• NVD Prefix for Automotive and Other Applications Requiring
• These Devices are Pb−Free and are RoHS Compliant
DS(on)
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
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I
V
(BR)DSS
100 V81 mW @ 10 V17 A
R
DS(on)
MAX
D
D
(Note 1)
MAX
MAXIMUM RATINGS (T
Parameter
Drain−to−Source VoltageV
Gate−to−Source Voltage − ContinuousV
Continuous Drain
Current
Power DissipationSteady
Pulsed Drain Current
Operating and Storage Temperature RangeTJ, T
Source Current (Body Diode)I
Single Pulse Drain−to−Source Avalanche
Energy (V
I
L(pk)
Lead Temperature for Soldering
Purposes, 1/8″ from Case for 10 Seconds
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
= 50 Vdc, VGS = 10 Vdc,
DD
= 17 A, L = 0.3 mH, RG = 25 W)
= 25°C unless otherwise noted)
J
Steady
State
State
TC = 25°C
TC = 100°C11
TC = 25°CP
tp = 10 ms
SymbolValueUnit
stg
100V
±20V
17
71W
62A
−55 to
+175
17A
43mJ
260°C
A
°C
I
E
DSS
GS
I
D
D
DM
S
AS
T
L
THERMAL RESISTANCE RATINGS
ParameterSymbolMaxUnit
Junction−to−Case (Drain) Steady State
Junction−to−Ambient (Note 1)
1. Surface mounted on FR4 board using 1 sq in pad size,
(Cu Area 1.127 sq in [2 oz] including traces).
R
q
JC
R
q
JA
2.1
40
°C/W
G
2
1
3
DPAK
CASE 369AA
STYLE 2
4
N−Channel
S
1
2
IPAK
CASE 369D
STYLE 2
4
3
MARKING DIAGRAM
& PIN ASSIGNMENTS
4 Drain
AYWW6416ANG
1
Gate
Drain
A= Assembly Location*
Y= Year
WW= Work Week
6416AN = Device Code
G= Pb−Free Package
* The Assembly Location code (A) is front side
optional. In cases where the Assembly Location is
stamped in the package, the front side assembly
code may be blank.
See detailed ordering and shipping information on page 5 of
this data sheet.
1Publication Order Number:
NTD6416AN/D
NTD6416AN, NVD6416AN
ELECTRICAL CHARACTERISTICS (T
Parameter
= 25°C unless otherwise noted)
J
SymbolTest ConditionMinTypMaxUnit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
Drain−to−Source Breakdown Voltage
V
(BR)DSS
V
(BR)DSS/TJ
VGS = 0 V, ID = 250 mA
100V
112mV/°C
Temperature Coefficient
Zero Gate Voltage Drain CurrentI
Gate−to−Source Leakage CurrentI
DSS
GSS
VGS = 0 V,
V
= 100 V
DS
VDS = 0 V, VGS = "20 V±100nA
TJ = 25°C1.0mA
TJ = 125°C10
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
Negative Threshold Temperature
V
GS(TH)
V
GS(TH)/TJ
VGS = VDS, ID = 250 mA
2.04.0V
7.7mV/°C
Coefficient
Drain−to−Source On−ResistanceR
Forward Transconductanceg
DS(on)
FS
VGS = 10 V, ID = 17 A7381
VDS = 5 V, ID = 10 A12
mW
S
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance
C
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
G(TOT)
Threshold Gate ChargeQ
Gate−to−Source ChargeQ
Gate−to−Drain ChargeQ
Plateau VoltageV
Gate ResistanceR
ISS
OSS
RSS
G(TH)
GS
GD
GP
G
VGS = 0 V, f = 1.0 MHz, VDS = 25 V
VGS = 10 V, VDS = 80 V, ID = 17 A
620
110
50
20
1.0
3.6
10
5.8V
2.4
pF
nC
W
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
t
Rise Timet
Turn−Off Delay Timet
Fall Timet
d(on)
r
d(off)
f
VGS = 10 V, VDD = 80 V,
= 17 A, RG = 6.1 W
I
D
9.2
22
24
20
ns
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Timet
Charge Timet
Discharge Timet
Reverse Recovery ChargeQ
V
SD
rr
a
b
RR
VGS = 0 V, IS = 17 A
VGS = 0 V, dIS/dt = 100 A/ms,
I
= 17 A
S
TJ = 25°C0.851.2
TJ = 125°C0.7
56
41
15
135nC
V
ns
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Surface mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces).
