• NVMFD5873NLWF − Wettable Flanks Option for Enhanced Optical
Inspection
• AEC−Q101 Qualified and PPAP Capable
• This is a Pb−Free Device
MAXIMUM RATINGS (T
Drain−to−Source VoltageV
Gate−to−Source VoltageV
Continuous Drain Cur
rent R
Y
2, 3, 4)
Power Dissipation
R
Y
J−mb
Continuous Drain Cur
rent R
q
JA
& 4)
Power Dissipation
(Notes 1 & 3)
R
q
JA
Pulsed Drain Current
Operating Junction and Storage TemperatureTJ, T
Source Current (Body Diode)I
Single Pulse Drain−to−Source Avalanche
Energy (TJ = 25°C, VGS = 10 V, I
L = 0.1 mH, R
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
THERMAL RESISTANCE MAXIMUM RATINGS (Note 1)
Junction−to−Mounting Board (top) − Steady
State (Notes 2, 3)
Junction−to−Ambient − Steady State (Note 3)R
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2. P si (Y) is used as required per JESD51−12 for packages in which
substantially less than 100% of the heat flows to single case surface.
3. Surface−mounted on FR4 board using a 650 mm
4. Maximum current for pulses as long as 1 second are higher but are dependent
on pulse duration and duty cycle.
to Minimize Conduction Losses
DS(on)
= 25°C unless otherwise noted)
J
Parameter
(Notes 1,
J−mb
(Notes 1, 2, 3
(Notes 1, 3
= 25 W)
G
Steady
State
Steady
State
TA = 25°C, t
L(pk)
Parameter
SymbolValueUnit
stg
60V
"20V
58
107
10
3.1
190A
−55 to
175
58A
40mJ
260°C
1.4
48
DSS
GS
Tmb = 25°C
Tmb = 100°C41
Tmb = 25°C
Tmb = 100°C54
TA = 25°C
TA = 100°C7.0
TA = 25°C
TA = 100°C1.6
= 10 ms
p
= 28.3 A,
I
D
P
D
I
D
P
D
I
DM
S
E
AS
T
L
SymbolValueUnit
R
Y
J−mb
q
JA
2
, 2 oz. Cu pad.
A
W
A
W
°C
°C/W
http://onsemi.com
G1
V
(BR)DSS
60 V
R
DS(on)
13 mW @ 10 V
16.5 mW @ 4.5 V
Dual N−Channel
D1
S1
MAXID MAX
58 A
D2
G2
S2
MARKING DIAGRAM
D1
1
DFN8 5x6
(SO8FL)
CASE 506BT
5873NL = Specific Device Code
5873LW = Specific Device Code
A= Assembly Location
Y= Year
W= Work Week
ZZ= Lot Traceability
S1
G1
S2
G2
for NVMFD5873NL
for NVMFD5873NLWF
D1
5873xx
AYWZZ
D2
D2
D1
D1
D2
D2
ORDERING INFORMATION
DevicePackageShipping
NVMFD5873NLT1GDFN8
(Pb−Free)
NVMFD5873NLWFT1GDFN8
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
6. Switching characteristics are independent of operating junction temperatures.
60V
54.9mV/°C
TJ = 25°C1.0mA
TJ = 125°C100
1.52.5V
−5.8mV/°C
1560
145
98
16.5
1.3
4.0
8.8
10.8
51
21
42.6
9.5
13
25
6.6
TJ = 25°C0.81.0
TJ = 125°C0.7
22.4
14.5
9.0
18nC
pF
nC
ns
ns
V
ns
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2
Page 3
NVMFD5873NL
TYPICAL CHARACTERISTICS
80
10 V
60
40
20
, DRAIN CURRENT (A)
D
I
0
0.01.02.03.04.05.0
VDS, DRAIN−TO−SOURCE VOLTAGE (V)VGS, GATE−TO−SOURCE VOLTAGE (V)
4.5 V
VGS = 3.0 V
TJ = 25°C
Figure 1. On−Region CharacteristicsFigure 2. Transfer Characteristics
0.025
ID = 15 A
T
0.020
0.015
0.010
3.8 V
3.4 V
= 25°C
J
80
VDS ≥ 10 V
60
40
TJ = 25°C
20
, DRAIN CURRENT (A)
D
I
0.0200
0.0175
0.0150
0.0125
0.0100
0.0075
TJ = 125°C
0
2.02.53.03.54.04.5
TJ = 25°C
TJ = −55°C
VGS = 4.5 V
VGS = 10 V
, DRAIN−TO−SOURCE RESISTANCE (W)
0.005
2345678910
DS(on)
R
2.4
2.2
2.0
1.8
1.6
1.4
1.2
, DRAIN−TO−SOURCE
1.0
DS(on)
R
RESISTANCE (NORMALIZED)
0.8
0.6
−50 −250255075100 125 150 175
VGS, GATE−TO−SOURCE VOLTAGE (V)ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. V
ID = 15 A
= 10 V
V
GS
TJ, JUNCTION TEMPERATURE (°C)VDS, DRAIN−TO−SOURCE VOLTAGE (V)
GS
Figure 5. On−Resistance Variation with
