• Small Footprint (3.3 x 3.3 mm) for Compact Design
• Low R
to Minimize Conduction Losses
DS(on)
• Low Capacitance to Minimize Driver Losses
• These Devices are Pb−Free and are RoHS Compliant
MAXIMUM RATINGS (T
Parameter
Drain−to−Source VoltageV
Gate−to−Source VoltageV
Continuous Drain Current R
2, 3, 4)
Power Dissipation
R
Y
J−mb
Continuous Drain Current R
3, 4)
Power Dissipation
R
q
JA
Pulsed Drain Current
Operating Junction and Storage TemperatureTJ, T
Source Current (Body Diode)I
Single Pulse Drain−to−Source Avalanche
Energy (T
I
L(pk)
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
(Notes 1,
Y
J−mb
(Notes 1, 2, 3)
(Notes 1 &
q
JA
(Notes 1, 3)
= 25°C, VDD = 50 V, VGS = 10 V,
J
= 36 A, L = 1.0 mH, RG = 25 W)
THERMAL RESISTANCE MAXIMUM RATINGS (Note 1)
Parameter
Junction−to−Mounting Board (top) − Steady
State (Note 2 and 3)
Junction−to−Ambient − Steady State (Note 3)
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2. Psi (Y) is used as required per JESD51−12 for packages in which
substantially less than 100% of the heat flows to single case surface.
3. Surface−mounted on FR4 board using a 650 mm
4. Continuous DC current rating. Maximum current for pulses as long as 1
second is higher but is dependent on pulse duration and duty cycle.
= 25°C unless otherwise noted)
J
SymbolValueUnit
Tmb = 25°C
Steady
State
Steady
State
TA = 25°C, t
Tmb = 100°C28
Tmb = 25°C
Tmb = 100°C10
TA = 25°C
TA = 100°C11
TA = 25°C
TA = 100°C1.6
= 10 ms
p
P
P
I
E
SymbolValueUnit
R
Y
R
q
2
, 2 oz. Cu pad.
DSS
GS
I
D
D
I
D
D
DM
S
AS
T
L
J−mb
JA
stg
40V
±20V
40
21
16
3.2
354A
−55 to
+175
17A
65mJ
260°C
7.2
47
A
W
A
W
°C
°C/W
www.onsemi.com
V
(BR)DSS
40 V
R
DS(on)
6.7 mW @ 10 V
10 mW @ 4.5 V
N−Channel MOSFET
D (5−8)
G (4)
MAXID MAX
40 A
S (1,2,3)
MARKING DIAGRAM
1
1
WDFN8
(m8FL)
CASE 511AB
5811= Specific Device Code
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
(Note: Microdot may be in either location)
S
5811
S
AYWWG
S
G
G
D
D
D
D
ORDERING INFORMATION
See detailed ordering, marking and shipping information in the
package dimensions section on page 5 of this data sheet.
6. Switching characteristics are independent of operating junction temperatures.
40V
TJ = 25°C1.0mA
TJ = 125°C10
1.52.2V
1570
215
157
17nC
1
5
9
11
55
20
40
TJ = 25°C0.831.2
TJ = 125°C0.70
22
12
10
17nC
pF
nC
ns
V
ns
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2
Page 3
NTTFS5811NL
0
TYPICAL CHARACTERISTICS
100
10 V
90
80
70
60
50
40
30
, DRAIN CURRENT (A)
D
20
I
10
0
012345
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 1. On−Region Characteristics
0.016
0.014
0.012
0.010
0.008
4.6 V
VGS = 5 V
TJ = 25°C
4.2 V
4.0 V
3.8 V
3.6 V
3.4 V
3.2 V
3.0 V
ID = 20 A
= 25°C
T
J
80
VDS ≥ 10 V
70
60
50
40
30
20
, DRAIN CURRENT (A)
D
I
10
0
12345
TJ = 25°C
TJ = 125°C
VGS, GATE−TO−SOURCE VOLTAGE (V)
TJ = −55°C
Figure 2. Transfer Characteristics
0.012
TJ = 25°C
0.010
0.008
0.006
VGS = 4.5 V
VGS = 10 V
0.006
, DRAIN−TO−SOURCE RESISTANCE (W)
0.004
2468
DS(on)
R
VGS, GATE−TO−SOURCE VOLTAGE (V)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
2.00
ID = 20 A
1.80
VGS = 10 V
1.60
1.40
1.20
, DRAIN−TO−SOURCE
1.00
DS(on)
0.80
R
RESISTANCE (NORMALIZED)
0.60
−50 −250255075100 125 150175
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
0.004
, DRAIN−TO−SOURCE RESISTANCE (W)
0.002
10
DS(on)
R
100000
10000
, LEAKAGE (nA)
1000
DSS
I
100
5 10152025303540455055606570
ID, DRAIN CURRENT (A)
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
VGS = 0 V
TJ = 150°C
TJ = 125°C
1020304
