), 5)
0
400
500 600 700 800 9001100
nm
Directional Characteristics
S
= f (φ)
rel
4), 5)
OHF00345
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LPT 80 A
]
OHF04049
CE
0V
0
pF
OHF04051
CE
C
CE
V
10-310-210-110010110
2
V
1
2
3
4
5
6
7
8
Photocurrent
I
= f (Ee) ; VCE = 5 V
PCE
[]
1
0.5
0.1
0.05
0.010.05 0.10.51
4), 5)
Dark Current
I
= f (VCE) ; E = 0
CE0
1
10
nA
I
CEO
0
10
-1
10
-2
10
[
5101520253035
4), 5)
V
Collector-Emitter Capacitance
4), 5)
CCE = f (VCE); f = 1 MHz; E = 0
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LPT 80 A
OHF04050
A
100
0
-25
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
0255075100
Ι
PCE
PCE
Ι
25
C
Dark Current
I
= f (TA); VCE = 5 V; Ee = 0 mW/cm²
CE0
4
10
4)
nA
I
CEO
3
10
2
10
1
10
0
10
-1
10
-2
10
-250 255075
Photocurrent
I
= f (TA); VCE = 5 V; Ev = 1000 lx
PCE,rel
4)
OHF01524
˚C
T
T
A
Power Consumption
P
= f (TA)
tot
125
Ι
mA
F
100
75
50
25
0
0
20406080 C 100
OHR01425
T
A
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LPT 80 A
0.64 (0.025)
0.46 (0.018)
Dimensional Drawing
1.52 (0.060)
spacing
2.54 (0.100)
Collector
Approx. weight 0.2 g
6)
16.51 (0.650)
16.00 (0.630)
1.52 (0.060)
0.64 (0.025)
0.46 (0.018)
5.84 (0.230)
5.59 (0.220)
1.29 (0.051)
1.14 (0.045)
1.52 (0.060)
Plastic marking
R = 0.76 (0.030)
4.57 (0.180)
4.32 (0.170)
2.34 (0.092)
2.08 (0.082)
2.54 (0.100)
2.03 (0.080)
1.70 (0.067)
1.45 (0.057)
GEOY6391
Further Information:
Approximate Weight:
Package marking:
157.0 mg
Collector
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LPT 80 A
OHA04645
t
Recommended Solder Pad
6)
TTW Soldering
IEC-61760-1 TTW
300
˚C
T
250
200
150
100
50
0
0
10 s max., max. contact time 5 s per wave
235 ˚C - 260 ˚C
First wave
∆
T
< 150 K
Preheating
130 ˚C
120 ˚C
100 ˚C
20406080100120140160180200220240
Second wave
Typical
Continuous line: typical process
Dotted line: process limits
Cooling
ca. 3.5 K/s typical
ca. 2 K/s
ca. 5 K/s
s
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LPT 80 A
Notes
The evaluation of eye safety occurs according to the standard IEC 62471:2006 (photo biological safety of
lamps and lamp systems). Within the risk grouping system of this IEC standard, the device specied in this
data sheet falls into the class exempt group (exposure time 10000 s)
sure time, conditions of the eye pupils, observation distance), it is assumed that no endangerment to the
eye exists from these devices. As a matter of principle, however, it should be mentioned that intense light
sources have a high secondary exposure potential due to their blinding eect. When looking at bright light
sources (e.g. headlights), temporary reduction in visual acuity and afterimages can occur, leading to irritation, annoyance, visual impairment, and even accidents, depending on the situation.
Subcomponents of this device contain, in addition to other substances, metal lled materials including silver.
Metal lled materials can be aected by environments that contain traces of aggressive substances. There-
fore, we recommend that customers minimize device exposure to aggressive substances during storage,
production, and use. Devices that showed visible discoloration when tested using the described tests above
did show no performance deviations within failure limits during the stated test duration. Respective failure
limits are described in the IEC60810.
For further application related information please visit www.osram-os.com/appnotes
. Under real circumstances (for expo-
Version 1.4 | 2019-12-20
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LPT 80 A
Disclaimer
Attention please!
The information describes the type of component and shall not be considered as assured characteristics.
Terms of delivery and rights to change design reserved. Due to technical requirements components may
contain dangerous substances.
For information on the types in question please contact our Sales Organization.
If printed or downloaded, please nd the latest version on the OSRAM OS website.
Packing
Please use the recycling operators known to you. We can also help you – get in touch with your nearest
sales oce. By agreement we will take packing material back, if it is sorted. You must bear the costs of
transport. For packing material that is returned to us unsorted or which we are not obliged to accept, we
shall have to invoice you for any costs incurred.
Product and functional safety devices/applications or medical devices/applications
OSRAM OS components are not developed, constructed or tested for the application as safety relevant
component or for the application in medical devices.
OSRAM OS products are not qualied at module and system level for such application.
In case buyer – or customer supplied by buyer – considers using OSRAM OS components in product safety
devices/applications or medical devices/applications, buyer and/or customer has to inform the local sales
partner of OSRAM OS immediately and OSRAM OS and buyer and /or customer will analyze and coordi-
nate the customer-specic request between OSRAM OS and buyer and/or customer.
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LPT 80 A
Glossary
1)
Photocurrent: The photocurrent values are measured (by irradiating the devices with a homogenous
light source and applying a voltage to the device) with a tolerance of ±11 %.
2)
Tolerance of Measure: Unless otherwise noted in
drawing, tolerances are specied with ±0.1 and
dimensions are specied in mm.
3)
IPCEmin: IPCEmin is the min. photocurrent of the specied group.
4)
Typical Values: Due to the special conditions of the manufacturing processes of semiconductor devic-
es, the typical data or calculated correlations of technical parameters can only reect statistical gures.
These do not necessarily correspond to the actual parameters of each single product, which could differ from the typical data and calculated correlations or the typical characteristic line. If requested, e.g.
because of technical improvements, these typ. data will be changed without any further notice.
5)
Testing temperature: TA = 25°C (unless otherwise specied)
6)
Tolerance of Measure: Unless otherwise noted in drawing, tolerances are specied with ±0.1 and