ON Semiconductor NTB90N02, NTP90N02 Technical data

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NTB90N02, NTP90N02
Power MOSFET 90 Amps, 24 Volts
N−Channel D2PAK and TO−220
Designed for low voltage, high speed switching applications in power supplies, converters and power motor controls and bridge circuits.
Typical Applications
Power Supplies
Converters
Power Motor Controls
Bridge Circuits
(BR)DSS
24 V
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R
TYP
DS(on)
5.0 m @ 10 V
7.5 m @ 4.5 V
ID MAXV
90 A
MAXIMUM RATINGS (T
Drain−to−Source Voltage V
Gate−to−Source Voltage
− Continuous
Drain Current
− Continuous @ T
− Single Pulse (t
Total Power Dissipation @ TA = 25°C
Derate above 25°C
Operating and Storage Temperature TJ, T
Single Pulse Drain−to−Source Avalanche
Energy − Starting T (V
= 28 Vdc, VGS = 10 Vdc, L = 5.0 mH,
DD
I
= 17 A, RG = 25 )
L(pk)
Thermal Resistance
Junction−to−Case Junction−to−Ambient (Note 1)
Maximum Lead Temperature for Soldering Pur­poses, 1/8 from case for 10 seconds
1. When surface mounted to an FR4 board using 1 pad size,
(Cu Area 1.127 in
2. When surface mounted to an FR4 board using minimum recommended pad
size, (Cu Area 0.412 in
*Chip current capability limited by package.
= 25°C unless otherwise noted)
J
Rating
= 25°C
A
= 10 s)
p
= 25°C
J
2
).
2
).
Symbol Value Unit
D
stg
JC JA
L
24 Vdc
20
0.66WW/°C
+150
1.55
Vdc
90*
200
85
−55
733 mJ
70
260 °C
°C
to
°C/W
A A
R R
V
I
E
DSS
GS
I
D
DM
P
AS
 
T
1
Gate
2
3
4
Drain
NTx90N02 LLYWW
1
Drain
4
1
TO−220AB
CASE 221A
Style 5
MARKING DIAGRAMS
& PIN ASSIGNMENTS
NTx90N02 LLYWW
3 Source
2
NTx90N02 = Device Code x = P or B LL = Location Code Y = Year WW = Work Week
1
Gate
2
3
2
D
PAK
CASE 418B
Style 2
4
Drain
2
Drain
4
3 Source
N−Channel
D
G
S
Semiconductor Components Industries, LLC, 2003
October, 2003 − Rev. 1
ORDERING INFORMATION
Device Package Shipping
NTP90N02 TO−220AB 50 Units/Rail NTB90N02 D2PAK 50 Units/Rail NTB90N02T4 D2PAK 800/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
1 Publication Order Number:
NTB90N02/D
NTB90N02, NTP90N02
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
J
Characteristic
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage (Note 3)
(VGS = 0 Vdc, ID = 250 Adc)
Temperature Coefficient (Positive) Zero Gate Voltage Drain Current
= 24 Vdc, VGS = 0 Vdc)
(V
DS
(V
= 24 Vdc, VGS = 0 Vdc, TJ = 150°C)
DS
Gate−Body Leakage Current (VGS =  20 Vdc, VDS = 0 Vdc) I
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage (Note 3)
(V
= VGS, ID = 250 Adc)
DS
Threshold Temperature Coefficient (Negative) Static Drain−to−Source On−Resistance (Note 3)
= 10 Vdc, ID = 90 Adc)
(V
GS
= 4.5 Vdc, ID = 40 Adc)
(V
GS
(V
= 10 Vdc, ID = 20 Adc)
GS
= 4.5 Vdc, ID = 20 Adc)
(V
GS
Forward Transconductance (Note 3) (VDS = 15 Vdc, ID = 10 Adc) g
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance
(VDS = 20 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
Transfer Capacitance C
SWITCHING CHARACTERISTICS (Note 4)
(V
Turn−On Delay Time Rise Time
= 20 Vdc, ID = 20 Adc,
DD
VGS = 4.5 Vdc, RG = 2.5 )
Turn−Off Delay Time t Fall Time t Gate Charge (VDS = 20 Vdc, ID = 20 Adc,
VGS = 4.5 Vdc) (Note 3)
SOURCE−DRAIN DIODE CHARACTERISTICS
Forward On−Voltage (IS = 2.3 Adc, VGS = 0 Vdc)
(IS = 40 Adc, VGS = 0 Vdc) (Note 3)
(I
= 2.3 Adc, VGS = 0 Vdc, TJ = 150°C)
S
Reverse Recovery Time (IS = 2.3 Adc, VGS = 0 Vdc,
dIS/dt = 100 A/s) (Note 3)
