Pulsed Drain Current
Operating Junction and Storage TemperatureTJ, T
Source Current (Body Diode)I
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
= 25°C unless otherwise noted)
J
RatingSymbolValueUnit
stg
−20V
"12V
−2.1
1.1
−9.0A
−55 to
150
−2.5A
260°C
A
W
°C
DSS
GS
Steady
State
t v 5 sTA = 25°C−3.0
Steady
State
t v 5 sTA = 25°C2.1
TA = 25°C
TA = 85°C−1.5
TA = 25°C
TA = 85°C0.6
tp = 10 ms
I
D
P
D
I
DM
S
T
L
THERMAL RESISTANCE RATINGS
RatingSymbolValueUnit
Junction−to−Ambient − Steady State (Note 1)R
Junction−to−Ambient − t v 5 s60
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.27 in sq
[1 oz] including traces).
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
3000/Tape & Ree
NTHD4401P/D
†
NTHD4401P
ELECTRICAL CHARACTERISTICS(T
= 25°C unless otherwise noted)
J
CharacteristicSymbolTest ConditionMinTypMaxUnit
OFF CHARACTERISTICS
Drain−to−Source Breakdown VoltageV
Drain−to−Source Breakdown Voltage Tem-
perature Coefficient
V
(Br)DSS/TJ
Zero Gate Voltage Drain CurrentI
(Br)DSS
DSS
VGS = 0 V, ID = −250 mA
VGS = 0 VTJ = 25°C−1.0mA
VDS = −16 VTJ = 85°C−5.0
Gate−to−Source Leakage CurrentI
GSS
VDS = 0 V, VGS = "12 V"100nA
ON CHARACTERISTICS (Note 2)
Gate Threshold VoltageV
Gate Threshold Temperature CoefficientV
Drain−to−Source On ResistanceR
GS(th)
GS(th)/TJ
DS(on)
VGS = VDS, ID = −250 mA
VGS = −4.5 V, ID = −2.1 A
VGS = −2.5 V, ID = −1.7 A
VGS = −1.8 V, ID = −1.0 A
Forward Transconductanceg
FS
VDS = −10 V, ID = −2.1 A5.0S
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
Threshold Gate ChargeQ
Gate−to−Source ChargeQ
Gate−to−Drain ChargeQ
iss
oss
rss
G(TOT)
G(TH)
GS
GD
VGS = 0 V, f = 1.0 MHz,
VDS = −10 V
VGS = −4.5 V, VDS = −10 V,
ID = −2.1 A
SWITCHING CHARACTERISTICS (Note 3)
Turn−On Delay Timet
Rise Timet
Turn−Off Delay Timet
Fall Timet
d(on)
r
d(off)
f
VGS = −4.5 V, VDD = −16 V,
ID = −2.1 A, RG = 2.5 W
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode VoltageV
SD
VGS = 0 V
IS = −2.5 A
Reverse Recovery Timet
Charge Timet
Discharge Timet
Reverse Recovery ChargeQ
rr
a
b
RR
VGS = 0 V, dIS/dt = 90 A/ms,
IS = −2.1 A
2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%.
3. Switching characteristics are independent of operating junction temperatures.
−20−23V
−8.0mV/°C
−0.6−0.75−1.2V
2.65mV/°C
0.130
0.200
0.155
0.240
0.34
185300
95150
3050
3.06.0
0.2
0.5
0.9
7.012
1325
3350
2740
−0.85−1.15
32
10
22
15nC
W
pF
nC
ns
V
ns
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2
NTHD4401P
4
−2.2 V
3
2
1
DRAIN CURRENT (AMPS)
D,
−I
0
0
1
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region Characteristics
0.5
0.4
0.3
0.2
TYPICAL PERFORMANCE CURVES (T
VGS = −6 V to −3 V
VGS = −2.4 V
4
−2 V
−1.8 V
−1.6 V
−1.4 V
−1.2 V
5
TJ = 25°C
632
78
ID = −2.1 A
TJ = 25°C
= 25°C unless otherwise noted)
J
4
VDS ≥ −10 V
3
2
1
DRAIN CURRENT (AMPS)
D,
−I
TC = −55°C
25°C
0
0.5
1
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
0.25
TJ = 25°C
0.225
0.2
0.175
0.15
VGS = −2.5 V
100°C
21.52.5
3
0.1
DRAIN−TO−SOURCE RESISTANCE (W)
0
16
DS(on),
R
24
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
35
Figure 3. On−Resistance vs. Gate−to−Source
0.125
DRAIN−TO−SOURCE RESISTANCE (W)
0.1
0.54.5
DS(on),
R
1.52.53.5
−ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance vs. Drain Current and
Voltage
VGS = −4.5 V
Gate Voltage
1.6
ID = −2.1 A
VGS = −4.5 V
1.4
ID = −1.0 A
VGS = −1.8 V
1.2
1.2
1
DRAIN−TO−SOURCE
0.8
DS(on),
R
RESISTANCE (NORMALIZED)
0.6
−500−2525
Figure 5. On−Resistance Variation with
50125100
75150
TJ, JUNCTION TEMPERATURE (°C)
Temperature
1
DRAIN−TO−SOURCE
DS(on),
R
RESISTANCE (NORMALIZED)
0.8
−50−250255075100125150
TJ, JUNCTION TEMPERATURE (°C)
Figure 6. On−Resistance Variation with
Temperature
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3
NTHD4401P
S)
−V
GATE−TO−SOURCE VOLTAGE (VOLTS)
0
−I
, LEAKAGE (A)
TYPICAL PERFORMANCE CURVES (T
10000
VGS = 0 V
TJ = 150°C
1000
DSS
100
TJ = 100°C
10
248
6101814
12
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 7. Drain−to−Source Leakage Current
vs. Voltage
6
−V
DS
5
4
3
