ON Semiconductor NVMFD5873NL User Manual

Page 1
NVMFD5873NL
­)
-
Power MOSFET
60 V, 13 mW, 58 A, Dual N−Channel Logic Level, Dual SO−8FL
Small Footprint (5x6 mm) for Compact Designs
Low R
Low Capacitance to Minimize Driver Losses
NVMFD5873NLWF − Wettable Flanks Option for Enhanced Optical
Inspection
AEC−Q101 Qualified and PPAP Capable
This is a Pb−Free Device
MAXIMUM RATINGS (T
Drain−to−Source Voltage V Gate−to−Source Voltage V Continuous Drain Cur
rent R
Y
2, 3, 4) Power Dissipation
R
Y
J−mb
Continuous Drain Cur rent R
q
JA
& 4) Power Dissipation
(Notes 1 & 3)
R
q
JA
Pulsed Drain Current Operating Junction and Storage Temperature TJ, T
Source Current (Body Diode) I Single Pulse Drain−to−Source Avalanche
Energy (TJ = 25°C, VGS = 10 V, I L = 0.1 mH, R
Lead Temperature for Soldering Purposes (1/8 from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.
THERMAL RESISTANCE MAXIMUM RATINGS (Note 1)
Junction−to−Mounting Board (top) − Steady State (Notes 2, 3)
Junction−to−Ambient − Steady State (Note 3) R
1. The entire application environment impacts the thermal resistance values shown, they are not constants and are only valid for the particular conditions noted.
2. P si (Y) is used as required per JESD51−12 for packages in which substantially less than 100% of the heat flows to single case surface.
3. Surface−mounted on FR4 board using a 650 mm
4. Maximum current for pulses as long as 1 second are higher but are dependent on pulse duration and duty cycle.
to Minimize Conduction Losses
DS(on)
= 25°C unless otherwise noted)
J
Parameter
(Notes 1,
J−mb
(Notes 1, 2, 3
(Notes 1, 3
= 25 W)
G
Steady
State
Steady
State
TA = 25°C, t
L(pk)
Parameter
Symbol Value Unit
stg
60 V
"20 V
58
107
10
3.1
190 A
−55 to 175
58 A 40 mJ
260 °C
1.4
48
DSS
GS
Tmb = 25°C
Tmb = 100°C 41
Tmb = 25°C
Tmb = 100°C 54
TA = 25°C
TA = 100°C 7.0
TA = 25°C
TA = 100°C 1.6
= 10 ms
p
= 28.3 A,
I
D
P
D
I
D
P
D
I
DM
S
E
AS
T
L
Symbol Value Unit
R
Y
J−mb
q
JA
2
, 2 oz. Cu pad.
A
W
A
W
°C
°C/W
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G1
V
(BR)DSS
60 V
R
DS(on)
13 mW @ 10 V
16.5 mW @ 4.5 V
Dual N−Channel
D1
S1
MAX ID MAX
58 A
D2
G2
S2
MARKING DIAGRAM
D1
1
DFN8 5x6
(SO8FL)
CASE 506BT
5873NL = Specific Device Code
5873LW = Specific Device Code
A = Assembly Location Y = Year W = Work Week ZZ = Lot Traceability
S1 G1 S2 G2
for NVMFD5873NL
for NVMFD5873NLWF
D1
5873xx
AYWZZ
D2
D2
D1 D1 D2 D2
ORDERING INFORMATION
Device Package Shipping
NVMFD5873NLT1G DFN8
(Pb−Free)
NVMFD5873NLWFT1G DFN8
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D.