Reverse Recovery Stored Charge Q
3. Pulse Test: Pulse Width ≤300 s, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
Symbol Min Typ Max Unit
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
C
C
t
d(on)
d(off)
Q
Q Q
V
t t t
FS
iss oss rss
t
SD
rr
a
b RR
24
27 25
1.0 10
±100 nAdc
1.0
1.9
−3.8
5.0
7.5
5.0
7.5
3.0
5.8
9.0
5.8
9.0
25 mhos
2120
900
360
16
r
90
28
f
T 1 2
60
29
8.0
20
0.75
1.2
0.65
1.0
40
21
18
0.036 C
Vdc
mV/°C
Adc
Vdc
mV/°C
m
pF
ns
nC
Vdc
ns
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2
NTB90N02, NTP90N02
100
9 V
90 80 70 60
50
8 V
4.6 V
4.8 V
5 V
6.5 V
40
30
20
, DRAIN CURRENT (AMPS)
D
I
10
0
0.5 43.5
0
V
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
Figure 1. On−Region Characteristics
0.07
0.06
0.05
0.04
4.4 V
5.2 V 6 V
TJ = 25°C
21.51
2.5 3
4.2 V
4 V
3.8 V
3.6 V
3.4 V
3.2 V
VGS = 3.0 V
ID = 10 A T
= 25°C
J
160 150 140
VDS 24 V
130 120 110 100
90 80 70
TJ = 25°C
60 50 40
TJ = 125°C
30 20
, DRAIN CURRENT (AMPS)
10
D
I
0
23 6
V
TJ = −55°C
45
, GATE−TO−SOURCE VOLTAGE (V)
GS
Figure 2. Transfer Characteristics
0.015 TJ = 25°C
0.01
VGS = 4.5 V
0.03
0.02
0.01
, DRAIN−TO−SOURCE RESISTANCE ()
0
DS(on)
R
0
26810
4
VGS, GATE−TO−SOURCE VOLTAGE (V)
Figure 3. On−Resistance versus
Gate−To−Source Voltage
0.015
0.0125
ID = 90 A V
= 4.5 V
DS
0.001
0.0075
0.005
0.0025
0
−50 100750−25 125 150
, DRAIN−TO−SOURCE RESISTANCE (NORMALIZED)
5025
TJ, JUNCTION TEMPERATURE (°C)
DS(on)
R
Figure 5. On−Resistance Variation with
Temperature
ID = 10 A V
= 10 V
DS
VGS = 10 V
0.005
, DRAIN−TO−SOURCE RESISTANCE ()
0
55
DS(on)
R
60 65 70 75 80
85 90
ID, DRAIN CURRENT (A)
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
1000
VGS = 0 V
100
TJ = 125°C
TJ = 100°C
10
1
, LEAKAGE (nA)
DSS
I
0.1
0.01 41612820
TJ = 25°C
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 6. Drain−To−Source Leakage
Current versus Voltage
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3
NTB90N02, NTP90N02
5000
4000
VGS = 0 V
TJ = 25°C
3000
C
iss
2000
C
oss
C, CAPACITANCE (pF)
1000
C
rss
0
−8 −6 −4 −2
0 2 4 6 8 1012141618202224
VGSV
DS
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (V)
Figure 7. Capacitance Variation Figure 8. Gate−to−Source and
1000
VDD = 20 V I
= 20 A
D
= 10 V
V
GS
t
d(off)
t
d(on)
t
r
t
f
10 100
RG, GATE RESISTANCE ()
100
t, TIME (ns)
10
1
1
10
Q
8
V
D
6
Q
1
4
T
V
GS
Q
2
2
, GATE−TO−SOURCE VOLTAGE (V)
GS
V
0
010
20 30 40 50
Q
, TOTAL GATE CHARGE (nC)
g
ID = 1.0 A T
= 25°C
J
Drain−to−Source Voltage versus Total Charge
90
VGS = 0 V
80
T
= 25°C
J
70 60 50 40 30 20
, SOURCE CURRENT (AMPS)
S
I
10
0
0.55 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00 VSD, SOURCE−TO−DRAIN VOLTAGE (V)
28 24 20 16 12 8 4
0
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
−V
Figure 9. Resistive Switching Time Variation
versus Gate Resistance
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Figure 10. Diode Forward Voltage versus
Current
4
NTB90N02, NTP90N02
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (t) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that
t QI
G(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, V
. Therefore, rise and fall
SGP
times may be approximated by the following:
tr Q2 R210(VGG V tf Q2 R2V
GSP
GSP
)
where:
VGG= the gate drive voltage, which varies from
zero to V
RG= the gate drive resistance and Q2 and V
GG
GSP
are read from the gate charge curve.