2
Q2Q1
1
0
GS,
02
1
Qg, TOTAL GATE CHARGE (nC)
QT
−V
GS
ID = −2.1 A
TJ = 25°C
1.50.53.5
32.5
= 25°C unless otherwise noted)
J
600
500
VDS = 0 VVGS = 0 V
C
iss
TJ = 25°C
400
C
rss
300
200
C, CAPACITANCE (pF)
100
0
2016
50
−VGS−V
51010
DS
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLT
Figure 8. Capacitance Variation
12
10
8
6
4
2
0
t, TIME (ns)
DRAIN−TO−SOURCE VOLTAGE (VOLTS)
DS,
−V
100
10
t
d(off)
t
d(on)
t
f
t
r
VDD = −16 V
ID = −2.1 A
VGS = −4.5 V
1
101
RG, GATE RESISTANCE (OHMS)
C
oss
15
20
10
Figure 9. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
2.5
VGS = 0 V
TJ = 25°C
2
1.5
1
0.5
, SOURCE CURRENT (AMPS)
S
−I
0
−VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 11. Diode Forward Voltage vs. Current
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4
Figure 10. Resistive Switching Time Variation
vs. Gate Resistance
0.70.50.3
0.9
NTHD4401P
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.0175 Ω0.0710 Ω0.2706 Ω0.5776 Ω0.7086 Ω
0.02
0.01
r(t), NORMALIZED EFFECTIVE
SINGLE PULSE
TRANSIENT THERMAL RESISTANCE
0.01
1.0E−031.0E−021.0E−011.0E+001.0E+011.0E+021.0E+03
Chip
t, TIME (s)
Figure 12. Thermal Response
SOLDERING FOOTPRINT*
Normalized to θJA at 10s.
107.55 F1.7891 F0.3074 F0.0854 F0.0154 F
Ambient
0.457
0.018
0.66
0.026
2.032
0.08
0.711
0.028
SCALE 20:1
0.635
0.025
mm
ǒ
inches
0.635
0.025
0.457
0.018
Ǔ
0.66
0.026
2.032
0.08
Figure 13. BasicFigure 14. Style 2
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
0.254
0.010
SCALE 20:1
1.092
0.043
mm
ǒ
inches
0.178
0.007
Ǔ
BASIC PAD PATTERNS
The basic pad layout with dimensions is shown in
Figure 13. This is sufficient for low power dissipation
MOSFET applications, but power semiconductor
performance requires a greater copper pad area, particularly
for the drain leads.
The minimum recommended pad pattern shown in
Figure 14 improves the thermal area of the drain
connections (pins 5, 6, 7, 8) while remaining within the
ChipFET is a trademark of Vishay Siliconix.
http://onsemi.com
confines of the basic footprint. The drain copper area is
0.0019 sq. in. (or 1.22 sq. mm). This will assist the power
dissipation path away from the device (through the copper
leadframe) and into the board and exterior chassis (if
applicable) for the single device. The addition of a further
copper area and/or the addition of vias to other board layers
will enhance the performance still further.
5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
H
E
e1
STYLE 1:
PIN 1. DRAIN
2. DRAIN
3. DRAIN
4. GATE
5. SOURCE
6. DRAIN
7. DRAIN
8. DRAIN
8
1
SCALE 1:1
D
8765
1234
e
STYLE 2:
PIN 1. SOURCE 1
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. DRAIN 2
7. DRAIN 1
8. DRAIN 1
E
b
A
q
c
0.05 (0.002)
STYLE 3:
PIN 1. ANODE
2. ANODE
3. SOURCE
4. GATE
5. DRAIN
6. DRAIN
7. CATHODE
8. CATHODE
ChipFETt
CASE1206A−03
ISSUE K
L
RESET
STYLE 4:
PIN 1. COLLECTOR
2. COLLECTOR
3. COLLECTOR
4. BASE
5. EMITTER
6. COLLECTOR
7. COLLECTOR
8. COLLECTOR
8765
1234
STYLE 5:
PIN 1. ANODE
2. ANODE
3. DRAIN
4. DRAIN
5. SOURCE
6. GATE
7. CATHODE
8. CATHODE
DATE 19 MAY 2009
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE.
4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL
AND VERTICAL SHALL NOT EXCEED 0.08 MM.
5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS.
6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD
SURFACE.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
GENERIC
MARKING DIAGRAM*
xxx MG
G
xxx= Specific Device Code
M= Month Code
G= Pb−Free Package
(Note: Microdot may be in either location)
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
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*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DOCUMENT NUMBER:
DESCRIPTION:
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ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
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rights of others.
98AON03078D
ChipFET
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
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