1500 / Tape &
Reel
1500 / Tape &
Reel
© Semiconductor Components Industries, LLC, 2014
September, 2014 − Rev. 3
1 Publication Order Number:
NVMFD5873NL/D
Page 2
NVMFD5873NL
ELECTRICAL CHARACTERISTICS (T
Parameter
= 25°C unless otherwise specified)
J
Symbol Test Condition Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage Drain−to−Source Breakdown Voltage
Temperature Coefficient Zero Gate Voltage Drain Current I
Gate−to−Source Leakage Current I
V
(BR)DSS
V
(BR)DSS/TJ
DSS
GSS
VGS = 0 V, ID = 250 mA
VGS = 0 V,
V
= 60 V
DS
VDS = 0 V, VGS = ±20 V ±100 nA
ON CHARACTERISTICS (Note 5)
Gate Threshold Voltage Threshold Temperature Coefficient V Drain−to−Source On Resistance R
V
GS(TH)
GS(TH)/TJ
DS(on)
VGS = VDS, ID = 250 mA
VGS = 10 V, ID = 15 A 10.7 13 mW
VGS = 4.5 V, ID = 10 A 13.6 16.5
Forward Transconductance g
FS
VDS = 5.0 V, ID = 15 A 15 S
CHARGES AND CAPACITANCES
Input Capacitance Output Capacitance C Reverse Transfer Capacitance C Total Gate Charge Q Threshold Gate Charge Q Gate−to−Source Charge Q Gate−to−Drain Charge Q Total Gate Charge Q
C
iss oss rss
G(TOT)
G(TH)
GS GD
G(TOT)
VGS = 0 V, f = 1.0 MHz, VDS = 25 V
VGS = 4.5 V, VDS = 48 V,
ID = 15 A
VGS = 10 V, VDS = 48V, ID = 15 A 30.5 nC
SWITCHING CHARACTERISTICS (Note 6)
Turn−On Delay Time Rise Time t Turn−Off Delay Time t Fall Time t Turn−On Delay Time t Rise Time t Turn−Off Delay Time t Fall Time t
t
d(on)
d(off)
d(on)
d(off)
r
f
r
f
VGS = 4.5 V, VDS = 48 V,
= 15 A, RG = 2.5 W
I
D
VGS = 10 V, VDS = 48 V,
= 15 A, RG = 2.5 W
I
D
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Time t Charge Time t Discharge Time t Reverse Recovery Charge Q
V
SD
RR
a
b RR
VGS = 0 V,
I
= 15 A
S
VGS = 0 V, dIS/dt = 100 A/ms,
I
= 15 A
S
5. Pulse Test: pulse width = 300 ms, duty cycle v 2%.
6. Switching characteristics are independent of operating junction temperatures.
60 V
54.9 mV/°C
TJ = 25°C 1.0 mA
TJ = 125°C 100
1.5 2.5 V
−5.8 mV/°C
1560
145
98
16.5
1.3
4.0
8.8
10.8 51 21
42.6
9.5 13 25
6.6
TJ = 25°C 0.8 1.0
TJ = 125°C 0.7
22.4
14.5
9.0 18 nC
pF
nC
ns
ns
V
ns
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NVMFD5873NL
TYPICAL CHARACTERISTICS
80
10 V
60
40
20
, DRAIN CURRENT (A)
D
I
0
0.0 1.0 2.0 3.0 4.0 5.0 VDS, DRAIN−TO−SOURCE VOLTAGE (V) VGS, GATE−TO−SOURCE VOLTAGE (V)
4.5 V
VGS = 3.0 V
TJ = 25°C
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
0.025 ID = 15 A
T
0.020
0.015
0.010
3.8 V
3.4 V
= 25°C
J
80
VDS 10 V
60
40
TJ = 25°C
20
, DRAIN CURRENT (A)
D
I
0.0200
0.0175
0.0150
0.0125
0.0100
0.0075
TJ = 125°C
0
2.0 2.5 3.0 3.5 4.0 4.5
TJ = 25°C
TJ = −55°C
VGS = 4.5 V
VGS = 10 V
, DRAIN−TO−SOURCE RESISTANCE (W)
0.005
2345678910
DS(on)
R
2.4
2.2
2.0
1.8
1.6
1.4
1.2
, DRAIN−TO−SOURCE
1.0
DS(on)
R
RESISTANCE (NORMALIZED)
0.8
0.6
−50 −25 0 25 50 75 100 125 150 175
VGS, GATE−TO−SOURCE VOLTAGE (V) ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. V
ID = 15 A
= 10 V
V
GS
TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (V)
GS
Figure 5. On−Resistance Variation with
Temperature
, DRAIN−TO−SOURCE RESISTANCE (W)
0.0050 5 1015202530
DS(on)
R
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
100000
VGS = 0 V
10000
, LEAKAGE (nA)
1000
DDS
I
100
10 20 30 40 50 60
TJ = 150°C
TJ = 125°C