During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network.
The equations are:
t
d(on)
RGC
In [VGG(VGG V
iss
GSP
)]
The capacitance (C
) is read from the capacitance curve
iss
at a voltage corresponding to the off−state condition when calculating t on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
t
d(off)
RGC
In (VGGV
iss
GSP
)
INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE
RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total design. The footprint for the semiconductor packages must be the correct size to ensure proper solder connection
0.33
8.38
0.42
10.66
17.02
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0.63
interface between the board and the package. With the correct pad geometry, the packages will self align when subjected to a solder reflow process.
0.08
2.032
1.016
0.12
3.05
5
0.24
6.096
0.04
inches
mm
NTB90N02, NTP90N02
SOLDER STENCIL GUIDELINES
Prior to placing surface mount components onto a printed circuit board, solder paste must be applied to the pads. Solder stencils are used to screen the optimum amount. These stencils are typically 0.008 inches thick and may be made of brass or stainless steel. For packages such as the SC−59, SC−70/SOT−323, SOD−123, SOT−23, SOT−143, SOT−223, SO−8, SO−14, SO−16, and SMB/SMC diode packages, the stencil opening should be the same as the pad size or a 1 : 1 registration. This is not the case with the DPAK
2
and D
PAK packages. If one uses a 1:1 opening to screen solder onto the drain pad, misalignment and/or “tombstoning” may occur due to an excess of solder. For these two packages, the opening in the stencil for the paste should be approximately 50% of the tab area. The opening for the leads is still a 1:1 registration. Figure 11 shows a typical stencil for the DPAK and D
2
PAK packages. The
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated temperature of the device. When the entire device is heated to a high temperature, failure to complete soldering within a short time could result in device failure. Therefore, the following items should always be observed in order to minimize the thermal stress to which the devices are subjected.
Always preheat the device.
The delta temperature between the preheat and
soldering should be 100°C or less.*
When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum temperature ratings as shown on the data sheet. When using infrared heating with the reflow soldering method, the difference shall be a maximum of 10°C.
The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
pattern of the opening in the stencil for the drain pad is not critical as long as it allows approximately 50% of the pad to be covered with paste.
SOLDER PASTE OPENINGS
STENCIL
Figure 11. Typical Stencil for DPAK and
2
D
PAK Packages
When shifting from preheating to soldering, the maximum temperature gradient shall be 5°C or less.
After soldering has been completed, the device should be allowed to cool naturally for at least three minutes. Gradual cooling should be used as the use of forced cooling will increase the temperature gradient and result in latent failure due to mechanical stress.
Mechanical stress or shock should not be applied during cooling.
* * Soldering a device without preheating can cause excessive thermal shock and stress which can result in damage to the device.
* * Due to shadowing and the inability to set the wave height to incorporate other surface mount components, the
2
D
PAK is not recommended for wave soldering.