4. Switching characteristics are independent of operating junction temperatures.
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2
NTD6416AN, NVD6416AN
TYPICAL CHARACTERISTICS
40
TJ = 25°C
30
10 V
7.5 V
6.5 V
6.0 V
20
5.5 V
, DRAIN CURRENT (A)
10
D
I
0
5.0 V
4.5 V
0246810
V
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
Figure 1. On−Region Characteristics
0.11
ID = 17 A
= 25°C
T
0.10
0.09
J
40
VDS w 10 V
35
30
25
20
15
, DRAIN CURRENT (A)
10
D
I
TJ = 125°C
TJ = 25°C
5
0
TJ = −55°C
2345678
V
, GATE−TO−SOURCE VOLTAGE (V)
GS
Figure 2. Transfer Characteristics
0.25
VGS = 10 V
0.20
0.15
TJ = 175°C
TJ = 125°C
0.08
0.07
, DRAIN−TO−SOURCE RESISTANCE (W)
0.06
5678910
DS(on)
R
, GATE−TO−SOURCE VOLTAGE (V)
V
GS
Figure 3. On−Region versus Gate Voltage
3
ID = 17 A
= 10 V
V
GS
2.5
2
1.5
(NORMALIZED)
1
, DRAIN−TO−SOURCE RESISTANCE
0.5
−50 −250255075100 125 150 175
DS(on)
R
T
, JUNCTION TEMPERATURE (°C)
J
Figure 5. On−Resistance Variation with
Temperature
0.10
TJ = 25°C
0.05
, DRAIN−TO−SOURCE RESISTANCE (W)
TJ = −55°C
0.00
DS(on)
R
1020812
I
, DRAIN CURRENT (A)
D
141618
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
10000
, LEAKAGE (nA)
DSS
I
VGS = 0 V
1000
TJ = 150°C
100
TJ = 125°C
10
102030405060708090 100
, DRAIN−TO−SOURCE VOLTAGE (V)
V
DS
Figure 6. Drain−to−Source Leakage Current
versus Voltage
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3
NTD6416AN, NVD6416AN
TYPICAL CHARACTERISTICS
1200
1000
TJ = 25°C
= 0 V
V
GS
800
C
600
iss
400
C, CAPACITANCE (pF)
200
C
C
rss
0
oss
0 20406080100
V
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
Figure 7. Capacitance Variation
1000
VDS = 80 V
= 17 A
I
D
V
= 10 V
GS
t
100
d(off)
t
r
10
8
V
DS
Q
gs
6
Q
T
V
GS
Q
gd
4
2
, GATE−TO−SOURCE VOLTAGE (V)
GS
V
0
ID = 17 A
= 25°C
T
J
05101520
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate−to−Source Voltage and
Drain−to−Source Voltage versus Total Charge
20
TJ = 25°C
= 0 V
V
GS
15
10
100
80
60
40
20
0
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
V
t, TIME (ns)
10
1
110100
t
f
, GATE RESISTANCE (W)
R
G
Figure 9. Resistive Switching Time Variation
versus Gate Resistance
1000
100
10 ms
10
VGS = 10 V
SINGLE PULSE
, DRAIN CURRENT (A)
D
I
TC = 25°C
1
R
DS(on)
LIMIT
100 ms
1 ms
10 ms
dc
THERMAL LIMIT
0.1
PACKAGE LIMIT
1101001000
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
t
d(on)
5
, SOURCE CURRENT (A)
S
I
0
0.50.60.70.80.91.0
, SOURCE−TO−DRAIN VOLTAGE (V)
V
SD
Figure 10. Diode Forward Voltage versus
Current
50
ID = 17 A
40
30
20
10
AVALANCHE ENERGY (mJ)
0
255075100125150175
TJ, STARTING JUNCTION TEMPERATURE
Figure 12. Maximum Avalanche Energy versus
Starting Junction Temperature
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4
NTD6416AN, NVD6416AN
TYPICAL CHARACTERISTICS
10
1
D = 0.5
0.2
0.1
0.1
0.05
0.02
R(t) (°C/W)
ORDERING INFORMATION
NTD6416ANT4GDPAK
NTD6416AN−1GIPAK
NVD6416ANT4G*DPAK
NVD6416ANT4G−VF01*DPAK
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specification Brochure, BRD8011/D.