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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3
Page 4
NTTFS5811NL
5
TYPICAL CHARACTERISTICS
2200
2000
1800
1600
C
iss
VGS = 0 V
TJ = 25°C
1400
1200
1000
800
600
C, CAPACITANCE (pF)
400
200
0
C
rss
0 10203040
C
oss
DRAIN−TO−SOURCE VOLTAGE (V)
Figure 7. Capacitance Variation
1000
VDD = 32 V
= 20 A
I
D
V
= 4.5 V
GS
100
t
r
t
f
t
t, TIME (ns)
10
d(off)
t
d(on)
10
Q
T
8
6
(V)
4
Q
gs
2
, GATE−TO−SOURCE VOLTAGE
GS
V
0
051015202530
Q
gd
VDS = 32 V
I
D
T
J
Qg, TOTAL GATE CHARGE (nC)
Figure 8. Gate−to−Source Voltage vs. Total
Charge
60
VGS = 0 V
TJ = 25°C
50
40
30
20
, SOURCE CURRENT (A)
S
10
I
= 20 A
= 25°C
1.0
110100
RG, GATE RESISTANCE (W)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
1000
, DRAIN CURRENT (A)
D
I
VGS = 10 V
Single Pulse
TC = 25°C
100
10
1
R
Limit
DS(on)
Thermal Limit
Package Limit
0.1
0.1110100
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
10 ms
100 ms
1 ms
10 ms
dc
0
0.50.60.70.80.9
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 10. Diode Forward Voltage vs. Current
60
50
40
30
20
, SINGLE PULSE DRAIN−TO−
10
AS
E
SOURCE AVALANCHE ENERGY (mJ)
0
25507510012515017
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy vs.
Starting Junction Temperature
1.0
ID = 36 A
www.onsemi.com
4
Page 5
NTTFS5811NL
0
TYPICAL CHARACTERISTICS
100
Duty Cycle = 0.5
10
0.1
THERMAL RESISTANCE
(°C/W) EFFECTIVE TRANSIENT
JA(t)
q
0.01
R
0.0000010.000010.00010.0010.010.1110100100
DEVICE ORDERING INFORMATION
NTTFS5811NLTAG5811WDFN8
NTTFS5811NLTWG5811WDFN8
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
0.2
0.1
0.05
0.02
1
0.01
Single Pulse
PULSE TIME (sec)
Figure 13. Thermal Response
DeviceMarkingPackageShipping
(Pb−Free)
(Pb−Free)
†
1500 / Tape & Reel
1500 / Tape & Reel
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5
Page 6
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
1
SCALE 2:1
0.05
E2
G
0.10 C
0.10 C
8X
C
A0.10B
C
4X
E3
1234
TOP VIEW
SIDE VIEW
b
L
14
8
BOTTOM VIEW
78
D
D1
D2
56
5
2X
E1
e/2
K
C
0.20
A
B
E
A
DETAIL A
M
L1
2X
0.20 C
c
WDFN8 3.3x3.3, 0.65P
CASE 511AB
ISSUE D
4X
q
A1
6X
e
DETAIL A
C
SEATING
PLANE
0.75
DATE 23 APR 2012
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH
PROTRUSIONS OR GATE BURRS.
DIM MINNOM
MILLIMETERS
A0.700.75
A10.00−−−
b0.230.30
c0.150.20
D
D12.953.05
D21.982.11
E
E12.953.05
E21.471.60
E30.230.300.40
e0.65 BSC
G0.300.41
K0.650.80
L0.300.43
L10.060.13
M1.401.50
q0 −−−
3.30 BSC
3.30 BSC
_
MAX
0.80
0.05
0.40
0.25
3.15
2.24
3.15
1.73
0.51
0.95
0.56
0.20
1.60
12
_
INCHES
MINNOM
0.028 0.030
0.000−−−
0.009 0.012
0.006 0.008
0.130 BSC
0.116 0.120
0.078 0.083
0.130 BSC
0.116 0.120
0.058 0.063
0.009 0.0120.016
0.026 BSC
0.012 0.016
0.026 0.032
0.012 0.017
0.002 0.005
0.055 0.059
0 −−−
_
MAX
0.031
0.002
0.016
0.010
0.124
0.088
0.124
0.068
0.020
0.037
0.022
0.008
0.063
12
SOLDERING FOOTPRINT*
PACKAGE
OUTLINE
0.57
8X
0.650.42
PITCH
2.30
4X
0.66
3.60
_
GENERIC
MARKING DIAGRAM*
1
XXXXX
AYWWG
G
XXXXX = Specific Device Code
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
*This information is generic. Please refer
to device data sheet for actual part
marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
DOCUMENT NUMBER:
DESCRIPTION:
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ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
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98AON30561E
WDFN8 3.3X3.3, 0.65P
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
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