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NTB90N02, NTP90N02
TYPICAL SOLDER HEATING PROFILE
For any given circuit board, there will be a group of control settings that will give the desired heat pattern. The operator must set temperatures for several heating zones, and a figure for belt speed. Taken together, these control settings make up a heating “profile” for that particular circuit board. On machines controlled by a computer, the computer remembers these profiles from one operating session to the next. Figure 12 shows a typical heating profile for use when soldering a surface mount device to a printed circuit board. This profile will vary among soldering systems but it is a good starting point. Factors that can affect the profile include the type of soldering system in use, density and types of components on the board, type of solder used, and the type of board or substrate material being used. This profile shows temperature versus time.
200°C
150°C
100°C
STEP 1
PREHEAT
ZONE 1 “RAMP”
DESIRED CURVE FOR HIGH
STEP 2
VENT
“SOAK”
MASS ASSEMBLIES
150°C
100°C
HEATING
ZONES 2 & 5
STEP 3
“RAMP”
The line on the graph shows the actual temperature that might be experienced on the surface of a test board at or near a central solder joint. The two profiles are based on a high density and a low density board. The Vitronics SMD310 convection/infrared reflow soldering system was used to generate this profile. The type of solder used was 62/36/2 Tin Lead Silver with a melting point between 177−189°C. When this type of furnace is used for solder reflow work, the circuit boards and solder joints tend to heat first. The components on the board are then heated by conduction. The circuit board, because it has a large surface area, absorbs the thermal energy more efficiently, then distributes this energy to the components. Because of this effect, the main body of a component may be up to 30 degrees cooler than the adjacent solder joint.
STEP 4
HEATING
ZONES 3 & 6
“SOAK”
160°C
140°C
STEP 5
HEATING
ZONES 4 & 7
“SPIKE”
170°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
(DEPENDING ON
MASS OF ASSEMBLY)
STEP 6
VENT
STEP 7
COOLING
205° TO 219°C
PEAK AT SOLDER
JOINT
5°C
DESIRED CURVE FOR LOW
MASS ASSEMBLIES
TIME (3 TO 7 MINUTES TOTAL) T
Figure 12. Typical Solder Heating Profile
MAX
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7
−T−
SEATING PLANE
−B−
G
NTB90N02, NTP90N02
PACKAGE DIMENSIONS
D2PAK
CASE 418B−04
ISSUE H
NOTES:
C
E
V
4
W
A
231
S
K
W
J
3 PL
D
0.13 (0.005) T
M
M
B
H
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. 418B−01 THRU 418B−03 OBSOLETE, NEW STANDARD 418B−04.
DIM MIN MAX MIN MAX
A 0.340 0.380 8.64 9.65 B 0.380 0.405 9.65 10.29 C 0.160 0.190 4.06 4.83 D 0.020 0.035 0.51 0.89 E 0.045 0.055 1.14 1.40 F 0.310 0.350 7.87 8.89 G 0.100 BSC 2.54 BSC H 0.080 0.110 2.03 2.79 J 0.018 0.025 0.46 0.64 K 0.090 0.110 2.29 2.79 L 0.052 0.072 1.32 1.83
M 0.280 0.320 7.11 8.13
N 0.197 REF 5.00 REF P 0.079 REF 2.00 REF R 0.039 REF 0.99 REF S 0.575 0.625 14.60 15.88 V 0.045 0.055 1.14 1.40
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
TO−220
CASE 221A−09
ISSUE AA
SEATING
−T−
PLANE
B
4
Q
123
F
T
A
U
C
S
H
K
Z
L
V
R J
G
D
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED.
DIM MIN MAX MIN MAX
A 0.570 0.620 14.48 15.75 B 0.380 0.405 9.66 10.28 C 0.160 0.190 4.07 4.82 D 0.025 0.035 0.64 0.88 F 0.142 0.147 3.61 3.73
G 0.095 0.105 2.42 2.66
H 0.110 0.155 2.80 3.93 J 0.018 0.025 0.46 0.64 K 0.500 0.562 12.70 14.27 L 0.045 0.060 1.15 1.52 N 0.190 0.210 4.83 5.33
Q 0.100 0.120 2.54 3.04
R 0.080 0.110 2.04 2.79 S 0.045 0.055 1.15 1.39 T 0.235 0.255 5.97 6.47 U 0.000 0.050 0.00 1.27 V 0.045 −−− 1.15 −−− Z −−− 0.080 −−− 2.04
STYLE 5:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
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NTB90N02, NTP90N02
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
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