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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NVMFD5873NL
TYPICAL CHARACTERISTICS
2000
VGS = 0 V
C
iss
= 25°C
T
J
1500
1000
500
C, CAPACITANCE (pF)
C
oss
C
rss
0
0 102030405060
VDS, DRAIN−TO−SOURCE VOLTAGE (V) Qg, TOTAL GATE CHARGE (nC)
Figure 7. Capacitance Variation Figure 8. Gate−to−Source and
1000
VDS = 48 V
= 15 A
I
D
V
= 10 V
GS
100
t
d(off)
t
f
t
r
10
Q
T
8
6
Q
4
gs
Q
gd
2
, GATE−TO−SOURCE VOLTAGE (V)
GS
0
V
0 5 10 15 20 25 30 35
Drain−to−Source Voltage vs. Total Charge
80
VGS = 0 V
70
TJ = 25°C
60 50 40
TJ = 25°C
= 48 V
V
DS
I
= 15 A
D
t, TIME (ns)
10
1
1 10 100
RG, GATE RESISTANCE (W)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
100
10
1
NVMFD5873NL
, DRAIN CURRENT (A)
D
FBSOA
I
TA = 25°C, 650 mm2, 2 oz Cu Pad, V
0.1
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Rated Forward Biased
t
d(on)
, SOURCE CURRENT (A)
S
I
= 10 V
GS
Safe Operating Area
30 20 10
0
0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00 V
, SOURCE−TO−DRAIN VOLTAGE (V)
SD
Figure 10. Diode Forward Voltage vs. Current
0.01 ms
0.1 ms
1 ms
10 ms
1001010.1
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NVMFD5873NL
TYPICAL CHARACTERISTICS
100
Duty Cycle = 50%
20%
10
10%
5% 2%
1
(°C/W)
(t)
R
1%
0.1
Single Pulse
0.01
0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 PULSE TIME (sec)
Figure 12. Thermal Response
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Page 6
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DFN8 5x6, 1.27P Dual Flag (SO8FLDual)
1
SCALE 2:1
PIN ONE
IDENTIFIER
NOTE 7
0.10 C
0.10 C
NOTE 4
DETAIL B
M
N
4X
G
BOTTOM VIEW
D
D1
78
1234
TOP VIEW
SIDE VIEW
D2
D3
e
14
8
K1
5
56
2X
4X
b1
0.20 C
A
E1
E
A
DETAIL A
L
4X
K
E2
b
8X
B
C
0.05
2X
0.20 C
c
SEATING
PLANE
NOTE 6
DETAIL B
ALTERNATE
CONSTRUCTION
C
A0.10 B
C
NOTE 3
CASE 506BT
ISSUE E
DETAIL A
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.30 MM FROM THE TERMINAL TIP.
4. PROFILE TOLERANCE APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS.
5. DIMENSIONS D1 AND E1 DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS.
6. SEATING PLANE IS DEFINED BY THE TERMINALS. A1 IS DEFINED AS THE DISTANCE FROM THE SEATING PLANE TO THE LOWEST POINT ON THE PACKAGE BODY.
7. A VISUAL INDICATOR FOR PIN 1 MUST BE LOCATED IN THIS AREA.
4X
h
GENERIC
MARKING DIAGRAM*
A1
*This information is generic. Please refer
to device data sheet for actual part marking.
1
XXXXXX
AYWZZ
XXXXXX= Specific Device Code A = Assembly Location Y = Year W = Work Week ZZ = Lot Traceability
SOLDERING FOOTPRINT*
4.56
8X
0.75
4.84
2.30
DATE 26 FEB 2013
MILLIMETERS
3.70
MAX
0.42
4.90
4.10
5.90
4.15
0.55
0.61
3.50
0.56
6.59
DIM MIN
A 0.90
A1 −−−
b 0.33
b1 0.33 0.42
c 0.20
D 5.15 BSC D1 4.70 D2 3.90 D3 1.50 1.70
E 6.15 BSC E1 5.70 E2 3.90
e 1.27 BSC
G 0.45
h −−−
K 0.51 K1 0.56 −−−
L 0.48 M 3.25 N 1.80 2.00
2X
2.08
4X
1.40
−−−
−−−
−−−
−−−
−−−
2X
MAX
1.10
0.05
0.51
0.51
0.33
5.10
4.30
1.90
6.10
4.40
0.65 12
−−−
−−−
0.71
3.75
2.20
_
0.70
4X
1.00
1.27 PITCH
5.55
DIMENSION: MILLIMETERS
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others.
© Semiconductor Components Industries, LLC, 2019
98AON50417E
DFN8 5X6, 1.27P DUAL FLAG (SO8FLDUAL)
Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
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