Temperature
, DRAIN−TO−SOURCE RESISTANCE (W)
0.0050
5 1015202530
DS(on)
R
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
100000
VGS = 0 V
10000
, LEAKAGE (nA)
1000
DDS
I
100
102030405060
TJ = 150°C
TJ = 125°C
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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3
Page 4
NVMFD5873NL
TYPICAL CHARACTERISTICS
2000
VGS = 0 V
C
iss
= 25°C
T
J
1500
1000
500
C, CAPACITANCE (pF)
C
oss
C
rss
0
0 102030405060
VDS, DRAIN−TO−SOURCE VOLTAGE (V)Qg, TOTAL GATE CHARGE (nC)
Figure 7. Capacitance VariationFigure 8. Gate−to−Source and
1000
VDS = 48 V
= 15 A
I
D
V
= 10 V
GS
100
t
d(off)
t
f
t
r
10
Q
T
8
6
Q
4
gs
Q
gd
2
, GATE−TO−SOURCE VOLTAGE (V)
GS
0
V
05101520253035
Drain−to−Source Voltage vs. Total Charge
80
VGS = 0 V
70
TJ = 25°C
60
50
40
TJ = 25°C
= 48 V
V
DS
I
= 15 A
D
t, TIME (ns)
10
1
110100
RG, GATE RESISTANCE (W)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
100
10
1
NVMFD5873NL
, DRAIN CURRENT (A)
D
FBSOA
I
TA = 25°C, 650 mm2,
2 oz Cu Pad, V
0.1
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Rated Forward Biased
t
d(on)
, SOURCE CURRENT (A)
S
I
= 10 V
GS
Safe Operating Area
30
20
10
0
0.600.650.700.750.800.850.900.95 1.00
V
, SOURCE−TO−DRAIN VOLTAGE (V)
SD
Figure 10. Diode Forward Voltage vs. Current
0.01 ms
0.1 ms
1 ms
10 ms
1001010.1
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4
Page 5
NVMFD5873NL
TYPICAL CHARACTERISTICS
100
Duty Cycle = 50%
20%
10
10%
5%
2%
1
(°C/W)
(t)
R
1%
0.1
Single Pulse
0.01
0.0000010.000010.00010.0010.010.11101001000
PULSE TIME (sec)
Figure 12. Thermal Response
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5
Page 6
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DFN8 5x6, 1.27P Dual Flag (SO8FL−Dual)
1
SCALE 2:1
PIN ONE
IDENTIFIER
NOTE 7
0.10 C
0.10 C
NOTE 4
DETAIL B
M
N
4X
G
BOTTOM VIEW
D
D1
78
1234
TOP VIEW
SIDE VIEW
D2
D3
e
14
8
K1
5
56
2X
4X
b1
0.20 C
A
E1
E
A
DETAIL A
L
4X
K
E2
b
8X
B
C
0.05
2X
0.20 C
c
SEATING
PLANE
NOTE 6
DETAIL B
ALTERNATE
CONSTRUCTION
C
A0.10B
C
NOTE 3
CASE 506BT
ISSUE E
DETAIL A
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED
BETWEEN 0.15 AND 0.30 MM FROM THE TERMINAL TIP.
4. PROFILE TOLERANCE APPLIES TO THE EXPOSED PAD AS WELL
AS THE TERMINALS.
5. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD FLASH,
PROTRUSIONS, OR GATE BURRS.
6. SEATING PLANE IS DEFINED BY THE TERMINALS. A1 IS DEFINED
AS THE DISTANCE FROM THE SEATING PLANE TO THE LOWEST
POINT ON THE PACKAGE BODY.
7. A VISUAL INDICATOR FOR PIN 1 MUST BE LOCATED IN THIS AREA.
4X
h
GENERIC
MARKING DIAGRAM*
A1
*This information is generic. Please refer
to device data sheet for actual part
marking.
1
XXXXXX
AYWZZ
XXXXXX= Specific Device Code
A= Assembly Location
Y= Year
W= Work Week
ZZ= Lot Traceability
SOLDERING FOOTPRINT*
4.56
8X
0.75
4.84
2.30
DATE 26 FEB 2013
MILLIMETERS
3.70
MAX
0.42
4.90
4.10
5.90
4.15
0.55
0.61
3.50
0.56
6.59
DIM MIN
A0.90
A1−−−
b0.33
b10.330.42
c0.20
D5.15 BSC
D14.70
D23.90
D31.501.70
E6.15 BSC
E15.70
E23.90
e1.27 BSC
G0.45
h−−−
K0.51
K10.56−−−
L0.48
M3.25
N1.802.00
2X
2.08
4X
1.40
−−−
−−−
−−−
−−−
−−−
2X
MAX
1.10
0.05
0.51
0.51
0.33
5.10
4.30
1.90
6.10
4.40
0.65
12
−−−
−−−
0.71
3.75
2.20
_
0.70
4X
1.00
1.27
PITCH
5.55
DIMENSION: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
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