*NVD Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP
Capable.
0.01
0.01
SINGLE PULSE
0.001
0.0000010.000010.00010.0010.010.1110
t, PULSE TIME (s)
Figure 13. Thermal Response
DevicePackageShipping†
(Pb−Free)
(Pb−Free)
(Pb−Free)
(Pb−Free)
2500 / Tape & Reel
75 Units / Rail
2500 / Tape & Reel
2500 / Tape & Reel
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
IPAK
CASE 369D−01
ISSUE C
DATE 15 DEC 2010
SCALE 1:1
STYLE 1:
PIN 1. BASE
STYLE 5:
PIN 1. GATE
V
S
−T−
SEATING
PLANE
F
2. COLLECTOR
3. EMITTER
4. COLLECTOR
2. ANODE
3. CATHODE
4. ANODE
B
R
4
123
G
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
STYLE 6:
PIN 1. MT1
2. MT2
3. GATE
4. MT2
A
K
3 PL
D
0.13 (0.005)T
STYLE 3:
PIN 1. ANODE
STYLE 7:
PIN 1. GATE
C
J
M
2. CATHODE
3. ANODE
4. CATHODE
2. COLLECTOR
3. EMITTER
4. COLLECTOR
E
H
STYLE 4:
PIN 1. CATHODE
2. ANODE
3. GATE
4. ANODE
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
Z
DIM MINMAXMIN MAX
A 0.235 0.2455.976.35
B 0.250 0.2656.356.73
C 0.086 0.0942.192.38
D 0.027 0.0350.690.88
E 0.018 0.0230.460.58
F 0.037 0.0450.941.14
0.090 BSC2.29 BSC
G
H 0.034 0.0400.871.01
J 0.018 0.0230.460.58
K 0.350 0.3808.899.65
R 0.180 0.2154.455.45
S 0.025 0.0400.631.01
V 0.035 0.0500.891.27
Z 0.155−−−3.93−−−
MILLIMETERSINCHES
MARKING
DIAGRAMS
Integrated
Discrete
YWW
xxxxxxxx
Circuits
xxxxx
ALYWW
x
xxxxxxxxx = Device Code
A= Assembly Location
lL= Wafer Lot
Y= Year
WW= Work Week
DOCUMENT NUMBER:
DESCRIPTION:
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
98AON10528D
IPAK (DPAK INSERTION MOUNT)
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
98AON13126D
DPAK (SINGLE GAUGE)
2.58
0.102
3.00
0.118
0.063
1.60
SCALE 3:1
6.17
0.243
ǒ
inches
XXXXXXG
ALYWW
YWW
XXX
XXXXXG
DiscreteIC
XXXXXX = Device Code
A= Assembly Location
L= Wafer Lot
Y= Year
WW= Work Week
G= Pb−Free Package
*This information is generic. Please refer
to device data sheet for actual part
mm
Ǔ
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
marking.
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